Influence of Storage Conditions, Sample Handling, Sample Preparation, and Repeated Analysis on the Measured Flash Point and Hydrocarbon Composition of Jet A

Fuel ◽  
2021 ◽  
Vol 305 ◽  
pp. 121399
Author(s):  
Brent A. Modereger ◽  
Sarah E. Nowling ◽  
Wan Tang Jeff Zhang ◽  
Mackenzie L. Jones ◽  
Nathan Chapman ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Hydrocarbon Composition ◽  
Storage Conditions ◽  
Flash Point ◽  
Sample Handling ◽  
Repeated Analysis

scholarly journals A streamlined pipeline for multiplexed quantitative site-specific N-glycoproteomics

2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Pan Fang ◽  
Yanlong Ji ◽  
Ivan Silbern ◽  
Carmen Doebele ◽  
Momchil Ninov ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Sample Preparation ◽  
Large Scale ◽  
Handling Time ◽  
Database Search ◽  
High Confidence ◽  
Site Specific ◽  
Sample Handling ◽  
Data Processing Tool

Abstract Regulation of protein N-glycosylation is essential in human cells. However, large-scale, accurate, and site-specific quantification of glycosylation is still technically challenging. We here introduce SugarQuant, an integrated mass spectrometry-based pipeline comprising protein aggregation capture (PAC)-based sample preparation, multi-notch MS3 acquisition (Glyco-SPS-MS3) and a data-processing tool (GlycoBinder) that enables confident identification and quantification of intact glycopeptides in complex biological samples. PAC significantly reduces sample-handling time without compromising sensitivity. Glyco-SPS-MS3 combines high-resolution MS2 and MS3 scans, resulting in enhanced reporter signals of isobaric mass tags, improved detection of N-glycopeptide fragments, and lowered interference in multiplexed quantification. GlycoBinder enables streamlined processing of Glyco-SPS-MS3 data, followed by a two-step database search, which increases the identification rates of glycopeptides by 22% compared with conventional strategies. We apply SugarQuant to identify and quantify more than 5,000 unique glycoforms in Burkitt’s lymphoma cells, and determine site-specific glycosylation changes that occurred upon inhibition of fucosylation at high confidence.

High-Yield and High-Throughput TEM Sample Preparation Using Focused Ion Beam Automation

1998 ◽  
Author(s):  
R.J. Young ◽  
P.D. Carleson ◽  
X. Da ◽  
T. Hunt ◽  
J.F. Walker
Keyword(s):  
Electron Microscope ◽  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
User Involvement ◽  
High Yield ◽  
Sample Handling ◽  
System Utilization ◽  
Transmission Electron ◽  
Column Design

Abstract Recent advances in the methods of preparing transmission electron microscope (TEM) samples using the focused ion beam (FIB) are presented. In particular, automation of TEM sample preparation is described. These automation methods, coupled with advances in ion column design, make it possible to prepare samples more efficiently and with less user involvement, thereby increasing FIB system utilization. Issues relating to sample handling and process-induced artifacts are also discussed.

A Big Tripod Polisher; 16 Years of Imaging Surfaes

1999 ◽  
Vol 5 (S2) ◽  
pp. 678-679
Author(s):  
L.D. Marks
Keyword(s):  
Electron Microscopy ◽  
Sample Preparation ◽  
Ex Situ ◽  
Sample Treatment ◽  
Cleaning Process ◽  
Sample Handling ◽  
Crucial Element ◽  
Surface Information ◽  
Electron Microscopes

Electron Microscopy of surfaces has always been a topic for a few stubborn souls. In addition to the standard headaches of electron microscopes (maintenance, breakdown) one has to handle the additional complications of maintaining a clean enough vacuum to make the results mean anything. (Without vacuum control the structures observed may be due to the contaminants, and hence meaningless.) To complicate things further, in addition to conventional ex-situ sample preparation one has to clean and equilibriate the surface while still retaining thin enough regions for useful study. The final step is to work out which techniques provide surface information and learn how to exploit them. It is appropriate to look at some of the key elements that are needed.Sample Handling: The key to success with surfaces is not really the microscopy, but instead the sample treatment. The first crucial element is control over the sputter cleaning process.(While simple heating would be less damaging, if one wants to look at something other than silicon sputter cleaning is a must.)

Some Practical Aspects of FT-IR/PBDS. Part II: Sample Handling Procedures

1987 ◽  
Vol 41 (2) ◽  
pp. 280-287 ◽  
Author(s):  
M. J. D. Low ◽  
C. Morterra
Keyword(s):  
Sample Preparation ◽  
Beam Deflection ◽  
Surface Studies ◽  
Preparation Methods ◽  
Sample Handling ◽  
Nondestructive Examination ◽  
Vacuum Pyrolysis ◽  
Ft Ir ◽  
Grinding Efficiency ◽  
Sample Preparation Methods

FT-IR photothermal beam deflection spectroscopy (PBDS) is truly nondestructive in that none of the sample preparation methods needed for the IR examination of solids are mandated. Such nondestructive examination is, however, inefficient—in that long scanning times are frequently needed—and is not really required with many samples. If it is permissible to subject the sample to a simple hand grinding, efficiency can be greatly improved. Sample preparation and handling are discussed, and the peculiarities of certain samples are described. Particular emphasis is placed on the necessity of proper sample handling for surface studies, data of the vacuum pyrolysis of polyvinyledene being used as example.

Sampling in the Analytical Scheme

1989 ◽  
Vol 72 (3) ◽  
pp. 405-411 ◽  
Author(s):  
Frederick M Garfield
Keyword(s):  
Sample Preparation ◽  
Control Charts ◽  
Sampling Techniques ◽  
Sampling Errors ◽  
Sample Handling ◽  
Analytical Scheme ◽  
Chain Of Custody

Abstract The general principles of sampling in the analytical scheme, sampling definitions, and sampling planning are considered. Statistical considerations are stressed with attention to sampling by attributes and variables and the use of sampling control charts. Sampling techniques, records and chain-of-custody procedures, sample handling, laboratory sampling, and sample preparation for analysis, as well as reasons and causes of sampling errors, are discussed.

scholarly journals Direct Coupling of an Elemental Analyzer and a Hybrid Ion Source for AMS Measurements

Radiocarbon ◽  
2004 ◽  
Vol 46 (1) ◽  
pp. 65-75 ◽  
Author(s):  
Thomas Uhl ◽  
Wolfgang Kretschmer ◽  
Wolfgang Luppold ◽  
Andreas Scharf
Keyword(s):  
Sample Preparation ◽  
Ion Source ◽  
Direct Coupling ◽  
Low Carbon ◽  
New Techniques ◽  
Carbon Contamination ◽  
Sample Handling ◽  
Handling System

The requests to measure many samples, and samples with very low carbon masses, make it necessary to develop new techniques in sample handling to accelerate sample preparation and to eliminate carbon contamination. Our 40 MC-SNICS was recently modified to a hybrid ion source. To run the hybrid ion source with a gas parameter, settings were studied and a gas handling system for the direct coupling of an elemental analyzer and a gas ion source was developed.

scholarly journals Pursuing Experimental Reproducibility: An Efficient Protocol for the Preparation of Cerebrospinal Fluid Samples for NMR-Based Metabolomics and Analysis of Sample Degradation

Metabolites ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 251
Author(s):  
Benjamin Albrecht ◽  
Elena Voronina ◽  
Carola Schipke ◽  
Oliver Peters ◽  
Maria Kristina Parr ◽  
...  
Keyword(s):  
Cerebrospinal Fluid ◽  
Sample Preparation ◽  
Ph Control ◽  
Sample Storage ◽  
Sample Collection ◽  
Experimental Conditions ◽  
Sample Handling ◽  
Sample Stability ◽  
Standard Operating ◽  
New Biomarkers

NMR-based metabolomics investigations of human biofluids offer great potential to uncover new biomarkers. In contrast to protocols for sample collection and biobanking, procedures for sample preparation prior to NMR measurements are still heterogeneous, thus compromising the comparability of the resulting data. Herein, we present results of an investigation of the handling of cerebrospinal fluid (CSF) samples for NMR metabolomics research. Origins of commonly observed problems when conducting NMR experiments on this type of sample are addressed, and suitable experimental conditions in terms of sample preparation and pH control are discussed. Sample stability was assessed by monitoring the degradation of CSF samples by NMR, hereby identifying metabolite candidates, which are potentially affected by sample storage. A protocol was devised yielding consistent spectroscopic data as well as achieving overall sample stability for robust analysis. We present easy to adopt standard operating procedures with the aim to establish a shared sample handling strategy that facilitates and promotes inter-laboratory comparison, and the analysis of sample degradation provides new insights into sample stability.

Study of volatile selenium metabolites stability in normal urine: effects of sample handling and storage conditions

2011 ◽  
Vol 26 (3) ◽  
pp. 602 ◽  
Author(s):  
Marlène Klein ◽  
Hugues Preud'homme ◽  
Maïté Bueno ◽  
Florence Pannier
Keyword(s):  
Storage Conditions ◽  
Sample Handling ◽  
Normal Urine ◽  
And Storage

scholarly journals TEM Sample Preparation Using Focused Ion Beam - Capabilities And Limits

2003 ◽  
Vol 11 (2) ◽  
pp. 22-25 ◽  
Author(s):  
H.J. Engelmann ◽  
B. Volkmann ◽  
Y. Ritz ◽  
H. Saage ◽  
H Stegmann ◽  
...  
Keyword(s):  
Electron Beam ◽  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Sample Handling ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Preparation Techniques ◽  
Scanning Electron

TEM sample preparation using Focused Ion Beam (FIB) methods becomes more and more interesting for microscopists because the technique allows for reliable and very efficient sample preparation. The first application of TEM sample preparation by FIB-cutting was reported more than 10 years ago. Meanwhile, a lot of experience has been gathered that allows one to discuss the capabilities and limits of the FIB technique in detail.Several TEM sample preparation techniques are known that all include FIB-cutting but differ in sample pre-preparation, sample handling,etc. This paper focuses on the actual FIB process, FIB tools are closely related to Scanning Electron Microscopes, but instead of an electron beam an ion beam (mostly Ga+ions) is used to remove and deposit material.

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