scholarly journals Prototypical Organic–Oxide Interface: Intramolecular Resolution of Sexiphenyl on In2O3(111)

2018 ◽  
Vol 10 (16) ◽  
pp. 14175-14182 ◽  
Author(s):  
Margareta Wagner ◽  
Jakob Hofinger ◽  
Martin Setvín ◽  
Lynn A. Boatner ◽  
Michael Schmid ◽  
...  
Keyword(s):  
Oxide Interface

Interface morphology of thermal oxide grown on polycrystalline silicon by different processes

1992 ◽  
Vol 50 (2) ◽  
pp. 1396-1397
Author(s):  
H. Yen ◽  
E. P. Kvam ◽  
R. Bashir ◽  
S. Venkatesan ◽  
G. W. Neudeck
Keyword(s):  
Integrated Circuits ◽  
Polycrystalline Silicon ◽  
Silicon Films ◽  
Interface Morphology ◽  
Oxide Interface ◽  
Poly Silicon ◽  
Thermal Oxide ◽  
Grain Orientations ◽  
Polycrystalline Silicon Films ◽  
P Type

Polycrystalline silicon, when highly doped, is commonly used in microelectronics applications such as gates and interconnects. The packing density of integrated circuits can be enhanced by fabricating multilevel polycrystalline silicon films separated by insulating SiO2 layers. It has been found that device performance and electrical properties are strongly affected by the interface morphology between polycrystalline silicon and SiO2. As a thermal oxide layer is grown, the poly silicon is consumed, and there is a volume expansion of the oxide relative to the atomic silicon. Roughness at the poly silicon/thermal oxide interface can be severely deleterious due to stresses induced by the volume change during oxidation. Further, grain orientations and grain boundaries may alter oxidation kinetics, which will also affect roughness, and thus stress.Three groups of polycrystalline silicon films were deposited by LPCVD after growing thermal oxide on p-type wafers. The films were doped with phosphorus or arsenic by three different methods.

HREM observation of NiO growth on submicron spheres of pure nickel

1989 ◽  
Vol 47 ◽  
pp. 548-549
Author(s):  
C.M. Teng ◽  
T.F. Kelly ◽  
J.P. Zhang ◽  
H.M. Lin ◽  
Y.W. Kim
Keyword(s):  
Nickel Oxide ◽  
Grain Boundaries ◽  
Pure Nickel ◽  
Submicron Particles ◽  
Crystal Formation ◽  
Nickel Wire ◽  
Liquid Droplets ◽  
Oxide Interface ◽  
Nickel Chromium ◽  
Chromium Alloys

Spherical submicron particles of materials produced by electrohydrodynamic (EHD) atomization have been used to study a variety of materials processes including nucleation of alternative crystallization phases in iron-nickel and nickel-chromium alloys, amorphous solidification in submicron droplets of pure metals, and quasi-crystal formation in nickel-chromium alloys. Some experiments on pure nickel, nickel oxide single crystals, the nickel/nickel(II) oxide interface, and grain boundaries in nickel monoxide have been performed by STEM. For these latter studies, HREM is the most direct approach to obtain particle crystal structures at the atomic level. Grain boundaries in nickel oxide have also been investigated by HREM. In this paper, we present preliminary results of HREM observations of NiO growth on submicron spheres of pure nickel.Small particles of pure nickel were prepared by EHD atomization. For the study of pure nickel, 0.5 mm diameter pure nickel wire (99.9975%) is sprayed directly in the EHD process. The liquid droplets solidify in free-flight through a vacuum chamber operated at about 10-7 torr.

Dendritic Growth Failure of a Mesa Diode

1997 ◽  
Author(s):  
P. Singh ◽  
V. Cozzolino ◽  
G. Galyon ◽  
R. Logan ◽  
K. Troccia ◽  
...  
Keyword(s):  
Electric Fields ◽  
Dendritic Growth ◽  
Silicon Oxide ◽  
Impact Ionization ◽  
Electron Tunneling ◽  
Growth Failure ◽  
Side Wall ◽  
Oxide Interface ◽  
Band Bending ◽  
Cross Section Area

Abstract The time delayed failure of a mesa diode is explained on the basis of dendritic growth on the oxide passivated diode side walls. Lead dendrites nucleated at the p+ side Pb-Sn solder metallization and grew towards the n side metallization. The infinitesimal cross section area of the dendrites was not sufficient to allow them to directly affect the electrical behavior of the high voltage power diodes. However, the electric fields associated with the dendrites caused sharp band bending near the silicon-oxide interface leading to electron tunneling across the band gap at velocities high enough to cause impact ionization and ultimately the avalanche breakdown of the diode. Damage was confined to a narrow path on the diode side wall because of the limited influence of the electric field associated with the dendrite. The paper presents experimental details that led to the discovery of the dendrites. The observed failures are explained in the context of classical semiconductor physics and electrochemistry.

2D MoS 2 Charge Injection Memory Transistors Utilizing Hetero‐Stack SiO 2 /HfO 2 Dielectrics and Oxide Interface Traps

2021 ◽  
pp. 2100074
Author(s):  
Livia Janice Widiapradja ◽  
Taewook Nam ◽  
Yeonsu Jeong ◽  
Hye‐Jin Jin ◽  
Yangjin Lee ◽  
...  
Keyword(s):  
Charge Injection ◽  
Interface Traps ◽  
Oxide Interface

Surface to bulk charge transfer at an alkali metal/metal oxide interface

2003 ◽  
Vol 547 (1-2) ◽  
pp. L859-L864 ◽  
Author(s):  
R Lindsay ◽  
E Michelangeli ◽  
B.G Daniels ◽  
M Polcik ◽  
A Verdini ◽  
...  
Keyword(s):  
Charge Transfer ◽  
Alkali Metal ◽  
Metal Oxide ◽  
Oxide Interface ◽  
Metal Metal ◽  
Bulk Charge

Polar Oxide Interface Stabilization by Formation of Metallic Nanocrystals

2003 ◽  
Vol 90 (21) ◽  
Author(s):  
Vlado K. Lazarov ◽  
Scott A. Chambers ◽  
Marija Gajdardziska-Josifovska
Keyword(s):  
Oxide Interface ◽  
Polar Oxide

Nitrogen Implantation and Diffusion in Silicon

1999 ◽  
Vol 568 ◽  
Author(s):  
Lahir Shaik Adam ◽  
Mark E. Law ◽  
Omer Dokumaci ◽  
Yaser Haddara ◽  
Cheruvu Murthy ◽  
...  
Keyword(s):  
Silicon Oxide ◽  
Gate Oxide ◽  
Nitrogen Diffusion ◽  
Nitrogen Implantation ◽  
Oxide Interface ◽  
Diffusion Behavior ◽  
Czochralski Silicon ◽  
Interface Modeling ◽  
And Diffusion ◽  
Silicon Silicon

ABSTRACTNitrogen implantation can be used to control gate oxide thicknesses [1,2]. This study aims at studying the fundamental behavior of nitrogen diffusion in silicon. Nitrogen at sub-amorphizing doses has been implanted as N2+ at 40 keV and 200 keV into Czochralski silicon wafers. Furnace anneals have been performed at a range of temperatures from 650°C through 1050°C. The resulting annealed profiles show anomalous diffusion behavior. For the 40 keV implants, nitrogen diffuses very rapidly and segregates at the silicon/ silicon-oxide interface. Modeling of this behavior is based on the theory that the diffusion is limited by the time to create a mobile nitrogen interstitial.

A Chemomechanical Model for Stress Evolution and Distribution in the Viscoplastic Oxide Scale During Oxidation

2016 ◽  
Vol 83 (5) ◽  
Author(s):  
Hailong Wang ◽  
Shengping Shen
Keyword(s):  
Oxide Scale ◽  
Maximum Stress ◽  
Stress Gradient ◽  
Oxidation Time ◽  
Stress Evolution ◽  
Oxide Interface ◽  
Temperature Oxidation ◽  
Substrate Interface ◽  
Oxide Substrate ◽  
Chemomechanical Model

Using the location-dependent growth strain, a chemomechanical model is developed for the analysis of the stress evolution and distribution in the viscoplastic oxide scale during high-temperature oxidation. The problem of oxidizing a semi-infinite substrate is formulated and solved. The numerical results reveal high compressive stress and significant stress gradient. The maximum stress is at the oxide/substrate interface and the minimum stress at the oxygen/oxide interface in short oxidation time, while the maximum stress is no longer at the oxide/substrate interface in long oxidation time. The stress evolutions at different locations are also presented. The predicted results agree well with the experimental data.

High temperature behavior of the metal/oxide interface of ferritic stainless steels

2012 ◽  
Vol 59 ◽  
pp. 148-156 ◽  
Author(s):  
Jérôme Issartel ◽  
Sébastien Martoia ◽  
Frédéric Charlot ◽  
Valérie Parry ◽  
Guillaume Parry ◽  
...  
Keyword(s):  
High Temperature ◽  
Metal Oxide ◽  
Stainless Steels ◽  
Temperature Behavior ◽  
Oxide Interface ◽  
Ferritic Stainless Steels ◽  
High Temperature Behavior

Evidence of SiO at the Si-oxide interface by surface soft X-ray absorption near edge spectroscopy

1980 ◽  
Vol 99 (1) ◽  
pp. 76-86 ◽  
Author(s):  
Antonio Bianconi ◽  
R.S. Bauer
Keyword(s):  
Oxide Interface ◽  
X Ray ◽  
X Ray Absorption
Sign in / Sign up

Export Citation Format

Share Document