scholarly journals Spectroscopic and structural studies of cadmium oxide thin films prepared by D.C magnetron sputtering

2018 ◽  
Vol 16 (37) ◽  
pp. 7-14
Author(s):  
Ghuson H. Mohamed
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Cadmium Oxide ◽  
Xrd Analysis ◽  
Spectroscopic Properties ◽  
Plasma Diagnostic ◽  
Oxide Thin Films ◽  
Plasma Sputtering ◽  
Different Temperatures ◽  
Cdo Thin Films

Cadmium oxide thin films were prepared by D.C magnetron plasma sputtering using different voltages (700, 800, 900, 1000, 1100 and 1200) Volt. The Cadmium oxide structural properties using XRD analysis for just a voltage of 1200 volt at room temperature after annealing in different temperatures (523 and 623) K were studied .The results show that the films prepared at room temperature have some peaks belong to cadmium element along the directions (002), (100), (102) and (103) while the other peaks along the directions of (111), (200) and (222) belong to cadmium oxide. Annealed samples display only cadmium oxide peaks. Also, the spectroscopic properties of plasma diagnostic for CdO thin films were determined and the results show that the electron temperature and electron density increase with increasing of sputtered voltage.

scholarly journals The Effect of Doping Thiourea In CdO Thin Films For Electronic Applications

2021 ◽  
Author(s):  
Murat Soylu
Keyword(s):  
Thin Films ◽  
Structural Parameters ◽  
Cadmium Oxide ◽  
Soda Lime ◽  
Optical Transmittance ◽  
Xrd Analysis ◽  
Soda Lime Glass ◽  
Coating Method ◽  
Cdo Thin Films ◽  
P Type

Abstract Cadmium oxide (CdO) and Thiourea (Th) doped CdO thin films were deposited on soda lime glass (SLG) and crystalline p-type Si (100) substrates for various Th doping concentrations (0.3, 0.5, 0.7 at.%) using spin coating method. Some structural parameters such as the crystallite size, lattice constant, dislocation density (δ) and strain in the films were obtained from XRD analysis in which the polycrystalline structure with cubic nature and (111) prefential orientation was confirmed. CdO thin film has not shown any change in crystal phase after Th doping. The optical study emerged that the Th doping caused important changes in the transmittance, absorbance and reflectance spectra. A maximum optical transmittance (above 80%) have been obtained for 0.3% Th doped CdO thin films. Th doped CdO/p-Si heterojunctions exhibited low rectifying character and were not found to be the light sensitive.

Room-temperature remote-plasma sputtering of c-axis oriented zinc oxide thin films

2012 ◽  
Vol 112 (1) ◽  
pp. 014907 ◽  
Author(s):  
L. García-Gancedo ◽  
J. Pedrós ◽  
Z. Zhu ◽  
A. J. Flewitt ◽  
W. I. Milne ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Room Temperature ◽  
Oxide Thin Films ◽  
Remote Plasma ◽  
Plasma Sputtering

scholarly journals Optical properties of CdO thin films

2010 ◽  
Vol 7 (1) ◽  
pp. 10-13
Author(s):  
Baghdad Science Journal
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Band Gap ◽  
Glass Substrate ◽  
Optical Band Gap ◽  
Spray Pyrolysis Technique ◽  
Cadmium Oxide ◽  
Localized States ◽  
Different Temperatures ◽  
Cdo Thin Films

Cadmium Oxide thin films were deposited on glass substrate by spray pyrolysis technique at different temperatures (300,350,400, 500)oC. The optical properties of the films were studied in this work. The optical band-gap was determined from absorption spectra, it was found that the optical band-gap was within the range of (2.5-2.56)eV also width of localized states and another optical properties.

scholarly journals Temperature-Dependent Stimulated Emission Cross-Section in Nd3+:YLF Crystal

Materials ◽  
2021 ◽  
Vol 14 (2) ◽  
pp. 431
Author(s):  
Giorgio Turri ◽  
Scott Webster ◽  
Michael Bass ◽  
Alessandra Toncelli
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Room Temperature ◽  
Radiative Decay ◽  
Emission Cross Section ◽  
Spectroscopic Properties ◽  
Stimulated Emission ◽  
Different Temperatures ◽  
Stimulated Emission Cross Section ◽  
Semi Empirical

Spectroscopic properties of neodymium-doped yttrium lithium fluoride were measured at different temperatures from 35 K to 350 K in specimens with 1 at% Nd3+ concentration. The absorption spectrum was measured at room temperature from 400 to 900 nm. The decay dynamics of the 4F3/2 multiplet was investigated by measuring the fluorescence lifetime as a function of the sample temperature, and the radiative decay time was derived by extrapolation to 0 K. The stimulated-emission cross-sections of the transitions from the 4F3/2 to the 4I9/2, 4I11/2, and 4I13/2 levels were obtained from the fluorescence spectrum measured at different temperatures, using the Aull–Jenssen technique. The results show consistency with most results previously published at room temperature, extending them over a broader range of temperatures. A semi-empirical formula for the magnitude of the stimulated-emission cross-section as a function of temperature in the 250 K to 350 K temperature range, is presented for the most intense transitions to the 4I11/2 and 4I13/2 levels.

scholarly journals Sensing mechanism of an optimized room temperature optical hydrogen gas sensor made of zinc oxide thin films

2020 ◽  
Vol 9 (5) ◽  
pp. 10624-10634
Author(s):  
Siti Nor Aliffah Mustaffa ◽  
Nurul Assikin Ariffin ◽  
Ahmed Lateef Khalaf ◽  
Mohd. Hanif Yaacob ◽  
Nizam Tamchek ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Gas Sensor ◽  
Room Temperature ◽  
Hydrogen Gas ◽  
Oxide Thin Films ◽  
Sensing Mechanism

Epsilon-near-Zero Modes and Surface Plasmon Resonance in Fluorine-Doped Cadmium Oxide Thin Films

ACS Photonics ◽  
2017 ◽  
Vol 4 (8) ◽  
pp. 1885-1892 ◽  
Author(s):  
Evan L. Runnerstrom ◽  
Kyle P. Kelley ◽  
Edward Sachet ◽  
Christopher T. Shelton ◽  
Jon-Paul Maria
Keyword(s):  
Thin Films ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Cadmium Oxide ◽  
Oxide Thin Films ◽  
Zero Modes ◽  
Epsilon Near Zero

Optical Degradation of Indium Tin Oxide Thin Films Induced by Hydrogen-Related Room Temperature Reduction

2003 ◽  
Vol 42 (Part 2, No. 5B) ◽  
pp. L546-L548 ◽  
Author(s):  
Yu Wang ◽  
Wan Ping Chen ◽  
Kei Chun Cheng ◽  
Helen Lai Wah Chan ◽  
Chung Loong Choy
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Room Temperature ◽  
Oxide Thin Films ◽  
Temperature Reduction

scholarly journals CHARACTERISTICS OF LITHIUM LANTHANUM TITANATE THIN FILMS MADE BY ELECTRON BEAM EVAPORATION FROM NANOSTRUCTURED La0.67-xLi 3xTiO3 TARGET

2017 ◽  
Vol 25 (2) ◽  
pp. 243-250
Author(s):  
Nguyen Nang Dinh ◽  
Le Dinh Trong ◽  
Pham Duy Long
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Ionic Conductivity ◽  
Room Temperature ◽  
Xrd Analysis ◽  
Electron Beam Evaporation ◽  
Electrochromic Devices ◽  
Lanthanum Titanate ◽  
Average Size ◽  
Beam Deposition

Bulk nanostructured perovskites of La0.67-xLi3xTiO3 (LLTO) were prepared by using thermally ball-grinding from compounds of La2O3, Li2CO3 and TiO2. From XRD analysis, it was found that LTTO materials were crystallized with nano-size grains of an average size of 30 nm. The bulk ionic conductivity was found strongly dependent on the Li+ composition, the samples with x = 0.11 (corresponding to a La0.56Li0.33TiO3 compound) have the best ionic conductivity, which is ca. 3.2 x 10-3 S/cm at room temperature. The LLTO amorphous films were made by electron beam deposition. At room temperature the smooth films have ionic conductivity of 3.5 x 10-5  S/cm and transmittance of 80%. The optical bandgap of the films was found to be of 2.3 eV. The results have shown that the perovskite La0.56Li0.33TiO3  thin films can be used for a transparent solid electrolyte in ionic battery and in all-solid-state electrochromic devices, in particular.    

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