Application of Tapered Monocapillary in a Laboratory Mxrf Set-Up

1995 ◽  
Vol 39 ◽  
pp. 81-86
Author(s):  
N. Gao ◽  
I. Ponomarev ◽  
Q. F. Xiao ◽  
W. M. Gibson ◽  
D. A. Carpenter
Keyword(s):  
Experimental Work ◽  
High Energy ◽  
X Rays ◽  
Output Beam ◽  
Bremsstrahlung Radiation ◽  
X Ray ◽  
Set Up

Simulation and experimental work that compare the performance of straight and tapered monocapillaries when used with laboratory x-ray sources are reported. Detailed simulations for various taper profiles give several important conclusions for optimizing the design of a tapered monocapillary. Several tapered monocapillaries were prepared. With a 16W x-ray source, beam intensities of 4×105 photon/sec/μm2 and 3×105photon/sec/μm2 of Cu Kα x rays were obtained from the tapered monocapillaries for output diameters of 8μm and 3.5μm, respectively. These intensities are 1.4 and 1.5 times that obtained from straight capillaries with the same output beam sizes at the experimental set-up optimized for a straight capillary. In addition to the gain in x-ray flux, the tapered monocapillaries produce output beams with significantly reduced high energy bremsstrahlung radiation and increased flux stability with respect to shifts of the x-ray source spot.

Influence of Tilt Angle on Hole Count and Secondary Fluorescence in x-ray Microanalysis

1990 ◽  
Vol 48 (2) ◽  
pp. 462-463
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Tilt Angle ◽  
High Energy ◽  
Primary Electron ◽  
Objective Lens ◽  
X Rays ◽  
Bremsstrahlung Radiation ◽  
X Ray ◽  
Backscattered Electrons ◽  
The Magnetic Field ◽  
Secondary Fluorescence

The spatial resolution and accuracy of X-ray microanalysis in an analytical electron microscope (AEM) are limited by a variety of factors, two of which are the hole count and secondary fluorescence. The hole count arises from uncollimated radiation, either electrons or X rays, which excites areas of the specimen other than that excited by the primary electron beam. This can result in X-ray generation even when the probe does not hit the specimen; hence the name hole count. Secondary fluorescence deals with X-ray generation resulting from radiation produced by the interaction of the incident probe with the specimen. This radiation may be either backscattered electrons spiraling in the magnetic field of the objective lens or high energy X rays, particularly forward-peaked bremsstrahlung radiation. As the interaction of both the uncollimated radiation and the secondary radiation with the specimen can be influenced by the tilt angle of the specimen, the variation of the hole count and secondary fluorescence with specimen tilt was investigated.

scholarly journals OPTIMIZATION OF A COMPTON DIRECT-CHARGE DETECTOR FOR MONITORING HIGH-ENERGY BREMSSTRAHLUNG RADIATION

2019 ◽  
pp. 158-162
Author(s):  
V.I. Nikiforov ◽  
I.N. Shlyakhov ◽  
V.A. Shevchenko ◽  
A.Eh. Tenishev ◽  
V.L. Uvarov
Keyword(s):  
Computer Simulation ◽  
Atomic Number ◽  
Electron Accelerator ◽  
High Energy ◽  
X Rays ◽  
Bremsstrahlung Radiation ◽  
Charge Generation ◽  
Point Energy ◽  
X Ray ◽  
Different Thickness

The conditions of application of a Compton direct-charge detector (DCD) for monitoring of intensity of the highenergy bremsstrahlung (X-ray) radiation are studied. A method is described for calculation of characteristics of the secondary е,Х-radiation at exit of an electron accelerator, and also for providing the conditions of the electronic equilibrium. By means of computer simulation, the processes of charge generation in a DCD monitor comprising two plates of different thickness from various metals are analyzed. On the basis of the obtained results, the requirements imposed on DCD composition for providing the maximum of its sensitivity are formulated. It is shown, that within the suggested DCD geometry, the monitor sensitivity reveals a weak dependence on the atomic number of its material at Z>29, and also on the end-point energy of X-rays in the span of 20…100 MeV.

scholarly journals Vertical intensity modulation for improved radiographic penetration and reduced exclusion zone

2016 ◽  
Vol 44 ◽  
pp. 1660213 ◽  
Author(s):  
J. Bendahan ◽  
W.G.J. Langeveld ◽  
V. Bharadwaj ◽  
J. Amann ◽  
C. Limborg ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Energy ◽  
Dual Energy ◽  
X Rays ◽  
Exclusion Zone ◽  
Bremsstrahlung Radiation ◽  
Radiographic Images ◽  
Power Sources ◽  
X Ray ◽  
Energy Beam

In the present work, a method to direct the X-ray beam in real time to the desired locations in the cargo to increase penetration and reduce exclusion zone is presented. Cargo scanners employ high energy X-rays to produce radiographic images of the cargo. Most new scanners employ dual-energy to produce, in addition to attenuation maps, atomic number information in order to facilitate the detection of contraband. The electron beam producing the bremsstrahlung X-ray beam is usually directed approximately to the center of the container, concentrating the highest X-ray intensity to that area. Other parts of the container are exposed to lower radiation levels due to the large drop-off of the bremsstrahlung radiation intensity as a function of angle, especially for high energies (>6 MV). This results in lower penetration in these areas, requiring higher power sources that increase the dose and exclusion zone. The capability to modulate the X-ray source intensity on a pulse-by-pulse basis to deliver only as much radiation as required to the cargo has been reported previously. This method is, however, controlled by the most attenuating part of the inspected slice, resulting in excessive radiation to other areas of the cargo. A method to direct a dual-energy beam has been developed to provide a more precisely controlled level of required radiation to highly attenuating areas. The present method is based on steering the dual-energy electron beam using magnetic components on a pulse-to-pulse basis to a fixed location on the X-ray production target, but incident at different angles so as to direct the maximum intensity of the produced bremsstrahlung to the desired locations. The details of the technique and subsystem and simulation results are presented.

The Energy Flow of X-Rays in Germanium Single Crystals

1973 ◽  
Vol 28 (5) ◽  
pp. 577-580
Author(s):  
L. Gerward
Keyword(s):  
Absorption Edge ◽  
Energy Flow ◽  
High Energy ◽  
Low Energy ◽  
X Rays ◽  
Angular Divergence ◽  
Wave Fields ◽  
X Ray ◽  
Set Up ◽  
Energy Side

The energy flow of the X-ray wave fields set up by diffraction in a germanium single crystal has been studied by shadow sharpness measurements. The shadow has been produced by an absorbing wire close to the X-ray entrance surface of the crystal. Intensity profiles have been observed in the wavelength range from 1.541 Å to 0.709 Å, including the K absorption edge of germanium at 1.117 Å. It is shown that the angular divergence of the energy flow is almost independent of the wavelength on each side of the absorption edge. The angular divergence is considerably reduced when passing the absorption edge from the low-energy side to the high-energy side, the thickness of the crystal being kept constant.

The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

1985 ◽  
Vol 43 ◽  
pp. 154-157
Author(s):  
A.J. Tousimis
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Sample Surface ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
Electrons And Ions ◽  
Spatial Depth ◽  
Minimum Surface Area ◽  
Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

scholarly journals More than XRF Mapping: STEAM (Statistically Tailored Elemental Angle Mapper) a Pioneering Analysis Protocol for Pigment Studies

2021 ◽  
Vol 11 (4) ◽  
pp. 1446
Author(s):  
Jacopo Orsilli ◽  
Anna Galli ◽  
Letizia Bonizzoni ◽  
Michele Caccia
Keyword(s):  
Cultural Heritage ◽  
Element Distribution ◽  
Elemental Distribution ◽  
X Rays ◽  
Spectral Angle Mapper ◽  
X Ray ◽  
Fluorescence Radiation ◽  
Set Up ◽  
Non Destructive ◽  
Analysis Protocol

Among the possible variants of X-Ray Fluorescence (XRF), applications exploiting scanning Macro-XRF (MA-XRF) are lately widespread as they allow the visualization of the element distribution maintaining a non-destructive approach. The surface is scanned with a focused or collimated X-ray beam of millimeters or less: analyzing the emitted fluorescence radiation, also elements present below the surface contribute to the elemental distribution image obtained, due to the penetrative nature of X-rays. The importance of this method in the investigation of historical paintings is so obvious—as the elemental distribution obtained can reveal hidden sub-surface layers, including changes made by the artist, or restorations, without any damage to the object—that recently specific international conferences have been held. The present paper summarizes the advantages and limitations of using MA-XRF considering it as an imaging technique, in synergy with other hyperspectral methods, or combining it with spot investigations. The most recent applications in the cultural Heritage field are taken into account, demonstrating how obtained 2D-XRF maps can be of great help in the diagnostic applied on Cultural Heritage materials. Moreover, a pioneering analysis protocol based on the Spectral Angle Mapper (SAM) algorithm is presented, unifying the MA-XRF standard approach with punctual XRF, exploiting information from the mapped area as a database to extend the comprehension to data outside the scanned region, and working independently from the acquisition set-up. Experimental application on some reference pigment layers and a painting by Giotto are presented as validation of the proposed method.

A multi-length-scale USAXS/SAXS facility: 10–50 keV small-angle X-ray scattering instrument

2013 ◽  
Vol 46 (5) ◽  
pp. 1508-1512 ◽  
Author(s):  
Byron Freelon ◽  
Kamlesh Suthar ◽  
Jan Ilavsky
Keyword(s):  
Small Angle ◽  
Soft Matter ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Wide Range ◽  
And Performance ◽  
New Facility ◽  
Ray Scattering

Coupling small-angle X-ray scattering (SAXS) and ultra-small-angle X-ray scattering (USAXS) provides a powerful system of techniques for determining the structural organization of nanostructured materials that exhibit a wide range of characteristic length scales. A new facility that combines high-energy (HE) SAXS and USAXS has been developed at the Advanced Photon Source (APS). The application of X-rays across a range of energies, from 10 to 50 keV, offers opportunities to probe structural behavior at the nano- and microscale. An X-ray setup that can characterize both soft matter or hard matter and high-Zsamples in the solid or solution forms is described. Recent upgrades to the Sector 15ID beamline allow an extension of the X-ray energy range and improved beam intensity. The function and performance of the dedicated USAXS/HE-SAXS ChemMatCARS-APS facility is described.

A high-energy triple-axis X-ray diffractometer for the study of the structure of bulk crystals

2004 ◽  
Vol 37 (6) ◽  
pp. 901-910 ◽  
Author(s):  
C. Seitz ◽  
M. Weisser ◽  
M. Gomm ◽  
R. Hock ◽  
A. Magerl
Keyword(s):  
High Energy ◽  
X Rays ◽  
Bulk Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Intensity ◽  
High Penetration ◽  
Massive Sample ◽  
Laue Geometry ◽  
The Ideal

A triple-axis diffractometer for high-energy X-ray diffraction is described. A 450 kV/4.5 kW stationary tungsten X-ray tube serves as the X-ray source. Normally, 220 reflections of thermally annealed Czochralski Si are employed for the monochromator and analyser. Their integrated reflectivity is about ten times higher than the ideal crystal value. With the same material as the sample, and working with the WKα line at 60 keV in symmetric Laue geometry for all axes, the full width at half-maximum (FWHM) values for the longitudinal and transversal resolution are 2.5 × 10−3and 1.1 × 10−4for ΔQ/Q, respectively, and the peak intensity for a non-dispersive setting is 3000 counts s−1. In particular, for a double-axis mode, an energy well above 100 keV from theBremsstrahlungspectrum can be used readily. High-energy X-rays are distinguished by a high penetration power and materials of several centimetre thickness can be analysed. The feasibility of performing experiments with massive sample environments is demonstrated.

scholarly journals Nanofocusing Optics for an X-Ray Free-Electron Laser Generating an Extreme Intensity of 100 EW/cm2 Using Total Reflection Mirrors

2020 ◽  
Vol 10 (7) ◽  
pp. 2611
Author(s):  
Hirokatsu Yumoto ◽  
Yuichi Inubushi ◽  
Taito Osaka ◽  
Ichiro Inoue ◽  
Takahisa Koyama ◽  
...  
Keyword(s):  
Photon Energy ◽  
Pulse Energy ◽  
Free Electron ◽  
Free Electron Laser ◽  
Total Reflection ◽  
Experimental Chamber ◽  
X Rays ◽  
X Ray ◽  
Set Up ◽  
Focused Beam

A nanofocusing optical system—referred to as 100 exa—for an X-ray free-electron laser (XFEL) was developed to generate an extremely high intensity of 100 EW/cm2 (1020 W/cm2) using total reflection mirrors. The system is based on Kirkpatrick-Baez geometry, with 250-mm-long elliptically figured mirrors optimized for the SPring-8 Angstrom Compact Free-Electron Laser (SACLA) XFEL facility. The nano-precision surface employed is coated with rhodium and offers a high reflectivity of 80%, with a photon energy of up to 12 keV, under total reflection conditions. Incident X-rays on the optics are reflected with a large spatial acceptance of over 900 μm. The focused beam is 210 nm × 120 nm (full width at half maximum) and was evaluated at a photon energy of 10 keV. The optics developed for 100 exa efficiently achieved an intensity of 1 × 1020 W/cm2 with a pulse duration of 7 fs and a pulse energy of 150 μJ (25% of the pulse energy generated at the light source). The experimental chamber, which can provide different stage arrangements and sample conditions, including vacuum environments and atmospheric-pressure helium, was set up with the focusing optics to meet the experimental requirements.

scholarly journals X-ray spectra and light curves of cooling novae and a nova like

2020 ◽  
Vol 499 (2) ◽  
pp. 3006-3018
Author(s):  
Bangzheng Sun ◽  
Marina Orio ◽  
Andrej Dobrotka ◽  
Gerardo Juan Manuel Luna ◽  
Sergey Shugarov ◽  
...  
Keyword(s):  
Light Curve ◽  
Accretion Rate ◽  
High Energy ◽  
Gravitational Energy ◽  
Light Curves ◽  
Clear Correlation ◽  
X Rays ◽  
High State ◽  
X Ray ◽  
Low X

ABSTRACT We present X-ray observations of novae V2491 Cyg and KT Eri about 9 yr post-outburst of the dwarf nova and post-nova candidate EY Cyg, and of a VY Scl variable. The first three objects were observed with XMM–Newton, KT Eri also with the Chandra ACIS-S camera, V794 Aql with the Chandra ACIS-S camera and High Energy Transmission Gratings. The two recent novae, similar in outburst amplitude and light curve, appear very different at quiescence. Assuming half of the gravitational energy is irradiated in X-rays, V2491 Cyg is accreting at $\dot{m}=1.4\times 10^{-9}{\!-\!}10^{-8}\,{\rm M}_\odot \,{\rm yr}^{-1}$, while for KT Eri, $\dot{m}\lt 2\times 10^{-10}{\rm M}_\odot \,{\rm yr}$. V2491 Cyg shows signatures of a magnetized WD, specifically of an intermediate polar. A periodicity of  39 min, detected in outburst, was still measured and is likely due to WD rotation. EY Cyg is accreting at $\dot{m}\sim 1.8\times 10^{-11}{\rm M}_\odot \,{\rm yr}^{-1}$, one magnitude lower than KT Eri, consistently with its U Gem outburst behaviour and its quiescent UV flux. The X-rays are modulated with the orbital period, despite the system’s low inclination, probably due to the X-ray flux of the secondary. A period of  81 min is also detected, suggesting that it may also be an intermediate polar. V794 Aql had low X-ray luminosity during an optically high state, about the same level as in a recent optically low state. Thus, we find no clear correlation between optical and X-ray luminosity: the accretion rate seems unstable and variable. The very hard X-ray spectrum indicates a massive WD.

Sign in / Sign up

Export Citation Format

Share Document