scholarly journals Elastic Properties of Cerium Oxide Nanocubes from In Situ TEM Compression Tests and DFT+U Simulations

2018 ◽  
Vol 24 (S1) ◽  
pp. 1818-1819
Author(s):  
Lucile Joly-Pottuz ◽  
Thierry Epicier ◽  
Tristan Albaret ◽  
Manuel Cobian ◽  
Douglas D. Stauffer ◽  
...  
2009 ◽  
Vol 1185 ◽  
Author(s):  
Changqiang Chen ◽  
Yutao Pei ◽  
Jeff De Hosson

AbstractWe show results of in situ TEM (Transmission electron microscope) quantitative investigations on the compression behaviors of amorphous micropillars fabricated by focused ion beam from Cu47Ti33Zr11Ni6Sn2Si1 metallic glass (MG) ribbon. Pillars with well defined gauge sections and tip diameter ranging from 100 nm to 640 nm are studied. Quantitative compression tests were performed by a recently developed Picoindenter TEM holder, with the evolution of individual shear bands monitored in real time in TEM. It is found that the deformation of the MG pillars at the present size domain is still dominated by discrete shear banding as demonstrated by intermittent events in the load-displacement curves. However, the frequency, amplitude and distribution of these shear banding events are clearly size dependent at submicrometer scale, leading to an apparently transition in deformation mode from highly localized inhomogeneous deformation to less localized and more distributed deformation with decreasing pillars diameter. Deformation of a 105 nm diameter pillar having rounded tips is characterized with fully homogeneous bulge at the initial stage of deformation, indicating prompting effect of multi-axial stress state on transition to fully homogeneous deformation.


1996 ◽  
Vol 460 ◽  
Author(s):  
Y. Minonishi ◽  
M. Legros ◽  
D. Caillard

ABSTRACTIn situ TEM straining experiments have been performed on a Ti3Al single crystal, along the c-axis, in order to study the slip of 2c+a dislocations in pyramidal planes. The results show that slip takes place in π1 planes, in contrast with what has been observed after compression tests (slip in π2 planes), and that rows of loops are nucleated in the slip plane. The mechanisms which may control slip in the π1 planes are briefly discussed.


1965 ◽  
Vol 2 (2) ◽  
pp. 116-128 ◽  
Author(s):  
Earle J Klohn

Dense, heavily preconsolidated glacial till is a relatively incompressible soil that occurs throughout most of Canada. When loaded, it undergoes very small settlement, most of which is elastic. For the average structure, these elastic compressions are too small to be of concern and are usually ignored. However, for some structures they can be critical and their magnitude must be estimated prior to construction. To make the necessary analyses requires knowledge of the elastic properties of the in situ glacial till.This paper presents the results of field and laboratory tests that were made on a dense glacial till deposit to determine its modulus of elasticity, in connection with the design and construction of a 100 ft. high combined earth and concrete dam. In the field, in situ loading tests were made against the walls of a 50 ft. deep test shaft. The modulus of elasticity was computed, using elastic equations applicable to the case of a rigid circular plate pressed against a semi-infinite elastic solid. Moreover, during construction of the project, measurements were made of the elastic rebounds and settlements that occurred under known conditions of unloading and loading. Steinbrenner’s approximate solution for computing settlement due to loads acting on the surface of an elastic layer was then used to compute the apparent modulus of elasticity. In the laboratory, unconfined compression tests and repetitive triaxial tests were made on undisturbed samples. The modulus of elasticity was estimated from the stress-strain relationships obtained.The data presented in the paper indicate that the apparent, in situ modulus of elasticity of the glacial till deposit is very high, being in the order of 150,000 lb./sq. in. Reasonable agreement exists between modulus of elasticity values computed from the in situ plate bearing tests and those computed from observed rebounds and settlements. However, modulus of elasticity values computed from unconfined compression and repetitive triaxial tests in the laboratory are apparently too small, being only a fraction of those values obtained by the field procedures. Sample disturbance is thought to be a major factor affecting laboratory test results.Grain size characteristics, density, natural water content, and strength properties of the glacial till deposit are presented in the paper. These data provide a comprehensive description of the material and permit comparison with glacial till deposits encountered at other areas.


2012 ◽  
Vol 18 (S2) ◽  
pp. 750-751
Author(s):  
R. Arenal ◽  
M.S. Wang ◽  
Z. Xu ◽  
D. Golberg

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


Author(s):  
Charles W. Allen

Irradiation effects studies employing TEMs as analytical tools have been conducted for almost as many years as materials people have done TEM, motivated largely by materials needs for nuclear reactor development. Such studies have focussed on the behavior both of nuclear fuels and of materials for other reactor components which are subjected to radiation-induced degradation. Especially in the 1950s and 60s, post-irradiation TEM analysis may have been coupled to in situ (in reactor or in pile) experiments (e.g., irradiation-induced creep experiments of austenitic stainless steels). Although necessary from a technological point of view, such experiments are difficult to instrument (measure strain dynamically, e.g.) and control (temperature, e.g.) and require months or even years to perform in a nuclear reactor or in a spallation neutron source. Consequently, methods were sought for simulation of neutroninduced radiation damage of materials, the simulations employing other forms of radiation; in the case of metals and alloys, high energy electrons and high energy ions.


Author(s):  
F. M. Ross ◽  
R. Hull ◽  
D. Bahnck ◽  
J. C. Bean ◽  
L. J. Peticolas ◽  
...  

We describe an investigation of the electrical properties of interfacial dislocations in strained layer heterostructures. We have been measuring both the structural and electrical characteristics of strained layer p-n junction diodes simultaneously in a transmission electron microscope, enabling us to correlate changes in the electrical characteristics of a device with the formation of dislocations.The presence of dislocations within an electronic device is known to degrade the device performance. This degradation is of increasing significance in the design and processing of novel strained layer devices which may require layer thicknesses above the critical thickness (hc), where it is energetically favourable for the layers to relax by the formation of misfit dislocations at the strained interfaces. In order to quantify how device performance is affected when relaxation occurs we have therefore been investigating the electrical properties of dislocations at the p-n junction in Si/GeSi diodes.


Author(s):  
Tai D. Nguyen ◽  
Ronald Gronsky ◽  
Jeffrey B. Kortright

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.


Author(s):  
S. Hagège ◽  
U. Dahmen ◽  
E. Johnson ◽  
A. Johansen ◽  
V.S. Tuboltsev

Small particles of a low-melting phase embedded in a solid matrix with a higher melting point offer the possibility of studying the mechanisms of melting and solidification directly by in-situ observation in a transmission electron microscope. Previous studies of Pb, Cd and other low-melting inclusions embedded in an Al matrix have shown well-defined orientation relationships, strongly faceted shapes, and an unusual size-dependent superheating before melting.[e.g. 1,2].In the present study we have examined the shapes and thermal behavior of eutectic Pb-Cd inclusions in Al. Pb and Cd form a simple eutectic system with each other, but both elements are insoluble in solid Al. Ternary alloys of Al (Pb,Cd) were prepared from high purity elements by melt spinning or by sequential ion implantation of the two alloying additions to achieve a total alloying addition of up to lat%. TEM observations were made using a heating stage in a 200kV electron microscope equipped with a video system for recording dynamic behavior.


Author(s):  
R. C. Cieslinski ◽  
M. T. Dineen ◽  
J. L. Hahnfeld

Advanced Styrenic resins are being developed throughout the industry to bridge the properties gap between traditional HIPS (High Impact Polystyrene) and ABS (Acrylonitrile-Butadiene-Styrene copolymers) resins. These new resins have an unprecedented balance of high gloss and high impact energies. Dow Chemical's contribution to this area is based on a unique combination of rubber morphologies including labyrinth, onion skin, and core-shell rubber particles. This new resin, referred as a controlled morphology resin (CMR), was investigated to determine the toughening mechanism of this unique rubber morphology. This poster will summarize the initial studies of these resins using the double-notch four-point bend test of Su and Yee, tensile stage electron microscopy, and Poisson Ratio analysis of the fracture mechanism.


Author(s):  
M. Park ◽  
S.J. Krause ◽  
S.R. Wilson

Cu alloying in Al interconnection lines on semiconductor chips improves their resistance to electromigration and hillock growth. Excess Cu in Al can result in the formation of Cu-rich Al2Cu (θ) precipitates. These precipitates can significantly increase corrosion susceptibility due to the galvanic action between the θ-phase and the adjacent Cu-depleted matrix. The size and distribution of the θ-phase are also closely related to the film susceptibility to electromigration voiding. Thus, an important issue is the precipitation phenomena which occur during thermal device processing steps. In bulk alloys, it was found that the θ precipitates can grow via the grain boundary “collector plate mechanism” at rates far greater than allowed by volume diffusion. In a thin film, however, one might expect that the growth rate of a θ precipitate might be altered by interfacial diffusion. In this work, we report on the growth (lengthening) kinetics of the θ-phase in Al-Cu thin films as examined by in-situ isothermal aging in transmission electron microscopy (TEM).


Sign in / Sign up

Export Citation Format

Share Document