scholarly journals The High Resolution Diffraction Beamline P08 at Petra III Expanded Towards a Platform for Structure Characterization of Organic Liquid Surfaces - Results from Lipid Monolayers

2018 ◽  
Vol 114 (3) ◽  
pp. 524a ◽  
Author(s):  
Florian Bertram ◽  
Gerald Brezesinski ◽  
Olof Gutowski ◽  
Beate Klösgen ◽  
Milena Lippmann ◽  
...  
Keyword(s):  
High Resolution ◽  
Organic Liquid ◽  
Structure Characterization ◽  
Lipid Monolayers ◽  
Liquid Surfaces

scholarly journals Common Phase and Structure Misidentifications in High-Resolution TEM Characterization of Perovskite Materials

2020 ◽  
Vol 6 (1) ◽  
pp. 1
Author(s):  
Yu-Hao Deng
Keyword(s):  
High Resolution ◽  
Research Field ◽  
Structure Characterization ◽  
Phase Identification ◽  
Lead Iodide ◽  
Perovskite Materials ◽  
High Resolution Tem ◽  
Methylammonium Lead Iodide ◽  
Dose Imaging

High-resolution TEM (HRTEM) is a powerful tool for structure characterization. However, methylammonium lead iodide (MAPbI3) perovskite is highly sensitive to electron beams and easily decomposes into lead iodide (PbI2). Misidentifications, such as PbI2 being incorrectly labeled as perovskite, are widely present in HRTEM characterization and would negatively affect the development of perovskite research field. Here misidentifications in MAPbI3 perovskite are summarized, classified, and corrected based on low-dose imaging and electron diffraction (ED) simulations. Corresponding crystallographic parameters of intrinsic tetragonal MAPbI3 and the confusable hexagonal PbI2 are presented unambiguously. Finally, the method of proper phase identification and some strategies to control the radiation damage in HRTEM are provided. This warning paves the way to avoid future misinterpretations in HRTEM characterization of perovskite and other electron beam-sensitive materials.

scholarly journals 3-Alkylpyridinium salts from Haplosclerida marine sponges: Isolation, structure elucidations, and biosynthetic considerations

2009 ◽  
Vol 81 (6) ◽  
pp. 1033-1040 ◽  
Author(s):  
Rémi Laville ◽  
Philippe Amade ◽  
Olivier P. Thomas
Keyword(s):  
High Resolution ◽  
Mass Spectra ◽  
Biosynthetic Pathway ◽  
2D Nmr ◽  
Marine Sponges ◽  
Structure Characterization ◽  
Ionization Mass ◽  
Family Structures ◽  
Resolution Electron

A very little studied marine sponge Callyspongia sp. collected off the coast of Martinique was chemically investigated. The study led to the isolation and structure characterization of two new 3-alkylpyridinium salts which belonged to the recently isolated pachychaline family. Structures were elucidated by 1D, 2D NMR and detailed high-resolution electron spray ionization mass spectra (HRESIMS)-MS studies. The use of HRESIMS-MS studies proved to be highly efficient to identify two other close derivatives in a mixture. Finally, these studies allowed us to propose a general biosynthetic pathway leading to important 3-alkylpyridinium salts.

High-resolution electron microscopy on SSZ-26 zeolite materials

1991 ◽  
Vol 49 ◽  
pp. 1032-1033 ◽  
Author(s):  
M. Pan ◽  
P.A. Crozier ◽  
I.Y. Chan ◽  
S.I. Zones
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Imaging Techniques ◽  
High Resolution Electron Microscopy ◽  
Shape Selectivity ◽  
Structure Characterization ◽  
Resolution Electron ◽  
Structure Sensitive ◽  
Dose Imaging

Zeolites constitute an important class of catalyst materials in the petrochemical industry. Zeolites are aluminosilicates with their framework structures made up of SiO4 (or AlO4) tetrahedra. The catalytic properties such as selectivity and activity are closely related to the structure sensitive properties of zeolites, e.g. shape selectivity, diffusivity, etc. Understanding these properties requires detailed structure characterization of the zeolites. High resolution electron microscopy (HREM) has been successfully applied to solve some zeolite structures when combined with experimental data from other techniques, e.g. absorption experiment. The connectivities of n-member rings in the zeolite frameworks can be directly deduced from the corresponding HREM images. However, radiation damage to the zeolite framework structures by the electron beam necessitates the use of low dose imaging techniques.

scholarly journals Transmission electron microscopy as an important tool for characterization of zeolite structures

2018 ◽  
Vol 5 (11) ◽  
pp. 2836-2855 ◽  
Author(s):  
W. Wan ◽  
J. Su ◽  
X. D. Zou ◽  
T. Willhammar
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Electron Tomography ◽  
Structure Characterization ◽  
Transmission Electron ◽  
High Resolution Tem

This review presents various TEM techniques including electron diffraction, high-resolution TEM and scanning TEM imaging, and electron tomography and their applications for structure characterization of zeolite materials.

Tem Structure Characterization Of Ti/Al and Ti/Al/Ni/Au Ohmic Contacts For n-GaN

1996 ◽  
Vol 423 ◽  
Author(s):  
S. Ruvimov ◽  
Z. Liliental-Weber ◽  
J. Washburn ◽  
K. J. Duxstad ◽  
E. E. Hailer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Ohmic Contacts ◽  
High Resolution Electron Microscopy ◽  
Structure Characterization ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Thin Polycrystalline

AbstractTransmission electron microscopy has been applied to characterize the structure of Ti/Al and Ti/Al/Ni/Au ohmic contacts on n-type GaN (˜1017 cm−3 ) epitaxial layers. A thin polycrystalline cubic TiN layer epitaxially matched to the (0001) GaN surface was detected at the interface with the GaN substrate. This layer was studied in detail by electron diffraction and high resolution electron microscopy. The orientation relationship between the cubic TiN and the GaN was found to be: {111}TiN//{00.1}GaN, [110]TiN//[11.0]GaN, [112 ]TiN//[ 10.0]GaN. The formation of this cubic TiN layer results in an excess of N vacancies in the GaN close to the interface which is considered to be the reason for the low resistance of the contact.

Skeletal elements of crinoid echinoderms: High-resolution structural and microanalytical results

1983 ◽  
Vol 41 ◽  
pp. 194-195
Author(s):  
D. F. Blake ◽  
L. F. Allard ◽  
D. R. Peacor
Keyword(s):  
High Resolution ◽  
Marine Invertebrates ◽  
Sea Urchins ◽  
Structural Features ◽  
Sea Stars ◽  
High Resolution Tem ◽  
Relationship Of ◽  
The Relationship ◽  
Insight Into

Echinodermata is a phylum of marine invertebrates which has been extant since Cambrian time (c.a. 500 m.y. before the present). Modern examples of echinoderms include sea urchins, sea stars, and sea lilies (crinoids). The endoskeletons of echinoderms are composed of plates or ossicles (Fig. 1) which are with few exceptions, porous, single crystals of high-magnesian calcite. Despite their single crystal nature, fracture surfaces do not exhibit the near-perfect {10.4} cleavage characteristic of inorganic calcite. This paradoxical mix of biogenic and inorganic features has prompted much recent work on echinoderm skeletal crystallography. Furthermore, fossil echinoderm hard parts comprise a volumetrically significant portion of some marine limestones sequences. The ultrastructural and microchemical characterization of modern skeletal material should lend insight into: 1). The nature of the biogenic processes involved, for example, the relationship of Mg heterogeneity to morphological and structural features in modern echinoderm material, and 2). The nature of the diagenetic changes undergone by their ancient, fossilized counterparts. In this study, high resolution TEM (HRTEM), high voltage TEM (HVTEM), and STEM microanalysis are used to characterize tha ultrastructural and microchemical composition of skeletal elements of the modern crinoid Neocrinus blakei.

High-resolution electron microscopy of nanostructured materials

1995 ◽  
Vol 53 ◽  
pp. 172-173
Author(s):  
M. José-Yacamán
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
Nanostructured Materials ◽  
High Resolution Electron Microscopy ◽  
Hrem Image ◽  
Small Particles ◽  
Resolution Electron ◽  
Nanophase Materials

Electron microscopy is a fundamental tool in materials characterization. In the case of nanostructured materials we are looking for features with a size in the nanometer range. Therefore often the conventional TEM techniques are not enough for characterization of nanophases. High Resolution Electron Microscopy (HREM), is a key technique in order to characterize those materials with a resolution of ~ 1.7A. High resolution studies of metallic nanostructured materials has been also reported in the literature. It is concluded that boundaries in nanophase materials are similar in structure to the regular grain boundaries. That work therefore did not confirm the early hipothesis on the field that grain boundaries in nanostructured materials have a special behavior. We will show in this paper that by a combination of HREM image processing, and image calculations, it is possible to prove that small particles and coalesced grains have a significant surface roughness, as well as large internal strain.

High-resolution transmission electron microscopic study of highly oxygen doped silicon layer

1989 ◽  
Vol 47 ◽  
pp. 692-693
Author(s):  
H. Takaoka ◽  
M. Tomita ◽  
T. Hayashi
Keyword(s):  
High Resolution ◽  
Oxygen Concentration ◽  
Silicon Layer ◽  
Detailed Structure ◽  
Electron Microscopic ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Doped Silicon ◽  
Argon Ion

High resolution transmission electron microscopy (HRTEM) is the effective technique for characterization of detailed structure of semiconductor materials. Oxygen is one of the important impurities in semiconductors. Detailed structure of highly oxygen doped silicon has not clearly investigated yet. This report describes detailed structure of highly oxygen doped silicon observed by HRTEM. Both samples prepared by Molecular beam epitaxy (MBE) and ion implantation were observed to investigate effects of oxygen concentration and doping methods to the crystal structure.The observed oxygen doped samples were prepared by MBE method in oxygen environment on (111) substrates. Oxygen concentration was about 1021 atoms/cm3. Another sample was silicon of (100) orientation implanted with oxygen ions at an energy of 180 keV. Oxygen concentration of this sample was about 1020 atoms/cm3 Cross-sectional specimens of (011) orientation were prepared by argon ion thinning and were observed by TEM at an accelerating voltage of 400 kV.

Characterization of microwave-sintered ceramic composites

1993 ◽  
Vol 51 ◽  
pp. 1136-1137
Author(s):  
X. Zhang ◽  
Y. Pan ◽  
T.T. Meek
Keyword(s):  
Matrix Material ◽  
Maximum Output Power ◽  
Ceramic Matrix Composite ◽  
Ceramic Composites ◽  
Processing Technique ◽  
Structure Characterization ◽  
Alumina Powder ◽  
Maximum Output ◽  
Sintered Ceramic

Industrial microwave heating technology has emerged as a new ceramic processing technique. The unique advantages of fast sintering, high density, and improved materials properties makes it superior in certain respects to other processing methods. This work presents the structure characterization of a microwave sintered ceramic matrix composite.Commercial α-alumina powder A-16 (Alcoa) is chosen as the matrix material, β-silicon carbide whiskers (Third Millennium Technologies, Inc.) are used as the reinforcing element. The green samples consisted of 90 vol% Al2O3 powder and 10 vol% ultrasonically-dispersed SiC whiskers. The powder mixture is blended together, and then uniaxially pressed into a cylindrical pellet under a pressure of 230 MPa, which yields a 52% green density. The sintering experiments are carried out using an industry microwave system (Gober, Model S6F) which generates microwave radiation at 2.45 GHz with a maximum output power of 6 kW. The composites are sintered at two different temperatures (1550°C and 1650°C) with various isothermal processing time intervals ranging from 10 to 20 min.

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