Multi-Gate MOSFETs with Back-Gate Control

Author(s):  
T. Hiramoto ◽  
T. Nagumo
Keyword(s):  
2009 ◽  
Vol 48 (4) ◽  
pp. 04C201 ◽  
Author(s):  
Hideyuki Maki ◽  
Tomoyuki Mizuno ◽  
Satoru Suzuki ◽  
Tetsuya Sato ◽  
Yoshihiro Kobayashi

Author(s):  
Sarvesh Dubey ◽  
Rahul Mishra

The present paper deals with the analytical modeling of subthreshold characteristics of short-channel fully-depleted recessed-source/drain SOI MOSFET with back-gate control. The variations in the subthreshold current and subthreshold swing have been analyzed against the back-gate bias voltage, buried-oxide (BOX) thickness and recessed source/drain thickness to assess the severity of short-channel effects in the device. The model results are validated by simulation data obtained from two-dimensional device simulator ATLAS from Silvaco.


MRS Advances ◽  
2017 ◽  
Vol 3 (3) ◽  
pp. 137-141 ◽  
Author(s):  
Wei-Tse Lin ◽  
Wen-Chia Liao ◽  
Yi-Nan Zhong ◽  
Yue-ming Hsin

ABSTRACTIn this study, AlGaN/GaN high electron mobility transistors (HEMTs) with a two-dimensional hole gas (2DHG) were investigated. In addition to a two-dimensional electron gas (2DEG) formed at the interface of the AlGaN and GaN layers for being a channel, a 2DHG was designed and formed underneath the channel to be the back gate. The simulated results showed the operation of device can be depletion-mode and enhancement-mode by adjusting the back gate bias. The fabricated devices showed the feasibility of 2DHG back gate control.


2016 ◽  
Vol 9 (2) ◽  
pp. 023103 ◽  
Author(s):  
Takumi Miyakawa ◽  
Takafumi Akiho ◽  
Yuya Ebina ◽  
Masafumi Yamamoto ◽  
Tetsuya Uemura

Author(s):  
Kyunghwan Kim ◽  
Kangseop Lee ◽  
Sungmin Cho ◽  
Gibeom Shin ◽  
Ho-Jin Song
Keyword(s):  

2014 ◽  
Vol 61 (4) ◽  
pp. 969-975 ◽  
Author(s):  
Nikolaos Fasarakis ◽  
Theano Karatsori ◽  
Dimitrios H. Tassis ◽  
Christoforos G. Theodorou ◽  
Francois Andrieu ◽  
...  

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