Comparative Study of Electrical and Microstructural Properties of 4H-SiC MOSFETs

2012 ◽  
Vol 717-720 ◽  
pp. 437-440 ◽  
Author(s):  
Christian Strenger ◽  
Volker Haeublein ◽  
Tobias Erlbacher ◽  
Anton J. Bauer ◽  
Heiner Ryssel ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Interfacial Layer ◽  
Chemical Properties ◽  
Microstructural Properties ◽  
Layer Formation ◽  
Carbon Distribution ◽  
Transmission Electron ◽  
Inversion Channel ◽  
P Type ◽  
And Chemical Properties

N-channel MOSFETs were manufactured on p-type and on p-implanted, n-type 4H-SiC substrates. The electron mobility in the inversion channel was measured to be correlated with the structural and chemical properties determined by transmission electron microscopy. With regard to what was previously discussed in the literature, interfacial layer formation and carbon distribution across the SiC/SiO2 interface were considered in relation with the measured Hall electron mobility.

Nano-Analytical and Electrical Characterization of 4H-SiC MOSFETs

2012 ◽  
Vol 711 ◽  
pp. 134-138 ◽  
Author(s):  
Ana Maria Beltran ◽  
Sylvie Schamm-Chardon ◽  
Vincent Mortet ◽  
Mathieu Lefebvre ◽  
Elena Bedel-Pereira ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Electronic Devices ◽  
Chemical Properties ◽  
Electrical Characterization ◽  
Power Electronic ◽  
Layer Formation ◽  
Transmission Electron ◽  
P Type ◽  
And Chemical Properties

4H-SiC presents great advantages for its use in power electronic devices working at particular conditions. However the development of MOSFETs based on this material is limited by mobility degradation. N-channel SiC MOSFETs were manufactured on p-type epitaxial and p-implanted substrates and the electron mobility in the inversion channels was measured to be correlated with their structural and chemical properties determined by transmission electron microscopy methods. With regard to what was previously discussed in the literature, transition layer formation and carbon distribution across the SiC-SiO2interface are considered in relation with the measured low electron mobility of the MOSFETS.

The microstructure of a TiB2/Ti-47 Al composite material

1989 ◽  
Vol 47 ◽  
pp. 674-675
Author(s):  
O. Popoola ◽  
A.H. Heuer ◽  
P. Pirouz
Keyword(s):  
Composite Material ◽  
Ion Beam ◽  
Chemical Properties ◽  
Intermetallic Alloys ◽  
Transmission Electron ◽  
Diamond Polishing ◽  
Al Composite ◽  
The Matrix ◽  
Argon Ion ◽  
And Chemical Properties

The addition of fibres or particles (TiB2, SiC etc.) into TiAl intermetallic alloys could increase their toughness without compromising their good high temperature mechanical and chemical properties. This paper briefly discribes the microstructure developed by a TiAl/TiB2 composite material fabricated with the XD™ process and forged at 960°C.The specimens for transmission electron microscopy (TEM) were prepared in the usual way (i.e. diamond polishing and argon ion beam thinning) and examined on a JEOL 4000EX for microstucture and on a Philips 400T equipped with a SiLi detector for microanalyses.The matrix was predominantly γ (TiAl with L10 structure) and α2(TisAl with DO 19 structure) phases with various morphologies shown in figure 1.

Structural and Chemical Properties of MBE Grown Niobium Overlayers on (110) Rutile

1996 ◽  
Vol 441 ◽  
Author(s):  
J. Marien ◽  
T. Wagner ◽  
M. Rühle
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Defect Structure ◽  
Chemical Properties ◽  
High Energy ◽  
Initial Growth ◽  
High Energy Electron ◽  
Transmission Electron ◽  
Different Temperatures ◽  
And Chemical Properties

AbstractThin Nb films were grown by MBE in a UHV chamber at two different temperatures (50°C and 950°C) on the (110) surface of TiO2 (rutile).At a growth temperature of 50°C, reflection high energy electron diffraction (RHEED) revealed epitaxial growth of Nb on rutile: (110)[001] TiO2 ¦¦ (100)[001] Nb. In addition, investigations with Auger electron spectroscopy (AES) revealed that a chemical reaction took place between the Nb overlayer and the TiO2 substrate at the initial growth stage. A 2 nm thick reaction layer at the Nb/TiO2 interface has been identified by means of conventional transmission electron microscopy (CTEM) and high-resolution transmission electron microscopy (HRTEM).At a substrate temperature of 950°C, during growth, the Nb film was oxidized completely, and NbO2 grew epitaxially on TiO2. The structure and the chemical composition of the overlayers have been investigated by RHEED, AES, CTEM and HRTEM. Furthermore, it was determined that the reaction of Nb with TiO2 is governed by the defect structure of the TiO2 and the relative oxygen affinities of Nb and TiO2.

Influence of the Surfactant on the CdTe Nanomaterials Morphology

2011 ◽  
Vol 287-290 ◽  
pp. 294-297
Author(s):  
Cui Zhi Dong ◽  
Li Fang Zhang ◽  
Xiao Yan Wang ◽  
Ming Xi Zhang ◽  
Zhi Min Cui ◽  
...  
Keyword(s):  
Room Temperature ◽  
Chemical Properties ◽  
Semiconductor Materials ◽  
Alkaline Condition ◽  
Microemulsion System ◽  
X Ray ◽  
Cdte Nanoparticles ◽  
Ctab Concentration ◽  
Transmission Electron ◽  
And Chemical Properties

Because of the good photoelectric learning properties and chemical properties, CdTe nanocrystalline as an important Ⅱ-Ⅵ clan semiconductor materials has been used in LEDs, photonics, in aspects of materials and biomarker and so on. W/O microemulsion method has the peculiarity of tester simpleness, easy manipulation, room temperature react etc. In this paper CdTe nanoparticles was synthesized in CTAB/cyclohexane/isobutanol/water quatemary microemulsion system in alkaline condition and nitrogen. The morphology of the final products were characterized by X-ray power diffraction, transmission electron microscopy. according to the means, this paper researches the effect of surfactant contentration to morphology. The result is that the different morphology can be obtained through the different CTAB concentration. Finally, according to TEM chart, this paper infers the formation mechanism of the CdTe.

A unique pathway of PtNi nanoparticle formation observed with liquid cell transmission electron microscopy

Nanoscale ◽  
2020 ◽  
Vol 12 (3) ◽  
pp. 1414-1418
Author(s):  
Liyun Zheng ◽  
Lixin Zhao ◽  
Songhao Zhao ◽  
Xiaowei Zhang ◽  
Karen C. Bustillo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Chemical Properties ◽  
Controlled Synthesis ◽  
Physical And Chemical Properties ◽  
Nanoparticle Growth ◽  
Transmission Electron ◽  
Liquid Cell ◽  
Physical And Chemical ◽  
Synthesis Of Nanomaterials ◽  
And Chemical Properties

An understanding of nanoparticle growth is significant for controlled synthesis of nanomaterials with desired physical and chemical properties.

Nanolayered Au/Ti/Al Ohmic Contacts to P-Type SiC: Electrical, Morphological and Chemical Properties Depending on the Contact Composition

2007 ◽  
Vol 556-557 ◽  
pp. 725-728 ◽  
Author(s):  
Lilyana Kolaklieva ◽  
Roumen Kakanakov ◽  
Iva Avramova ◽  
Ts. Marinova
Keyword(s):  
Surface Roughness ◽  
Surface Morphology ◽  
Ohmic Contacts ◽  
Annealing Temperature ◽  
Chemical Properties ◽  
Interface Chemistry ◽  
Optimal Annealing Temperature ◽  
P Type ◽  
Contact Resistivities ◽  
And Chemical Properties

Electrical, morphological and chemical properties of nanolayered Au/Ti/Al ohmic contacts with different Ti:Al ratio are investigated. Contact resistivities of 1.42×10-5 ⋅cm2 and 1.21×10-5 ⋅cm2 are achieved for Au/Ti(70)/Al(30) and Au/Ti(30)/Al(70) contacts, respectively. It is found that the Ti:Al ratio does not affect the lowest resistivity value but influences on the optimal annealing temperature at which it is obtained. The different optimal annealing temperature provokes different element distributions and interface chemistry of the annealed contacts. An increase of the Al concentration in the contact composition causes essentially the surface morphology leading to an increase in surface roughness of the as-deposited and annealed contacts.

Mineralogy of volcanically derived alluvial soils at Moshi, Tanzania

Soil Research ◽  
2016 ◽  
Vol 54 (8) ◽  
pp. 926
Author(s):  
T. S. Taylor ◽  
J. C. Hughes ◽  
L. W. Titshall
Keyword(s):  
Electron Microscopy ◽  
Clay Fraction ◽  
Chemical Properties ◽  
Volcanic Glass ◽  
X Ray Diffraction ◽  
Surface Areas ◽  
Transmission Electron ◽  
Physical And Chemical ◽  
Extractable Iron ◽  
And Chemical Properties

Despite intensive commercial agriculture in the rift zone of Tanzania, mineralogical studies on the soils influenced by volcanic parent materials are scarce. A mineralogical investigation of the soils and two buried ash layers from an irrigated sugar estate was undertaken using X-ray diffraction, transmission electron microscopy and measurements of extractable iron, aluminium and silicon and the specific surface area (SSA) of the clay fraction. The dominant mineral in the sand and silt fractions was sanidine. The clay fractions contained mainly high-defect kaolin, illite and K-feldspar, with small amounts of calcite, talc and gibbsite in some samples. Electron microscopy revealed the presence of tubular and spheroidal halloysite and <0.5µm kaolinite crystals, as well as nanocrystalline material, probably allophane, and volcanic glass. The amounts of ferrihydrite (0.34–1.84%) and allophane (0.52–6.84%) were low in the soils but higher in the buried ash layers. The surface areas of the clay fractions were high (up to 145m2g–1) and it was calculated that 5% allophane constituted 22% of the total SSA. Although all soils were dominated by halloysite and small kaolinite particles, it is likely that the small amounts of allophane with high SSA has a strong effect on their physical and chemical properties.

Characterization of Y/TiO2 Nanoparticles and their Reactivity for CO2 Photoreduction

2011 ◽  
Vol 55-57 ◽  
pp. 1506-1510 ◽  
Author(s):  
Jing Wei ◽  
Xin Tan ◽  
Tao Yu ◽  
Lin Zhao
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Chemical Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Uv Illumination ◽  
Transmission Electron ◽  
And Chemical Properties

A series of Y/TiO2nanoparticles (NPs) were synthesized via sol-gel method. The crystal structures, morphologies and chemical properties were characterized using X-ray diffraction (XRD), high resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS). We investigated the effects of different doping amounts of Y on the reaction of CO2photoreduction. The results shown that 0.1 wt.%Y/TiO2(0.1YT) performed the highest photocatalytic activity, which yielded 384.62 µmol/g∙cat. formaldehyde after 6 h of UV illumination.

scholarly journals A Au/CuNiCoS4/p-Si photodiode: electrical and morphological characterization

2021 ◽  
Vol 12 ◽  
pp. 984-994
Author(s):  
Adem Koçyiğit ◽  
Adem Sarılmaz ◽  
Teoman Öztürk ◽  
Faruk Ozel ◽  
Murat Yıldırım
Keyword(s):  
Electron Microscopy ◽  
Interfacial Layer ◽  
High Efficiency ◽  
Series Resistance ◽  
Morphological Characterization ◽  
Shunt Resistance ◽  
X Ray ◽  
Transmission Electron ◽  
Hot Injection ◽  
P Type

In this present work, CuNiCoS4 thiospinel nanocrystals were synthesized by hot injection and characterized by X-ray diffractometry (XRD), high-resolution transmission electron microscopy (HR-TEM), and energy-dispersive X-ray spectroscopy (EDS). The XRD, EDS, and HR-TEM analyses confirmed the successful synthesis of CuNiCoS4. The obtained CuNiCoS4 thiospinel nanocrystals were tested for photodiode and capacitance applications as interfacial layer between Au and p-type Si by measuring I–V and C–V characteristics. The fabricated Au/CuNiCoS4/p-Si device exhibited good rectifying properties, high photoresponse activity, low series resistance, and high shunt resistance. The C–V characteristics revealed that capacitance and conductance of the photodiode are voltage-and frequency-dependent. The fabricated device with CuNiCoS4 thiospinel nanocrystals can be employed in high-efficiency optoelectronic applications.

Electrical, Optical and Ionic Probe inside Transmission Electron Microscope

2013 ◽  
Vol 1525 ◽  
Author(s):  
Xuedong Bai ◽  
Zhi Xu ◽  
Peng Gao ◽  
Kaihui Liu ◽  
Wenlong Wang ◽  
...  
Keyword(s):  
Electrical Transport ◽  
Chemical Properties ◽  
Atomic Scale ◽  
In Situ Tem ◽  
Physical And Chemical Properties ◽  
Transmission Electron ◽  
Tem Method ◽  
Physical And Chemical ◽  
And Chemical Properties

ABSTRACTIn-situ transmission electron microscopy (TEM) method is powerful in a way that it can directly correlate the atomic-scale structure with physical and chemical properties. We will report on the construction and applications of the homemade in-situ TEM electrical and optical holders. Electrical transport of carbon nanotubes and photoconducting response on bending of individual ZnO nanowires have been studied inside TEM. Oxygen vacancy electromigration and its induced resistance switching effect have been probed in CeO2 films.

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