A study on the effects of electrical and thermal stresses on void formation and migration lifetime of Sn3.0Ag0.5Cu solder joints

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Yanruoyue Li ◽  
Guicui Fu ◽  
Bo Wan ◽  
Zhaoxi Wu ◽  
Xiaojun Yan ◽  
...  
Keyword(s):  
Solder Joint ◽  
Thermal Stresses ◽  
Solder Joints ◽  
Void Formation ◽  
Model Parameters ◽  
Time To Failure ◽  
Current Crowding ◽  
Theoretical Derivation ◽  
Content Type ◽  
And Migration

Purpose The purpose of this study is to investigate the effect of electrical and thermal stresses on the void formation of the Sn3.0Ag0.5Cu (SAC305) lead-free ball grid array (BGA) solder joints and to propose a modified mean-time-to-failure (MTTF) equation when joints are subjected to coupling stress. Design/methodology/approach The samples of the BGA package were subjected to a migration test at different currents and temperatures. Voltage variation was recorded for analysis. Scanning electron microscope and electron back-scattered diffraction were applied to achieve the micromorphological observations. Additionally, the experimental and simulation results were combined to fit the modified model parameters. Findings Voids appeared at the corner of the cathode. The resistance of the daisy chain increased. Two stages of resistance variation were confirmed. The crystal lattice orientation rotated and became consistent and ordered. Electrical and thermal stresses had an impact on the void formation. As the current density and temperature increased, the void increased. The lifetime of the solder joint decreased as the electrical and thermal stresses increased. A modified MTTF model was proposed and its parameters were confirmed by theoretical derivation and test data fitting. Originality/value This study focuses on the effects of coupling stress on the void formation of the SAC305 BGA solder joint. The microstructure and macroscopic performance were studied to identify the effects of different stresses with the use of a variety of analytical methods. The modified MTTF model was constructed for application to SAC305 BGA solder joints. It was found suitable for larger current densities and larger influences of Joule heating and for the welding ball structure with current crowding.

Microstructural and compositional evolution of SAC305/TiN composite solder under thermal stressing

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Guang Chen ◽  
Yao-Feng Wu
Keyword(s):  
Temperature Gradient ◽  
Solder Joint ◽  
Internal Structure ◽  
Composite Solder ◽  
Solder Joints ◽  
Lead Free ◽  
Large Temperature ◽  
Composite Solder Joint ◽  
Content Type ◽  
And Migration

Purpose The purpose of this paper is to investigate the effect of titanium nitride (TiN) on microstructure and composition of 96.5Sn3Ag0.5Cu (SAC305) lead-free solder joints under a large temperature gradient. Design/methodology/approach In this paper, SAC305 lead-free composite solder containing 0.05 Wt.% TiN was prepared by powder metallurgy method. A temperature gradient generator was designed and the corresponding samples were also prepared. The microstructural evolution, internal structure and elemental content of SAC305 and SAC305/TiN solder joints before and after thermal loading were comparatively studied. Findings The experimental results show that the addition of the TiN reinforcing phase can effectively inhibit the diffusion and migration of copper atoms and, therefore, affect the distribution of newly formed Cu-Sn IMC in solder joints under the condition of thermal migration (TM). Compared with the SAC305 solder joint, the interconnection interface and internal structure of the composite solder joint after 600 h of TM are also relatively complete. Originality/value The TiN reinforcing phase is proven effective to mitigate the TM behavior in solder joints under thermal stressing. Specifically, based on the observation and analysis results of microstructure and internal structure of composite solder joint, the TiN particle can change the temperature gradient distribution of the solder joint, so as to suppress the diffusion and migration of Sn and Cu atoms. In addition, the results of Micro-CT and compositional analysis also indicate that the addition of TiN reinforcement is very helpful to maintain the structural integrity and the compositional stability of the solder joint. Different from other ceramic reinforcements, TiN has good thermo- and electro-conductivity and the thermal-electrical performance of composite solder will not be significantly affected by this reinforcement, which is also the main advantage of selecting TiN as the reinforcing phase to prepare composite solder. This study can not only provide preliminary experimental support for the preparation of high reliability lead-free composite solder but also provide a theoretical basis for the subsequent study (such as electro-thermo distribution in solder joints), which has important application significance.

Effect of intermetallic compound layer thickness on the shear strength of 1206 chip resistor solder joint

2015 ◽  
Vol 27 (1) ◽  
pp. 52-58 ◽  
Author(s):  
Peter K. Bernasko ◽  
Sabuj Mallik ◽  
G. Takyi
Keyword(s):  
Shear Strength ◽  
Intermetallic Compound ◽  
Solder Joint ◽  
Layer Thickness ◽  
Solder Joints ◽  
Ageing Time ◽  
Circuit Board ◽  
Intermetallic Compound Layer ◽  
Content Type ◽  
Surface Mount

Purpose – The purpose of this paper is to study the effect of intermetallic compound (IMC) layer thickness on the shear strength of surface-mount component 1206 chip resistor solder joints. Design/methodology/approach – To evaluate the shear strength and IMC thickness of the 1206 chip resistor solder joints, the test vehicles were conventionally reflowed for 480 seconds at a peak temperature of 240°C at different isothermal ageing times of 100, 200 and 300 hours. A cross-sectional study was conducted on the reflowed and aged 1206 chip resistor solder joints. The shear strength of the solder joints aged at 100, 200 and 300 hours was measured using a shear tester (Dage-4000PXY bond tester). Findings – It was found that the growth of IMC layer thickness increases as the ageing time increases at a constant temperature of 175°C, which resulted in a reduction of solder joint strength due to its brittle nature. It was also found that the shear strength of the reflowed 1206 chip resistor solder joint was higher than the aged joints. Moreover, it was revealed that the shear strength of the 1206 resistor solder joints aged at 100, 200 and 300 hours was influenced by the ageing reaction times. The results also indicate that an increase in ageing time and temperature does not have much influence on the formation and growth of Kirkendall voids. Research limitations/implications – A proper correlation between shear strength and fracture mode is required. Practical implications – The IMC thickness can be used to predict the shear strength of the component/printed circuit board pad solder joint. Originality/value – The shear strength of the 1206 chip resistor solder joint is a function of ageing time and temperature (°C). Therefore, it is vital to consider the shear strength of the surface-mount chip component in high-temperature electronics.

Effects of Fe on the Kirkendall Void Formation of Sn-3.5Ag-xFe/Cu Solder Joints

2010 ◽  
Vol 2010 (1) ◽  
pp. 000294-000297 ◽  
Author(s):  
S. H. Kim ◽  
Jin Yu
Keyword(s):  
Solder Joint ◽  
Solder Joints ◽  
Void Formation ◽  
Kirkendall Void ◽  
Fe Content ◽  
Kirkendall Voids

Ternary Sn-3.5Ag-xFe solders with varying amount of Fe; 0.1, 0.5, 1.0, and 2.0 wt. % were reacted with Cu UBM which was electroplated using SPS additive and characteristics of Kirkendall void formation at the solder joints were investigated. Results indicate that the propensity to form Kirkendall voids at the solder joint decreased with the Fe content. It showed that Fe dissolved in the Cu UBM and reduced the segregation of S atoms to the Cu3Sn/Cu interface, which suppressed the nucleation of Kirkendall voids at the interface.

SAC–xTiO2 nano-reinforced lead-free solder joint characterizations in ultra-fine package assembly

2018 ◽  
Vol 30 (1) ◽  
pp. 1-13 ◽  
Author(s):  
Fakhrozi Che Ani ◽  
Azman Jalar ◽  
Abdullah Aziz Saad ◽  
Chu Yee Khor ◽  
Roslina Ismail ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Solder Joint ◽  
Solder Joints ◽  
Ion Beam ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Paste ◽  
Content Type ◽  
X Ray ◽  
Free Solder

Purpose This paper aims to investigate the characteristics of ultra-fine lead-free solder joints reinforced with TiO2 nanoparticles in an electronic assembly. Design/methodology/approach This study focused on the microstructure and quality of solder joints. Various percentages of TiO2 nanoparticles were mixed with a lead-free Sn-3.5Ag-0.7Cu solder paste. This new form of nano-reinforced lead-free solder paste was used to assemble a miniature package consisting of an ultra-fine capacitor on a printed circuit board by means of a reflow soldering process. The microstructure and the fillet height were investigated using a focused ion beam, a high-resolution transmission electron microscope system equipped with an energy dispersive X-ray spectrometer (EDS), and a field emission scanning electron microscope coupled with an EDS and X-ray diffraction machine. Findings The experimental results revealed that the intermetallic compound with the lowest thickness was produced by the nano-reinforced solder with a TiO2 content of 0.05 Wt.%. Increasing the TiO2 content to 0.15 Wt.% led to an improvement in the fillet height. The characteristics of the solder joint fulfilled the reliability requirements of the IPC standards. Practical implications This study provides engineers with a profound understanding of the characteristics of ultra-fine nano-reinforced solder joint packages in the microelectronics industry. Originality/value The findings are expected to provide proper guidelines and references with regard to the manufacture of miniaturized electronic packages. This study also explored the effects of TiO2 on the microstructure and the fillet height of ultra-fine capacitors.

Combined loading and failure analysis of lead-free solder joints due to creep and fatigue phenomena

2014 ◽  
Vol 26 (1) ◽  
pp. 22-26 ◽  
Author(s):  
Krystian Jankowski ◽  
Artur Wymyslowski ◽  
Didier Chicot
Keyword(s):  
Environmental Conditions ◽  
Industrial Development ◽  
Solder Joints ◽  
Operating Conditions ◽  
Combined Loading ◽  
Time To Failure ◽  
Loading Conditions ◽  
Content Type ◽  
New Device ◽  
Reliability Of Solder Joints

Purpose – The aim of this work is the use of specially designed, authoring device to evaluate the strength of solder alloys commonly used in all kinds of electronic and electrical devices that are used in various fields of economic and industrial development to shorten the testing period. By obtaining answers to pervade science questions on how to properly investigate the reliability of solder joints can increase lifespan (uptime) of all electronic devices, and especially those that are used in the process submitted severe external conditions (dust, humidity air, heat, mechanical stress). Design/methodology/approach – The basic demand for performing the experimental tests is to measure small displacements (order of fractions of micrometers or of single microns) occurring within the sample. The analysis of the displacement values in various environmental conditions (temperature, humidity, current flow) allows estimating how a given material behaves also in a longer time, under normal operating conditions. Unlike a commonly used method, based on measuring the time-to-failure, at which the item is damaged due to accelerated aging, a behaviour of the sample is being tested for the selected duration time and the given loading conditions. Findings – The theoretical analysis and performed numerical simulations of ATC tests based on developed failure and reliability investigation system (FRIS) imply proposed here combined loading approach a promising and affective method for accelerated reliability tests. Both indentation and FRIS techniques by numerous possibilities of loading conditions seem to be appropriate in order to study the creep and fatigue behaviour. That kind of behaviours can be used by different models which characterize separately the mechanical properties under creep or fatigue tests. In case of creep mode, the displacement is expressed as a function of time where different parameters can be used to represent the creep sensibility. Originality/value – New device can provide both creep and fatigue phenomena simultaneously and perform tests in digital controlled environmental conditions. That approach enables faster method for testing reliability of solder joints.

The size effect on intermetallic microstructure evolution of critical solder joints for flip chip assemblies

2015 ◽  
Vol 27 (4) ◽  
pp. 178-184 ◽  
Author(s):  
Ye Tian ◽  
Justin Chow ◽  
Xi Liu ◽  
Suresh K. Sitaraman
Keyword(s):  
Solder Joint ◽  
Design Methodology ◽  
Growth Process ◽  
Flip Chip ◽  
Solder Bump ◽  
Solder Joints ◽  
Solder Matrix ◽  
Industrial Practice ◽  
Content Type ◽  
Flip Chips

Purpose – The purpose of this paper is to study the intermetallic compound (IMC) thickness, composition and morphology in 100-μm pitch and 200-μm pitch Sn–Ag–Cu (SAC305) flip-chip assemblies after bump reflow and assembly reflow. In particular, emphasis is placed on the effect of solder joint size on the interfacial IMCs between metal pads and solder matrix. Design/methodology/approach – This work uses 100-μm pitch and 200-μm pitch silicon flip chips with nickel (Ni) pads and stand-off height of approximately 45 and 90 μm, respectively, assembled on substrates with copper (Cu) pads. The IMCs evolution in solder joints was investigated during reflow by using 100- and 200-μm pitch flip-chip assemblies. Findings – After bump reflow, the joints size controls the IMC composition and dominant IMC type as well as IMC thickness and also influences the dominant IMC morphology. After assembly reflow, the cross-reaction of the pad metallurgies promotes the dominant IMC transformation and shape coarsened on the Ni pad interface for smaller joints and promotes a great number of new dominate IMC growth on the Ni pad interface in larger joints. On the Cu pad interface, many small voids formed in the IMC in larger joints, but were not observed in smaller joints, combined with the drawing of the IMC growth process. Originality/value – With continued advances in microelectronics, it is anticipated that next-generation microelectronic assemblies will require a reduction of the flip-chip solder bump pitch to 100 μm or less from the current industrial practice of 130 to150 μm. This work shows that as the packaging size reduced with the solder joint interconnection, the solder size becomes an important factor in the intermetallic composition as well as morphology and thickness after reflow.

Solder joint defect classification based on ensemble learning

2017 ◽  
Vol 29 (3) ◽  
pp. 164-170 ◽  
Author(s):  
Hao Wu
Keyword(s):  
Random Forest ◽  
Solder Joint ◽  
Decision Trees ◽  
Printed Circuit Board ◽  
Solder Joints ◽  
High Accuracy ◽  
Ensemble Method ◽  
Circuit Board ◽  
Content Type

Purpose This paper aims to inspect the defects of solder joints of printed circuit board in real-time production line, simple computing and high accuracy are primary consideration factors for feature extraction and classification algorithm. Design/methodology/approach In this study, the author presents an ensemble method for the classification of solder joint defects. The new method is based on extracting the color and geometry features after solder image acquisition and using decision trees to guarantee the algorithm’s running executive efficiency. To improve algorithm accuracy, the author proposes an ensemble method of random forest which combined several trees for the classification of solder joints. Findings The proposed method has been tested using 280 samples of solder joints, including good and various defect types, for experiments. The results show that the proposed method has a high accuracy. Originality/value The author extracted the color and geometry features and used decision trees to guarantee the algorithm's running executive efficiency. To improve the algorithm accuracy, the author proposes using an ensemble method of random forest which combined several trees for the classification of solder joints. The results show that the proposed method has a high accuracy.

Electromigration Analysis of Solder Joints for Power Modules Using an Electrical-Thermal-Stress Coupled Model

2020 ◽  
Author(s):  
Mitsuaki Kato ◽  
Takahiro Omori ◽  
Akihiro Goryu ◽  
Tomoya Fumikura ◽  
Kenji Hirohata
Keyword(s):  
Solder Joint ◽  
Mechanical Stress ◽  
Solder Joints ◽  
Hydrostatic Stress ◽  
Vacancy Concentration ◽  
Intermetallic Layer ◽  
Current Crowding ◽  
Metal Atoms ◽  
Power Modules ◽  
Rate Of Increase

Abstract Power modules are being developed with the aim of increasing power output. Achieving this aim requires increased current density in power modules. However, at high current densities, power modules can degrade as a result of electromigration, which is a phenomenon where atoms move due to momentum transfer between conducting electrons and metal atoms. In addition, atoms are also moved by mechanical stress gradients and temperature gradients, so it is necessary to consider the combined effects of electrical, thermal, and mechanical stress. This report describes an electromigration analysis of solder joints for power modules. First, we validated our numerical implementation and showed that it could reproduce the distributions of vacancy concentrations and hydrostatic stress that were almost the same as those in previous studies. We then describe the effects of electromigration in a single solder joint. Due to the appearance of plastic and creep strains, the rate of increase in vacancy concentration was very slow and inelastic strain grew at an increasing rate. This result indicates that inelastic properties may strongly affect electromigration-induced degradation. Next, we present results for the solder joint with a SiC device and substrate. A current crowding appeared at the edge of the solder joint, and a vacancy concentration gradient was generated in not only the thickness direction but also the longitudinal direction. The absolute value of vacancy concentration increased significantly at the edge and did not reach a steady state even after a long time. These results indicate that peripheral components may strongly affect the electromigration-induced degradation. In addition, we modeled the behavior of metal atoms passing through the interface of the solder joint and simulated the growth of the intermetallic layer by electromigration.

Effect of hourglass shape solder joints on underfill encapsulation process: numerical and experimental studies

2020 ◽  
Vol 32 (3) ◽  
pp. 147-156
Author(s):  
Muhammad Naqib Nashrudin ◽  
Zhong Li Gan ◽  
Aizat Abas ◽  
M.H.H. Ishak ◽  
M. Yusuf Tura Ali
Keyword(s):  
Solder Joint ◽  
Numerical Method ◽  
Flip Chip ◽  
Solder Joints ◽  
Experimental Studies ◽  
Three Dimensional ◽  
Cross Sectional ◽  
Content Type ◽  
Filling Time ◽  
Encapsulation Process

Purpose In line with the recent development of flip-chip reliability and underfill process, this paper aims to comprehensively investigate the effect of different hourglass shape solder joint on underfill encapsulation process by mean of experimental and numerical method. Design/methodology/approach Lattice Boltzmann method (LBM) numerical was used for the three-dimensional simulation of underfill process. The effects of ball grid arrays (BGA) encapsulation process in terms of filling time of the fluid were investigated. Experiments were then carried out to validate the simulation results. Findings Hourglass shape solder joint has shown the shortest filling time for underfill process compared to truncated sphere. The underfill flow obtained from both simulation and experimental results are found to be in good agreement for the BGA model studied. The findings have also shown that the filling time of Hourglass 2 with parabolic shape gives faster filling time compared to the Hourglass 1 with hemisphere angle due to bigger cross-sectional area of void between the solder joints. Practical implications This paper provides reliable insights to the effect of hourglass shape BGA on the encapsulation process that will benefit future development of BGA packages. Originality/value LBM numerical method was implemented in this research to study the flow behaviour of an encapsulation process in term of filling time of hourglass shape BGA. To date, no research has been found to simulate the hourglass shape BGA using LBM.

Performance of 96.5Sn–3Ag–0.5Cu/fullerene composite solder under isothermal ageing and high-current stressing

2020 ◽  
Vol 33 (1) ◽  
pp. 35-46 ◽  
Author(s):  
Guang Chen ◽  
Xinzhan Cui ◽  
Yaofeng Wu ◽  
Wei Li ◽  
Fengshun Wu
Keyword(s):  
Solder Joint ◽  
Composite Solder ◽  
Solder Joints ◽  
Experimental Results ◽  
High Current ◽  
Sac305 Solder ◽  
Content Type ◽  
Interfacial Imcs ◽  
Current Stressing ◽  
Isothermal Ageing

Purpose The purpose of this paper is to investigate the effect of fullerene (FNS) reinforcements on the microstructure and mechanical properties of 96.5Sn3Ag0.5Cu (SAC305) lead-free solder joints under isothermal ageing and electrical-migration (EM) stressing. Design/methodology/approach In this paper, SAC305 solder alloy doped with 0.1 Wt.% FNS was prepared via the powder metallurgy method. A sandwich-like sample and a U-shaped sample were designed and prepared to conduct an isothermal ageing test and an EM test. The isothermal ageing test was implemented under vacuum atmosphere at 150°C, whereas the EM experiment was carried out with a current density of 1.5 × 104 A/cm2. The microstructural and mechanical evolutions of both plain and composite solder joints after thermal ageing and EM stressing were comparatively studied. Findings A growth of Ag3Sn intermetallic compounds (IMCs) in solder matrix and Cu-Sn interfacial IMCs in composite solder joints was notably suppressed under isothermal ageing condition, whereas the hardness and shear strength of composite solder joints significantly outperformed those of non-reinforced solder joints throughout the ageing period. The EM experimental results showed that for the SAC305 solder, the interfacial IMCs formulated a protrusion at the anode after 360 h of EM stressing, whereas the surface of the composite solder joint was relatively smooth. During the stressing period, the interfacial IMC on the anode side of the plain SAC305 solder showed a continuous increasing trend, whereas the IMC at the cathode presented a decreasing trend for its thickness as the stressing time increased; after 360 h of stressing, some cracks and voids had formed on the cathode side. For the SAC305/FNS composite solder, a continuous increase in the thickness of the interfacial IMC was found on both the anode and cathode sides; the growth rate of the interfacial IMC at the anode was higher than that at the cathode. The nanoindentation results showed that the hardness of the SAC305 solder joint presented a gradient distribution after EM stressing, whereas the hardness data showed a relatively homogeneous distribution in the SAC305/FNS solder joint. Originality/value The experimental results showed that the FNS reinforcement could effectively mitigate the failure risk in solder joints under isothermal ageing and high-current stressing. Specifically, the FNS particles in solder joints can work as a barrier to suppress the diffusion and migration of Sn and Cu atoms. In addition, the nanoidentation results also indicated that the addition of the FNS reinforcement was very helpful in maintaining the mechanical stability of the solder joint. These findings have provided a theoretical and experimental basis for the practical application of this novel composite solder with high-current densities.

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