Stress Evaluation of Flexible Displays With Multiple-Laminations Architecture Enabled by Experimental Measurement and Simulation Based Factorial Design

2019 ◽  
Author(s):  
Chang-Chun Lee ◽  
Pei-Chen Huang ◽  
Chi-Wei Wang ◽  
Oscar Chuang
Keyword(s):  
Indium Tin Oxide ◽  
Fatigue Behavior ◽  
Neutral Axis ◽  
Dominant Factor ◽  
Flexible Display ◽  
Resistance Change ◽  
Flexible Displays ◽  
Research Attention ◽  
Ito Film ◽  
Simulation Based

Abstract Fatigue behavior of multiple-stacked film-type flexible displays under flexural load has received considerable research attention, whereas the requirement of a considerably thin and flexible packaging structure with single/multiple neutral axis has not been systemically explored. Consequently, this study evaluated the flexural load induced strain and corresponding resistance change in flexible display architecture by both experimental and simulation works. The relationship between mechanical strains and the relevant resistance change in a touch panel module is estimated by both nonlinear finite element analysis and actual experiments. The aforementioned results revealed that the simulated strain and the resistance change of indium tin oxide (ITO) film were increased as the bending radius becomes narrow. Moreover, the influences of several mechanical parameters within an entire organic light-emitting diode device package with multiple coatings were estimated by a simulation-based parametric study. It should be noted that the structure design would lead the single/multiple neutral axis (N.A.) occurred in the concerned flexible displays. Among all the designed structural and material properties, the Young’s modulus of the adhesive is the most dominant factor to determine the bending strain of ITO film and the phenomenon occurrence of multiple N.A. The analytic results indicated that the multiple N.A. design is contributed to decrease the flexural strain and corresponding resistance change of ITO film. Therefore, the design rules of single/multiple N.A. and its influences on stress-induced electric variation in flexible display are revealed.

The Mechanical Reliability of Sputter-Coated Indium Tin Oxide Polyester Substrates for Flexible Display and Touchscreen Applications

2001 ◽  
Vol 666 ◽  
Author(s):  
Darran R. Cairns ◽  
David C. Paine ◽  
Gregory P. Crawford
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Liquid Crystal Displays ◽  
Mechanical Reliability ◽  
Flexible Display ◽  
Ito Film ◽  
Polyethylene Terephthalate Substrate ◽  
Electrical Reliability ◽  
New Generation ◽  
Over Time

ABSTRACTIndium tin oxide (ITO) films deposited on polyester substrates are a key material in the development of two exciting technologies, touchscreens and flexible liquid crystal displays. The new generation “plastic” displays and touchscreens must be flexible and robust, have excellent optical properties, and be inexpensive. We report on the mechanical and electrical reliability of ITO on a polyethylene terephthalate substrate (PET). We show that the mechanical behavior of the ITO film is dominated by the properties of the substrate and that the deformation of the substrate is mapped by the crack patterns in the ITO. This is most strongly evidenced in the simulated wear of a touchscreen where failure after >50000 pen strokes is primarily due to cracking of the ITO as a result of increased substrate deformation over time. In addition the mechanical reliability of the ITO layer is dependent on the film thickness. Cracking was observed in a 105 nm thick ITO film at a strain of 0.022 and for a 16.8 nm thick film at 0.003. The thickness and hence sheet resistance of the film effectively limits the maximum allowable deformation of the substrate and must be considered in the design of suitable display and touchscreen devices. In addition we report on the change in resistance with time-at- temperature and relate this to the shrinkage of the substrate.

Uni-axial Cracking of ITO to Form Row and Column Electrodes for Roll to Roll Production of Flexible Displays and Electronics

2013 ◽  
Vol 1529 ◽  
Author(s):  
John Lawton West ◽  
Miko Cakmak ◽  
Tsang-Min Huang ◽  
Da-Wei Lee
Keyword(s):  
Indium Tin Oxide ◽  
Small Dimension ◽  
Small Radius ◽  
Radius Of Curvature ◽  
Flexible Displays ◽  
Ito Film ◽  
Roll To Roll ◽  
Contact Electrodes ◽  
Contact Electrode ◽  
Individual Line

ABSTRACTUniformly uni-axially aligned electrodes are formed by uniaxially cracking an indium tin oxide, ITO, film vacuum deposited on a polyester substrate. The cracks are produced by bending the film around a small radius of curvature, producing narrow, parallel cracks in the ITO separated by 5-10 μm. The cracks are enhanced by etching or uniaxial stretching. Heating and stretching is the most effective, producing a crack width of about 0.05 μm and a differential conductivity (measured parallel and perpendicular to the cracks) several orders of magnitude or greater. A passive matrix bistable cholesteric display is fabricated using top and bottom substrates with perpendicularly aligned electrodes. The addressed lines on each substrate are defined by the contact electrode, which contacts multiple cracked ITO lines. Because of the small dimension of the cracks (much less than the thickness of the active layer) they are not visible in the display. The separation between the contact electrodes must be great than 20 μm in order to include at least one crack and electrically isolate each individual line. The resulting display demonstrates how controlled cracking of ITO can replace photolithographic etching of ITO or printing of conducting polymers to produce the line electrodes required for flexible, passive matrix displays and related electronic applications. Un-axially cracking can be easily integrated into a roll-to-roll manufacturing process.

scholarly journals Improving Performance of CIGS Solar Cells by Annealing ITO Thin Films Electrodes

2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Chuan Lung Chuang ◽  
Ming Wei Chang ◽  
Nien Po Chen ◽  
Chung Chiang Pan ◽  
Chung Ping Liu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Solar Cells ◽  
Indium Tin Oxide ◽  
Copper Indium Gallium Diselenide ◽  
Glass Substrates ◽  
Ito Film ◽  
Ito Thin Films ◽  
Cigs Solar Cells ◽  
Ito Films

Indium tin oxide (ITO) thin films were grown on glass substrates by direct current (DC) reactive magnetron sputtering at room temperature. Annealing at the optimal temperature can considerably improve the composition, structure, optical properties, and electrical properties of the ITO film. An ITO sample with a favorable crystalline structure was obtained by annealing in fixed oxygen/argon ratio of 0.03 at 400°C for 30 min. The carrier concentration, mobility, resistivity, band gap, transmission in the visible-light region, and transmission in the near-IR regions of the ITO sample were-1.6E+20 cm−3,2.7E+01 cm2/Vs,1.4E-03 Ohm-cm, 3.2 eV, 89.1%, and 94.7%, respectively. Thus, annealing improved the average transmissions (400–1200 nm) of the ITO film by 16.36%. Moreover, annealing a copper-indium-gallium-diselenide (CIGS) solar cell at 400°C for 30 min in air improved its efficiency by 18.75%. The characteristics of annealing ITO films importantly affect the structural, morphological, electrical, and optical properties of ITO films that are used in solar cells.

scholarly journals Improve the Performance of SONOS Type UV TD Sensors Using IOHAOS with Enhanced UV Transparency ITO Gate

Coatings ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 408
Author(s):  
Wen-Ching Hsieh ◽  
Fun-Cheng Jong ◽  
Wei-Ting Tseng
Keyword(s):  
Aluminum Oxide ◽  
Threshold Voltage ◽  
Indium Tin Oxide ◽  
Silicon Oxide ◽  
Poly Silicon ◽  
Ito Film ◽  
Post Annealing ◽  
Response Performance ◽  
Fading Rate ◽  
Silicon Device

This research demonstrates that an indium tin oxide–silicon oxide–hafnium aluminum oxide‒silicon oxide–silicon device with enhanced UV transparency ITO gate (hereafter E-IOHAOS) can greatly increase the sensing response performance of a SONOS type ultraviolet radiation total dose (hereafter UV TD) sensor. Post annealing process is used to optimize UV optical transmission and electrical resistivity characterization in ITO film. Via nano-columns (NCols) crystalline transformation of ITO film, UV transparency of ITO film can be enhanced. UV radiation causes the threshold voltage VT of the E-IOHAOS device to increase, and the increase of the VT of E-IOHAOS device is also related to the UV TD. The experimental results show that under UV TD irradiation of 100 mW·s/cm2, ultraviolet light can change the threshold voltage VT of E-IOHAOS to 12.5 V. Moreover, the VT fading rate of ten-years retention on E-IOHAOS is below 10%. The VT change of E-IOHAOS is almost 1.25 times that of poly silicon–aluminum oxide–hafnium aluminum oxide–silicon oxide–silicon with poly silicon gate device (hereafter SAHAOS). The sensing response performance of an E-IOHAOS UV TD sensor is greatly improved by annealed ITO gate.

65.4: Stress Corrosion Cracking of Patterned Indium Tin Oxide Electrodes for Flexible Displays

2007 ◽  
Vol 38 (1) ◽  
pp. 1790-1793 ◽  
Author(s):  
Karpagavalli Ramji ◽  
Darran R. Cairns ◽  
Kostas A. Sierros ◽  
Stephen N. Kukureka
Keyword(s):  
Stress Corrosion ◽  
Tin Oxide ◽  
Stress Corrosion Cracking ◽  
Indium Tin Oxide ◽  
Corrosion Cracking ◽  
Flexible Displays ◽  
Oxide Electrodes

Tri-Metal Layered Semitransparent Electrode for Red Phosphorescent Organic Light-Emitting Diodes

2015 ◽  
Vol 15 (10) ◽  
pp. 8144-8148 ◽  
Author(s):  
Jae Woo Lee ◽  
Ho Won Lee ◽  
Song Eun Lee ◽  
Hyung Jin Yang ◽  
Sung Kyu Lee ◽  
...  
Keyword(s):  
Indium Tin Oxide ◽  
Glass Substrate ◽  
Light Emitting Diode ◽  
Metal Layer ◽  
Flexible Substrate ◽  
Flexible Display ◽  
Light Emitting ◽  
Light Emitting Devices ◽  
Organic Light Emitting Diode ◽  
Organic Light

In this paper, we fabricated tri-metal layered thin film semitransparent electrodes consisting of a thin conductive metal layer, sandwiched between two nickel layers. An equal red phosphorescent organic light-emitting diode (PHOLED) structure was deposited on the anodes of indium tin oxide (ITO) and three types of tri-metal layers (Ni/Al/Ni, Ni/Cu/Ni, and Ni/Ag/Ni, thickness of 3/7/3 nm in common) on a glass substrate. The optical and electrical performances of the device using Ni/Ag/Ni were improved more than the performances of the other devices due to the micro-cavity effect in accordance with the various electrode characteristics. Moreover, we fabricated the same red PHOLED structures on a flexible substrate, as a consequence, showed competitive emission characteristics compared to the devices fabricated on a glass substrate. Therefore, this study could succeed to additional research on flexible display panel and light-emitting devices with ITO-free electrodes.

Characterization of indium tin oxide film and practical ITO film by electron microscopy

2000 ◽  
Vol 370 (1-2) ◽  
pp. 155-162 ◽  
Author(s):  
T. Nakao ◽  
T. Nakada ◽  
Y. Nakayama ◽  
K. Miyatani ◽  
Y. Kimura ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Oxide Film ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Ito Film

CRITICAL STEPS IN DATA ANALYSIS FOR PRECISION CASIMIR FORCE MEASUREMENTS WITH SEMICONDUCTING FILMS

2011 ◽  
Vol 26 (22) ◽  
pp. 3900-3909 ◽  
Author(s):  
A. A. BANISHEV ◽  
CHIA-CHENG CHANG ◽  
U. MOHIDEEN
Keyword(s):  
Data Analysis ◽  
Indium Tin Oxide ◽  
Casimir Force ◽  
High Vacuum ◽  
Force Measurements ◽  
Uv Treatment ◽  
Critical Data ◽  
Ito Film ◽  
Atomic Force ◽  
Gold Sphere

Some experimental procedures and corresponding results of the precision measurement of the Casimir force between low doped Indium Tin Oxide ( ITO ) film and gold sphere are described. Measurements were performed using an Atomic Force Microscope in high vacuum. It is shown that the magnitude of the Casimir force decreases after prolonged UV treatment of the ITO film. Some critical data analysis steps such as the correction for the mechanical drift of the sphere-plate system and photodiodes are discussed.

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