Dielectric and Impedance Spectroscopic Studies of SrBi4-xLaxTi4O15
2012 ◽
Vol 428
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pp. 52-56
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Keyword(s):
X Ray
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Ceramic samples of SrBi4-xLaxTi4O15with x=0.025 is prepared by standard solid state reaction method. The phase formation is confirmed by X-ray diffraction (XRD) studies. The Dielectric and Impedance measurement has been performed in the temperature range 50°C to 600°C and the frequency range 1Hz to 1MHz. The Curie temperature is found to decrease from 535°C to 505°C. The Cole-Cole plots are semi circles in the temperature range 450°C to600°C. The relaxation time is decreased with increase of temperature. The investigations on this material at high temperatures and frequencies reveal its stable behavior.