Image Processing Segmentation applied on Defect Estimation in Production Processes

2020 ◽  
Author(s):  
Alessandro Massaro ◽  
Antonio Panarese ◽  
Giovanni Dipierro ◽  
Emanuele Cannella ◽  
Angelo Galiano ◽  
...  
Keyword(s):  
Image Processing ◽  
Production Processes ◽  
Defect Estimation

RESEARCH ON THE CORRELATION BETWEEN THE POROSITY OF PLANT GRANULAR MATERIALS AND THE SELECTED PARAMETERS OF SURFACE TEXTURE

Tribologia ◽  
2016 ◽  
Vol 270 (6) ◽  
pp. 179-189
Author(s):  
Artur WÓJCIK ◽  
Jarosław FRĄCZEK
Keyword(s):  
Image Processing ◽  
Granular Materials ◽  
Surface Texture ◽  
3D Scanner ◽  
Plant Materials ◽  
Specialized Software ◽  
New Methods ◽  
Innovative Methods ◽  
Production Processes ◽  
Specialized Equipment

The issues concerning porosity of granular materials, especially plant materials, are considered very important matters in respect of their transport, storage, precise dosing, and tribological properties. The classic method of measuring porosity requires specialized equipment and takes time, thus often being of little use in dynamic production processes. Therefore, there is a growing need for developing new methods for fast porosity measurement. In the article, the authors present an attempt to define a correlation between the selected parameters of the surface texture of plant granular materials and their porosities. To digitize the surface, an optical 3D scanner and specialized software for analysis of the surface topography were used. The results should provide a basis for the development of innovative methods for measuring porosity based on digital image processing (DIA).

scholarly journals Quality Control in Automated Manufacturing Processes – Combined Features for Image Processing

10.14311/868 ◽  
2006 ◽  
Vol 46 (5) ◽  
Author(s):  
B. Kuhlenkötter ◽  
X. Zhang ◽  
C. Krewet
Keyword(s):  
Image Processing ◽  
Quality Control ◽  
Support Vector ◽  
Manufacturing Processes ◽  
Automated Manufacturing ◽  
Defect Classification ◽  
Production Processes ◽  
Combined Features ◽  
Important Challenge ◽  
Selection Of

In production processes the use of image processing systems is widespread. Hardware solutions and cameras respectively are available for nearly every application. One important challenge of image processing systems is the development and selection of appropriate algorithms and software solutions in order to realise ambitious quality control for production processes. This article characterises the development of innovative software by combining features for an automatic defect classification on product surfaces. The artificial intelligent method Support Vector Machine (SVM) is used to execute the classification task according to the combined features. This software is one crucial element for the automation of a manually operated production process. 

Some comments about observations and image processing of comet 29P/Schwassmann-Wachmann 1

1999 ◽  
Vol 173 ◽  
pp. 243-248
Author(s):  
D. Kubáček ◽  
A. Galád ◽  
A. Pravda
Keyword(s):  
Image Processing ◽  
Large Scale ◽  
Harvard College ◽  
Oak Ridge ◽  
Large Scale Structures ◽  
Short Period Comet ◽  
Short Period ◽  
Scale Structures ◽  
Harvard College Observatory ◽  
Period Comet

AbstractUnusual short-period comet 29P/Schwassmann-Wachmann 1 inspired many observers to explain its unpredictable outbursts. In this paper large scale structures and features from the inner part of the coma in time periods around outbursts are studied. CCD images were taken at Whipple Observatory, Mt. Hopkins, in 1989 and at Astronomical Observatory, Modra, from 1995 to 1998. Photographic plates of the comet were taken at Harvard College Observatory, Oak Ridge, from 1974 to 1982. The latter were digitized at first to apply the same techniques of image processing for optimizing the visibility of features in the coma during outbursts. Outbursts and coma structures show various shapes.

Analysis of the 9th November 1990 flare

2000 ◽  
Vol 179 ◽  
pp. 229-232
Author(s):  
Anita Joshi ◽  
Wahab Uddin
Keyword(s):  
Image Processing ◽  
Two Dimensional ◽  
Temporal Behaviour ◽  
Contour Maps ◽  
Dimensional Measurements ◽  
Processing Software ◽  
Image Processing Software

AbstractIn this paper we present complete two-dimensional measurements of the observed brightness of the 9th November 1990Hαflare, using a PDS microdensitometer scanner and image processing software MIDAS. The resulting isophotal contour maps, were used to describe morphological-cum-temporal behaviour of the flare and also the kernels of the flare. Correlation of theHαflare with SXR and MW radiations were also studied.

The 'well-known' theory of electron image formation

1983 ◽  
Vol 41 ◽  
pp. 288-289
Author(s):  
M.A. O'Keefe ◽  
W.O. Saxton
Keyword(s):  
Image Processing ◽  
Image Formation ◽  
Source Profiles ◽  
Electron Image

A recent paper by Kirkland on nonlinear electron image processing, referring to a relatively new textbook, highlights the persistence in the literature of calculations based on incomplete and/or incorrect models of electron imageing, notwithstanding the various papers which have recently pointed out the correct forms of the appropriate equations. Since at least part of the problem can be traced to underlying assumptions about the illumination coherence conditions, we attempt to clarify both the assumptions and the corresponding equations in this paper, illustrating the effects of an incorrect theory by means of images calculated in different ways.The first point to be made clear concerning the illumination coherence conditions is that (except for very thin specimens) it is insufficient simply to know the source profiles present, i.e. the ranges of different directions and energies (focus levels) present in the source; we must also know in general whether the various illumination components are coherent or incoherent with respect to one another.

Recent Applications of High Resolution Electron Microscopy to Crystalline Arrays of Virus Particles

1978 ◽  
Vol 36 (3) ◽  
pp. 470-482 ◽  
Author(s):  
R.W. Horne
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Analytical Techniques ◽  
Staining Technique ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
Full Potential ◽  
Virus Particles ◽  
Resolution Electron ◽  
Wide Range

The technique of surrounding virus particles with a neutralised electron dense stain was described at the Fourth International Congress on Electron Microscopy, Berlin 1958 (see Home & Brenner, 1960, p. 625). For many years the negative staining technique in one form or another, has been applied to a wide range of biological materials. However, the full potential of the method has only recently been explored following the development and applications of optical diffraction and computer image analytical techniques to electron micrographs (cf. De Hosier & Klug, 1968; Markham 1968; Crowther et al., 1970; Home & Markham, 1973; Klug & Berger, 1974; Crowther & Klug, 1975). These image processing procedures have allowed a more precise and quantitative approach to be made concerning the interpretation, measurement and reconstruction of repeating features in certain biological systems.

An Overview of Digital Image Processing and Recognition (Invited Paper)

1982 ◽  
Vol 40 ◽  
pp. 700-702
Author(s):  
R. C. Gonzalez
Keyword(s):  
Image Processing ◽  
New York ◽  
Digital Image Processing ◽  
Digital Image ◽  
Practical Implementation ◽  
Submarine Cable ◽  
Vigorous Growth ◽  
Digitized Pictures ◽  
Processing Techniques ◽  
And Storage

Interest in digital image processing techniques dates back to the early 1920's, when digitized pictures of world news events were first transmitted by submarine cable between New York and London. Applications of digital image processing concepts, however, did not become widespread until the middle 1960's, when third-generation digital computers began to offer the speed and storage capabilities required for practical implementation of image processing algorithms. Since then, this area has experienced vigorous growth, having been a subject of interdisciplinary research in fields ranging from engineering and computer science to biology, chemistry, and medicine.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

A method to measure pores and fissures in geologic materials under S.E.M. by digital image processing

1978 ◽  
Vol 36 (1) ◽  
pp. 212-213
Author(s):  
L. Montoto ◽  
M. Montoto ◽  
A. Bel-Lan
Keyword(s):  
Image Processing ◽  
Optical Microscopy ◽  
Digital Image Processing ◽  
Digital Image ◽  
Digital Processing ◽  
Free Surfaces ◽  
Geologic Materials ◽  
Automatic Information ◽  
Detector Output ◽  
Rock Specimens

INTRODUCTION.- The physical properties of rock masses are greatly influenced by their internal discontinuities, like pores and fissures. So, these need to be measured as a basis for interpretation. To avoid the basic difficulties of measurement under optical microscopy and analogic image systems, the authors use S.E.M. and multiband digital image processing. In S.E.M., analog signal processing has been used to further image enhancement (1), but automatic information extraction can be achieved by simple digital processing of S.E.M. images (2). The use of multiband image would overcome difficulties such as artifacts introduced by the relative positions of sample and detector or the typicals encountered in optical microscopy.DIGITAL IMAGE PROCESSING.- The studied rock specimens were in the form of flat deformation-free surfaces observed under a Phillips SEM model 500. The SEM detector output signal was recorded in picture form in b&w negatives and digitized using a Perkin Elmer 1010 MP flat microdensitometer.

Digital image processing methods applied to the study of annealing time on semiconductor-metal eutectic composites

1988 ◽  
Vol 46 ◽  
pp. 848-849
Author(s):  
J. Hefter
Keyword(s):  
Image Processing ◽  
Digital Image Processing ◽  
Digital Image ◽  
Electronic Device ◽  
Processing System ◽  
Average Diameter ◽  
Eutectic Solidification ◽  
Metal Silicide ◽  
The Matrix ◽  
Microscopic Studies

Semiconductor-metal composites, formed by the eutectic solidification of silicon and a metal silicide have been under investigation for some time for a number of electronic device applications. This composite system is comprised of a silicon matrix containing extended metal-silicide rod-shaped structures aligned in parallel throughout the material. The average diameter of such a rod in a typical system is about 1 μm. Thus, characterization of the rod morphology by electron microscope methods is necessitated.The types of morphometric information that may be obtained from such microscopic studies coupled with image processing are (i) the area fraction of rods in the matrix, (ii) the average rod diameter, (iii) an average circularity (roundness), and (iv) the number density (Nd;rods/cm2). To acquire electron images of these materials, a digital image processing system (Tracor Northern 5500/5600) attached to a JEOL JXA-840 analytical SEM has been used.

Sign in / Sign up

Export Citation Format

Share Document