ANALYSIS OF LIQUID MEDIATED CONTACT OF GLASS COLLOIDAL PARTICLE WITH POLYSTYRENE COATED SURFACE

2019 ◽  
Vol 27 (02) ◽  
pp. 1950101
Author(s):  
KHURSHID AHMAD ◽  
ABDUS SABOOR AHMAD ◽  
MUHAMMAD HASSAN ◽  
ZUBAIR AHMAD ◽  
XUEZENG ZHAO ◽  
...  
Keyword(s):  
Colloidal Particle ◽  
Sudden Change ◽  
Polymeric Coating ◽  
Coated Film ◽  
Spherical Domains ◽  
Coated Surface ◽  
Mediated Contact ◽  
Film Substrate ◽  
Glass Surfaces ◽  
Sudden Reduction

Spin coating has been widely used for obtaining uniform thin polymeric coating over glass surfaces. Previous studies have shown that the thin-coated film can deform and bulge out upon immersion in liquid. Such deformations can affect various properties of the films. In this study, we have analyzed the interaction of glass colloidal particle and the polystyrene (PS) spin-coated surface immersed in deionized (DI) water. It was found that the glass colloidal particle interacts with the surface in dissimilar way at various locations on the surface. A sudden reduction in the forces was also observed at different locations on the same surface. The separation distances at which the sudden change in the force occurred was closer to the height of the spherical domains. Therefore, the change could be attributed to the presence of blisters on the surface formed due to permeation of water into the thin film-substrate interface.

Validity of Adhesion between Films and Substrate with Friction-Detected Scratch Test

1993 ◽  
Vol 308 ◽  
Author(s):  
Ru Wang
Keyword(s):  
Friction Coefficient ◽  
Critical Load ◽  
High Speed ◽  
Sudden Change ◽  
High Speed Steel ◽  
Scratch Test ◽  
Optical Microscope ◽  
Film Substrate ◽  
Film Failure ◽  
Ti Films

ABSTRACTThe validity of Lc of film failure is studied with friction — detected scratch test . The specimens used in the experiment are ion-plated TiN and Ti films,Chemical-Plated NiPCu films on steel of various hardness,ion beam mixed plated TiN films on optical glass,The morphology of failed films was studied under optical microscope and scanning electronmicroscope,The composition of starting failure of films was analyzed with electro — probe. It is found that in the curves of scratch tests of ion-plated TiN and Ti films on high-speed steel,the load corresponding the sudden change of the horizontal force is the same as the critical load of film failure,however,the critical load obtained in the scratch test of the ion-plated TiN and Ti films on soft steel is the some deference compared with optical microscope analyzed, that is principally due to the property of films and substrates (hardness and coefficient).The morphology and mechanism of ion — plated TiN and Ti films on high —speed steel are also studied in the paper.The adhesion between film and substrate is an effective method in evaluating the films property. After apprasing the effectiveness of acoustic emission monitoring scratch test, someone think that no matter coated with hard or soft film it is effective on the brittle hard substrate. However,there exist errors to different extent on other film-substrate system,and the scratch test is inapplicable for soft film-soft substrate system[1]. P. A. Steinmann pointed out while studying the factors influnceing the critical load Lc,that friction coefficient is a key factor on Lc,it provided valuable information in measuring Lc,but it think it is imporsible to measure Lc totally dependent on sudden change friction or friction coefficient, howeveer, for a specific coating substrate system,it is acceptable to say that Lc is dependent on friction coefficient[2]. This paper study experimentally on the friction detected scratch test and found out that effectiveness of Lc varies substantially in different film-substrate system. The author studiied the regularity of various system and discuse the season. The failure morphology and principles of ion-plated TiN and Ti film on highspeed steel are also analyzed in this paper.

scholarly journals The Inhibition of Icing and Frosting on Glass Surfaces by the Coating of Polyethylene Glycol and Polypeptide Mimicking Antifreeze Protein

Biomolecules ◽  
2020 ◽  
Vol 10 (2) ◽  
pp. 259
Author(s):  
Kazuya Kasahara ◽  
Tomonori Waku ◽  
Peter W. Wilson ◽  
Taishi Tonooka ◽  
Yoshimichi Hagiwara
Keyword(s):  
Polyethylene Glycol ◽  
Antifreeze Protein ◽  
Average Weight ◽  
Silane Coupling Agents ◽  
Height Profile ◽  
Ice Nuclei ◽  
Atomic Force ◽  
Coated Surface ◽  
Glass Surfaces ◽  
Supercooling Temperature

The development of anti-icing, anti-frosting transparent plates is important for many reasons, such as poor visibility through the ice-covered windshields of vehicles. We have fabricated new glass surfaces coated with polypeptides which mimic a part of winter flounder antifreeze protein. We adopted glutaraldehyde and polyethylene glycol as linkers between these polypeptides and silane coupling agents applied to the glass surfaces. We have measured the contact angle, the temperature of water droplets on the cooling surfaces, and the frost weight. In addition, we have conducted surface roughness observation and surface elemental analysis. It was found that peaks in the height profile, obtained with the atomic force microscope for the polypeptide-coated surface with polyethylene glycol, were much higher than those for the surface without the polypeptide. This shows the adhesion of many polypeptide aggregates to the polyethylene glycol locally. The average supercooling temperature of the droplet for the polypeptide-coated surface with the polyethylene glycol was lower than for the polypeptide-coated surface with glutaraldehyde and the polyethylene-glycol-coated surface without the polypeptide. In addition, the average weight of frost cover on the specimen was lowest for the polypeptide-coated surface with the polyethylene glycol. These results argue for the effects of combined polyethylene glycol and polypeptide aggregates on the locations of ice nuclei and condensation droplets. Thus, this polypeptide-coating with the polyethylene glycol is a potential contender to improve the anti-icing and anti-frosting of glasses.

scholarly journals Modeling the relative dynamics of DNA-coated colloids

Soft Matter ◽  
2018 ◽  
Vol 14 (40) ◽  
pp. 8147-8159 ◽  
Author(s):  
James P. Lee-Thorp ◽  
Miranda Holmes-Cerfon
Keyword(s):  
Theoretical Model ◽  
Colloidal Particle ◽  
Relative Dynamics ◽  
Coated Surface

We construct a theoretical model for the dynamics of a microscale colloidal particle, modeled as an interval, moving horizontally on a DNA-coated surface, modelled as a line coated with springs that can stick to the interval.

The Wear of Polymers Sliding on Polymeric Films Deposited on Rough Surfaces

1981 ◽  
Vol 103 (2) ◽  
pp. 266-273 ◽  
Author(s):  
N. S. Eiss ◽  
K. A. Smyth
Keyword(s):  
Vapor Deposition ◽  
Surface Coating ◽  
Friction And Wear ◽  
Deposition Process ◽  
Polymeric Films ◽  
Polymeric Coating ◽  
Deformation Characteristics ◽  
Significant Difference ◽  
Uncoated Surface ◽  
Coated Surface

The single-pass, transfer wear of LDPE, PVC, and PCTFE was studied as a function of the roughness of the steel counterface, and the presence or absence of a polymeric coating. A 50 nm thick film of poly(chloro-p-xylylene) was formed on the steel in a pyrolytic-vapor-deposition process. The results showed that LDPE had lower friction and wear on the coated surface than on the uncoated surface. There was no significant difference in wear or friction as a function of surface coating for PVC and PCTFE. The results were explained by considering the deformation characteristics of the polymeric coating and the three polymer sliders and the modification of the topography by the polymeric coating.

Microtomy of spherical Al2O3 powders

1983 ◽  
Vol 41 ◽  
pp. 74-75
Author(s):  
E.J. Jenkins ◽  
D.S. Tucker ◽  
J.J. Hren
Keyword(s):  
Thin Film ◽  
Size Range ◽  
Particle Aggregation ◽  
Ion Milling ◽  
Thin Sections ◽  
Α Phase ◽  
Convenient Means ◽  
Van Der Waals Attraction ◽  
Negative Feature ◽  
Film Substrate

The size range of mineral and ceramic particles of one to a few microns is awkward to prepare for examination by TEM. Electrons can be transmitted through smaller particles directly and larger particles can be thinned by crushing and dispersion onto a substrate or by embedding in a film followed by ion milling. Attempts at dispersion onto a thin film substrate often result in particle aggregation by van der Waals attraction. In the present work we studied 1-10 μm diameter Al2O3 spheres which were transformed from the amprphous state to the stable α phase.After the appropriate heat treatment, the spherical powders were embedded in as high a density as practicable in a hard EPON, and then microtomed into thin sections. There are several advantages to this method. Obviously, this is a rapid and convenient means to study the microstructure of serial slices. EDS, ELS, and diffraction studies are also considerably more informative. Furthermore, confidence in sampling reliability is considerably enhanced. The major negative feature is some distortion of the microstructure inherent to the microtoming operation; however, this appears to have been surprisingly small. The details of the method and some typical results follow.

Structural and electronic properties of defects in semiconductors

1995 ◽  
Vol 53 ◽  
pp. 4-5
Author(s):  
J.L. Batstone
Keyword(s):  
Semiconductor Device ◽  
Chemical Vapor ◽  
Misfit Strain ◽  
Organic Chemical ◽  
Extended Defects ◽  
Transmission Electron ◽  
Semiconductor Thin Films ◽  
Wide Range ◽  
Metal Organic ◽  
Film Substrate

The development of growth techniques such as metal organic chemical vapor deposition (MOCVD) and molecular beam epitaxy during the last fifteen years has resulted in the growth of high quality epitaxial semiconductor thin films for the semiconductor device industry. The III-V and II-VI semiconductors exhibit a wide range of fundamental band gap energies, enabling the fabrication of sophisticated optoelectronic devices such as lasers and electroluminescent displays. However, the radiative efficiency of such devices is strongly affected by the presence of optically and electrically active defects within the epitaxial layer; thus an understanding of factors influencing the defect densities is required.Extended defects such as dislocations, twins, stacking faults and grain boundaries can occur during epitaxial growth to relieve the misfit strain that builds up. Such defects can nucleate either at surfaces or thin film/substrate interfaces and the growth and nucleation events can be determined by in situ transmission electron microscopy (TEM).

Microstructural investigation of surface roughness in MBE-grown AlAs

1995 ◽  
Vol 53 ◽  
pp. 454-455
Author(s):  
R. Rajesh ◽  
R. Droopad ◽  
C. H. Kuo ◽  
R. W. Carpenter ◽  
G. N. Maracas
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Growth Control ◽  
Native Oxide ◽  
Effusion Cell ◽  
Surface Oxide Layer ◽  
Microstructural Investigation ◽  
Mbe Growth ◽  
Film Substrate ◽  
And Control

Knowledge of material pseudodielectric functions at MBE growth temperatures is essential for achieving in-situ, real time growth control. This allows us to accurately monitor and control thicknesses of the layers during growth. Undesired effusion cell temperature fluctuations during growth can thus be compensated for in real-time by spectroscopic ellipsometry. The accuracy in determining pseudodielectric functions is increased if one does not require applying a structure model to correct for the presence of an unknown surface layer such as a native oxide. Performing these measurements in an MBE reactor on as-grown material gives us this advantage. Thus, a simple three phase model (vacuum/thin film/substrate) can be used to obtain thin film data without uncertainties arising from a surface oxide layer of unknown composition and temperature dependence.In this study, we obtain the pseudodielectric functions of MBE-grown AlAs from growth temperature (650°C) to room temperature (30°C). The profile of the wavelength-dependent function from the ellipsometry data indicated a rough surface after growth of 0.5 μm of AlAs at a substrate temperature of 600°C, which is typical for MBE-growth of GaAs.

The value of Electron Microscope studies of imperfect natural diamonds

1990 ◽  
Vol 48 (4) ◽  
pp. 194-195
Author(s):  
J C Walmsley ◽  
A R Lang
Keyword(s):  
Electron Microscope ◽  
Classification Scheme ◽  
Natural Diamond ◽  
Sudden Change ◽  
Growth Conditions ◽  
Diamond Growth ◽  
Major Constituent ◽  
Natural Diamonds ◽  
Type Ia ◽  
Platelet Defects

Interest in the defects and impurities in natural diamond, which are found in even the most perfect stone, is driven by the fact that diamond growth occurs at a depth of over 120Km. They display characteristics associated with their origin and their journey through the mantle to the surface of the Earth. An optical classification scheme for diamond exists based largely on the presence and segregation of nitrogen. For example type Ia, which includes 98% of all natural diamonds, contain nitrogen aggregated into small non-paramagnetic clusters and usually contain sub-micrometre platelet defects on {100} planes. Numerous transmission electron microscope (TEM) studies of these platelets and associated features have been made e.g. . Some diamonds, however, contain imperfections and impurities that place them outside this main classification scheme. Two such types are described.First, coated-diamonds which possess gem quality cores enclosed by a rind that is rich in submicrometre sized mineral inclusions. The transition from core to coat is quite sharp indicating a sudden change in growth conditions, Figure 1. As part of a TEM study of the inclusions apatite has been identified as a major constituent of the impurity present in many inclusion cavities, Figure 2.

Microstructure of YBa2Cu3O7-x thin films deposited by dc sputtering

1989 ◽  
Vol 47 ◽  
pp. 172-173
Author(s):  
O. Eibl ◽  
G. Gieres ◽  
H. Behner
Keyword(s):  
Thin Films ◽  
Cross Sections ◽  
Intermediate Layer ◽  
Amorphous State ◽  
Critical Currents ◽  
Dc Sputtering ◽  
State Process ◽  
Diffraction Patterns ◽  
Film Substrate ◽  
Substrate Temperatures

The microstructure of high-Tc YBa2Cu3O7-X thin films deposited by DC-sputtering on SrTiO3 substrates was analysed by TEM. Films were either (i) deposited in the amorphous state at substrate temperatures < 450°C and crystallised by a heat treatment at 900°C (process 1) or (ii) deposited at around 740°C in the crystalline state (process 2). Cross sections were prepared for TEM analyses and are especially useful for studying film substrate interdiffusion (fig.1). Films deposited in process 1 were polycristalline and the grain size was approximately 200 nm. Films were porous and the size of voids was approximately 100 nm. Between the SrTiO3 substrate and the YBa2Cu3Ox film a densly grown crystalline intermediate layer approximately 150 nm thick covered the SrTiO3 substrate. EDX microanalyses showed that the layer consisted of Sr, Ba and Ti, however, did not contain Y and Cu. Crystallites of the layer were carefully tilted in the microscope and diffraction patterns were obtained in five different poles for every crystallite. These patterns were consistent with the phase (Ba1-XSrx)2TiO4. The intermediate layer was most likely formed during the annealing at 900°C. Its formation can be understood as a diffusion of Ba from the amorphously deposited film into the substrate and diffusion of Sr from the substrate into the film. Between the intermediate layer and the surface of the film the film consisted of YBa2Cu3O7-x grains. Films prepared in process 1 had Tc(R=0) close to 90 K, however, critical currents were as low as jc = 104A/cm2 at 77 K.

Advances in Stem Instrumentation for Biology

1990 ◽  
Vol 48 (1) ◽  
pp. 362-363
Author(s):  
J. S. Wall
Keyword(s):  
Scanning Transmission Electron Microscope ◽  
Carbon Films ◽  
Specimen Preparation ◽  
Material Deposition ◽  
Active User ◽  
Percent Improvement ◽  
Scanning Transmission ◽  
The Moment ◽  
Film Substrate ◽  
High Level

The forte of the Scanning transmission Electron Microscope (STEM) is high resolution imaging with high contrast on thin specimens, as demonstrated by visualization of single heavy atoms. of equal importance for biology is the efficient utilization of all available signals, permitting low dose imaging of unstained single molecules such as DNA.Our work at Brookhaven has concentrated on: 1) design and construction of instruments optimized for a narrow range of biological applications and 2) use of such instruments in a very active user/collaborator program. Therefore our program is highly interactive with a strong emphasis on producing results which are interpretable with a high level of confidence.The major challenge we face at the moment is specimen preparation. The resolution of the STEM is better than 2.5 A, but measurements of resolution vs. dose level off at a resolution of 20 A at a dose of 10 el/A2 on a well-behaved biological specimen such as TMV (tobacco mosaic virus). To track down this problem we are examining all aspects of specimen preparation: purification of biological material, deposition on the thin film substrate, washing, fast freezing and freeze drying. As we attempt to improve our equipment/technique, we use image analysis of TMV internal controls included in all STEM samples as a monitor sensitive enough to detect even a few percent improvement. For delicate specimens, carbon films can be very harsh-leading to disruption of the sample. Therefore we are developing conducting polymer films as alternative substrates, as described elsewhere in these Proceedings. For specimen preparation studies, we have identified (from our user/collaborator program ) a variety of “canary” specimens, each uniquely sensitive to one particular aspect of sample preparation, so we can attempt to separate the variables involved.

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