Properties Of SiC Film As X-Ray Mask Membrane

1993 ◽  
Vol 306 ◽  
Author(s):  
Yoh-Ichi Yamaguchi ◽  
Norimichi Annaka ◽  
Tsutomu Shoki ◽  
Isao Amemiya ◽  
Hiroyuki Nagasawa ◽  
...  
Keyword(s):  
Optical Spectrum ◽  
Atomic Ratio ◽  
X Rays ◽  
Interference Peak ◽  
X Ray ◽  
Local Stresses ◽  
Stress Uniformity ◽  
Sic Film ◽  
Transmittance Peak ◽  
Ar Coating

AbstractMany properties of LPCVD SiC film as X-ray mask membrane have been investigated in detail. The film has an atomic ratio of 1.0 and negligible impurities, and was found to be damage-free to SR X-rays up to 500 KJ/cm2. An integrated transparency of 1.05 μm thick SiC membrane for SR X-rays was measured to be 76%. The interference peak at 633 nm of optical spectrum has given the membrane of around 1.0 μm in thickness the transmittance peak of 70% and increased to more than 80% after an AR coating or planarizations by polishing and etching-back. The attainable transmittance was found to be limited to about 84%, theoretically and experimentally, due to the absorption of the membrane. The peak transmittance of 87% is obtainable by the AR coating on the polished SiC membrane. The internal stress was found to be independent of thicknesses above 0.6 μm and the measured Young's modulus is 4.5×1011 Pa irrespective of the thickness and stress. Some extremely polished (0.1 nm Ra) and all the etched-back membranes studied withstood breakage at the pressure as high as the as-deposited ones. The stress uniformity in 30 mm square of the membrane was found to be ± 10 % by measuring five local stresses with a bulge method.

scholarly journals PSR B0656+14: the unified outlook from the infrared to X-rays

2021 ◽  
Vol 502 (2) ◽  
pp. 2005-2022
Author(s):  
S Zharikov ◽  
D Zyuzin ◽  
Yu Shibanov ◽  
A Kirichenko ◽  
R E Mennickent ◽  
...  
Keyword(s):  
Neutron Star ◽  
Absorption Line ◽  
Optical Spectrum ◽  
Near Infrared ◽  
Thermal Emission ◽  
Model Parameters ◽  
X Rays ◽  
Polar Cap ◽  
X Ray ◽  
Star Surface

ABSTRACT We report detection of PSR B0656+14 with the Gran Telescopio Canarias in narrow optical F657, F754, F802, and F902 and near-infrared JHKs bands. The pulsar detection in the Ks band extends its spectrum to 2.2 $\mu$m and confirms its flux increase towards the infrared. We also present a thorough analysis of the optical spectrum obtained by us with the VLT. For a consistency check, we revised the pulsar near-infrared and narrow-band photometry obtained with the HST. We find no narrow spectral lines in the optical spectrum. We compile available near-infrared-optical-UV and archival 0.3–20 keV X-ray data and perform a self-consistent analysis of the rotation phase-integrated spectrum of the pulsar using unified spectral models. The spectrum is best fitted by the four-component model including two blackbodies, describing the thermal emission from the neutron star surface and its hot polar cap, the broken power law, originating from the pulsar magnetosphere, and an absorption line near ∼0.5 keV detected previously. The fit provides better constraints on the model parameters than using only a single spectral domain. The derived surface temperature is $T_{NS}^{\infty } = 7.9(3)\times 10^5$ K. The intrinsic radius (7.8–9.9 km) of the emitting region is smaller than a typical neutron star radius (13 km) and suggests a non-uniform temperature distribution over the star surface. In contrast, the derived radius of the hot polar cap is about twice as large as the ‘canonical’ one. The spectrum of the non-thermal emission steepens from the optical to X-rays and has a break near 0.1 keV. The X-ray data suggest the presence of another absorption line near 0.3 keV.

scholarly journals Rapid X-Ray Variability and The FE II Problem in I Zw 1 Objects

1994 ◽  
Vol 161 ◽  
pp. 660-661
Author(s):  
Th. Boller ◽  
J. Trümper ◽  
S. Molendi ◽  
S. Schaeidt ◽  
H. Fink
Keyword(s):  
Spectral Analysis ◽  
Accretion Disk ◽  
Energy Band ◽  
Optical Spectrum ◽  
Seyfert Galaxies ◽  
X Rays ◽  
Narrow Line ◽  
X Ray ◽  
Compact Region ◽  
First Time

X-ray variability in the 0.1–2.4 keV ROSAT energy band with a doubling timescale of 800 s and a factor of 4 within a few hours has been detected in a 20 ksec pointing on the IRAS AGN 13224-3809. The optical spectrum indicates that IRAS 13224-3809 is a narrow-line Seyfert 1 galaxy with strong permitted Fe II emission, a member of the unusual I Zw 1 class objects. IRAS 13224-3809 appears to be one of the most rapidly variable AGN known so far. This is the first time that variability on a timescale smaller than 1000 s is reported at such high L (0.1–2.4 keV) = 3·1044 erg · s−1 X-ray luminosity in Seyfert galaxies. It is also the first reported X-ray variability in I Zw 1 class objects. The δt = 800 s variation indicates that the X-rays come from a compact region of about 17 light minutes in size. Our results from the X-ray spectral analysis favour a scenario in which a hard X-ray source irradiates the accretion disk which reemits at soft X-ray energies. The absence of broad H I wings can be explained if only a part of the BLR, far from the centre, is observed and the bulk of the region, which emits the wings, is hidden. We want to draw attention to the fact that rapid X-ray variability could also be connected with the absence of broad H I lines in IRAS 13224-3809.

scholarly journals X-Ray Observations of NP 0532

1971 ◽  
Vol 46 ◽  
pp. 84-86
Author(s):  
Saul Rappaport
Keyword(s):  
Optical Spectrum ◽  
Crab Nebula ◽  
Sounding Rocket ◽  
X Rays ◽  
X Ray ◽  
The Crab Nebula

The Crab Nebula pulsar, NP 0532, is the only one of the 56 known pulsars which has been observed to pulse in the optical spectrum. Even more spectacular are the vast quantities of pulsed X-rays which it has been found to emit. Soft X-rays in the 1–10 keV region have been observed during four sounding rocket flights (Fritz et al., 1969; Bradt et al., 1969; Boldt et al., 1969; Ducros et al. 1970) and harder X-rays, 25–200 keV, have been detected during two balloon flights (Fishman et al., 1969a, b; Floyd et al., 1969). From the results of these six experiments we summarize the properties of the X-ray pulsations from NP 0532.

White-Light Coronal Structures: Streamers and CMEs

1994 ◽  
Vol 144 ◽  
pp. 82
Author(s):  
E. Hildner
Keyword(s):  
Emission Line ◽  
Electron Density ◽  
White Light ◽  
Coronal Mass Ejections ◽  
X Rays ◽  
Solar Cycles ◽  
Temperature Function ◽  
X Ray ◽  
Eclipse Observations ◽  
Coronal Structures

AbstractOver the last twenty years, orbiting coronagraphs have vastly increased the amount of observational material for the whitelight corona. Spanning almost two solar cycles, and augmented by ground-based K-coronameter, emission-line, and eclipse observations, these data allow us to assess,inter alia: the typical and atypical behavior of the corona; how the corona evolves on time scales from minutes to a decade; and (in some respects) the relation between photospheric, coronal, and interplanetary features. This talk will review recent results on these three topics. A remark or two will attempt to relate the whitelight corona between 1.5 and 6 R⊙to the corona seen at lower altitudes in soft X-rays (e.g., with Yohkoh). The whitelight emission depends only on integrated electron density independent of temperature, whereas the soft X-ray emission depends upon the integral of electron density squared times a temperature function. The properties of coronal mass ejections (CMEs) will be reviewed briefly and their relationships to other solar and interplanetary phenomena will be noted.

Chemical Species Identification in an SEM by Changes in Emitted X-Ray Energies

1974 ◽  
Vol 32 ◽  
pp. 570-571
Author(s):  
R. H. Duff
Keyword(s):  
Species Identification ◽  
Valence Electron ◽  
Chemical Species ◽  
X Rays ◽  
Chemical Bonds ◽  
Small Shift ◽  
X Ray ◽  
Electron Transitions ◽  
Peak Energy ◽  
Chemical Combination

A material irradiated with electrons emits x-rays having energies characteristic of the elements present. Chemical combination between elements results in a small shift of the peak energies of these characteristic x-rays because chemical bonds between different elements have different energies. The energy differences of the characteristic x-rays resulting from valence electron transitions can be used to identify the chemical species present and to obtain information about the chemical bond itself. Although these peak-energy shifts have been well known for a number of years, their use for chemical-species identification in small volumes of material was not realized until the development of the electron microprobe.

Influence of X-Ray Induced Fluorescence on Energy Dispersive X-Ray Analysis of Thin Foils

1977 ◽  
Vol 35 ◽  
pp. 328-329
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Thin Foil ◽  
Electron Excitation ◽  
Simple Approach ◽  
Foil Thickness ◽  
X Rays ◽  
X Ray ◽  
Hole Spectrum ◽  
Illumination System ◽  
Thin Foils ◽  
Intensity Ratios

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.

X-ray micro tomography in the scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 106-107 ◽  
Author(s):  
W. Brünger
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Target Surface ◽  
The Body ◽  
X Rays ◽  
Cross Sectional ◽  
X Ray ◽  
Micro Tomography ◽  
Scanning Electron

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

X-ray diffraction properties of curved crystal diffractors

1992 ◽  
Vol 50 (2) ◽  
pp. 1734-1735
Author(s):  
W. Z. Chang ◽  
D. B. Wittry
Keyword(s):  
Diffraction Theory ◽  
X Rays ◽  
Diffraction Image ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Bent Crystal ◽  
Diffraction Geometry ◽  
Crystal Parameter ◽  
Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

Studies of metaphase chromosomes in the scanning transmission x-ray microscope: Image fidelity, radiation damage and specimen preparation

1992 ◽  
Vol 50 (2) ◽  
pp. 1038-1039
Author(s):  
Shawn Williams ◽  
Xiaodong Zhang ◽  
Susan Lamm ◽  
Jack Van’t Hof
Keyword(s):  
Visible Light ◽  
Radiation Damage ◽  
Cross Section ◽  
Imaging Techniques ◽  
Dose Range ◽  
Specimen Preparation ◽  
X Rays ◽  
Metaphase Chromosomes ◽  
X Ray ◽  
Scanning Transmission

The Scanning Transmission X-ray Microscope (STXM) is well suited for investigating metaphase chromosome structure. The absorption cross-section of soft x-rays having energies between the carbon and oxygen K edges (284 - 531 eV) is 6 - 9.5 times greater for organic specimens than for water, which permits one to examine unstained, wet biological specimens with resolution superior to that attainable using visible light. The attenuation length of the x-rays is suitable for imaging micron thick specimens without sectioning. This large difference in cross-section yields good specimen contrast, so that fewer soft x-rays than electrons are required to image wet biological specimens at a given resolution. But most imaging techniques delivering better resolution than visible light produce radiation damage. Soft x-rays are known to be very effective in damaging biological specimens. The STXM is constructed to minimize specimen dose, but it is important to measure the actual damage induced as a function of dose in order to determine the dose range within which radiation damage does not compromise image quality.

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