In situ IR ellipsometry study of the adhesion and growth of plasma deposited silica thin films on stainless steel substrates

1996 ◽  
Vol 290-291 ◽  
pp. 264-270 ◽  
Author(s):  
N. Bertrand ◽  
B. Drévillon ◽  
J.E. Klemberg-Sapieha ◽  
L. Martinu
1991 ◽  
Vol 48-49 ◽  
pp. 409-413 ◽  
Author(s):  
T. Wadayama ◽  
T. Hihara ◽  
A. Hatta ◽  
W. Suëtaka

2001 ◽  
Vol 16 (10) ◽  
pp. 2934-2938 ◽  
Author(s):  
G. Compagnini ◽  
M. M. Fragal´ ◽  
L. D'Urso ◽  
C. Spinella ◽  
O. Puglisi

Silver nanoparticles (10–20 nm) embedded into silica thin films have been obtained through the use of a silver organometallic precursor compound dissolved in Spin-On-Glass and subsequently spinned onto suitable substrates. In this paper we present a study of the shape, size, and distribution of silver particles through the use of microscopes, x-ray diffraction, and optical extinction. It has been observed that the obtained films are stable for annealing up to 500 °C with a progressive degradation above this temperature. Furthermore it is possible to obtain high-density silver particles up to 15% in weight without affecting the cluster size and shape.


2008 ◽  
Vol 2008 ◽  
pp. 1-5 ◽  
Author(s):  
E. Barrera-Calva ◽  
J. Méndez-Vivar ◽  
M. Ortega-López ◽  
L. Huerta-Arcos ◽  
J. Morales-Corona ◽  
...  

Silica-copper oxide (silica-CuO) composite thin films were prepared by a dipping sol-gel route using ethanolic solutions comprised TEOS and a copper-propionate complex. Sols with different TEOS/Cu-propionate (Si/Cu) molar ratios were prepared and applied on stainless steel substrates using dipping process. During the annealing process, copper-propionate complexes developed into particulate polycrystalline CuO dispersed in a partially crystallized silica matrix, as indicated by the X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) analyses. The gel thermal analysis revealed that the prepared material might be stable up to400°C. The silica-CuO/stainless steel system was characterized as a selective absorber surface and its solar selectivity parameters, absorptance (α), and emittance (ε) were evaluated from UV-NIR reflectance data. The solar parameters of such a system were mostly affected by the thickness and phase composition of theSiO2-CuO film. Interestingly, the best solar parameters (α= 0.92 andε= 0.2) were associated to the thinnest films, which comprised a CuO-Cu2Omixture immersed in the silica matrix, as indicated by XPS.


2019 ◽  
Vol 784 ◽  
pp. 231-236 ◽  
Author(s):  
Susu Wang ◽  
Hao Wang ◽  
Jie Jian ◽  
Jianguo Chen ◽  
Jinrong Cheng

2017 ◽  
Vol 71 (8) ◽  
pp. 1990-2000 ◽  
Author(s):  
José L. Ruiz-Caballero ◽  
Joaquín A. Aparicio-Bolaño ◽  
Amanda M. Figueroa-Navedo ◽  
Leonardo C. Pacheco-Londoño ◽  
Samuel P. Hernandez-Rivera

2016 ◽  
Vol 8 (1) ◽  
pp. 122-127 ◽  
Author(s):  
Sang Hoon Choi ◽  
Seok-Jun Seo ◽  
Dan Zhao ◽  
Kyoung-Tae Park ◽  
Bum Sung Kim ◽  
...  

1993 ◽  
Vol 308 ◽  
Author(s):  
Karl B. Yoder ◽  
Donald S. Stone

ABSTRACTThe ability to measure the temperature-dependence of the hardness of thin films is useful from both an applications and a scientific standpoint. For this reason, we have designed and constructed a load- and depth-sensing indentation tester combining sub-nanometer resolution with the ability to operate over a range of temperatures, currently 150K to 400K. This paper describes the new experimental apparatus and reports preliminary data on 440C stainless steel substrates with and without a 0.75 μm ZrN coating.


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