scholarly journals Effect of Secondary Cold Reduction Rates on Microstructure, Texture and Earing Behavior of Double Reduction Tinplate

Materials ◽  
2021 ◽  
Vol 14 (14) ◽  
pp. 4040
Author(s):  
Peng Tian ◽  
Luhai Liao ◽  
Guoming Zhu ◽  
Yonglin Kang
Keyword(s):  
Electron Backscatter Diffraction ◽  
Reduction Rate ◽  
Microstructural Characterization ◽  
Cold Reduction ◽  
Double Reduction ◽  
X Ray ◽  
Dissolved Carbon ◽  
Electron Backscatter ◽  
Texture Characterization ◽  
Backscatter Diffraction

In order to evaluate the effect of secondary cold reduction rate on the drawing performance of double reduction tinplate and explain the mechanism, a detailed investigation into the microstructural characterization, dissolved carbon atoms, texture characterization by an X-ray powder diffractometer (XRD) and electron backscatter diffraction (EBSD), and earing behavior were carried out with different secondary cold reduction rates of 15%, 20% and 25% for double reduction tinplate. The experimental results indicate that 15% secondary cold reduction rate could obtain a better drawing performance because there are no holes and cracks at the microstructure, and the content of dissolved carbon atom is relatively low; at the same time, it has a better texture distribution and low earing coefficient.

scholarly journals Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods

2019 ◽  
Vol 52 (4) ◽  
pp. 828-843 ◽  
Author(s):  
Dorian Delbergue ◽  
Damien Texier ◽  
Martin Lévesque ◽  
Philippe Bocher
Keyword(s):  
Residual Stress ◽  
Grain Size ◽  
Tilt Angle ◽  
Measurement Errors ◽  
Electron Backscatter Diffraction ◽  
Measurement Techniques ◽  
Single Exposure ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

X-ray diffraction (XRD) is a widely used technique to evaluate residual stresses in crystalline materials. Several XRD measurement methods are available. (i) The sin2ψ method, a multiple-exposure technique, uses linear detectors to capture intercepts of the Debye–Scherrer rings, losing the major portion of the diffracting signal. (ii) The cosα method, thanks to the development of compact 2D detectors allowing the entire Debye–Scherrer ring to be captured in a single exposure, is an alternative method for residual stress measurement. The present article compares the two calculation methods in a new manner, by looking at the possible measurement errors related to each method. To this end, sets of grains in diffraction condition were first identified from electron backscatter diffraction (EBSD) mapping of Inconel 718 samples for each XRD calculation method and its associated detector, as each method provides different sets owing to the detector geometry or to the method specificities (such as tilt-angle number or Debye–Scherrer ring division). The X-ray elastic constant (XEC) ½S 2, calculated from EBSD maps for the {311} lattice planes, was determined and compared for the different sets of diffracting grains. It was observed that the 2D detector captures 1.5 times more grains in a single exposure (one tilt angle) than the linear detectors for nine tilt angles. Different XEC mean values were found for the sets of grains from the two XRD techniques/detectors. Grain-size effects were simulated, as well as detector oscillations to overcome them. A bimodal grain-size distribution effect and `artificial' textures introduced by XRD measurement techniques are also discussed.

Comparison of Workability of ZK60A Alloy Depending on Casting Methods

2012 ◽  
Vol 630 ◽  
pp. 35-40
Author(s):  
K.H. Jung ◽  
B. Ahn ◽  
S. Lee ◽  
D.S. Choi ◽  
Y.S. Lee ◽  
...  
Keyword(s):  
Magnesium Alloy ◽  
Continuous Casting ◽  
Elevated Temperatures ◽  
Electron Backscatter Diffraction ◽  
Die Casting ◽  
Inspection System ◽  
Compression Tests ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

In this research, the effect of casting methods on the workability of magnesium alloy ZK60A was investigated by comparing two different billets, fabricated by semi-continuous casting and die casting. To determine the workability of the materials, uniaxial compression tests were conducted at different elevated temperatures and strain rate of 0.01/s. In addition, the X-ray inspection system and electron backscatter diffraction (EBSD) were employed to compare their internal defects and microstructures, respectively. The workability of ZK60A depending on the casting methods is discussed based on the obtained experimental results.

Understanding Whisker Growth: Effect of Substrate and Underlayer

2016 ◽  
Vol 2016 (1) ◽  
pp. 000512-000515 ◽  
Author(s):  
Piyush Jagtap ◽  
Praveen Kumar
Keyword(s):  
Whisker Growth ◽  
Electron Backscatter Diffraction ◽  
Growth Effect ◽  
X Rays ◽  
Ion Imaging ◽  
Electron Backscatter ◽  
Texture Characterization ◽  
Backscatter Diffraction ◽  
Pure Cu ◽  
Pure Sn

Abstract The fundamentals of whiskering in pure Sn coatings electrodeposited on pure Cu and brass (65 wt. % Cu: 35 wt. % Zn) substrates with and without electrodeposited Ni underlayer was studied. These coatings were subjected to isothermal aging at 50 °C to accelerate the whisker growth, and whisker growth was studied using scanning electron microscope (SEM) equipped with focused ion imaging. Texture characterization was conducted using X-rays and electron backscatter diffraction (EBSD). It was observed that whisker growth was more accelerated in case of brass substrate compared to pure Cu substrate. No whisker growth was observed in coatings with Ni underlayer. It was observed that diffusion of substrate atoms along Sn grain boundaries plays major role in whiskering. Ni underlayer inhibited diffusion of Cu and Zn atoms into Sn coating and hence was very effective in mitigating whisker growth.

scholarly journals Effect of TiO2-Nanoparticles on Ni Electrodeposition on Copper Wire

Metals ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 406
Author(s):  
Samiha Saad ◽  
Zakaria Boumerzoug ◽  
Anne Laure Helbert ◽  
François Brisset ◽  
Thierry Baudin
Keyword(s):  
Surface Morphology ◽  
Tio2 Nanoparticles ◽  
Vickers Microhardness ◽  
Electron Backscatter Diffraction ◽  
Copper Wire ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Electrodeposited Nickel ◽  
Backscatter Diffraction

The objective of this work is to study, on a copper wire, the effect of TiO2-nanoparticles on electrodeposited nickel. Both the microstructure and surface morphology (texture) of the coating were investigated. This deposit is obtained from baths of sulfated electroplating Watts. The Ni-TO2 composite coating is deposited at a temperature of 45 °C. The composite deposit is prepared by adding nanoparticles of TiO2 to the electrolyte. The characterization has been carried out by X-ray diffraction, scanning electron microscopy, microhardness measurements, and electron backscatter diffraction (EBSD). Vickers microhardness was used to characterize the mechanical properties of the electrodeposited nickel. The results showed the effects of the TiO2 on the composition, the surface morphology, and the hardness of the deposited layer. However, there was not an effect of TiO2 nanoparticles on texture.

Surface Crystallization of Cordierite from Glass Studied by High-Temperature X-ray Diffraction and Electron Backscatter Diffraction (EBSD)

2011 ◽  
Vol 11 (10) ◽  
pp. 4660-4666 ◽  
Author(s):  
Wolfgang Wisniewski ◽  
Carlos André Baptista ◽  
Matthias Müller ◽  
Günter Völksch ◽  
Christian Rüssel
Keyword(s):  
High Temperature ◽  
Electron Backscatter Diffraction ◽  
Surface Crystallization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction
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