Evaluation of an alternative technique for the fabrication of direct detector X-ray imagers: spray pyrolysis of lead iodide and mercury iodide

2004 ◽  
Vol 808 ◽  
Author(s):  
J. F. Condeles ◽  
J. C. Ugucioni ◽  
M. Mulato
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Deposition Process ◽  
Radiation Detectors ◽  
Deposition Technique ◽  
X Ray Diffraction ◽  
Large Area ◽  
Lead Iodide ◽  
X Ray ◽  
Mercury Iodide

ABSTRACTThis work discusses the new use of an old deposition technique: spray pyrolysis. The objective is the deposition of thin films of lead iodide and mercury iodide and their future use as photoconductors in medical X-ray digital imagers. We discuss the main advantages and limitations of the deposition process comparing both materials. The final thin films are structurally investigated using X-ray diffraction and microscopy. The deposition technique seems to be very promising for the future development of large area radiation detectors.

Lead Iodide Thin Films Grown Using N.N-Dimethylformamide as Solvent

2007 ◽  
Vol 994 ◽  
Author(s):  
Jose Fernando Condeles ◽  
Ademar Marques Caldeira-Filho ◽  
Marcelo Mulato
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Dark Conductivity ◽  
Medical Systems ◽  
X Ray Diffraction ◽  
Lead Iodide ◽  
Final Thickness ◽  
X Ray ◽  
Deposition Parameters ◽  
X Ray Imaging

AbstractSpray pyrolysis was used for the deposition of lead iodide (PbI2) thin films using N.N-dimethylformamide (DMF) as an alternative solvent under varying deposition parameters. Final thickness of 60 μm was obtained for a total deposition time of 2.5 hours. The films were characterized mainly by using Raman and photoluminescence, but additional techniques such as X-ray diffraction, scanning electron microscopy and dark conductivity as a function of temperature were also employed. Thick PbI2 films deposited by spray pyrolysis using DMF as a solvent are promising to be used in medical systems as X-ray imaging.

Study of Raman Spectrum of Fe Doped CeO2 Thin Films Grown by Pulsed Laser Deposition

2010 ◽  
Vol 123-125 ◽  
pp. 375-378 ◽  
Author(s):  
Ram Prakash ◽  
Shalendra Kumar ◽  
Chan Gyu Lee ◽  
S.K. Sharma ◽  
Marcelo Knobel ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Single Phase ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Fe Doping ◽  
Full Width ◽  
Deposition Technique ◽  
X Ray Diffraction ◽  
X Ray

Ce1-xFexO2 (x=0, 0.01, 0.03 and 0.0 5) thin films were grown by pulsed laser deposition technique on Si and LaAlO3 (LAO) substrates. These films were deposited in vacuum and 200 mTorr oxygen partial pressure for both the substrates. These films were characterized by x-ray diffraction XRD and Raman spectroscopy measurements. XRD results reveal that these films are single phase. Raman results show F2g mode at ~466 cm-1 and defect peak at 489 cm-1 for film that deposited on LAO substrates, full width at half maximum (FWHM) is increasing with Fe doping for films deposited on both the substrates.

scholarly journals Shedding Light on Phase Stability and Surface Engineering of Formamidinium Lead Iodide (FaPbI3) Thin Films for Solar Cells

2021 ◽  
Vol 12 (1) ◽  
pp. 1
Author(s):  
Julia Marí-Guaita ◽  
Amal Bouich ◽  
Bernabé Marí
Keyword(s):  
Thin Films ◽  
Surface Engineering ◽  
Optical Analysis ◽  
X Ray Diffraction ◽  
Lead Iodide ◽  
X Ray ◽  
Structure Surface ◽  
Uv Visible ◽  
The Stability ◽  
Humidity Environment

In this work, FAPbI3 thin films with different antisolvents (toluene, diethyl ether and chlorobenzene) were successfully elaborated by the spin coating technique to study the influence of the different antisolvents in the films. The crystal structure, surface morphology and optical properties were characterized by X-ray diffraction (XRD), field-emission scanning electron microscopy (FESEM) photoluminescence and UV–visible spectrometry. According to XRD, the crystalline structure of FAPbI3 was found in the orientation of the (110) plane, and it is observed that the type of antisolvent content in the absorber layer plays an important role in the growth and stabilization of the film. Here, chlorobenzene leads to a smooth and homogenous surface, a large grain size and a pinhole-free perovskite film. Additionally, the optical analysis revealed that the band gap is in the range from 1.55 to 1.57 eV. Furthermore, in an approximately 60% humidity environment and after two weeks, the stability and absorption of FaPbI3 showed low degradation.

CRYSTALLINE SrTiO3 THIN FILMS ON SILICON BY PULSED LASER DEPOSITION

2005 ◽  
Vol 19 (01n03) ◽  
pp. 533-535
Author(s):  
J. H. HAO ◽  
J. GAO
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Perovskite Oxide ◽  
Deposition Technique ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Silicon Materials

We have developed a process to grow SrTiO 3 ( STO ) thin films showing single (110) orientation directly on Si by means of pulsed laser deposition technique. The growth of STO films directly on Si has been described. The crystallinity of the grown STO films was characterized by X-ray diffraction analysis of θ-2θ scan and rocking curve. Our results may be of interest for better understanding of the growth based on the perovskite oxide thin films on silicon materials.

SnO2:F Thin Films with High Fluorine Contents Produced by Spray Pyrolysis at Constant Substrate Temperature

1996 ◽  
Vol 441 ◽  
Author(s):  
D. R. Acosta ◽  
E. Zironi ◽  
W. Estrada ◽  
E. Montoya
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Spray Pyrolysis ◽  
Tin Oxide ◽  
Spray Pyrolysis Technique ◽  
Structural Parameters ◽  
Final Concentration ◽  
X Ray Diffraction ◽  
Electrical And Optical Properties ◽  
X Ray

AbstractFluorine doped tin oxide thin films were prepared from solutions with high fluorine contents using the spray pyrolysis technique; the resulting films were studied by electron and X-ray diffraction methods; the resonant nuclear reaction (RNR) method was used to determine the final concentration of fluorine atoms in our films for different doping levels. Also, electrical and optical properties of SnO2:F films were measured and correlated with deposition and structural parameters obtained from X-Ray diffraction and electron microscopy studies.

Deposition of Nano Fiber ZnO and Zn1-xCdxO Thin Films by a Simple Spray Pyrolysis and Characterizations for Optoelectronic Applications

2012 ◽  
Vol 545 ◽  
pp. 100-104 ◽  
Author(s):  
J. Podder ◽  
M.R Islam
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Optical Band Gap ◽  
Zinc Alloy ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Vis Spectroscopy ◽  
Nano Fiber ◽  
Cadmium Zinc

ZnO and Zn1-xCdxO thin films have been deposited onto glass substrate using spray pyrolysis at 200°C. Cadmium-zinc alloy thin films have been prepared by taking different concentrations of cadmium (Cd). The elemental analysis and the surface morphology of the films were carried by the energy dispersive X-ray (EDX) and scanning electron microscopy (SEM). The EDX data show that the films are highly stoichiometric. The SEM images show that the film changes from nano fiber to grain with the increase of Cd concentrations. The X-ray diffraction pattern shows that the films are polycrystalline in nature. The crystal structure of the films changes from hexagonal-ZnO to cubic-CdO depending on the concentration of Zn and Cd in the Zn1-xCdxO films. The optical properties of these films were studied by UV-VIS spectroscopy. The optical band gap of the films was changed from 3.2 to 2.4 with the variation of cadmium.

Microstructure of In Situ Reaction TiB2/Zn-30Al-1Cu Composites Prepared by Spray Deposition Process

2015 ◽  
Vol 1120-1121 ◽  
pp. 572-575
Author(s):  
Hong Wei Liu ◽  
Feng Wang ◽  
Qiang Zhang ◽  
Xi Wu Li ◽  
Zhi Hui Li ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Spray Deposition ◽  
Deposition Process ◽  
Deposition Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
Α Phase ◽  
Scanning Electron

An innovative spray deposition technique has been applied to produce in situ TiB2/Zn-30Al-1Cu composites. The microstructures of the spray-deposited composite were studied using optical microscopy, scanning electron microscopy, and X-ray diffraction. Both theoretical and experimental results have shown that the TiB2particulates are formed in the microstructure. It was found that the TiB2particles were distributed in Zn-30Al-1Cu matrix uniformly, and the TiB2particles are about 2 μm in size. Moreover, the presence of the TiB2particles was led to increasing of α’ phase with less 2 μm size in the composites which have a tendency to decompose to α+η structure.

X-ray diffraction and compositional studies of AgInS2 thin films obtained by spray pyrolysis

2008 ◽  
Vol 43 (21) ◽  
pp. 6848-6852 ◽  
Author(s):  
M. Calixto-Rodriguez ◽  
A. Tiburcio-Silver ◽  
A. Sanchez-Juarez ◽  
M. E. Calixto
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
X Ray Diffraction ◽  
X Ray

Preparation of CuIn(SxSe1–x)2 thin films with tunable band gap by controlling sulfurization temperature of CuInSe2

2010 ◽  
Vol 25 (12) ◽  
pp. 2426-2429 ◽  
Author(s):  
Guangjun Wang ◽  
Gang Cheng ◽  
Binbin Hu ◽  
Xiaoli Wang ◽  
Shaoming Wan ◽  
...  
Keyword(s):  
Thin Films ◽  
Solar Cell ◽  
Band Gap ◽  
Low Cost ◽  
Chalcopyrite Structure ◽  
X Ray Diffraction ◽  
Large Area ◽  
X Ray ◽  
Sulfurization Temperature ◽  
Tunable Band Gap

In this paper, polycrystalline CuIn(SxSe1–x)2 thin films with tunable x and Eg (band gap) values were prepared by controlling the sulfurization temperature (T) of CuInSe2 thin films. X-ray diffraction indicated the CuIn(SxSe1–x)2 films exhibited a homogeneous chalcopyrite structure. When T increases from 150 to 500 °C, x increases from 0 to 1, and Eg increases from 0.96 to 1.43 eV. The relations between x and Eg and the sulfurization process of CuIn(SxSe1–x)2 thin films have been discussed. This work provides an easy and low-cost technique for preparing large area absorber layers of solar cell with tunable Eg.

scholarly journals Electrochromic Performance of V2O5 Thin Films Grown by Spray Pyrolysis

Materials ◽  
2020 ◽  
Vol 13 (17) ◽  
pp. 3859 ◽  
Author(s):  
Kyriakos Mouratis ◽  
Valentin Tudose ◽  
Cosmin Romanitan ◽  
Cristina Pachiu ◽  
Oana Tutunaru ◽  
...  
Keyword(s):  
Thin Films ◽  
Spray Deposition ◽  
Cost Effective ◽  
Active Surface ◽  
X Ray Diffraction ◽  
Large Area ◽  
New Approach ◽  
X Ray ◽  
Area Deposition ◽  
Scanning Electron

A new approach regarding the development of nanostructured V2O5 electrochromic thin films at low temperature (250 °C), using air-carrier spray deposition and ammonium metavanadate in water as precursor is presented. The obtained V2O5 films were characterized by X-ray diffraction, scanning electron microscopy and Raman spectroscopy, while their electrochromic response was studied using UV-vis absorption spectroscopy and cyclic voltammetry. The study showed that this simple, cost effective, suitable for large area deposition method can lead to V2O5 films with large active surface for electrochromic applications.

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