A Surface Roughness Comparison of Cartilage in Different Types of Synovial Joints

The naturally occurring structure of articular cartilage has proven to be an effective means for the facilitation of motion and load support in equine and other animal joints. For this reason, cartilage has been extensively studied for many years. Although the roughness of cartilage has been determined from atomic force microscopy (AFM) and other methods in multiple studies, a comparison of roughness to joint function has not be completed. It is hypothesized that various joint types with different motions and regimes of lubrication have altered demands on the articular surface that may affect cartilage surface properties. Micro- and nanoscale stylus profilometry was performed on the carpal cartilage harvested from 16 equine forelimbs. Eighty cartilage surface samples taken from three different functioning joint types (radiocarpal, midcarpal, and carpometacarpal) were measured by a Veeco Dektak 150 Stylus Surface Profilometer. The average surface roughness measurements were statistically different for each joint. This indicates that the structure of cartilage is adapted to, or worn by, its operating environment. Knowledge of cartilage micro- and nanoscale roughness will assist the future development and design of treatments for intra- articular substances or surfaces to preserve joint integrity and reduce limitations or loss of joint performance.

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Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100166798 ◽

1996 ◽

Vol 54 ◽

pp. 866-867

Author(s):

H. Kinney ◽

M.L. Occelli ◽

S.A.C. Gould

Keyword(s):

Surface Roughness ◽

Zeolite Y ◽

Atomic Level ◽

Microporous Structure ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

Roughness Measurements ◽

Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

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Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

10.26434/chemrxiv.13238708.v1 ◽

2020 ◽

Author(s):

Benjamin P. A. Gabriele ◽

Craig J. Williams ◽

Douglas Stauffer ◽

Brian Derby ◽

Aurora J. Cruz-Cabeza

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Single Crystals ◽

Spalling Fracture ◽

Force Microscopy ◽

Atomic Force ◽

Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

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Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

10.26434/chemrxiv.13238708 ◽

2020 ◽

Author(s):

Benjamin P. A. Gabriele ◽

Craig J. Williams ◽

Douglas Stauffer ◽

Brian Derby ◽

Aurora J. Cruz-Cabeza

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Single Crystals ◽

Spalling Fracture ◽

Force Microscopy ◽

Atomic Force ◽

Afm Imaging

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Assessing the Functional Properties of TiZr Nanotubular Structures for Biomedical Applications, through Nano-Scratch Tests and Adhesion Force Maps

Molecules ◽

10.3390/molecules26040900 ◽

2021 ◽

Vol 26 (4) ◽

pp. 900

Author(s):

Maria Vardaki ◽

Aida Pantazi ◽

Ioana Demetrescu ◽

Marius Enachescu

Keyword(s):

Surface Roughness ◽

Functional Properties ◽

Bacterial Adhesion ◽

Biomedical Applications ◽

Adhesion Force ◽

Roughness Parameters ◽

Force Microscopy ◽

Atomic Force ◽

The Mean ◽

Scratch Tests

In this work we present the results of a functional properties assessment via Atomic Force Microscopy (AFM)-based surface morphology, surface roughness, nano-scratch tests and adhesion force maps of TiZr-based nanotubular structures. The nanostructures have been electrochemically prepared in a glycerin + 15 vol.% H2O + 0.2 M NH4F electrolyte. The AFM topography images confirmed the successful preparation of the nanotubular coatings. The Root Mean Square (RMS) and average (Ra) roughness parameters increased after anodizing, while the mean adhesion force value decreased. The prepared nanocoatings exhibited a smaller mean scratch hardness value compared to the un-coated TiZr. However, the mean hardness (H) values of the coatings highlight their potential in having reliable mechanical resistances, which along with the significant increase of the surface roughness parameters, which could help in improving the osseointegration, and also with the important decrease of the mean adhesion force, which could lead to a reduction in bacterial adhesion, are providing the nanostructures with a great potential to be used as a better alternative for Ti implants in dentistry.

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Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

BMC Ophthalmology ◽

10.1186/s12886-021-02039-6 ◽

2021 ◽

Vol 21 (1) ◽

Author(s):

Juan Gros-Otero ◽

Samira Ketabi ◽

Rafael Cañones-Zafra ◽

Montserrat Garcia-Gonzalez ◽

Cesar Villa-Collar ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Intraocular Lenses ◽

Posterior Chamber ◽

Anterior Surface ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Phakic Intraocular Lenses ◽

Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

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Effect of Water Temperature, pH Value, and Film Thickness on the Wettability Behaviour of Copper Surfaces Coated with Copper Using EB-PVD Technique

Journal of Nano Research ◽

10.4028/www.scientific.net/jnanor.60.124 ◽

2019 ◽

Vol 60 ◽

pp. 124-141 ◽

Cited By ~ 1

Author(s):

Naser Ali ◽

Joao Amaral Teixeira ◽

Abdulmajid Addali

Keyword(s):

Surface Roughness ◽

Contact Angle ◽

Film Thickness ◽

Water Temperature ◽

Ph Value ◽

Surface Wettability ◽

Copper Surfaces ◽

Force Microscopy ◽

Atomic Force ◽

Static Contact

This research investigates the effect of surface roughness, water temperature, and pH value on the wettability behaviour of copper surfaces. An electron beam physical vapour deposition technique was used to fabricate 25, 50, and 75 nm thin films of copper on the surface of copper substrates. Surface topographical analysis, of the uncoated and coated samples, was performed using an atomic force microscopy device to observe the changes in surface microstructure. A goniometer device was then employed to examine the surface wettability of the samples by obtaining the static contact angle between the liquid and the attached surface using the sessile drops technique. Waters of pH 4, 7, and 9 were employed as the contact angle testing fluids at a set of fixed temperatures that ranged from 20°C to 60°C. It was found that increasing the deposited film thickness reduces the surface roughness of the as-prepared copper surfaces and thus causing the surface wettability to diverge from its initial hydrophobic nature towards the hydrophilic behaviour region. A similar divergence behaviour was seen with the rise in temperature of water of pH 4, and 9. In contrast, the water of pH 7, when tested on the uncoated surface, ceased to reach a contact angle below 90o. It is believed that the observed changes in surface wettability behaviour is directly linked to the liquid temperature, pH value, surface roughness, along with the Hofmeister effect between the water and the surface in contact.

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Effect of Surface Chemistry on Ruthenium Wet Etching

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.314.302 ◽

2021 ◽

Vol 314 ◽

pp. 302-306

Author(s):

Quoc Toan Le ◽

E. Kesters ◽

M. Doms ◽

Efrain Altamirano Sánchez

Keyword(s):

Surface Roughness ◽

Photoelectron Spectroscopy ◽

Etching Rate ◽

Wet Etching ◽

X Ray ◽

Force Microscopy ◽

Metal Free ◽

Atomic Force ◽

Different Types ◽

Effect Of Surface

Different types of ALD Ru films, including as-deposited, annealed Ru, without and with a subsequent CMP step, were used for wet etching study. With respect to the as-deposited Ru, the etching rate of the annealed Ru film in metal-free chemical mixtures (pH = 7-9) was found to decrease substantially. X-ray photoelectron spectroscopy characterization indicated that this behavior could be explained by the presence of the formation of RuOx (x = 2,3) caused by the anneal. A short CMP step applied to the annealed Ru wafer removed the surface RuOx, at least partially, resulting in a significant increase of the etching rate. The change in surface roughness was quantified using atomic force microscopy.

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Copper Diffusion Into Aluminum-Silicon Metallizations by Accelerated Thermal and Electrical Stressing

MRS Proceedings ◽

10.1557/proc-428-219 ◽

1996 ◽

Vol 428 ◽

Author(s):

G. O. Ramseyer ◽

L. H. Walsh ◽

J. V. Beasock ◽

H. F. Helbig ◽

R. C. Lacoe ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiling ◽

Copper Diffusion ◽

Force Microscopy ◽

Atomic Force ◽

Line Widths ◽

Electromigration Lifetime

AbstractPatterned 930 nm Al(1%-Si) interconnects over 147 nm of Cu were electromigration lifetime tested at 1.0–1.5 × 105 A/cm2 at 250 °C. The morphology of the surfaces of the electromigrated stripes with different line widths and times to failure were characterized by atomic force microscopy, and changes in surface roughness were compared. The diffusion of copper into the electromigrated aluminum stripes was determined by depth profiling using Auger electron spectroscopy. In particular, areas where hillocks formed were examined and compared to areas of median roughness.

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