scholarly journals Research on Anti-Radiation Noise Interference of High Definition Multimedia Interface Circuit Layout of a Laptop

Electronics ◽  
2020 ◽  
Vol 9 (3) ◽  
pp. 426 ◽  
Author(s):  
Wei Chien ◽  
Yu-Ting Cheng ◽  
Chiuan-Fu Hsiao ◽  
Kai-Xu Han ◽  
Chien-Ching Chiu
Keyword(s):  
Electromagnetic Interference ◽  
Printed Circuit Board ◽  
Near Field ◽  
Circuit Board ◽  
High Definition ◽  
Interface Circuit ◽  
Noise Interference ◽  
Multimedia Interface ◽  
Pcb Layout ◽  
Detection Instrument

In this paper, several aspects were studied, including the effect of an electromagnetic interference (EMI) noise interference strategy with High Definition Multimedia Interface (HDMI) 1.4, the analysis of a test on a printed circuit board (PCB) layout, and a comparison of the near field intensity radiation distribution between an EMI with a modified HDMI layout and an original layout. In this study, the near field detection instrument of APREL EM-ISight was employed to analyze the distribution of the strength of an electromagnetic noise field. After the practical validation, we found that the PCB layout complies with the standards after the modifications. Meanwhile, the PCB layout satisfies the requirements of most laptop HDMI-related products for EMI.

scholarly journals Design and Study of a Wide-Band Printed Circuit Board Near-Field Probe

Electronics ◽  
2021 ◽  
Vol 10 (18) ◽  
pp. 2201 ◽  
Author(s):  
Pedro A. Martinez ◽  
Enrique A. Navarro ◽  
Jorge Victoria ◽  
Adrian Suarez ◽  
Jose Torres ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Electromagnetic Interference ◽  
Printed Circuit Board ◽  
Transmission Loss ◽  
Near Field ◽  
Fem Simulation ◽  
Numerical Results ◽  
Circuit Board ◽  
Frequency Range ◽  
Printed Circuit

Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from a small electromagnetic interference (EMI) source. This kind of antenna is useful as a magnetic field probe for pre-compliance EMC measurements or debugging tasks since the user can scan a printed circuit board (PCB) looking for locations with strong magnetic fields. When a strong H-field point is found, the designer should check the PCB layout and components placement in that area to detect if this could result in an EMI source. This contribution focuses on analyzing the performance of an easy to build and low-cost H-field NFP designed and manufactured using a standard PCB stack-up. Thereby, the frequency range and sensitivity of the NFP-PCB are analyzed through a Finite Element Method (FEM) simulation model that makes it possible to evaluate its sensibility and effective frequency range. The numerical results obtained with the FEM models are validated against measurements to verify the design and performance of our NFP. The FEM model reproduces the experimental procedure, which is used to evaluate the performance of the NFP in terms of sensitivity by means of the simulated near-field distribution. The NFP-PCB has almost a flat response from 180 MHz to 6 GHz, with an almost perfect concordance between numerical and experimental S21 results. The numerical results show an average transmission loss of −27.9 dB by considering the flat response bandwidth, whereas the experimental one is −29.7 dB. Finally, the designed NFP is compared to two high-quality commercial probes in order to analyze its performance.

scholarly journals A Comprehensive Comparison of EMI Immunity in CMOS Amplifier Topologies

Electronics ◽  
2019 ◽  
Vol 8 (10) ◽  
pp. 1181 ◽  
Author(s):  
Simone Becchetti ◽  
Anna Richelli ◽  
Luigi Colalongo ◽  
Zsolt Kovacs-Vajna
Keyword(s):  
Electromagnetic Interference ◽  
Printed Circuit Board ◽  
Complementary Metal Oxide Semiconductor ◽  
Circuit Board ◽  
Oxide Semiconductor ◽  
Cmos Process ◽  
Fair Comparison ◽  
Comprehensive Comparison ◽  
Folded Cascode ◽  
Cmos Amplifier

This paper provides the results of a comprehensive comparison between complementary metal oxide semiconductor (CMOS) amplifiers with low susceptibility to electromagnetic interference (EMI). They represent the state-of-the-art in low EMI susceptibility design. An exhaustive scenario for EMI pollution has been considered: the injected interference can indeed directly reach the amplifier pins or can be coupled from the printed circuit board (PCB) ground. This is also a key point for evaluating the susceptibility from EMI coupled to the output pin. All of the amplifiers are re-designed in a United Microelectronics Corporation (UMC) 180 nm CMOS process in order to have a fair comparison. The topologies investigated and compared are basically derived from the Miller and the folded cascode ones, which are well-known and widely used by CMOS analog designers.

Vibration Based Energy Harvesting Interface Circuit using Diode-Capacitor Topologies for Low Power Applications

2017 ◽  
Vol 8 (4) ◽  
pp. 1943
Author(s):  
Amirul Adlan Amirnudin ◽  
Farahiyah Mustafa ◽  
Anis Maisarah Mohd Asry ◽  
Sy Yi Sim
Keyword(s):  
Energy Harvesting ◽  
Low Power ◽  
Printed Circuit Board ◽  
Electrical Energy ◽  
Input Voltage ◽  
Boost Converter ◽  
Circuit Board ◽  
Pass Filter ◽  
Low Pass Filter ◽  
Interface Circuit

<span>A battery-less energy harvesting interface circuit to extract electrical energy from vibration has been proposed in this paper for low power applications. The voltage doubler integrated with DC – DC boost converter circuits were designed and simulated using MultiSIM software. The circuit was then fabricated onto a printed circuit board (PCB), using standard fabrication process. The Cockcroft Walton doubler was chosen to be implemented in this study by utilizing diode-capacitor topologies with additional RC low pass filter. The DC – DC boost converter has been designed using a CMOS step -up DC – DC switching regulators, which are suitable for low input voltage system. The achievement of this interface circuit was able to boost up the maximum voltage of 5 V for input voltage of 800 mV.</span>

scholarly journals Hall-Effect Current Sensors Susceptibility to EMI: Experimental Study

Electronics ◽  
2019 ◽  
Vol 8 (11) ◽  
pp. 1310 ◽  
Author(s):  
Orazio Aiello
Keyword(s):  
Power Systems ◽  
Hall Effect ◽  
Electromagnetic Interference ◽  
Printed Circuit Board ◽  
Circuit Board ◽  
Current Sensing ◽  
Tem Cell ◽  
Power Injection ◽  
Current Sensors ◽  
Transverse Electromagnetic

The paper deals with the susceptibility to Electromagnetic Interference (EMI) of Hall-effect current sensors. They are usually employed in power systems because of their galvanic isolation. The EMI robustness of such contactless device was compared with that of resistive current sensing (wired method). To this purpose, a printed circuit board (PCB) was fabricated. EMI tests methods such as Bulk Current Injection (BCI), Transverse-Electromagnetic (TEM) cell and Direct Power injection (DPI) were performed to evaluate the robustness of the Hall-Effect current sensor. EMI-induced failures are highlighted by comparing the different measurements tests and setups.

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