Radiation Doses to Patients Undergoing Osteosynthesis Procedures

2021 ◽  
Vol 3 (1) ◽  
Author(s):  
Staniszewska MA ◽  
◽  
Owsiak E ◽  
Keyword(s):  
Image Intensifier ◽  
X Rays ◽  
Femoral Bone ◽  
Related Factors ◽  
Anatomic Structure ◽  
Factors Affecting ◽  
X Ray ◽  
Dose Rates ◽  
Number Of Factors ◽  
Beam Incident

Fractures of limbs are most frequent causes of orthopaedic interventions. Especially the older people are exposed to these because of motion disorders and osteoporosis. Most of orthopaedic surgery interventions are performed under X-rays control to achieve an optimal settings the anatomical details and also some artificial implants, if such are necessary. Because if that, X-ray units are common equipment in operational theatre where orthopaedic procedures are performed. As a rule they are mobile C-arm units, which are easy available in any time when are necessary. A consequence of every usage of X-rays an exposure to patient but also to operational medical team [1-3]. They are a number of factors affecting both the patient and staff irradiation. There are three categories: patient dependent, equipment dependent and procedure dependent factors. Patient dependent factors include: body thickness in the beam, complexity of the anatomic structure. Equipment dependent factors include: setting of dose rates in pulsed fluoro- and continuous fluoro mode, last image hold, acquisition, and virtual collimation. The main procedure related factors are: number of radiographic frames per run, collimation, fluoroscopic and radiographic acquisition modes, fluoroscopy time, wedge filter, magnification, distance of patient to image receptor (image intensifier or flat panel detector), distance between X-ray tube and patient, and tube angulations. Very important is also the experience of the operator. In case of patient, this is especially important for the procedures when the primary beam can cover the part of the trunk. Such situation has place in the procedure of osteosynthesis the femoral bone, reconstruction of head of femur and also osteosynthesis the humeral bone. Despite a relatively short time of real exposures, doses to patients undergoing these procedures can achieve quite high values: the entrance skin air kerma (here named the “dose”) over 80 mGy was also recorded. Additionally, in practice the primary X-ray beam incident on the same area patient’ body making a higher risk of radiation detriments. The paper presents collection of doses recorded for patients undergoing the procedures of osteosynthesis the femoral bone and the humeral bone during last moths in the big university clinic.

scholarly journals Parasitic Conduction Response to X-ray Radiation in Unstrained and Strained Triple-Gate SOI MuGFETs

2014 ◽  
Vol 9 (2) ◽  
pp. 97-102
Author(s):  
Fernando F. Teixeira ◽  
Caio C. M. Bordallo ◽  
Marcilei A. Guazzelli ◽  
Paula Ghedini Der Agopian ◽  
João Antonio Martino ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Gate Voltage ◽  
Drain Current ◽  
X Rays ◽  
Back Gate ◽  
X Ray ◽  
Dose Rates ◽  
Buried Oxide ◽  
Opposite Trend

In this work, the X-ray irradiation impact on the back gate conduction and drain current for Triple-Gate SOI FinFETs is investigated for strained and unstrained devices. Both types (P and N) of transistors were analyzed. Since X-rays promote trapped positive charges in the buried oxide, the second interface threshold voltage shifts to lower gate voltage. The performance of n-channel devices presented a strong degradation when submitted to X-rays, while for p-channel devices the opposite trend was observed. Two different dose rates were analyzed.

Factors Affecting Quantitative Analysis Error in ESEM-EDS

2000 ◽  
Vol 6 (S2) ◽  
pp. 790-791
Author(s):  
R. A. Carlton ◽  
C. E. Lyman ◽  
J. E. Roberts
Keyword(s):  
Electron Beam ◽  
Target Location ◽  
Primary Electron ◽  
Environmental Scanning ◽  
X Rays ◽  
Factors Affecting ◽  
X Ray ◽  
Carbon Coated ◽  
Sample Chamber ◽  
Analysis Error

Standard Reference Material (SRM) 482 of the National Institute of Standards and Technology is a set of 6 gold/copper wires, ranging in concentration from 0 to 100% Cu in 20% steps, intended for calibration studies of electron beam microanalyzers. This is an appropriate standard to test the accuracy of energy dispersive x-ray spectrometry (EDS) in the Environmental Scanning Electron Microscope (ESEM). While the presence of the gas in the sample chamber gives the ESEM its unique capabilities, it also is the source of complications to x-ray spectrometry. The gas can spread the primary electron beam into a wide skirt of electrons with the consequent production of x-rays many micrometers from the target location of the beam.The six wires (∼ 500 jam in diameter) were embedded and polished in one epoxy mount. The mount was carbon coated in one set of experiments. The coating was removed and the sample retested.

THE PRODUCTION OF MUTATIONS BY THE IRRADIATION OF MONTCALM BARLEY

1955 ◽  
Vol 33 (6) ◽  
pp. 515-530 ◽  
Author(s):  
Thomas Lawrence
Keyword(s):  
High Dose Rate ◽  
Mutation Induction ◽  
High Dose ◽  
X Rays ◽  
New Approach ◽  
X Ray ◽  
Dose Rates ◽  
Radiation Sources ◽  
Early Maturing ◽  
New Varieties

Five radiation sources were used to induce mutations in barley. All treatments were given at a dosage of 10,000 r. equivalent. The radiation sources with their respective dose-rates in the region of the irradiated seeds were: a betatron (181.8 r./min.), an X-ray machine (201 r./min.), radium-beryllium (5.3 r./min.), and two Co60 sources (4.5 r./min. and 75.75 r./min.). None of the radiation sources used was more effective than the X-ray treatment in producing mutations. The betatron and the high dose-rate treatments from Co60 appear to be somewhat less effective than X-rays. Over 30 different mutant types were produced, including a number of vital mutants, such as stiff-strawed and early-maturing types. These appear promising as new varieties, but require further agronomic evaluation. It is concluded that mutation induction will become a useful new approach for plant breeders.

Improvements of a-Si:H/CsI(TI) X-RAY Detectors for Radiation Monitoring

1993 ◽  
Vol 302 ◽  
Author(s):  
C. Manfredotti ◽  
F. Fizzotti ◽  
M. Boero ◽  
F. Cannistraci ◽  
E. Vittone ◽  
...  
Keyword(s):  
Experimental Data ◽  
Dark Current ◽  
Radiation Monitoring ◽  
X Rays ◽  
Exposure Rate ◽  
Good Sensitivity ◽  
X Ray ◽  
Dose Rates ◽  
Photovoltaic Mode ◽  
Light Generation

ABSTRACTPhotosensitive a-Si:H p-i-n diodes, working in photovoltaic mode, have been coupled to CsI(T1) scintillators for dosimetry applications to X-ray monitoring in the energy range from 50 keV up to 15 MeV. A “mesa” approach for p-i-n diodes has been adopted both in order to better define the geometry and to obtain very low dark current. In order to optimize the geometry, a computer program has been created which simulates light generation in the scintillator, the collection by the detector and the photovoltaic current obtained as a function of exposure rate.Measurements have been carried out in the X-rays energy ranges 50-240 keV, at 6MeV and at 15 MeV. Detectors are linear in response and shows a good sensitivity, with the capability of measuring dose rates as low as 60 mR/h.The agreement between experimental data and simulation outputs can be considered good.

scholarly journals X-ray Emission Hazards from Ultrashort Pulsed Laser Material Processing in an Industrial Setting

Materials ◽  
2021 ◽  
Vol 14 (23) ◽  
pp. 7163
Author(s):  
Ulf Stolzenberg ◽  
Mayka Schmitt Rahner ◽  
Björn Pullner ◽  
Herbert Legall ◽  
Jörn Bonse ◽  
...  
Keyword(s):  
Material Processing ◽  
High Dose ◽  
Reference Scenario ◽  
X Rays ◽  
Laser Material Processing ◽  
Laser Material ◽  
X Ray ◽  
Dose Rates ◽  
Industrial Setting ◽  
Ambient Dose

Interactions between ultrashort laser pulses with intensities larger than 1013 W/cm2 and solids during material processing can lead to the emission of X-rays with photon energies above 5 keV, causing radiation hazards to operators. A framework for inspecting X-ray emission hazards during laser material processing has yet to be developed. One requirement for conducting radiation protection inspections is using a reference scenario, i.e., laser settings and process parameters that will lead to an almost constant and high level of X-ray emissions. To study the feasibility of setting up a reference scenario in practice, ambient dose rates and photon energies were measured using traceable measurement equipment in an industrial setting at SCHOTT AG. Ultrashort pulsed (USP) lasers with a maximum average power of 220 W provided the opportunity to measure X-ray emissions at laser peak intensities of up to 3.3 × 1015 W/cm2 at pulse durations of ~1 ps. The results indicate that increasing the laser peak intensity is insufficient to generate high dose rates. The investigations were affected by various constraints which prevented measuring high ambient dose rates. In this work, a list of issues which may be encountered when performing measurements at USP-laser machines in industrial settings is identified.

Electro-Optical Systems for Dynamic Display of X-ray Diffraction Images

1970 ◽  
Vol 14 ◽  
pp. 311-337 ◽  
Author(s):  
Robert E. Green
Keyword(s):  
Image Intensifier ◽  
Optical Systems ◽  
List Type ◽  
X Rays ◽  
X Ray Diffraction ◽  
Large Format ◽  
Actual Performance ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
Fluorescent Screen

AbstractVarious electro-optical systems have been reported which permit intensification of X-ray diffraction patterns and thus a decrease in exposure time for recording and display of the X-ray images. Prior to 1966, all such electro-optical systems incorporated a large format X-ray image intensifier of the same type as conventionally used for medical and industrial fluoroscopy. In the past four years, a number of different systems have been reported which are superior to those developed prior to 1966. These systems may be grouped into two main categories, the large format variety for Laue diffraction applications, and the small format variety for topographic applications.The purpose of the present paper is to describe the particular characteristics of both the large format and small format systems and to discuss the advantages and disadvantages associated with each type. Based on actual performance characteristics it will be shown that:1.A multiple stage image intensifier system coupled to an external fluorescent screen is the most sensitive and only truly instantaneous system; it can be used with very weak X-ray intensities, the resolution is currently limited by the external fluorescent screen to 42μ the system is extremely versatile in that it can be used both for large format recording of Laue patterns as well as for small format recording of X-ray topographe; the system has a very long lifetime since nothing is altered by X-radiation.2.An X-ray sensitive vidicon is the least sensitive; it must be used with extremely high intensity X-rays or long exposure times; the resolution is the highest at approximately 15μ and is limited by either bandwidth of the television system, the thickness of the X-ray sensitive target or the size of the electron beam at the target; due to the small size of the X-ray sensitive target the system can only be used for small format recording of X-ray topographs; the lifetime of the system is short since X-radiation causes degradation of the target.

Dissolution characteristics of poly(methyl methacrylate) as an X-ray resist

1987 ◽  
Vol 65 (8) ◽  
pp. 975-978 ◽  
Author(s):  
E. M. Lehockey ◽  
J. D. Wice ◽  
I. Reid
Keyword(s):  
Methyl Methacrylate ◽  
Dissolution Rate ◽  
Chain Scission ◽  
X Rays ◽  
X Ray ◽  
Poly Methyl Methacrylate ◽  
Dose Rates ◽  
Main Requirement ◽  
Relative Measurements ◽  
First Time

A reversion in the dissolution characteristics of X-ray irradiated poly(methyl methacrylate) (PMMA) is shown experimentally, and a model is developed to explain the behaviour. The PMMA has been irradiated with 11 kV Cu X-rays to doses up to 240 μA∙min∙cm−2 at dose rates of 4 and 8 μA∙cm−2. The doses are determined by photoelectron emission and are therefore only relative measurements. The dissolution rate of the irradiated PMMA in a 1:2 developer of methyl isobutyl ketone and isopropyl alcohol is measured as a function of X-ray dose. For the first time, a model is developed that predicts this reversion in the dissolution rate. For the model to predict a reversion point, it is necessary to treat the processes of chain scission and cross-linking as operating on separate sites. The main requirement here is that cross-linked bonds do not become sites for scission. If this requirement is not made, no reversion is predicted.

scholarly journals X-RAY-INDUCED CHROMOSOME ABERRATIONS IN MOUSE DICTYATE OOCYTES. II. FRACTIONATION AND DOSE RATE EFFECTS

Genetics ◽  
1977 ◽  
Vol 87 (4) ◽  
pp. 699-708
Author(s):  
J G Brewen ◽  
H S Payne ◽  
I D Adler
Keyword(s):  
X Rays ◽  
Large Drop ◽  
X Ray ◽  
Split Dose ◽  
Dose Rates ◽  
Dose Rate Effects ◽  
Rate Effects ◽  
Radiation Induced ◽  
Peak Sensitivity ◽  
Specific Locus

ABSTRACT Split-dose experiments were done on maturing dictyate oocytes to determine if the magnitude of the first dose influenced the "rejoining time" of radiation-induced chromosomal lesions. A total dose of 400r was split into various combinations with varying fractionation intervals. The data derived from analyzing interchanges indicate that there is no difference in the rejoining time whether the first dose was 100, 200, or 300r. It thus appears that the radiation dose in the ranges studied does not significantly alter the rate of repair of the chromosomal lesions. This conclusion is contrary to that which has been propounded to explain the nonlinear dose curves obtained for specific locus mutations. Chronic 60Co Υ-ray exposures were given to female mice over an 8-day period. The exposures were delivered during the period of peak sensitivity, i.e., 8-16 days prior to ovulation. The doses given were 117, 240, 348, and 483r. The aberration yields observed were dramatically lower than for comparable doses of acute X rays even when the RBE of Υ rays compared with X rays is taken into account. The large drop in yields at the low dose rates is interpreted as resulting from a large two-track component in the acute curve, and as being independent of effects on repair systems.

White-Light Coronal Structures: Streamers and CMEs

1994 ◽  
Vol 144 ◽  
pp. 82
Author(s):  
E. Hildner
Keyword(s):  
Emission Line ◽  
Electron Density ◽  
White Light ◽  
Coronal Mass Ejections ◽  
X Rays ◽  
Solar Cycles ◽  
Temperature Function ◽  
X Ray ◽  
Eclipse Observations ◽  
Coronal Structures

AbstractOver the last twenty years, orbiting coronagraphs have vastly increased the amount of observational material for the whitelight corona. Spanning almost two solar cycles, and augmented by ground-based K-coronameter, emission-line, and eclipse observations, these data allow us to assess,inter alia: the typical and atypical behavior of the corona; how the corona evolves on time scales from minutes to a decade; and (in some respects) the relation between photospheric, coronal, and interplanetary features. This talk will review recent results on these three topics. A remark or two will attempt to relate the whitelight corona between 1.5 and 6 R⊙to the corona seen at lower altitudes in soft X-rays (e.g., with Yohkoh). The whitelight emission depends only on integrated electron density independent of temperature, whereas the soft X-ray emission depends upon the integral of electron density squared times a temperature function. The properties of coronal mass ejections (CMEs) will be reviewed briefly and their relationships to other solar and interplanetary phenomena will be noted.

Sign in / Sign up

Export Citation Format

Share Document