Glue Voids Reduction on QFN Device through Material and Process Improvement
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The paper is focused on the glue voids reduction on critical semiconductor quad-flat no-leads (QFN) device processed on a stencil printing type of die attach machine. Process optimization through material preparation improvement was done to mitigate the silver lumps of the sintering glue which is a main contributor on the voids occurrence. Eventually, the glue voids were reduced to less than the allowed 5% limit. For future works, the learnings and configuration could be used on devices with similar requirement.
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2016 ◽
Vol 32
(2)
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pp. 172-177
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2019 ◽
Vol 528
◽
pp. 012005
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