scholarly journals A laboratory transmission diffraction Laue setup to evaluate single-crystal quality

2020 ◽  
Vol 53 (4) ◽  
pp. 914-926
Author(s):  
Alexiane Arnaud ◽  
Wijdène Guediche ◽  
Clément Remacha ◽  
Edward Romero ◽  
Henry Proudhon
Keyword(s):  
Single Crystal ◽  
Simulation Model ◽  
Incident Beam ◽  
Crystal Quality ◽  
Lattice Rotation ◽  
Diffraction Spot ◽  
Forward Simulation ◽  
Rotation Tensor ◽  
Laboratory Setup ◽  
Orientation Mapping

A scanning laboratory Laue transmission setup is developed to probe extended quasi-monocrystalline samples. Orientation mapping is achieved by controlling the collimation of the incident beam and scanning the position of the specimen. An automated indexing algorithm for transmission Laue patterns is presented, together with a forward simulation model adapted for a laboratory setup. The effect of the main parameters of the system is studied with the aim of achieving exposure times of the order of one second. Applications are presented to probe the orientation of an extended part and detect disoriented regions within the bulk. Finally, the analysis of diffraction spot shapes shows that the misorientation within the illuminated volume can be measured, and a new method is proposed to evaluate its complete mean lattice rotation tensor.

Polycrystal orientation mapping using scanning three-dimensional X-ray diffraction microscopy

2015 ◽  
Vol 48 (4) ◽  
pp. 1094-1101 ◽  
Author(s):  
Yujiro Hayashi ◽  
Yoshiharu Hirose ◽  
Yoshiki Seno
Keyword(s):  
Grain Size ◽  
Three Dimensional ◽  
Incident Beam ◽  
Diffraction Spot ◽  
Beam Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Orientation Map ◽  
Orientation Mapping ◽  
Average Grain Size

A modified three-dimensional X-ray diffraction (3DXRD) technique is proposed as a solution to the main problem with 3DXRD-type experiments, namely, polycrystalline diffraction spot overlap. The modified method, termed scanning 3DXRD, enables three-dimensional crystallographic orientation mapping in polycrystals using a narrow incident X-ray beam with a beam size sufficiently smaller than the average grain size. This method can potentially allow one to apply a 3DXRD-type technique to specimens with a larger number of grains. Moreover, because of the use of a far-field area detector, scanning 3DXRD provides spacious specimen surroundings for equipment such as stress rigs, which are not feasible in 3DXRD methods using a near-field detector. As a first demonstration, a three-dimensional orientation map was obtained by an experiment using a 20 × 20 µm beam and a well annealed iron specimen with an average grain size of 60 µm. Scanning 3DXRD compared reasonably well with orientation image microscopy by electron backscatter diffraction (EBSD), considering the influence of the beam size in the case of scanning 3DXRD. The spatial resolution was estimated to be about twice the incident beam size from a scanning 3DXRD reconstruction simulation using an orientation map modeled on the EBSD orientation image of the specimen.

scholarly journals Understanding the Strain Path Effect on the Deformed Microstructure of Single Crystal Pure Aluminum

Metals ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 1189
Author(s):  
Yingjue Xiong ◽  
Qinmeng Luan ◽  
Kailun Zheng ◽  
Wei Wang ◽  
Jun Jiang
Keyword(s):  
Strain Rate ◽  
Single Crystal ◽  
Strain Path ◽  
Mechanical Response ◽  
Pure Aluminum ◽  
Lattice Rotation ◽  
Softening Behavior ◽  
Theoretical Support ◽  
Commercial Applications ◽  
Electron Back Scattered Diffraction

During plastic deformation, the change of structural states is known to be complicated and indeterminate, even in single crystals. This contributes to some enduring problems like the prediction of deformed texture and the commercial applications of such material. In this work, plane strain compression (PSC) tests were designed and implemented on single crystal pure aluminum to reveal the deformation mechanism. PSC tests were performed at different strain rates under strain control in either one-directional or two-directional compression. The deformed microstructures were analyzed according to the flow curve and the electron back-scattered diffraction (EBSD) mappings. The effects of grain orientation, strain rate, and strain path on the deformation and mechanical response were analyzed. Experimental results revealed that the degree of lattice rotation of one-dimensional compression mildly dependents on cube orientation, but it is profoundly sensitive to the strain rate. For two-dimensional compression, the softening behavior is found to be more pronounced in the case that provides greater dislocations gliding freeness in the first loading. Results presented in this work give new insights into aluminum deformation, which provides theoretical support for forming and manufacturing of aluminum.

Fine-control-valve of halide perovskite single crystal quality for high performance X-ray detection

2021 ◽  
Author(s):  
Weijun Li ◽  
Huayang Li ◽  
Jinmei Song ◽  
Chunjie Guo ◽  
Huimao Zhang ◽  
...  
Keyword(s):  
Single Crystal ◽  
High Performance ◽  
Control Valve ◽  
Crystal Quality ◽  
X Ray ◽  
Fine Control ◽  
Halide Perovskite

scholarly journals Precursor Phenomena of Barium Titanate Single Crystals Grown Using a Solid-State Single Crystal Growth Method Studied with Inelastic Brillouin Light Scattering and Birefringence Measurements

Molecules ◽  
2018 ◽  
Vol 23 (12) ◽  
pp. 3171 ◽  
Author(s):  
Soo Han Oh ◽  
Jae-Hyeon Ko ◽  
Ho-Yong Lee ◽  
Iwona Lazar ◽  
Krystian Roleder
Keyword(s):  
Crystal Growth ◽  
Solid State ◽  
Barium Titanate ◽  
Single Crystal ◽  
Single Crystals ◽  
Melting Process ◽  
Point Of View ◽  
Crystal Quality ◽  
Cubic Phase ◽  
Growth Method

The nature of precursor phenomena in the paraelectric phase of ferroelectrics is one of the main questions to be resolved from a fundamental point of view. Barium titanate (BaTiO3) is one of the most representative perovskite-structured ferroelectrics intensively studied until now. The pretransitional behavior of BaTiO3 single crystal grown using a solid-state crystal growth (SSCG) method was investigated for the first time and compared to previous results. There is no melting process in the SSCG method, thus the crystal grown using a SSCG method have inherent higher levels of impurity and defect concentrations, which is a good candidate for investigating the effect of crystal quality on the precursor phenomena. The acoustic, dielectric, and piezoelectric properties, as well as birefringence, of the SSCG-grown BaTiO3 were examined over a wide temperature range. Especially, the acoustic phonon behavior was investigated in terms of Brillouin spectroscopy, which is a complementary technique to Raman spectroscopy. The obtained precursor anomalies of the SSCG-grown BaTiO3 in the cubic phase were similar to those of other single crystals, in particular, of high-quality single crystal grown by top-seeded solution growth method. These results clearly indicate that the observed precursor phenomena are common and intrinsic effect irrespective of the crystal quality.

Characterization of Plastic Deformation Induced by Microscale Laser Shock Peening

2004 ◽  
Vol 71 (5) ◽  
pp. 713-723 ◽  
Author(s):  
Hongqiang Chen ◽  
Jeffrey W. Kysar ◽  
Y. Lawrence Yao
Keyword(s):  
Plastic Deformation ◽  
Single Crystal ◽  
Crystal Lattice ◽  
Electron Backscatter Diffraction ◽  
Fem Analysis ◽  
Copper Sample ◽  
Laser Shock Peening ◽  
Lattice Rotation ◽  
Laser Shock ◽  
Shock Peening

Electron backscatter diffraction (EBSD) is used to investigate crystal lattice rotation caused by plastic deformation during high-strain rate laser shock peening in single crystal aluminum and copper sample on 110¯ and (001) surfaces. New experimental methodologies are employed which enable measurement of the in-plane lattice rotation under approximate plane-strain conditions. Crystal lattice rotation on and below the microscale laser shock peened sample surface was measured and compared with the simulation result obtained from FEM analysis, which account for single crystal plasticity. The lattice rotation measurements directly complement measurements of residual strain/stress with X-ray micro-diffraction using synchrotron light source and it also gives an indication of the extent of the plastic deformation induced by the microscale laser shock peening.

Scatterless hybrid metal–single-crystal slit for small-angle X-ray scattering and high-resolution X-ray diffraction

2008 ◽  
Vol 41 (6) ◽  
pp. 1134-1139 ◽  
Author(s):  
Youli Li ◽  
Roy Beck ◽  
Tuo Huang ◽  
Myung Chul Choi ◽  
Morito Divinagracia
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Small Angle ◽  
Incident Beam ◽  
Single Crystal Substrate ◽  
X Ray Diffraction ◽  
Metal Base ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A simple hybrid design has been developed to produce practically scatterless aperture slits for small-angle X-ray scattering and high-resolution X-ray diffraction. The hybrid slit consists of a rectangular single-crystal substrate (e.g.Si or Ge) bonded to a high-density metal base with a large taper angle (> 10°). The beam-defining single-crystal tip is oriented far from any Bragg peak position with respect to the incident beam and hence produces none of the slit scattering commonly associated with conventional metal slits. It has been demonstrated that the incorporation of the scatterless slits leads to a much simplified design in small-angle X-ray scattering instruments employing only one or two apertures, with dramatically increased intensity (a threefold increase observed in the test setup) and improved low-angle resolution.

Electron Diffraction Study of Multilayer Structures with Partially Coherent Illumination

1985 ◽  
Vol 62 ◽  
Author(s):  
N. Otsuka ◽  
C. Choi ◽  
L. A. Kolodziejski ◽  
R. L. Gunshor
Keyword(s):  
Electron Diffraction ◽  
Incident Beam ◽  
Electron Diffraction Study ◽  
Diffraction Theory ◽  
Diffraction Spot ◽  
Multilayer Structures ◽  
Intensity Calculations ◽  
Diffraction Patterns ◽  
Monochromatic Source

ABSTRACTThe effect of partial coherency on electron diffraction patterns of Cd1−xMnxTe – Cd1−yMny Te superlattices has been investigated. Observed diffraction patterns are compared with intensity calculations performed using dynamical diffraction theory with a model of an extended incoherent monochromatic source. From this study, a new method of electron diffraction for characterization of multilayer structures can be developed. Under the condition that the lateral coherent distance of the incident beam covers two adjacent layers, diffraction beams arising from the two layers give rise to an interference fringe in a diffraction spot. With this type of diffraction pattern, one can determine the refractive index of a crystal in the multilayer structure.

Diffraction profiles of elastically bent single crystals with constant strain gradients

2007 ◽  
Vol 40 (2) ◽  
pp. 322-331 ◽  
Author(s):  
Hanfei Yan ◽  
Özgür Kalenci ◽  
I. C. Noyan
Keyword(s):  
Single Crystal ◽  
Strain Gradient ◽  
Bragg Reflection ◽  
Incident Beam ◽  
Sample Surface ◽  
Intersection Point ◽  
Diffraction Peak ◽  
Specimen Surface ◽  
Diffraction Profile ◽  
Integrated Intensity

This work presents a set of equations that can be used to predict the dynamical diffraction profile from a non-transparent single crystal with a constant strain gradient examined in Bragg reflection geometry with a spherical incident X-ray beam. In agreement with previous work, the present analysis predicts two peaks: a primary diffraction peak, which would have still been observed in the absence of the strain gradient and which exits the specimen surface at the intersection point of the incident beam with the sample surface, and a secondary (mirage) peak, caused by the deflection of the wavefield within the material, which exits the specimen surface further from this intersection point. The integrated intensity of the mirage peak increases with increasing strain gradient, while its separation from the primary reflection peak decreases. The directions of the rays forming the mirage peak are parallel to those forming the primary diffraction peak. However, their spatial displacement might cause (fictitious) angular shifts in diffractometers equipped with area detectors or slit optics. The analysis results are compared with experimental data from an Si single-crystal strip bent in cantilever configuration, and the implications of the mirage peak for Laue analysis and high-precision diffraction measurements are discussed.

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