Light Transmission and Surface Topography of KU-1 Optical Quartz After Sputtering and Cleaning from Al Films in RF Discharge of H2(D2)–Ne Mixtures

The response of single breast cancer cells (cell line T‐47D) to 17β‐estradiol (E2) under different concentrations was studied by using an instrument that allows to combine far‐field light microscopy with high resolution scanning near‐field (AFM/SNOM) microscopy on the same cell. Different concentrations of E2induce clearly different effects as well on cellular shape (in classical bright‐field imaging) as on surface topography (atomic force imaging) and absorbance (near‐field light transmission imaging). The differences range from a polygonal shape at zero via a roughly spherical shape at physiological up to a spindle‐like shape at un‐physiologically high concentrations. The surface topography of untreated control cells was found to be regular and smooth with small overall height modulations. At physiological E2concentrations the surfaces became increasingly jagged as detected by an increase in membrane height. After application of the un‐physiological high E2concentration the cell surface structures appeared to be smoother again with an irregular fine structure. The general behaviour of dose dependent differences was also found in the near‐field light transmission images. In order to quantify the treatment effects, line scans through the normalised topography images were drawn and a rate of co‐localisation between high topography and high transmission areas was calculated. The cell biological aspects of these observations are, so far, not studied in detail but measurements on single cells offer new perspectives to be empirically used in diagnosis and therapy control of breast cancers.

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The Broad Applications of the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100062002 ◽

1969 ◽

Vol 27 ◽

pp. 20-21

Author(s):

C. T. Nightingale ◽

S. E. Summers ◽

T. P. Turnbull

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Light Microscopy ◽

Surface Topography ◽

Great Depth ◽

Resolving Power ◽

Depth Of Field ◽

Pictorial Representations ◽

Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

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Effects of Ion Beam Milling on Surface Topography

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070862 ◽

1973 ◽

Vol 31 ◽

pp. 84-85

Author(s):

P.G. Pawar ◽

P. Duhamel ◽

G.W. Monk

Keyword(s):

Surface Topography ◽

Ion Beam ◽

Solid Material ◽

Beam Current ◽

Atomic Mass ◽

Micro Milling ◽

Ion Milling ◽

Controlled Atmospheres ◽

Milling Operations ◽

Sufficient Energy

A beam of ions of mass greater than a few atomic mass units and with sufficient energy can remove atoms from the surface of a solid material at a useful rate. A system used to achieve this purpose under controlled atmospheres is called an ion miliing machine. An ion milling apparatus presently available as IMMI-III with a IMMIAC was used in this investigation. Unless otherwise stated, all the micro milling operations were done with Ar+ at 6kv using a beam current of 100 μA for each of the two guns, with a specimen tilt of 15° from the horizontal plane.It is fairly well established that ion bombardment of the surface of homogeneous materials can produce surface topography which resembles geological erosional features.

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Low-Loss Images in a Stem/Tem Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010009244x ◽

1976 ◽

Vol 34 ◽

pp. 496-497 ◽

Cited By ~ 1

Author(s):

David C. Joy ◽

Dennis M. Maher

Keyword(s):

High Resolution ◽

Surface Topography ◽

Beam Direction ◽

Low Loss ◽

Specimen Holder ◽

Glancing Angle ◽

High Resolution Images ◽

Set Up ◽

Conventional Manner ◽

Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

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Advanced TEM sample preparation techniques for submicron Si devices

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100138956 ◽

1995 ◽

Vol 53 ◽

pp. 516-517 ◽

Cited By ~ 1

Author(s):

P. B. Basham ◽

H. L. Tsai

Keyword(s):

Sample Preparation ◽

Process Development ◽

Light Transmission ◽

Specific Area ◽

Turnaround Time ◽

Small Hole ◽

Area Of Interest ◽

Transmission Electron ◽

Polished Side ◽

Preparation Techniques

The use of transmission electron microscopy (TEM) to support process development of advanced microelectronic devices is often challenged by a large amount of samples submitted from wafer fabrication areas and specific-spot analysis. Improving the TEM sample preparation techniques for a fast turnaround time is critical in order to provide a timely support for customers and improve the utilization of TEM. For the specific-area sample preparation, a technique which can be easily prepared with the least amount of effort is preferred. For these reasons, we have developed several techniques which have greatly facilitated the TEM sample preparation.For specific-area analysis, the use of a copper grid with a small hole is found to be very useful. With this small-hole grid technique, TEM sample preparation can be proceeded by well-established conventional methods. The sample is first polished to the area of interest, which is then carefully positioned inside the hole. This polished side is placed against the grid by epoxy Fig. 1 is an optical image of a TEM cross-section after dimpling to light transmission.

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Role of the exosporial membrane in attachment and germination of C. sporogenes

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100146035 ◽

1993 ◽

Vol 51 ◽

pp. 38-39

Author(s):

B.J. Panessa-Warren ◽

G.T. Tortora ◽

J.B. Warren

Keyword(s):

Enzymatic Degradation ◽

Light Transmission ◽

Extended Period ◽

Growth Conditions ◽

Clostridium Sporogenes ◽

Radiation Chemical ◽

Physical Trauma ◽

Extended Contact ◽

Cold Pressure

Some bacteria are capable of forming highly resistant spores when environmental conditions are not adequate for growth. Depending on the genus and species of the bacterium, these endospores are resistant in varying degrees to heat, cold, pressure, enzymatic degradation, ionizing radiation, chemical sterilants,physical trauma and organic solvents. The genus Clostridium, responsible for botulism poisoning, tetanus, gas gangrene and diarrhea in man, produces endospores which are highly resistant. Although some sporocides can kill Clostridial spores, the spores require extended contact with a sporocidal agent to achieve spore death. In most clinical situations, this extended period of treatment is not possible nor practical. This investigation examines Clostridium sporogenes endospores by light, transmission and scanning electron microscopy under various dormant and growth conditions, cataloging each stage in the germination and outgrowth process, and analyzing the role played by the exosporial membrane in the attachment and germination of the spore.

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A procedure for cross-sectioning materials for TEM analysis without ion milling

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100176848 ◽

1990 ◽

Vol 48 (4) ◽

pp. 742-743

Author(s):

J.P. Benedict ◽

Ron Anderson ◽

S. J. Klepeis

Keyword(s):

Surface Topography ◽

Milling Time ◽

Specimen Preparation ◽

Ion Milling ◽

Cleaning Operation ◽

Tem Analysis ◽

Platinum Silicide ◽

Surface Alteration ◽

Polishing Damage ◽

Tools And Methods

Traditional specimen preparation procedures for non-biological samples, especially cross section preparation procedures, involves subjecting the specimen to ion milling for times ranging from minutes to tens of hours. Long ion milling time produces surface alteration, atomic number and rough-surface topography artifacts, and high temperatures. The introduction of new tools and methods in this laboratory improved our ability to mechanically thin specimens to a point where ion milling time was reduced to one to ten minutes. Very short ion milling times meant that ion milling was more of a cleaning operation than a thinning operation. The preferential thinning and the surface topography that still existed in briefly ion milled samples made the study of interfaces between materials such as platinum silicide and silicon difficult. These two problems can be eliminated by completely eliminating the ion milling step and mechanically polishing the sample to TEM transparency with the procedure outlined in this communication. Previous successful efforts leading to mechanically thinned specimens have shown that problems center on tool tilt control, removal of polishing damage, and specimen cleanliness.

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High Resolution Low Loss Microscopy of Crystalline Surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600000696 ◽

1980 ◽

Vol 38 ◽

pp. 162-163

Author(s):

William Krakow ◽

Alec N. Broers

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Surface Topography ◽

Secondary Electron ◽

Objective Lens ◽

Surface Imaging ◽

Low Loss ◽

Fine Grained ◽

Scanning Electron ◽

Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

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How nanoscale surface steps promote ice growth on feldspar: microscopy observation of morphology-enhanced condensation and freezing

Nanoscale ◽

10.1039/c9nr08729j ◽

2019 ◽

Vol 11 (44) ◽

pp. 21147-21154 ◽

Cited By ~ 2

Author(s):

Raymond W. Friddle ◽

Konrad Thürmer

Keyword(s):

Surface Topography ◽

Video Microscopy ◽

Microscopy Observation ◽

Atmospheric Dust ◽

Ice Growth ◽

Surface Steps

Video microscopy and AFM are used to relate surface topography to a mineral's ability to promote ice growth. On feldspar, abundant as atmospheric dust, basic surface steps can facilitate condensation and freezing when air becomes saturated.

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