Qualitative dynamic diagnosis of circuits

1993 ◽  
Vol 7 (1) ◽  
pp. 53-64 ◽  
Author(s):  
Alessandra Fanni ◽  
Paolo Diana ◽  
Alessandro Giua ◽  
Marco Perezzani
Keyword(s):  
Analog Circuits ◽  
Qualitative Data ◽  
Diagnostic System ◽  
Data Conversion ◽  
Qualitative Dynamic ◽  
Qualitative State ◽  
Test Points ◽  
Circuit Components ◽  
Localized Faults ◽  
Dynamic Diagnosis

We describe ACDS, an automatic diagnostic system. ACDS is capable of diagnosing faults on analog circuits in dynamic conditions. The circuit's dynamic behavior is studied by means of a series of intrastate simulations during which the qualitative state of the circuit does not change. An acquistion board collects the value of a set of quantities corresponding to accessible test points. These measurements are converted into qualitative values and are used for two purposes: first, to determine the state of the circuit components; second, to trigger the diagnostic procedure whenever a discrepancy between observed and predicted behavior is found. The main difficulty in this phase of measurement interpretation is in obtaining meaningful numerical-qualitative data conversion for values of quantities approaching a boundary between two different qualitative intervals. System performance has been verified through a number of simulations, which have shown the proposed approach to be efficient both in terms of localized faults and of flexibility in adapting to different circuits.

Concepts for In Situ Diagnostics in Analog Microelectronic Circuits

2007 ◽  
Author(s):  
Ted Kolasa ◽  
Alfredo Mendoza
Keyword(s):  
Analog Circuits ◽  
System Architecture ◽  
Analog Circuit ◽  
Fault Localization ◽  
Diagnostic System ◽  
Diagnostic Capability ◽  
Common Signal ◽  
Diagnostic Capabilities ◽  
In Situ Diagnostics

Abstract Comprehensive in situ (designed-in) diagnostic capabilities have been incorporated into digital microelectronic systems for years, yet similar capabilities are not commonly incorporated into the design of analog microelectronics. And as feature sizes shrink and back end interconnect metallization becomes more complex, the need for effective diagnostics for analog circuits becomes ever more critical. This paper presents concepts for incorporating in situ diagnostic capability into analog circuit designs. Aspects of analog diagnostic system architecture are discussed as well as nodal measurement scenarios for common signal types. As microelectronic feature sizes continue to shrink, diagnostic capabilities such as those presented here will become essential to the process of fault localization in analog circuits.

PARAMETRIC DEVIATION BASED ANALOG TEST AND DIAGNOSIS SYSTEM

2011 ◽  
Vol 20 (07) ◽  
pp. 1323-1340 ◽  
Author(s):  
KASTURI GHOSH ◽  
ARABINDA ROY ◽  
SEKHAR MONDAL ◽  
BAIDYANATH RAY
Keyword(s):  
Cellular Automata ◽  
Analog Circuits ◽  
Significant Enhancement ◽  
Performance Parameters ◽  
Analog Test ◽  
Diagnosis System ◽  
Response Data ◽  
Circuit Components ◽  
Diagnostic Resolution

This paper reports a comprehensive solution for the problem of test and diagnosis of OTA based analog circuits. Based on the parametric deviation of circuit components, a test and diagnosis methodology are proposed. Compressed signature generated out of multiple performance parameters has resulted in significant enhancement in fault diagnosing capability. The voluminous response data has been handled with Cellular Automata (CA) based classifier to achieve excellent diagnostic resolution.

scholarly journals PEMBERDAYAAN WANITA DALAM UPAYA MENINGKATKAN EKONOMI RUMAH TANGGA

2020 ◽  
Vol 3 (1) ◽  
pp. 21-36
Author(s):  
Iin Wijayanti
Keyword(s):  
Land Use ◽  
Data Analysis ◽  
Data Reduction ◽  
Family Life ◽  
Qualitative Data ◽  
Agricultural Land ◽  
Data Conversion ◽  
Role Of Women ◽  
Depth Interviews

This study was designed to describe the economic situation of rural households that focus on agricultural land and the role of women in Pangkal Village, Sawoo District. This study uses qualitative data analysis activities carried out in the field and even in conjunction with the process of data conversion in in-depth interviews, data reduction. Conclusions are drawn if the data collected is considered sufficient and considered complete. The number of samples taken from land bag farmers consisted of women who directly worked on the land bags themselves. The results of this study illustrate the economy in Pangkal Village, Sawoo District, with the contribution of land use in Tasen which greatly helps improve the economy of the community, involving the participating government, by providing seed subsidies, fertilizer and rental freedom from the Department of Forestry, so that the community can benefit. In this case the role of women is a double workload. They are able to hoe, irrigate plants, weed grass, provide fertilizer, care for plants, harvest crops and sell them. For them "work as a choice" for the fulfillment of family life needs.

The Principle of Dynamic Diagnosis Based on Integrated Maintenance Information and its Application

2013 ◽  
Vol 385-386 ◽  
pp. 1785-1789
Author(s):  
Song Lin Wu ◽  
Shi Chao Li ◽  
Jun Zhao
Keyword(s):  
Information System ◽  
Information Fusion ◽  
Diagnostic System ◽  
Information Environment ◽  
Time Analysis ◽  
Dynamic Faults ◽  
Related Information ◽  
Faults Diagnosis ◽  
Logic Process ◽  
Dynamic Diagnosis

Based on the concept of an integrated maintenance information system and related information environment, this paper discusses the process of troubleshooting in modern maintenance in detail, and gives a model of dynamic faults diagnosis, in which a reasoning program is designed through taking advantage of information fusion and time analysis. In the end, the authors present the logic process of dynamic diagnosis through a typical example, and propose a dynamic diagnostic system based on information fusion.

Optimization of amplifier circuits by using gradient boosted trees and probability annealing policy

2020 ◽  
Vol 15 (3) ◽  
pp. 1-5
Author(s):  
Evelyn Cristina de Oliveira Lima ◽  
André Borges Cavalcante ◽  
João Viana Da Fonseca Neto
Keyword(s):  
Machine Learning ◽  
Data Collection ◽  
Analog Circuits ◽  
Design Automation ◽  
Optimization Problem ◽  
State Of The Art ◽  
Circuit Parameter ◽  
Learning Module ◽  
Circuit Components ◽  
Parameter Values

One important step of the optimization of analog circuits is to properly size circuit components. Since the quantities that define specification may compete for different circuit parameter values, the optimization of analog circuits befits a hard and costly optimization problem. In this work, we propose two contributions to design automation methodologies based on machine learning. Firstly, we propose a probability annealing policy to boost early data collection and restrict electronic simulations later on in the optimization. Secondly, we employ multiple gradient boosted trees to predict design superiority, which reduces overfitting to learned designs. When compared to the state-of-the art, our approach reduces the number of electronic simulations, the number of queries made to the machine learning module required to finish the optimization.

A Method of Test Point Optimization Selection for Analog Circuits

2014 ◽  
Vol 568-570 ◽  
pp. 3-7
Author(s):  
Zhong Qun Li ◽  
Xu Fei Wang ◽  
Shu Nong Zhang ◽  
Jia Ming Liu
Keyword(s):  
Analog Circuits ◽  
Simulation Analysis ◽  
Test Point ◽  
Electronic Systems ◽  
Electronic Products ◽  
Modeling Analysis ◽  
Fault Prognosis ◽  
Test Points ◽  
Board Level ◽  
Selection Of

In analog electronic systems, characteristic information required for fault prognosis is achieved by test points of a board, so the selection and optimization of test points is an important topic for PHM research of electronic products. Current methods for selection of test points generally rely on functional simulation analysis or testability modeling analysis. Based on this, FMMEA method is introduced to find failure susceptibility components in this paper, moreover, through simulating and calculating the predictability of test points, the final test points are determined. As an example, a board level system is presented to validate this approach.

Fault Diagnosis of Analog Circuit Based on Multi-Test Points and Multi-Feature Information

2013 ◽  
Vol 313-314 ◽  
pp. 277-280
Author(s):  
Qiang Pan ◽  
Chao Yang
Keyword(s):  
Neural Network ◽  
Fault Diagnosis ◽  
Analog Circuits ◽  
Bp Neural Network ◽  
Analog Circuit ◽  
New Method ◽  
Feature Information ◽  
Simulation Results ◽  
Test Points ◽  
Sample Set

In the process of use BP neural network to fault diagnosis of analog circuits, the network input which represents fault signature was very important. A given new method which base on multi-points and multi-feature information is taken to construct the original sample set. With this method to construct the original fault signature set, then as the input of BP neural network and train the network. Simulation results show that, the network train with sample set which constructed by this method use in fault diagnosis of analog circuits is better accuracy than traditional methods. Proved the feasibility of this method in fault diagnosis of analog circuits, and offer a new method for fault diagnosis of analog circuits.

scholarly journals Concerns and Challenges of Data Integration from Objective Post-Positivist Approach and a Subjective Non-Positivist Interpretive Approach and Their Validity/Credibility Issues

2014 ◽  
Vol 9 (1) ◽  
pp. 115-129
Author(s):  
Ram Chandra Khanal
Keyword(s):  
Data Integration ◽  
Mixed Method ◽  
Mixed Methods Research ◽  
Qualitative Data ◽  
Data Conversion ◽  
Mixed Method Research ◽  
Analysis Process ◽  
Response Coding ◽  
Positivist Approach ◽  
Selection Of

Integration of data derived from objective post positivist approach and interpretive non-positivist approach through mixed methods research has gained increasing attention in the recent past. But, at the same, concerns have been raised in the process of integrating data and, hence, enhancing validity/credibility of a research. This article seeks to analyze some concerns and challenges related to these aspects and provides some process to address these challenges. This article reviewed various peer reviewed journals and other grey literatures focusing on data integration within mixed method research. The paper presents some theoretical and methodological concerns and challenges of data integration and reviews two validity/credibility frameworks. Based on these review, the paper outlines a strategy of data integration. The strategy includes selection of appropriate research methodology and data conversion processes based on the research need. The paper provides a four step process for data conversion by adopting quantitizing approach which include; creating focus questions, response coding, thematic categorizing and employing qualitative data analysis process. DOI: http://dx.doi.org/10.3126/jie.v9i1.10677Journal of the Institute of Engineering, Vol. 9, No. 1, pp. 115–129

Research on Test Points Selection Using Complex Field Fault Modeling in Analog Circuit

2013 ◽  
Vol 444-445 ◽  
pp. 1158-1162
Author(s):  
Jing Yang ◽  
Cheng Lin Yang ◽  
Zhen Liu
Keyword(s):  
Analog Circuits ◽  
Global Minimum ◽  
Analog Circuit ◽  
Search Algorithm ◽  
Fault Modeling ◽  
Fault Model ◽  
Complex Field ◽  
Dependency Matrix ◽  
Test Points ◽  
Test Points Selection

In this paper, a new test nodes selection technique based on the complex field fault modeling of analog circuits testability is presented. The function F () by the complex field fault modeling can be used as the fault model, which is applicable to both hard (open or short) and soft (parametric) faults. Therefore, we can obtain the signature curves of the potential fault components by PSPICE and MATLAB. For the testability of fault model, fault-test dependency matrix can be concluded. With the integer-coded fault-wise table method and heuristic graph search algorithm, we can obtain a global minimum node set. The number of potential faults with complex field fault modeling is half compared with the traditional methods and the time complexity of the circuit can be reduced significantly.

Scanning Electron Microscopy in Hybrid Microelectronics

1976 ◽  
Vol 34 ◽  
pp. 456-457
Author(s):  
S. Khadpe ◽  
R. Faryniak
Keyword(s):  
Integrated Circuits ◽  
Thick Film ◽  
Integrated Circuit ◽  
Failure Modes ◽  
Three Dimensional ◽  
Circuit Components ◽  
Hybrid Microcircuit ◽  
Electrical Connections ◽  
Scanning Electron

The Scanning Electron Microscope (SEM) is an important tool in Thick Film Hybrid Microcircuits Manufacturing because of its large depth of focus and three dimensional capability. This paper discusses some of the important areas in which the SEM is used to monitor process control and component failure modes during the various stages of manufacture of a typical hybrid microcircuit.Figure 1 shows a thick film hybrid microcircuit used in a Motorola Paging Receiver. The circuit consists of thick film resistors and conductors screened and fired on a ceramic (aluminum oxide) substrate. Two integrated circuit dice are bonded to the conductors by means of conductive epoxy and electrical connections from each integrated circuit to the substrate are made by ultrasonically bonding 1 mil aluminum wires from the die pads to appropriate conductor pads on the substrate. In addition to the integrated circuits and the resistors, the circuit includes seven chip capacitors soldered onto the substrate. Some of the important considerations involved in the selection and reliability aspects of the hybrid circuit components are: (a) the quality of the substrate; (b) the surface structure of the thick film conductors; (c) the metallization characteristics of the integrated circuit; and (d) the quality of the wire bond interconnections.

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