Electron diffraction detection of ordliking in annealed PbTe thin film

1990 ◽  
Vol 48 (4) ◽  
pp. 1018-1019
Author(s):  
Karimat El-Sayed
Keyword(s):  
Thin Film ◽  
Electron Diffraction ◽  
Lead Telluride ◽  
Structural Basis ◽  
Face Centered Cubic ◽  
X Ray ◽  
Polycrystalline Thin Films ◽  
Stage Process ◽  
Diffraction Patterns ◽  
Face Centered

Lead telluride is an important semiconductor of many applications. Many Investigators showed that there are anamolous descripancies in most of the electrophysical properties of PbTe polycrystalline thin films on annealing. X-Ray and electron diffraction studies are being undertaken in the present work in order to explain the cause of this anamolous behaviour.Figures 1-3 show the electron diffraction of the unheated, heated in air at 100°C and heated in air at 250°C respectively of a 300°A polycrystalline PbTe thin film. It can be seen that Fig. 1 is a typical [100] projection of a face centered cubic with unmixed (hkl) indices. Fig. 2 shows the appearance of faint superlattice reflections having mixed (hkl) indices. Fig. 3 shows the disappearance of thf superlattice reflections and the appearance of polycrystalline PbO phase superimposed on the [l00] PbTe diffraction patterns. The mechanism of this three stage process can be explained on structural basis as follows :

Electron diffraction studies of amorphous and polycrystalline thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 118-119
Author(s):  
D J H Cockayne ◽  
D R McKenzie
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Polycrystalline Materials ◽  
Good Resolution ◽  
Scattered Intensity ◽  
Radial Density ◽  
X Ray ◽  
Polycrystalline Thin Films ◽  
Nitrogen Ion ◽  
Diffraction Patterns

The study of amorphous and polycrystalline materials by obtaining radial density functions G(r) from X-ray or neutron diffraction patterns is a well-developed technique. We have developed a method for carrying out the same technique using electron diffraction in a standard TEM. It has the advantage that studies can be made of thin films, and on regions of specimen too small for X-ray and neutron studies. As well, it can be used to obtain nearest neighbour distances and coordination numbers from the same region of specimen from which HREM, EDS and EELS data is obtained.The reduction of the scattered intensity I(s) (s = 2sinθ/λ ) to the radial density function, G(r), assumes single and elastic scattering. For good resolution in r, data must be collected to high s. Previous work in this field includes pioneering experiments by Grigson and by Graczyk and Moss. In our work, the electron diffraction pattern from an amorphous or polycrystalline thin film is scanned across the entrance aperture to a PEELS fitted to a conventional TEM, using a ramp applied to the post specimen scan coils. The elastically scattered intensity I(s) is obtained by selecting the elastically scattered electrons with the PEELS, and collecting directly into the MCA. Figure 1 shows examples of I(s) collected from two thin ZrN films, one polycrystalline and one amorphous, prepared by evaporation while under nitrogen ion bombardment.

Phonons and Crystalline Structure of Hg1−xCdxS e Alloys (0 < x ≤ 0.5)

2012 ◽  
Vol 1372 ◽  
Author(s):  
David A. Miranda ◽  
S. A. López-Rivera ◽  
Ch. Power ◽  
J. A. Henao ◽  
M. A. Macías
Keyword(s):  
Experimental Data ◽  
Raman Spectroscopy ◽  
Powder Diffraction ◽  
Molar Fraction ◽  
Face Centered Cubic ◽  
X Ray ◽  
Cell Parameters ◽  
Cubic Structure ◽  
Diffraction Patterns ◽  
Face Centered

ABSTRACTPhonons and crystalline structures of Hg1−xCdxSe alloys (0 ≤ x ≤ 0.5) were studied by Raman spectroscopy and X-ray powder diffraction patterns at 298K. The crystalline alloys were prepared by a special combination of synthesis and the Bridgman method. Experimental data showed a face-centered cubic structure, $F\overline 4 \,3\,m$ (No. 216), for all samples, exhibiting a linear dependence for Cd molar fraction, x, for cell parameters, a, and the mass densities, ρ. Phonon frequencies were analyzed using the Romevi-Romevi model for phonons in multicomponent alloys, obtaining a fair agreement with experimental data. Furthermore, an algorithm to implement the Romevi-Romevi model is proposed.

scholarly journals Evolution of Face-Centered Cubic Ti Alloys Transformation by X-ray Diffraction Profile Analysis in Mechanical Alloying

Metals ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 1841
Author(s):  
Edgar Pio ◽  
Ariosto Medina ◽  
Carola Martínez ◽  
Felipe Manuel Castro Cerda ◽  
Claudio Aguilar
Keyword(s):  
Mechanical Alloying ◽  
Profile Analysis ◽  
Rietveld Method ◽  
Planetary Mill ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Diffraction Profile ◽  
X Ray ◽  
Diffraction Patterns ◽  
Face Centered

Four titanium alloys (Ti-Ta, Ti-Ta-Sn, Ti-Ta-Mn, and Ti-Nb-Sn) were synthesized by mechanical alloying (MA) in a planetary mill in different times between 2 h and 100 h. The microstructure characterization was made by X-ray diffraction (XRD), in which the Rietveld method was applied to analyze the diffraction patterns. The study demonstrated that after short milling times between 2 h and 30 h, the fraction of hexagonal close-packed (hcp) phase decreases; at the same time, the formation of body-centered cubic (bcc) and face-centered cubic (fcc) Ti phases are promoted. Additionally, after 30 h of MA, the full transformation of hcp-Ti was observed, and the bcc-Ti to fcc-Ti phase transformation took place until 50 h. The results suggest that the addition of Ta and Sn promotes the fcc-Ti phase formation, obtaining 100% of this phase at 50 h onwards, whereas Nb and Mn show the opposite effect.

scholarly journals Cation Distribution in Natural Chromites from Oman

1996 ◽  
Vol 1 (1) ◽  
pp. 55
Author(s):  
Z. Al-Alawi ◽  
A.M. Gismelseed ◽  
A.A. Yousif ◽  
M.A. Worthing ◽  
H.H. Sutherland ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Room Temperature ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Atomic Concentration ◽  
X Ray ◽  
Diffraction Patterns ◽  
Face Centered ◽  
Mössbauer Analysis ◽  
Scanning Electron

Two specimens or natural chromite from the Oman ophiolite were studied using Mossbauer Spectroscopy (MS), X-ray Diffraction (XRD). and Scanning Electron Microscopy (SEM). The diffraction patterns obtained at room temperature showed that the two specimens have a face-centered cubic spinal structure. Their Mossbauer spectra at 295 K. 160 K and 78 K have been fitted to three doublets. assigned to two Fe 2+ at the tetrahedral (A1+,A2) sites and one Fe1+ at the octahedral (B) site. The ferrous-ferric ratio obtained from the Mossbauer analysis together with the atomic concentration derived from the microprobe data are used to derive the chemical formulae for the two specimens. The data also supports also supports  a model of ordered caution distribution in the specimens examined.

scholarly journals Growth and Characterization of Electroplated NiO Coatings

2014 ◽  
Vol 17 (3) ◽  
pp. 173-177
Author(s):  
B. Bharathi ◽  
S. Thanikaikarasan ◽  
Pratap Kollu ◽  
P. V. Chandrasekar ◽  
T. Mahalingam ◽  
...  
Keyword(s):  
Face Centered Cubic ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Potentiostatic Electrodeposition ◽  
Direct Band ◽  
Diffraction Patterns ◽  
Face Centered ◽  
Deposited Films

Thin films of NiO have been prepared using potentiostatic electrodeposition technique from an aqueous electrolytic bath containing NiSO4. Deposited films have been characterized using x-ray diffraction, scanning electron microscopy and energy dispersive analysis by x-rays. X-ray diffraction patterns showed that the prepared films possess polycrystalline nature with face centered cubic structure. Surface morphology and film composition showed that films with better stoichiometry and smooth surface are obtained at optimized growth condition. Optical absorption analysis showed that the prepared films possess direct band gap value around 3.46 eV.

Dynamical Scattering in Electron Diffraction of wet Protein Crystals

1980 ◽  
Vol 38 ◽  
pp. 42-43
Author(s):  
B. B. Chang ◽  
D. F. Parsons
Keyword(s):  
Electron Diffraction ◽  
Scattering Theory ◽  
Protein Crystals ◽  
Electron Diffraction Data ◽  
Specimen Thickness ◽  
Major Question ◽  
X Ray ◽  
Scattering Effects ◽  
Diffraction Patterns ◽  
Acceleration Voltage

The significance of dynamical scattering effects remains the major question in the structural analysis by electron diffraction of protein crystals preserved in the hydrated state. In the few cases (single layers of purple membrane and 400-600 Å thick catalase crystals examined at 100 kV acceleration voltage) where electron-diffraction patterns were used quantitatively, dynamical scattering effects were considered unimportant on the basis of a comparison with x-ray intensities. The kinematical treatment is usually justified by the thinness of the crystal. A theoretical investigation by Ho et al. using Cowley-Moodie multislice formulation of dynamical scattering theory and cytochrome b5as the test object2 suggests that kinematical analysis of electron diffraction data with 100-keV electrons would not likely be valid for specimen thickness of 300 Å or more. We have chosen to work with electron diffraction patterns obtained from actual wet protein crystals (rat hemoglobin crystals of thickness range 1000 to 2500 Å) at 200 and 1000 kV and to analyze these for dynamical effects.

Preparation and properties of green rust type substances

1987 ◽  
Vol 52 (1) ◽  
pp. 93-102 ◽  
Author(s):  
Jaroslav Vinš ◽  
Jan Šubrt ◽  
Vladimír Zapletal ◽  
František Hanousek
Keyword(s):  
Chemical Composition ◽  
Electron Diffraction ◽  
Green Rust ◽  
X Ray ◽  
Synthesis Conditions ◽  
Diffraction Patterns

A method has been worked out for the reproducible preparation of Green Rust substances involving SO42-, Cl-, Br-, and I- anions. The chemical composition of the substances prepared has been followed in dependence on the synthesis conditions. The powder X-ray and electron diffraction patterns and infrared and Moessbauer spectra have been measured and discussed.

scholarly journals Deep learning for visualization and novelty detection in large X-ray diffraction datasets

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Lars Banko ◽  
Phillip M. Maffettone ◽  
Dennis Naujoks ◽  
Daniel Olds ◽  
Alfred Ludwig
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Artificial Intelligence ◽  
Deep Learning ◽  
Novelty Detection ◽  
Structural Similarity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns ◽  
Post Hoc

AbstractWe apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a similarly conditioned VAE is uniquely effective at knowing what it doesn’t know: it can rapidly identify data outside the distribution it was trained on, such as novel phases and mixtures. These capabilities demonstrate that a VAE is a valuable AI agent for aiding materials discovery and understanding XRD measurements both ‘on-the-fly’ and during post hoc analysis.

scholarly journals Effects of Perpendicular Magnetic Field Annealing on the Structural and Magnetic Properties of [Co/Ni]2/PtMn Thin Films

2021 ◽  
Vol 7 (3) ◽  
pp. 38
Author(s):  
Roshni Yadav ◽  
Chun-Hsien Wu ◽  
I-Fen Huang ◽  
Xu Li ◽  
Te-Ho Wu ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Films ◽  
Magnetic Properties ◽  
Photoelectron Spectroscopy ◽  
Perpendicular Magnetic Field ◽  
Face Centered Cubic ◽  
Lattice Image ◽  
X Ray ◽  
Field Annealing ◽  
Face Centered

In this study, [Co/Ni]2/PtMn thin films with different PtMn thicknesses (2.7 to 32.4 nm) were prepared on Si/SiO2 substrates. The post-deposition perpendicular magnetic field annealing (MFA) processes were carried out to modify the structures and magnetic properties. The MFA process also induced strong interlayer diffusion, rendering a less sharp interface between Co and Ni and PtMn layers. The transmission electron microscopy (TEM) lattice image analysis has shown that the films consisted of face-centered tetragonal (fct) PtMn (ordered by MFA), body-centered cubic (bcc) NiMn (due to intermixing), in addition to face-centered cubic (fcc) Co, Ni, and PtMn phases. The peak shift (2-theta from 39.9° to 40.3°) in X-ray diffraction spectra also confirmed the structural transition from fcc PtMn to fct PtMn after MFA, in agreement with those obtained by lattice images in TEM. The interdiffusion induced by MFA was also evidenced by the depth profile of X-ray photoelectron spectroscopy (XPS). Further, the magnetic properties measured by vibrating sample magnetometry (VSM) have shown an increased coercivity in MFA-treated samples. This is attributed to the presence of ordered fct PtMn, and NiMn phases exchange coupled to the ferromagnetic [Co/Ni]2 layers. The vertical shift (Mshift = −0.03 memu) of the hysteresis loops is ascribed to the pinned spins resulting from perpendicular MFA processes.

Stacking Faults in a High Nitrogen Face-Centered-Cubic Phase Formed on Nitrogen-Modified Austenitic Stainless Steel

2008 ◽  
Vol 373-374 ◽  
pp. 318-321
Author(s):  
J. Liang ◽  
M.K. Lei
Keyword(s):  
Stainless Steel ◽  
Plasma Source ◽  
Peak Shift ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
High Nitrogen ◽  
X Ray ◽  
Peak Asymmetry ◽  
Face Centered

Effects of stacking faults in a high nitrogen face-centered-cubic phase (γΝ) formed on plasma source ion nitrided 1Cr18Ni9Ti (18-8 type) austenitic stainless steel on peak shift and peak asymmetry of x-ray diffraction were investigated based on Warren’s theory and Wagner’s method, respectively. The peak shift from peak position of the γΝ phase is ascribed to the deformation faults density α, while the peak asymmetry of the γΝ phase is characterized by deviation of the center of gravity of a peak from the peak maximum (Δ C.G.) due to the twin faults density β. The calculated peak positions of x-ray diffraction patterns are consistent with that measured for plasma source ion nitrided 1Cr18Ni9Ti stainless steel.

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