Electrosynthesis and Studies on CdZnSe Thin Films

2011 ◽  
Vol 15 (1) ◽  
pp. 37-42
Author(s):  
T. Mahalingam ◽  
V. Dhanasekaran ◽  
S. Rajendran ◽  
R. Chandramohan ◽  
Luis Ixtlilco ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Band Gap ◽  
Ph Value ◽  
Bath Temperature ◽  
X Ray Diffraction ◽  
Optical Studies ◽  
Sem Images ◽  
X Ray ◽  
Predominant Orientation ◽  
Diffraction Patterns

Electrodeposited CdZnSe thin films have been prepared at various bath temperatures. The thickness of the films was estimated between 850 nm and 1500 nm by stylus method. The X-ray diffraction patterns revealed that the polycrystalline nature with cubic structure of CdZnSe alloy thin films. Microstructural properties such as, crystallite size, dislocation density, microstrain and number of crystallites per unit area were calculated using predominant orientation of the films. SEM images revealed that the surface morphology could be tailored suitably by adjusting the pH value during deposition. The surface roughness of the film was estimated using topographical studies. Optical properties of the film were analyzed from absorption and transmittance studies. Optical band gap of the films increased from 1.67 to 1.72 eV with the increase of bath temperature from 30 to 90℃. The optical constants (refractive index (n) and extinction coefficient (k)) of CdZnSe thin films were evaluated using optical studies.

Deposition of Nano Fiber ZnO and Zn1-xCdxO Thin Films by a Simple Spray Pyrolysis and Characterizations for Optoelectronic Applications

2012 ◽  
Vol 545 ◽  
pp. 100-104 ◽  
Author(s):  
J. Podder ◽  
M.R Islam
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Optical Band Gap ◽  
Zinc Alloy ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Vis Spectroscopy ◽  
Nano Fiber ◽  
Cadmium Zinc

ZnO and Zn1-xCdxO thin films have been deposited onto glass substrate using spray pyrolysis at 200°C. Cadmium-zinc alloy thin films have been prepared by taking different concentrations of cadmium (Cd). The elemental analysis and the surface morphology of the films were carried by the energy dispersive X-ray (EDX) and scanning electron microscopy (SEM). The EDX data show that the films are highly stoichiometric. The SEM images show that the film changes from nano fiber to grain with the increase of Cd concentrations. The X-ray diffraction pattern shows that the films are polycrystalline in nature. The crystal structure of the films changes from hexagonal-ZnO to cubic-CdO depending on the concentration of Zn and Cd in the Zn1-xCdxO films. The optical properties of these films were studied by UV-VIS spectroscopy. The optical band gap of the films was changed from 3.2 to 2.4 with the variation of cadmium.

scholarly journals The Influence of Bath Temperature on the Properties of SILAR Deposited Cobalt Selenide Thin Films

2021 ◽  
Vol 11 (4) ◽  
pp. 7393-7398
Author(s):  
S. M. Ho ◽  
T. J. S. Anand
Keyword(s):  
Thin Films ◽  
Bath Temperature ◽  
X Ray Diffraction ◽  
Silar Method ◽  
X Ray ◽  
Glass Slides ◽  
Average Grain Size ◽  
Diffraction Patterns ◽  
C 50 ◽  
Cobalt Selenide

In this paper, cobalt selenide thin films have been deposited onto glass slides with the SILAR method under various bath temperatures. The structure, optical properties, and morphology of thin films were investigated. The X-ray diffraction patterns confirmed that the number of peak intensities increased with increasing bath temperature. From the AFM images, bigger sizes and thicker films were observed for the films prepared at 80°C. The average grain size was estimated to be 0.2µm, 0.15µm, and 0.25µm when the bath temperature was 40°C, 50°C, and 80°C respectively. The highest absorbance value was observed for films prepared at 80°C. The band gap values range from 2eV to 2.4eV.

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

2011 ◽  
Vol 44 (5) ◽  
pp. 983-990 ◽  
Author(s):  
Chris Elschner ◽  
Alexandr A. Levin ◽  
Lutz Wilde ◽  
Jörg Grenzer ◽  
Christian Schroer ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Information ◽  
Grazing Incidence ◽  
Test Material ◽  
C60 Fullerene ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Arrangement ◽  
Diffraction Patterns

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a Bragg–Brentano X-ray diffraction measurement of the corresponding C60 powder. The diffraction patterns of both powder and film were used to calculate the pair distribution function (PDF), which allowed an investigation of the short-range order of the structures. With the help of the PDF, a structure model for the C60 molecular arrangement was determined for both C60 powder and thin film. The results agree very well with a classical whole-pattern fitting approach for the C60 diffraction patterns.

Transparent Conductive Cu-In-O Thin Films Deposited by Reactive DC Magnetron Sputtering with Different Targets

2011 ◽  
Vol 239-242 ◽  
pp. 2752-2755
Author(s):  
Fan Ye ◽  
Xing Min Cai ◽  
Fu Ping Dai ◽  
Dong Ping Zhang ◽  
Ping Fan ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Optical Band Gap ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Flow Rates ◽  
X Ray ◽  
Equal Distance ◽  
Transmittance Curve

Transparent conductive Cu-In-O thin films were deposited by reactive DC magnetron sputtering. Two types of targets were used. The first was In target covered with a fan-shaped Cu plate of the same radius and the second was Cu target on which six In grains of 1.5mm was placed with equal distance between each other. The samples were characterized with scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), UV/VIS spectrophotometer, four-probe measurement etc. SEM shows that the surfaces of all the samples are very smooth. EDX shows that the samples contain Cu, In as well as O, and different targets result in different atomic ratios of Cu to In. A diffraction peak related to rhombohedra-centered In2O3(012) is observed in the XRD spectra of all the samples. For both the two targets, the transmittance decreases with the increase of O2flow rates. The direct optical band gap of all the samples is also estimated according to the transmittance curve. For both the two targets, different O2flow rates result in different sheet resistances and conductivities. The target of Cu on In shows more controllability in the composition and properties of Cu-In-O films.

scholarly journals Effect of indium content on X- ray diffraction and optical constants of InxSe1-x thin films

2019 ◽  
Vol 14 (29) ◽  
pp. 55-72
Author(s):  
Bushra A. Hasan
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Indium Content ◽  
Degree Of Crystallinity ◽  
X Ray Diffraction ◽  
Dispersion Energy ◽  
X Ray ◽  
Evaporation Technique ◽  
High Indium Content ◽  
Diffraction Patterns

Alloys of InxSe1-x were prepared by quenching technique withdifferent In content (x=10, 20, 30, and 40). Thin films of these alloyswere prepared using thermal evaporation technique under vacuum of10-5 mbar on glass, at room temperature R.T with differentthicknesses (t=300, 500 and 700 nm). The X–ray diffractionmeasurement for bulk InxSe1-x showed that all alloys havepolycrystalline structures and the peaks for x=10 identical with Se,while for x=20, 30 and 40 were identical with the Se and InSestandard peaks. The diffraction patterns of InxSe1-x thin film showthat with low In content (x=10, and 20) samples have semicrystalline structure, The increase of indium content to x=30decreases degree of crystallinity and further increase of indiumcontent to x=40 leads to convert structure to amorphous. Increase ofthickness from 300 to 700nm increases degree of crystallinity for allindium content. Transmittance measurements were used to calculaterefractive index n and the extinction coefficient k using Swanepole’smethod. The optical constants such as refractive index (n), extinctioncoefficient (k) and dielectric constant (εr, εi) increases for low indiumcontent samples and decreases for high indium content samples,while increase of thickness increases optical constants for all xvalues. The oscillator energy E0, dispersion energy Ed, and otherparameters have been determined by Wemple - DiDomenico singleoscillator approach.

Structural, Optical, Photocatalytic and Electrochemical Studies of PbS Nanoparticles

2020 ◽  
Vol 61 ◽  
pp. 18-31 ◽  
Author(s):  
Peter A. Ajibade ◽  
Abimbola E. Oluwalana
Keyword(s):  
Particle Sizes ◽  
X Ray Diffraction ◽  
Lead Sulphide ◽  
Electron Transfer Process ◽  
Sem Images ◽  
Pbs Nanoparticles ◽  
X Ray ◽  
Diffusion Controlled ◽  
Reversible Redox ◽  
Diffraction Patterns

Oleic acid (OA) and octadecylamine (ODA) capped lead sulphide (PbS) nanoparticles were prepared at 150, 190 and 230 °C. X-ray diffraction patterns indicates that the synthesized PbS nanoparticles were in the rock cubic salt crystalline phase. The particle sizes of the as-prepared PbS nanoparticles are in the range 2.91–10.05 nm for OA-PbS(150), 24.92–39.98 nm for ODA-PbS(150), 9.26 – 29.08 nm for OA-PbS(190), 34.54 – 48.04 nm for ODA-PbS(190), 17.96–88.07 nm for OA-PbS(230) and 53.60 – 94.42 nm for ODA-PbS(230). SEM images revealed flaky and agglomerated spherical like morphology for the nanoparticles. The energy bandgap of the PbS nanoparticles are in the range 4.14 – 4.25 eV, OA-PbS(230) have the lowest bandgap of 4.14 eV while ODA-PbS(150) have the highest bandgap of 4.25 eV. The PbS nanoparticles were used as photocatalyst for the degradation of Rhodamine B and OA-PbS(150) showed efficiency of 44.11% after 360 mins. Cyclic voltammetry of the PbS nanoparticles showed a reversible redox reaction and linear Randles-Sevcik plots indicates electron transfer process is diffusion controlled.

Preparation of Ni-Coated SiC Ceramic Composite Powder by Electroless Plating

2011 ◽  
Vol 117-119 ◽  
pp. 77-80
Author(s):  
Huai Yao ◽  
Guang Lin Zhu ◽  
Yong Zhi Wang
Keyword(s):  
Electroless Plating ◽  
Ph Value ◽  
Nickel Chloride ◽  
Gas Production ◽  
Basic Solution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Deep Blue ◽  
Reaction Theory ◽  
Diffraction Patterns

As a surface technology, electroless plating is applied to almost every industry branch. To improve the wettability of SiC powder and metal, the surface of SiC powders was plated with a Ni plating in the basic solution according to the reaction theory of electroless plating. The main salting was nickel chloride, and the reducing agent was hydrazine hydrate. The plating velocity, phase transformation and microstructurewere investigated using XRD and SEM. The results show that the SiC powders had no increasing weight and no reaction can occur when the pH below 8.5. when the pH value was between 10 and 11, the weight gain of powders closed to the theoretical value, the Ni peaks in X-ray diffraction patterns of powders was relatively strong, the SiC coating surface was composed of granular, cellular and globe-like Ni, the substrate was covered of Ni plating completely. When the pH value was above 11, the gas production was becoming more pronounced and the reaction speed increasing with the increased of the pH value, the time from deep blue to colorless of solution started to drop off, the Ni(OH)2peaks in X-ray diffraction patterns of powders have already begun to emerged and a small amount of nickel films was generated.

Electrochemical Deposition and Characterization of Cd-Fe-Se Thin Films

2009 ◽  
Vol 68 ◽  
pp. 69-76 ◽  
Author(s):  
S. Thanikaikarasan ◽  
T. Mahalingam ◽  
K. Sundaram ◽  
Tae Kyu Kim ◽  
Yong Deak Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Hexagonal Structure ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Iron Selenide ◽  
Glass Substrates ◽  
Diffraction Patterns ◽  
Cadmium Iron Selenide ◽  
Deposited Films

Cadmium iron selenide (Cd-Fe-Se) thin films were deposited onto tin oxide (SnO2) coated conducting glass substrates from an aqueous electrolytic bath containing CdSO4, FeSO4 and SeO2 by potentiostatic electrodeposition. The deposition potentials of Cadmium (Cd), Iron (Fe), Selenium (Se) and Cadmium-Iron-Selenide (Cd-Fe-Se) were determined from linear cathodic polarization curves. The deposited films were characterized by x-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive analysis by x-rays (EDX) and optical absorption techniques, respectively. X-ray diffraction patterns shows that the deposited films are found to be hexagonal structure with preferential orientation along (100) plane. The effect of FeSO4 concentration on structural, morphological, compositional and optical properties of the films are studied and discussed in detail.

Structural and electrical properties of Cu-doped Ni–Zn nanocrystalline ferrites for MLCI applications

2017 ◽  
Vol 31 (33) ◽  
pp. 1750318 ◽  
Author(s):  
D. Venkatesh ◽  
K. V. Ramesh
Keyword(s):  
Electrical Properties ◽  
Cation Distribution ◽  
Tetrahedral Site ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Structural And Electrical Properties ◽  
Phase Spinel ◽  
Diffraction Patterns

Polycrystalline Cu substituted Ni–Zn ferrites with chemical composition Ni[Formula: see text]Zn[Formula: see text]-Cu[Formula: see text]Fe2O4 (x = 0.00 to 0.25 in steps of 0.05) have been prepared by citrate gel autocombustion method. The samples for electrical properties have been sintered at 900[Formula: see text]C for 4 h. The X-ray diffraction patterns of all samples indicate the formation of single phase spinel cubic structure. The value of lattice parameter is decreases with increasing Cu concentration. The estimated cation distribution can be derived from X-ray diffraction intensity calculations and IR spectra. The tetrahedral and octahedral bond lengths, bond angles, cation–cation and cation–anion distances were calculated by using experimental lattice parameter and oxygen positional parameters. It is observed that Cu ions are distributed in octahedral site and subsequently Ni and Fe ions in tetrahedral site. The grain size of all samples has been calculated by Scanning Electron Microscopy (SEM) images. The variations in DC electrical resistivity and dielectric constant have been explained on the basis of proposed cation distribution.

Characterization of Nano-Biphasic Calcium Phosphates Synthesized under Microwave Curing

2008 ◽  
Vol 3 ◽  
pp. 67-87 ◽  
Author(s):  
Wafa I. Abdel-Fattah ◽  
Fikry M. Reicha ◽  
Tarek A. Elkhooly
Keyword(s):  
Ph Value ◽  
Calcium Phosphates ◽  
Chemical Precipitation ◽  
Calcium Deficiency ◽  
Molar Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Microwave Curing ◽  
Tcp Phase ◽  
Diffraction Patterns

Two biphasic BCP ceramic samples were synthesized by chemical precipitation and microwave curing of calcium deficient hydroxyapatite CDHA under the same pH value and temperature but varied in their initial Ca/P molar ratio. Precipitates were characterization after thermogravimetric analysis, fourier transform infrared spectroscopy, X-ray diffraction, atomic absorption spectroscopy and TEM. Hydroxyapatite (HA) contents were measured for the two biphasic calcium phosphate (BCP) ceramics by sintering the calcium-deficient apatites (CDHA). The results reveal two condensation mechanisms of HPO42- affecting the Ca/P molar ratio after calcination. The X-ray diffraction patterns of BCP powders show the in situ formation of -TCP in the BCP powder. The amount of -TCP phase increases as the initial Ca/P molar ratio decreases due to more calcium deficiency in CDHA structure. The influence of HPO42- incorporation on increasing -TCP phase content after calcination is evaluated. TEM micrographs proved the effect of microwave curing during the preparation process on reducing of particle size to nanoscale range and the destruction of CDHA to finer HA and -TCP particles upon calcination.

Sign in / Sign up

Export Citation Format

Share Document