scholarly journals OPTIMIZATION OF A COMPTON DIRECT-CHARGE DETECTOR FOR MONITORING HIGH-ENERGY BREMSSTRAHLUNG RADIATION

2019 ◽  
pp. 158-162
Author(s):  
V.I. Nikiforov ◽  
I.N. Shlyakhov ◽  
V.A. Shevchenko ◽  
A.Eh. Tenishev ◽  
V.L. Uvarov
Keyword(s):  
Computer Simulation ◽  
Atomic Number ◽  
Electron Accelerator ◽  
High Energy ◽  
X Rays ◽  
Bremsstrahlung Radiation ◽  
Charge Generation ◽  
Point Energy ◽  
X Ray ◽  
Different Thickness

The conditions of application of a Compton direct-charge detector (DCD) for monitoring of intensity of the highenergy bremsstrahlung (X-ray) radiation are studied. A method is described for calculation of characteristics of the secondary е,Х-radiation at exit of an electron accelerator, and also for providing the conditions of the electronic equilibrium. By means of computer simulation, the processes of charge generation in a DCD monitor comprising two plates of different thickness from various metals are analyzed. On the basis of the obtained results, the requirements imposed on DCD composition for providing the maximum of its sensitivity are formulated. It is shown, that within the suggested DCD geometry, the monitor sensitivity reveals a weak dependence on the atomic number of its material at Z>29, and also on the end-point energy of X-rays in the span of 20…100 MeV.

Application of Tapered Monocapillary in a Laboratory Mxrf Set-Up

1995 ◽  
Vol 39 ◽  
pp. 81-86
Author(s):  
N. Gao ◽  
I. Ponomarev ◽  
Q. F. Xiao ◽  
W. M. Gibson ◽  
D. A. Carpenter
Keyword(s):  
Experimental Work ◽  
High Energy ◽  
X Rays ◽  
Output Beam ◽  
Bremsstrahlung Radiation ◽  
X Ray ◽  
Set Up

Simulation and experimental work that compare the performance of straight and tapered monocapillaries when used with laboratory x-ray sources are reported. Detailed simulations for various taper profiles give several important conclusions for optimizing the design of a tapered monocapillary. Several tapered monocapillaries were prepared. With a 16W x-ray source, beam intensities of 4×105 photon/sec/μm2 and 3×105photon/sec/μm2 of Cu Kα x rays were obtained from the tapered monocapillaries for output diameters of 8μm and 3.5μm, respectively. These intensities are 1.4 and 1.5 times that obtained from straight capillaries with the same output beam sizes at the experimental set-up optimized for a straight capillary. In addition to the gain in x-ray flux, the tapered monocapillaries produce output beams with significantly reduced high energy bremsstrahlung radiation and increased flux stability with respect to shifts of the x-ray source spot.

Influence of Tilt Angle on Hole Count and Secondary Fluorescence in x-ray Microanalysis

1990 ◽  
Vol 48 (2) ◽  
pp. 462-463
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Tilt Angle ◽  
High Energy ◽  
Primary Electron ◽  
Objective Lens ◽  
X Rays ◽  
Bremsstrahlung Radiation ◽  
X Ray ◽  
Backscattered Electrons ◽  
The Magnetic Field ◽  
Secondary Fluorescence

The spatial resolution and accuracy of X-ray microanalysis in an analytical electron microscope (AEM) are limited by a variety of factors, two of which are the hole count and secondary fluorescence. The hole count arises from uncollimated radiation, either electrons or X rays, which excites areas of the specimen other than that excited by the primary electron beam. This can result in X-ray generation even when the probe does not hit the specimen; hence the name hole count. Secondary fluorescence deals with X-ray generation resulting from radiation produced by the interaction of the incident probe with the specimen. This radiation may be either backscattered electrons spiraling in the magnetic field of the objective lens or high energy X rays, particularly forward-peaked bremsstrahlung radiation. As the interaction of both the uncollimated radiation and the secondary radiation with the specimen can be influenced by the tilt angle of the specimen, the variation of the hole count and secondary fluorescence with specimen tilt was investigated.

scholarly journals Novel Zeff imaging method for deep internal areas using back-scattered X-rays

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Akio Yoneyama ◽  
Masahide Kawamoto ◽  
Rika Baba
Keyword(s):  
Atomic Number ◽  
Effective Atomic Number ◽  
Chemical Properties ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Single Element ◽  
Imaging Method ◽  
X Rays ◽  
Front Side ◽  
X Ray

AbstractElemental kinds, composition ratios, effective atomic number (Zeff), and spatial distributions are the most basic information on materials and determine the physical and chemical properties of materials. X-ray fluorescence analysis have conventionally been used for elemental mapping, however maps on deep internal areas cannot be obtained because the escape depth of fluorescence X-rays is limited to a few mm from the surface of samples. Herein, we present a novel Zeff imaging method that uses back-scattered X-rays. The intensity ratio of elastic and inelastic back-scattered X-rays depends on the atomic number (Z) of a single-element sample (Zeff for a plural-element sample), and so Zeff maps in deep areas can be obtained by spectrum analysis of the scattered high-energy incident X-rays. We demonstrated the feasibility of observing a phantom covered by an aluminum plate by using synchrotron radiation X-ray. A fine Zeff map that can be used to identify materials was obtained from only front-side observation. The novel method opens up a new way for Zeff mapping of deep areas of thick samples from front-side observation.

scholarly journals Vertical intensity modulation for improved radiographic penetration and reduced exclusion zone

2016 ◽  
Vol 44 ◽  
pp. 1660213 ◽  
Author(s):  
J. Bendahan ◽  
W.G.J. Langeveld ◽  
V. Bharadwaj ◽  
J. Amann ◽  
C. Limborg ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Energy ◽  
Dual Energy ◽  
X Rays ◽  
Exclusion Zone ◽  
Bremsstrahlung Radiation ◽  
Radiographic Images ◽  
Power Sources ◽  
X Ray ◽  
Energy Beam

In the present work, a method to direct the X-ray beam in real time to the desired locations in the cargo to increase penetration and reduce exclusion zone is presented. Cargo scanners employ high energy X-rays to produce radiographic images of the cargo. Most new scanners employ dual-energy to produce, in addition to attenuation maps, atomic number information in order to facilitate the detection of contraband. The electron beam producing the bremsstrahlung X-ray beam is usually directed approximately to the center of the container, concentrating the highest X-ray intensity to that area. Other parts of the container are exposed to lower radiation levels due to the large drop-off of the bremsstrahlung radiation intensity as a function of angle, especially for high energies (>6 MV). This results in lower penetration in these areas, requiring higher power sources that increase the dose and exclusion zone. The capability to modulate the X-ray source intensity on a pulse-by-pulse basis to deliver only as much radiation as required to the cargo has been reported previously. This method is, however, controlled by the most attenuating part of the inspected slice, resulting in excessive radiation to other areas of the cargo. A method to direct a dual-energy beam has been developed to provide a more precisely controlled level of required radiation to highly attenuating areas. The present method is based on steering the dual-energy electron beam using magnetic components on a pulse-to-pulse basis to a fixed location on the X-ray production target, but incident at different angles so as to direct the maximum intensity of the produced bremsstrahlung to the desired locations. The details of the technique and subsystem and simulation results are presented.

The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

1985 ◽  
Vol 43 ◽  
pp. 154-157
Author(s):  
A.J. Tousimis
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Sample Surface ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
Electrons And Ions ◽  
Spatial Depth ◽  
Minimum Surface Area ◽  
Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

scholarly journals An investigation into the existence of zero-point energy in the Rock-Salt Lattice by an X-Ray Diffraction Method

1928 ◽  
Vol 118 (779) ◽  
pp. 334-350 ◽  
Keyword(s):  
Rock Salt ◽  
Diffraction Method ◽  
Zero Point ◽  
Temperature Factor ◽  
X Rays ◽  
Zero Point Energy ◽  
Chlorine Atoms ◽  
Point Energy ◽  
X Ray ◽  
State Of Rest

In the present paper we shall attempt to collate the results of four separate lines of research which, taken together, appear to provide some interesting checks between theory and experiment. The investigations to be considered are (1) the discussion by Waller* and by Wentzel,† on the basis of the quantum (wave) mechanics, of the scattering of radiation by an atom ; (2) the calculation by Hartree of the Schrödinger distribution of charge in the atoms of chlorine and sodium ; (3) the measurements of James and Miss Firth‡ of the scattering power of the sodium and chlorine atoms in the rock-salt crystal for X-rays at a series of temperatures extending as low as the temperature of liquid air ; and (4) the theoretical discussion of the temperature factor of X-ray reflexion by Debye§ and by Waller.∥ Application of the laws of scattering to the distribution of charge calculated for the sodium and chlorine atoms, enables us to calculate the coherent atomic scattering for X-radiation, as a function of the angle of scattering and of the wave-length, for these atoms in a state of rest, assuming that the frequency of the X-radiation is higher than, and not too near the frequency of the K - absorption edge for the atom.¶ From the observed scattering power at the temperature of liquid air, and from the measured value of the temperature factor, we can, by applying the theory of the temperature effect, calculate the scattering power at the absolute zero, or rather for the atom reduced to a state of rest. The extrapolation to a state of rest will differ according to whether we assume the existence or absence of zero point energy in the crystal lattice. Hence we may hope, in the first place to test the agreement between the observed scattering power and that calculated from the atomic model, and in the second place to see whether the experimental results indicate the presence of zero-point energy or no.

A multi-length-scale USAXS/SAXS facility: 10–50 keV small-angle X-ray scattering instrument

2013 ◽  
Vol 46 (5) ◽  
pp. 1508-1512 ◽  
Author(s):  
Byron Freelon ◽  
Kamlesh Suthar ◽  
Jan Ilavsky
Keyword(s):  
Small Angle ◽  
Soft Matter ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Wide Range ◽  
And Performance ◽  
New Facility ◽  
Ray Scattering

Coupling small-angle X-ray scattering (SAXS) and ultra-small-angle X-ray scattering (USAXS) provides a powerful system of techniques for determining the structural organization of nanostructured materials that exhibit a wide range of characteristic length scales. A new facility that combines high-energy (HE) SAXS and USAXS has been developed at the Advanced Photon Source (APS). The application of X-rays across a range of energies, from 10 to 50 keV, offers opportunities to probe structural behavior at the nano- and microscale. An X-ray setup that can characterize both soft matter or hard matter and high-Zsamples in the solid or solution forms is described. Recent upgrades to the Sector 15ID beamline allow an extension of the X-ray energy range and improved beam intensity. The function and performance of the dedicated USAXS/HE-SAXS ChemMatCARS-APS facility is described.

A high-energy triple-axis X-ray diffractometer for the study of the structure of bulk crystals

2004 ◽  
Vol 37 (6) ◽  
pp. 901-910 ◽  
Author(s):  
C. Seitz ◽  
M. Weisser ◽  
M. Gomm ◽  
R. Hock ◽  
A. Magerl
Keyword(s):  
High Energy ◽  
X Rays ◽  
Bulk Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Intensity ◽  
High Penetration ◽  
Massive Sample ◽  
Laue Geometry ◽  
The Ideal

A triple-axis diffractometer for high-energy X-ray diffraction is described. A 450 kV/4.5 kW stationary tungsten X-ray tube serves as the X-ray source. Normally, 220 reflections of thermally annealed Czochralski Si are employed for the monochromator and analyser. Their integrated reflectivity is about ten times higher than the ideal crystal value. With the same material as the sample, and working with the WKα line at 60 keV in symmetric Laue geometry for all axes, the full width at half-maximum (FWHM) values for the longitudinal and transversal resolution are 2.5 × 10−3and 1.1 × 10−4for ΔQ/Q, respectively, and the peak intensity for a non-dispersive setting is 3000 counts s−1. In particular, for a double-axis mode, an energy well above 100 keV from theBremsstrahlungspectrum can be used readily. High-energy X-rays are distinguished by a high penetration power and materials of several centimetre thickness can be analysed. The feasibility of performing experiments with massive sample environments is demonstrated.

scholarly journals The sensitivity of atomic analysis by X-rays

1932 ◽  
Vol 135 (828) ◽  
pp. 637-656 ◽  
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
High Sensitivity ◽  
Major Constituent ◽  
X Rays ◽  
Depth Of Penetration ◽  
X Ray ◽  
Constituent Element ◽  
The Difference ◽  
Atomic Analysis

In a previous paper it was shown that 0·0007 per cent, of 29 Cu and 0·0003 per cent, of 26 Fe could be detected in 30 Zn by atomic analysis by X-ray spectroscopy. This sensitivity is greater than that which was claimed by Noddack, Tacke, and Berg, who set the limit at about 0·1 per cent, for non-metals, and by Hevesy, who stated it to be about 0·01 per cent, for an element present in an alloy. It was later suggested by Hevesy that the high value of the sensitivity which we found might result from the fact that some of the alloys we had used were composed of elements of almost equal atomic number, and that the sensitivity would be smaller for a constituent of low atomic number mixed with a major constituent of high atomic number. To elucidate these disagreements we have made further observations of the sensitivity with elements of different atomic number and have investigated the conditions which can influence the sensitivity. The Factors Determining Sensitivity . The detection of one element in a mixture of elements depends upon the identification of its K or L lines in the general spectrum emitted by the mixture under examination. The intensity with which these lines are excited in the target (“excited intensity”) is proportional to the number of atoms of the constituent element excited, i. e ., to its concentration and to the volume of the target in which the cathode ray energy is absorbed. The depth of penetration of the cathode rays is determined by the density of the target material and by their velocity ( i. e ., by the voltage applied to the X-ray tube). Schonland has shown that the range of homogeneous cathode rays in different elements, expressed as a mass per unit area, is approximately constant and is independent of the atomic number of the absorbing element. When their velocity is increased, the cathode rays will penetrate to a greater depth, and therefore a greater number of atoms of all constituents will be ionised. This will increase the “excited intensity” of the lines due to the particular constituent sought equally with those lines of the other elements present. The intensity of a line further depends upon the difference between the voltage applied to the X-ray tube and that necessary to excite the series. For these reasons, a high applied voltage is required for a high sensitivity.

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