Circuit hot carrier reliability simulation in advanced CMOS technology process development

2002 ◽  
Author(s):  
Peng Fang ◽  
P.C. Li ◽  
J.T. Yue
Keyword(s):  
Process Development ◽  
Cmos Technology ◽  
Hot Carrier ◽  
Technology Process

scholarly journals Design of an Ultra-Low Voltage Bias Current Generator Highly Immune to Electromagnetic Interference

2021 ◽  
Vol 11 (1) ◽  
pp. 6
Author(s):  
Orazio Aiello
Keyword(s):  
Integrated Circuits ◽  
Electromagnetic Interference ◽  
Low Voltage ◽  
Current Source ◽  
Building Blocks ◽  
Cmos Technology ◽  
Threshold Region ◽  
Output Current ◽  
Current Generator ◽  
Technology Process

The paper deals with the immunity to Electromagnetic Interference (EMI) of the current source for Ultra-Low-Voltage Integrated Circuits (ICs). Based on the properties of IC building blocks, such as the current-splitter and current correlator, a novel current generator is conceived. The proposed solution is suitable to provide currents to ICs operating in the sub-threshold region even in the presence of an electromagnetic polluted environment. The immunity to EMI of the proposed solution is compared with that of a conventional current mirror and evaluated by analytic means and with reference to the 180 nm CMOS technology process. The analysis highlights how the proposed solution generates currents down to nano-ampere intrinsically robust to the Radio Frequency (RF) interference affecting the input of the current generator, differently to what happens to the output current of a conventional mirror under the same conditions.

scholarly journals CMOS Ultra-Wideband Low Noise Amplifier Design

2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
K. Yousef ◽  
H. Jia ◽  
R. Pokharel ◽  
A. Allam ◽  
M. Ragab ◽  
...  
Keyword(s):  
Impedance Matching ◽  
Cmos Technology ◽  
Low Noise ◽  
Low Noise Amplifier ◽  
Ultra Wideband ◽  
Output Impedance ◽  
Integrated Inductor ◽  
Technology Process ◽  
Amplifier Design ◽  
Noise Amplifier

This paper presents the design of ultra-wideband low noise amplifier (UWB LNA). The proposed UWB LNA whose bandwidth extends from 2.5 GHz to 16 GHz is designed using a symmetric 3D RF integrated inductor. This UWB LNA has a gain of 11 ± 1.0 dB and a NF less than 3.3 dB. Good input and output impedance matching and good isolation are achieved over the operating frequency band. The proposed UWB LNA is driven from a 1.8 V supply. The UWB LNA is designed and simulated in standard TSMC 0.18 µm CMOS technology process.

scholarly journals Design and implementation of CNTFET based ternary 1x1 memories

2019 ◽  
Vol 8 (3) ◽  
pp. 175 ◽  
Author(s):  
S.Tamil Selvan ◽  
M. Sundararajan
Keyword(s):  
High Performance ◽  
Data Access ◽  
Cmos Technology ◽  
Access Time ◽  
The Novel ◽  
Design And Implementation ◽  
Technology Process ◽  
Sram Cell ◽  
And Performance ◽  
Power Application

In this paper presented Design and implementation of CNTFET based Ternary 1x1 RAM memories high-performance digital circuits. CNTFET Ternary 1x1 SRAM memories is implement using 32nm technology process. The CNTFET decresase the diameter and performance matrics like delay,power and power delay, The CNTFET Ternary 6T SRAM cell consists of two cross coupled Ternary inverters one is READ and another WRITE operations of the Ternary 6T SRAM cell are performed with the Tritline using HSPICE and Tanner tools in this tool is performed high accuracy. The novel based work can be used for Low Power Application and Access time is less of compared to the conventional CMOS Technology. The CNTFET Ternary 6T SRAM array module (1X1) in 32nm technology consumes only 0.412mW power and data access time is about 5.23ns.

Novel stress-free Keep Out Zone process development for via middle TSV in 20nm planar CMOS technology

2014 ◽  
Author(s):  
Mohamed A. Rabie ◽  
Premachandran C. S. ◽  
Rakesh Ranjan ◽  
Mahadevan Iyer Natarajan ◽  
Sing Fui Yap ◽  
...  
Keyword(s):  
Process Development ◽  
Cmos Technology
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