Comparative Study of Sheet Resistance Stability of Electro-Deposited Ni/Co - Alloy Thin Films

2021 ◽  
Vol MA2021-01 (24) ◽  
pp. 931-931
Author(s):  
Masashi Rindo ◽  
Naoki Okamoto ◽  
Takeyasu Saito ◽  
Akira Kitajima
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Sheet Resistance ◽  
Resistance Stability

CONDUCTIVE COPPER SULFIDE THIN FILMS ON POLYIMIDE FOILS FOR OPTICAL AND OPTOELECTRONIC APPLICATIONS

2001 ◽  
Vol 15 (17n19) ◽  
pp. 774-777 ◽  
Author(s):  
J. CARDOSO ◽  
O. GOMEZ-DAZA ◽  
L. IXTLILCO ◽  
M. T. S. NAIR ◽  
P. K. NAIR
Keyword(s):  
Thin Films ◽  
Sheet Resistance ◽  
Copper Sulfide ◽  
Optoelectronic Device ◽  
Infrared Reflectance ◽  
Thermally Stable ◽  
Conductive Coatings ◽  
Device Structures ◽  
Conductive Substrates ◽  
Optoelectronic Applications

Copper sulfide thin films of 75 nm and 100 nm thickness were coated on Kapton foils (PI) of 25 nm thickness by floating them on a chemical bath. The foils were annealed at 150°C-400°C in N 2 converting the coating from CuS to Cu 1.8 S . The sheet resistance of the annealed coatings (100 nm) is 10-50 ohms/square which is almost unaltered after immersion in dilute HCl for 30-120 min. The infrared reflectance predicted for the coatings is 67%-77% at a wavelength 2.5 μm, which is nearly what is experimentally observed. The coated PI has a transmittance (25-35%) peak located around 550-600 nm. These thermally stable conductive coatings on PI foils might be used as conductive substrates for optoelectronic device structures.

A comparative study on the NO2 gas sensing properties of ZnO thin films, nanowires and nanorods

2011 ◽  
Vol 520 (3) ◽  
pp. 932-938 ◽  
Author(s):  
S. Öztürk ◽  
N. Kılınç ◽  
N. Taşaltin ◽  
Z.Z. Öztürk
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Gas Sensing ◽  
Zno Thin Films ◽  
Sensing Properties ◽  
Gas Sensing Properties

A comparative study of thin films of hole-doped Pr0.6Ca0.4MnO3 and electron-doped Pr0.4Ca0.6MnO3

2001 ◽  
Vol 62 (8) ◽  
pp. 1387-1391 ◽  
Author(s):  
Sachin Parashar ◽  
K.Vijaya Sarathy ◽  
P.V. Vanitha ◽  
A.R. Raju ◽  
C.N.R. Rao
Keyword(s):  
Thin Films ◽  
Comparative Study

Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films

2008 ◽  
Vol 516 (21) ◽  
pp. 7511-7518 ◽  
Author(s):  
A. Kovalskiy ◽  
J.R. Neilson ◽  
A.C. Miller ◽  
F.C. Miller ◽  
M. Vlcek ◽  
...  
Keyword(s):  
Thin Films ◽  
Comparative Study ◽  
Structural Transformations ◽  
Amorphous Thin Films

scholarly journals Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques

Electronics ◽  
2021 ◽  
Vol 10 (8) ◽  
pp. 960
Author(s):  
Mira Naftaly ◽  
Satyajit Das ◽  
John Gallop ◽  
Kewen Pan ◽  
Feras Alkhalil ◽  
...  
Keyword(s):  
Thin Films ◽  
Sheet Resistance ◽  
Flexible Electronics ◽  
Electronic Devices ◽  
Conductivity Measurements ◽  
Terahertz Time Domain Spectroscopy ◽  
Comparison Of Techniques ◽  
Terahertz Frequencies ◽  
Conductive Thin Films ◽  
Multiple Samples

Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, microwave resonator and terahertz time-domain spectroscopy. Multiple samples were examined, facilitating the comparison of the three techniques. Sheet resistance values at DC, microwave and terahertz frequencies were obtained and were found to be in close agreement.

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