Comparison of surface properties of synthetic and soil struvite

2014 ◽  
Vol 94 (2) ◽  
pp. 169-176
Author(s):  
S. M. Y. Baugé ◽  
L. M. (Les) Lavkulich ◽  
J. E. Wilson ◽  
H. E. Schreier
Keyword(s):  
Surface Layer ◽  
Surface Properties ◽  
Agricultural Soils ◽  
Analytical Techniques ◽  
Additional Species ◽  
X Ray ◽  
Phosphate Mineral ◽  
Intensively Managed ◽  
Secondary Ion ◽  
Phosphorus Chemistry

Baugé, S. M. Y., Lavkulich, L. M., Wilson, J. E. and Schreier, H. E. 2014. Comparison of surface properties of synthetic and soil struvite. Can. J. Soil Sci. 94: 169–176. X-ray, Raman and nuclear magnetic resonance (NMR) analyses of intensively managed agricultural soils in southwestern British Columbia reported the presence of the Mg-phosphate mineral, struvite. Soils are heterogeneous, thus analytical techniques based on single minerals require calibration in order to provide reliable results. A synthetic struvite was used to compare the properties of the soil phosphate with struvite. The results confirmed the presence of struvite and possibly additional species of Mg. Time of flight–secondary ion mass spectroscopy (TOF-SIMS) revealed that the surface of struvite, to 2nm depth, is dominated by Mg with other cations, notably Fe and NH4 that were measured in minor amounts and were associated with the Mg rich surface layer. The results suggest that P is located within the struvite structure. Chemical reactions of struvite and phosphorus chemistry in these soils appear to be governed by the Mg surface layer.

scholarly journals The Corrosion Inhibition of AA6082 Aluminium Alloy by Certain Azoles in Chloride Solution: Electrochemistry and Surface Analysis

Coatings ◽  
2019 ◽  
Vol 9 (6) ◽  
pp. 380 ◽  
Author(s):  
Klodian Xhanari ◽  
Matjaž Finšgar
Keyword(s):  
Surface Layer ◽  
Aluminium Alloy ◽  
Surface Analysis ◽  
Corrosion Inhibition ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Attenuated Total Reflectance ◽  
X Ray ◽  
Inhibition Effect ◽  
Secondary Ion

The corrosion inhibition effect of five azole compounds on the corrosion of an AA6082 aluminium alloy in 5 wt.% NaCl solution at 25 and 50 °C was investigated using weight loss and electrochemical measurements. Only 2-mercaptobenzothiazole (MBT) showed a corrosion inhibition effect at both temperatures and was further studied in detail, including with the addition of potassium iodide as a possible intensifier. Surface analysis of the MBT surface layer was performed by means of attenuated total reflectance Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass spectrometry techniques. The hydrophobicity of the MBT surface layer was also investigated.

scholarly journals Defect structure transformation after thermal annealing in a surface layer of Zn-implanted Si(001) substrates

2013 ◽  
Vol 46 (4) ◽  
pp. 882-886 ◽  
Author(s):  
Kirill Shcherbachev ◽  
Vladimir Privezentsev ◽  
Vaclav Kulikauskas ◽  
Vladimir Zatekin ◽  
Vladimir Saraykin
Keyword(s):  
Surface Layer ◽  
Secondary Ion Mass Spectrometry ◽  
Chemical Interaction ◽  
Structural Transformations ◽  
Rutherford Back Scattering ◽  
X Ray ◽  
Back Scattering ◽  
Heavily Doped ◽  
Zn Ions ◽  
Secondary Ion

A combination of high-resolution X-ray diffractometry, Rutherford back scattering spectroscopy and secondary-ion mass spectrometry (SIMS) methods were used to characterize structural transformations of the damaged layer in Si(001) substrates heavily doped by Zn ions after a multistage thermal treatment. The shape of the SIMS profiles for Zn atoms correlates with the crystal structure of the damaged layer and depends on the presence of the following factors influencing the mobility of Zn atoms: (i) an amorphous/crystalline (a/c) interface, (ii) end-of-range defects, which are located slightly deeper than the a/c interface; (iii) a surface area enriched by Si vacancies; and (iv) the chemical interaction of Zn with Si atoms, which leads to the formation of Zn-containing phases in the surface layer.

The use of x-ray microdiffraction in failure analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1762-1763
Author(s):  
D. M. File ◽  
L. R. Denton ◽  
P. L. Henderson
Keyword(s):  
Failure Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Analytical Techniques ◽  
Degree Of Crystallinity ◽  
Small Samples ◽  
X Ray ◽  
Elemental Analyses ◽  
Quantitative Analyses ◽  
Time Required ◽  
Secondary Ion

X-ray microdiffraction is a tool used at NSWC to perform and support failure analyses. Our failure analysis efforts attempt to determine the primary cause(s) of the failure and to recommend corrective action(s) in a timely manner. The analytical techniques used include Secondary Ion Mass Spectrometry (SIMS), Scanning Electron Microscopy (SEM), Auger Electron Spectroscopy (AES), and Electron Probe MicroAnalysis (EPMA). The addition of x-ray microdiffraction has provided additional capability which supports the elemental analyses, and has often reduced the analysis time required to identify the failure mode.X-ray microdiffraction can provide the following capabilities: 1) qualitative analyses, 2) quantitative analyses, 3) degree of crystallinity, 4) measurement of residual stress, 5) grain or particle size, 6) texture or preferred orientation, and 7) analysis of small samples (∼10 μm to 20 μm diameter). In addition, these analyses can usually be performed in a few minutes to an hour.X-ray microdiffraction has evolved steadily over the past 15 years.

scholarly journals Exploring Manufacturing Process and Degradation Products of Gilt and Painted Leather

2019 ◽  
Vol 9 (15) ◽  
pp. 3016 ◽  
Author(s):  
Morena Iorio ◽  
Valerio Graziani ◽  
Sergio Lins ◽  
Stefano Ridolfi ◽  
Paolo Branchini ◽  
...  
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Degradation Products ◽  
Analytical Techniques ◽  
Attenuated Total Reflectance ◽  
Animal Glue ◽  
Significant Information ◽  
X Ray ◽  
Green Areas ◽  
Secondary Ion ◽  
Potential Use

In this work, we studied the manufacturing processes and the conservation state of gilt and painted leather fragments from Palazzo Chigi in Ariccia (Italy) by using different analytical techniques. Leather fragments present a silver leaf superimposed onto leather support. A gold varnish and different painted layers decorate it all. A top-down analytical approach was used to investigate this complex multilayer structure, which adopted techniques with different sampling depths. Organic and inorganic constitutive materials together with related degradation products were studied by time of flight secondary ion mass spectrometry (ToF-SIMS), attenuated total reflectance-Fourier transform infrared spectroscopy (ATR-FTIR), and macro X-ray fluorescence (MA-XRF). The findings have revealed the presence of different elements and species as calcium and iron in the leather support, which was attributed to the un-hairing process in the leather tanning. Regarding what concerns the silver leaf, where the varnish cracked, silver chlorides, oxides, and sulfides were detected as degradation products of the silver leaf. Proteinaceous compounds were also identified where the silver leaf is unprotected by the varnish. These ion signals reveal a potential use of animal glue on both sides of the silver leaf to promote durable adhesion. In the gold varnish, the surface analysis revealed organic compounds such as resins and oils. In particular, the copresence of linoleic, arachidonic, and lignoceric acid ion signals in the yellow area suggests the use of aloe as a colorant. Lead ions in the same area were detected and attributed to the use of lead as siccative. Blue areas were obtained by using indigo and lead white in addition to an oil binder. This is confirmed by the detection of indigotin, fatty acid, and lead soap ion signals. A copper-based pigment was used to depict the green areas and copper oxalates were identified as its degradation products. Lastly, no significant information about the red colorant was obtained. Colophony is present as a component of the final varnish.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Microchemical imaging in biomedical research

1992 ◽  
Vol 50 (2) ◽  
pp. 1118-1119
Author(s):  
P. Ingram
Keyword(s):  
Data Analysis ◽  
Electron Probe ◽  
The Other ◽  
X Ray ◽  
Cell Element ◽  
Physiological Information ◽  
Functional States ◽  
Elemental Maps ◽  
Electron Energy Loss ◽  
Secondary Ion

It is well established that unique physiological information can be obtained by rapidly freezing cells in various functional states and analyzing the cell element content and distribution by electron probe x-ray microanalysis. (The other techniques of microanalysis that are amenable to imaging, such as electron energy loss spectroscopy, secondary ion mass spectroscopy, particle induced x-ray emission etc., are not addressed in this tutorial.) However, the usual processes of data acquisition are labor intensive and lengthy, requiring that x-ray counts be collected from individually selected regions of each cell in question and that data analysis be performed subsequent to data collection. A judicious combination of quantitative elemental maps and static raster probes adds not only an additional overall perception of what is occurring during a particular biological manipulation or event, but substantially increases data productivity. Recent advances in microcomputer instrumentation and software have made readily feasible the acquisition and processing of digital quantitative x-ray maps of one to several cells.

Imaging of Al-Li-Cu alloys with a Scanning Ion Microprobe

1990 ◽  
Vol 48 (2) ◽  
pp. 314-315
Author(s):  
K.K. Soni ◽  
D.B. Williams ◽  
J.M. Chabala ◽  
R. Levi-Setti ◽  
D.E. Newbury
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Equilibrium Phase ◽  
Icosahedral Symmetry ◽  
Ion Microprobe ◽  
X Ray ◽  
Cu Alloys ◽  
Two Phases ◽  
The University ◽  
Secondary Ion

In contrast to the inability of x-ray microanalysis to detect Li, secondary ion mass spectrometry (SIMS) generates a very strong Li+ signal. The latter’s potential was recently exploited by Williams et al. in the study of binary Al-Li alloys. The present study of Al-Li-Cu was done using the high resolution scanning ion microprobe (SIM) at the University of Chicago (UC). The UC SIM employs a 40 keV, ∼70 nm diameter Ga+ probe extracted from a liquid Ga source, which is scanned over areas smaller than 160×160 μm2 using a 512×512 raster. During this experiment, the sample was held at 2 × 10-8 torr.In the Al-Li-Cu system, two phases of major importance are T1 and T2, with nominal compositions of Al2LiCu and Al6Li3Cu respectively. In commercial alloys, T1 develops a plate-like structure with a thickness <∼2 nm and is therefore inaccessible to conventional microanalytical techniques. T2 is the equilibrium phase with apparent icosahedral symmetry and its presence is undesirable in industrial alloys.

Layered and ion implantation specimens as possible reference materials for the electron-probe microanalysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1652-1653
Author(s):  
G. Remond ◽  
R.H. Packwood ◽  
C. Gilles ◽  
S. Chryssoulis
Keyword(s):  
Ion Implantation ◽  
Reference Materials ◽  
Analytical Techniques ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
X Ray ◽  
Spatially Resolved ◽  
Analytical Expressions ◽  
Original Approach ◽  
Depth Concentration

Merits and limitations of layered and ion implanted specimens as possible reference materials to calibrate spatially resolved analytical techniques are discussed and illustrated for the case of gold analysis in minerals by means of x-ray spectrometry with the EPMA. To overcome the random heterogeneities of minerals, thin film deposition and ion implantation may offer an original approach to the manufacture of controlled concentration/ distribution reference materials for quantification of trace elements with the same matrix as the unknown.In order to evaluate the accuracy of data obtained by EPMA we have compared measured and calculated x-ray intensities for homogeneous and heterogeneous specimens. Au Lα and Au Mα x-ray intensities were recorded at various electron beam energies, and hence at various sampling depths, for gold coated and gold implanted specimens. X-ray intensity calculations are based on the use of analytical expressions for both the depth ionization Φ (ρz) and the depth concentration C (ρz) distributions respectively.

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