scholarly journals Microscopes aren't just for Microscopists, Anymore!

1994 ◽  
Vol 2 (5) ◽  
pp. 28-29
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Laser Beam ◽  
Atomic Force Microscope ◽  
Temporal Analysis ◽  
Scanning Probe ◽  
New Family ◽  
Atomic Force ◽  
The Future ◽  
Morphologic Data ◽  
Types Of Information

Historically, microscopes have been used to gather morphologic data. We have called people who use these instruments microscopists, and it is implied that microscopists are morphologists. As was pointed out in the April/May issue of this newsletter, useful information about a specimen is also gained from temporal analysis. Further, it has been appreciated that the new family of scanning probe microscopes can be used to gather additional types of information so that these instruments have the potential to be useful beyond the dreams of a conventional microscopist. As we will discuss in this article, the future is here for one such application.The atomic force microscope (AFM) takes advantage of the leverage afforded by the deflection of a laser beam bounced off a cantilevered stylus that is scanned over the surface of a specimen.

A Study of the Photoelectric Effect Caused by a Laser Beam Used in a Beam Bounce Technique in a C-AFM System

2008 ◽  
Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu
Keyword(s):  
Laser Beam ◽  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Photoelectric Effect ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrical Characteristics ◽  
Atomic Force ◽  
Probe Microscope ◽  
Probe Head

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

Spm Based Lithography for Nanometer Scale Electrodes Fabrication

1999 ◽  
Vol 584 ◽  
Author(s):  
A. Notargiacomo ◽  
E. Giovine ◽  
E. Cianci ◽  
V. Foglietti ◽  
F. Evangelisti
Keyword(s):  
Atomic Force Microscope ◽  
Material Removal ◽  
Low Cost ◽  
Metal Electrode ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Quantum Devices ◽  
Positioning Accuracy ◽  
Atomic Force ◽  
Local Oxidation

AbstractScanning probe assisted nanolithography is a very attractive technique in terms of low-cost, patterning resolution and positioning accuracy. Our approach makes use of a commercial atomic force microscope and silicon probes to build simple nanostructures, such as metal electrode pairs, for application in novel quantum devices.Sub-100 nm patterning was successfully performed using three different techniques: direct material removal, scanning probe assisted mask patterning and local oxidation.

Modeling the Thermomechanical Interaction Between an Atomic Force Microscope Cantilever and Laser Light

2012 ◽  
Author(s):  
Aarti Chigullapalli ◽  
Jason V. Clark
Keyword(s):  
Laser Beam ◽  
Resonance Frequency ◽  
Atomic Force Microscope ◽  
Laser Power ◽  
Laser Light ◽  
Laser Spot ◽  
Design Parameters ◽  
Atomic Force ◽  
Voltage Signal ◽  
Afm Cantilever

In this paper, we present the first computational model of the thermomechanical interaction between an atomic force microscope (AFM) cantilever and laser light. We validate simulation with experiment. Design parameters of our model include AFM laser power, laser spot position, and geometric and material properties of the cantilever. In the area of nanotechnology, the laser beam deflection method has been widely used in AFMs for detecting the cantilever’s deflection and resonance frequency. The laser deflection method consists of reflecting a laser beam off of an AFM cantilever onto a photo diode, which is converted to a voltage signal. Deflection of the cantilever results in a change in the laser reflection angle and a change in voltage signal. The mechanical properties of the cantilever affect the amount of deflection. Although much work has been done on increasing the sensitivity of the AFM, little work has been done on investigating the thermal effect of the laser-cantilever interaction. We observe that laser-induced thermal expansions in the AFM cantilever are measureable. Our simulated results suggest that both the laser power and spot positions significantly change the resonant response of the cantilevers. The resonance response is critical for the AFM tapping mode. In considering various laser powers, we observe that as we increase the power, the average temperature of the beam increases, which causes a decrease in resonance frequency. In considering various laser reflection spot positions, we find that as the laser spot moves away from the clamped end of the cantilever, the dissipation to the sample which is 6 m below the cantilever tip decreases, causing an increase in temperature but decrease in material softening. The results of our models are close to the experimental results with a relative error of 0.1%.

Measurement of the surface hydrophobicity of engineered nanoparticles using an atomic force microscope

2018 ◽  
Vol 20 (37) ◽  
pp. 24434-24443 ◽  
Author(s):  
Wanyi Fu ◽  
Wen Zhang
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscope ◽  
Surface Hydrophobicity ◽  
Probe Method ◽  
Engineered Nanoparticles ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force

A scanning probe method based on atomic force microscopy (AFM) was used to probe the nanoscale hydrophobicity of nanomaterials in liquid environments.

Development of a High-pressure Scanning Probe Microscope for the study of in situ corrosion mechanisms of metallic materials

2012 ◽  
Vol 1474 ◽  
Author(s):  
Christophe Harder ◽  
L. Berlu ◽  
B. Reneaume
Keyword(s):  
High Pressure ◽  
Atomic Force Microscope ◽  
Scanning Probe ◽  
Ex Situ ◽  
Scanning Tunneling ◽  
Gaseous Species ◽  
Atomic Force ◽  
Corrosion Mechanisms ◽  
The Impact

ABSTRACTCorrosion mechanisms take place at the extreme surface of materials before spreading in the bulk. In this way, in situ surface characterization techniques as scanning probe microscopy (Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM)) allow the observations of the very initial reaction steps.To achieve that goal, an environmental cell has been designed ; it is able to integrate either an atomic force microscope (AFM) or a scanning tunneling microscope (STM). This cell can resist to internal pressures ranging from 10-5 to 20 atm. Heterogeneous “solid – gas” reactions that only occur with pressures above several atmospheres, can then be studied. This could be achieved by following the topographical evolution of samples reacting with gaseous species. Identification of the surface defects at the origin of corrosive attacks as well as proposition of reaction mechanisms will be describe in future works.The present work shows first in situ measurements that validate this new and unique experimental “HP-AFM” (High Pressure Atomic Force Microscope). The impact of the atmosphere’s composition as well as the pressure values on the topographical measurements recorded by the AFM system is especially studied.In this way, a calibration standard is used to detect a potential working drift of the AFM system (scanner head displacements, optical detection …) that could lead to eventual distortions of pictures recorded and misinterpretation of observations. This sample has been studied under several experimental conditions and the results have shown an identical behaviour of the AFM used ex situ and in situ under Ar or He up to 1.5 atm as well as a good stability during long recording acquisitions (up to 90 min) necessary for kinetic studies.

scholarly journals False Engagements in AFM

1999 ◽  
Vol 7 (2) ◽  
pp. 26-27
Author(s):  
Chetan Dandavate
Keyword(s):  
Laser Beam ◽  
Atomic Force Microscope ◽  
Contact Force ◽  
Feedback Circuit ◽  
Contact Mode ◽  
Voltage Difference ◽  
Atomic Force ◽  
Photo Detectors

In scanning microscopes, like the Atomic Force Microscope (AFM), used in contact mode, scanning begins with engaging the tip with the sample at some contact force, which can be adjusted by the setpoint* (this is common to Digital Instruments' AFMs). It may differ for other brands. For a system that detects the motion of the cantilever with a laser beam, the setpoint basically gives an idea of the voltage difference between the top and bottom photo detectors, When the tip comes into contact, the feedback circuit adjusts the tip deflection according to the required contact force, This is the method commonly followed for the constant deflection method.

scholarly journals Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100)

Proceedings ◽  
2020 ◽  
Vol 56 (1) ◽  
pp. 34
Author(s):  
Jaqueline Stauffenberg ◽  
Ingo Ortlepp ◽  
Christoph Reuter ◽  
Mathias Holz ◽  
Denis Dontsov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Long Range ◽  
Field Emission ◽  
Scanning Probe ◽  
Measuring System ◽  
Scanning Probe Lithography ◽  
Nano Fabrication ◽  
Atomic Force

The focus of this work lies on investigations on a new Nano Fabrication Machine (NFM-100) with a mounted atomic force microscope (AFM). This installed tip-based measuring system uses self-sensing and self-actuated microcantilevers, which can be used especially for field-emission scanning probe lithography (FESPL). The NFM-100 has a positioning range of Ø 100 mm, which offers, in combination with the tip-based measuring system, the possibility to analyse structures over long ranges. Using different gratings, the accuracy and the reproducibility of the NFM-100 and the AFM-system will be shown.

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