Mesin Penetas Telur Menggunakan Microcontroller ATMega328 Berbasis Arduino

The purpose of this study was to design and implement a duck egg incubator. An egg incubator is a machine that functions to take over the incubation task of a duck mother in incubating fertilized eggs from the result of crossing or mating with a male. The existing incubators work in temperature control, reversing the egg racks, but do not use an egg informing system that has been hatched. In designing this duck egg incubator based on Arduino as a controller. The temperature used must be measured by the resistance of the space or the approximate resistance of the eggs to hatch. The microcontroller used is the ATMega328 integrated on the Arduino Uno, temperature sensor, humidity sensor, humidity control system and other supporting components using Arduino. The test was carried out by comparing the DS18B20 temperature sensor with a Thermometer with an error difference of 0.15. The result of this research is the device can control the temperature not exceeding 39 ° C for hatching eggs. The device has 2 usage buttons, namely a start button (green) to perform hatching day calculations and a reset button (red) to stop hatching day calculations. The day variable that has been running is still stored in the microcontroller EEPROM (Electrically Erasable Programmable Read-Only Memory) so that if there is a disconnection or loss of a voltage power source such as a power failure and so on. The 12VDC fan on the device turns on every 30 minutes and goes out for the next 30 minutes

Upscaling of 500 °C Durable SiC JFET-R Integrated Circuits

At HiTEC 2018, NASA Glenn Research Center reported the first demonstration of yearlong 500 °C operation of ceramic-packaged “Generation 10” ~200-transistor integrated circuits (ICs) based on two-level interconnect silicon carbide (4H-SiC) junction field effect transistors and resistors (JFET-R). This HiTEC 2021 submission updates on-going efforts at NASA Glenn spanning two subsequent prototype IC generations “11 and 12” to increase both complexity and durability of these ICs. Increased chip complexities of around 1000 transistors/chip for Gen. 11 and near 3000 transistors/chip for Gen. 12 are made possible by reductions in minimum layout feature sizes (including resistor width shrinkage from 6 μm to 2 μm) coupled with enlarged die size (from 3 × 3 mm to 5 × 5 mm). Gen. 11 ICs electrically tested to date include an 8-bit delta-sigma analog to digital converter (ADC) as well as upscaled random access memory (RAM) and nearly 1 kbit read only memory (ROM). However, Gen. 11 prototype ICs exhibited significantly lower yield and durability than Gen. 10 ICs. Development of revised processing is being investigated towards mitigating these issues in subsequent Gen. 12 fabrication run currently in progress.

A Digital Improvement—Trimming a Digital Temperature Sensor with EEPROM Reprogrammable Fuses

An EEPROM (electrically erasable programmable read-only memory) reprogrammable fuse for trimming a digital temperature sensor is designed in a 0.18-µm CMOS EEPROM. The fuse uses EEPROM memory cells, which allow multiple programming cycles by modifying the stored data on the digital trim codes applied to the thermal sensor. By reprogramming the fuse, the temperature sensor can be adjusted with an increased trim variation in order to achieve higher accuracy. Experimental results for the trimmed digital sensor showed a +1.5/−1.0 ℃ inaccuracy in the temperature range of −20 to 125 ℃ for 25 trimmed DTS samples at 1.8 V by one-point calibration. Furthermore, an average mean of 0.40 ℃ and a standard deviation of 0.70 ℃ temperature error were obtained in the same temperature range for power supply voltages from 1.7 to 1.9 V. Thus, the digital sensor exhibits similar performances for the entire power supply range of 1.7 to 3.6 V.

Design of Phototherapy Radiometer with a Measurement Stability Improvement

The amount of radiation given from the phototherapy lamp (Blue Light) who not right for neonates with hyperbilirubin is feared to cause the bilirubin levels in not decrease accordance with the calculated dose. The purpose of this study is to make a Blue Light calibration device with a stable measurement. The contribution of this research is by determine a sensor who able to measure the irradiation value more accurately between TCS3200 and AS7262 sensor. TCS3200 sensor measures the wavelengths of 470nm, 524nm and 640nm and AS7262 sensor can measure wavelengths of 430-670nm. The results of both sensors are stored in the Electrically Erasable Programmable Read-Only Memory, with the amount of data and the length of measurement can be adjusted according to user needs. Measurement the irradiation value of two sensors is done simultaneously using 3 Watt Light Emitting Diode lamp as a Blue Light simulation where the lamp is placed directly above the sensor and distance of the lamp to the sensor is 10cm, 20cm, 30cm, and 40cm. The average uncertainty value with TCS3200 sensor is 14.65 and the average uncertainty value with AS7262 sensor is 2.17. Type A uncertainty value is based on results of repeated measurements that show how close the measurement results are to the actual value (stable measurement results). The results showed that the average uncertainty value on AS7262 sensor is relatively small, so its mean the measurement results of AS7262 sensor are stable. The author suggests using sensors who capable of reading the value of light radiation without conversion. The results of this study can be implemented to measure the intensity of the lamp and be used as a reference to determining the time of lamp replacement.

Improving the Performance of RLizard on Memory-Constraint IoT Devices with 8-Bit ATmega MCU

We propose an improved RLizard implementation method that enables the RLizard key encapsulation mechanism (KEM) to run in a resource-constrained Internet of Things (IoT) environment with an 8-bit micro controller unit (MCU) and 8–16 KB of SRAM. Existing research has shown that the proposed method can function in a relatively high-end IoT environment, but there is a limitation when applying the existing implementation to our environment because of the insufficient SRAM space. We improve the implementation of the RLizard KEM by utilizing electrically erasable, programmable, read-only memory (EEPROM) and flash memory, which is possessed by all 8-bit ATmega MCUs. In addition, in order to prevent a decrease in execution time related to their use, we improve the multiplication process between polynomials utilizing the special property of the second multiplicand in each algorithm of the RLizard KEM. Thus, we reduce the required MCU clock cycle consumption. The results show that, compared to the existing code submitted to the National Institute of Standard and Technology (NIST) PQC standardization competition, the required MCU clock cycle is reduced by an average of 52%, and the memory used is reduced by approximately 77%. In this way, we verified that the RLizard KEM works well in our low-end IoT environments.

A system verilog approach for verification of memory controller

<span>Memory performance has become the major bottleneck to improve the overall performance of the computer system. By using memory controller, there is effective control of data between processor and memory. In this paper, a memory controller for interfacing Synchronous Static Random Access Memory (SSRAM), Synchronous Dynamic Random Access Memory (SDRAM), Read Only Memory (ROM) and FLASH which is Electrically Erasable Programmable Read-Only Memory is designed and a coverage driven Constraint random verification environment is built for the designed memory controller. Verification plays an important role in any design flow as it is done before silicon development. It is done at time of product development for quality checking and bug fixing in design.</span>