Geochemical analysis of small samples: Micro-analytical techniques for the nineties and beyond

1995 ◽  
Vol 33 ◽  
pp. 25 ◽  
Author(s):  
Clive R. Neal ◽  
Jon P. Davidson ◽  
Kevin D. McKeegan
Keyword(s):  
Analytical Techniques ◽  
Small Samples ◽  
Geochemical Analysis

Micromammals and the Late Quaternary of southern Africa

2021 ◽  
Author(s):  
D.M. Avery
Keyword(s):  
Iron Age ◽  
Southern Africa ◽  
Late Quaternary ◽  
Rattus Rattus ◽  
Analytical Techniques ◽  
Small Samples ◽  
Pinnacle Point ◽  
Human Movements ◽  
Geographical Scale ◽  
Land Mammal

Abstract Improvements in excavation methods, dating, analytical techniques and statistical applications have all led to a substantial increase in recoverable environmental evidence from micromammals. Because these animals are so small the information they provide is on a smaller geographical scale than that afforded by most other lines of evidence. However, with increasing amounts of data and greater interpretational precision in all spheres, the chances are improving of being able to mesh information from different scales. Blombos, Pinnacle Point and Klasies River on the southern coast of South Africa have clearly demonstrated that micromammalian data can contribute to multidisciplinary interpretations of past conditions, in this case during MIS 5 and 6. Little attention has been paid to the generally small samples from Iron Age sites but the presence of the House rat Rattus rattus may provide important information about human movements and may also contribute to our understanding of the Anthropocene once this has been formally defined. Micromammals have not yet been used as chronostratigraphic indicators in southern Africa but it may be possible to develop biochronologies using them and to incorporate this material into African Land Mammal Ages.

A Versatile XRF Analytical System for Geochemical Exploration and Other Applications

1983 ◽  
Vol 27 ◽  
pp. 481-486 ◽  
Author(s):  
T. K. Smith
Keyword(s):  
Large Scale ◽  
Mineral Exploration ◽  
Analytical Techniques ◽  
Geochemical Analysis ◽  
Geochemical Exploration ◽  
Fourth Period ◽  
Conventional Methods ◽  
Analytical System ◽  
Geological Sciences ◽  
And Tungsten

For more than a decade the Institute of Geological Sciences has carried out large-scale geochemical analysis in pursuit of mineral exploration and regional geochemical reconnaissance programmes for the Department of Industry. Over this period an XRF analytical system has been developed to meet part of this requirement for multielement data. The elements of interest range from the fourth period to uranium, and have become more numerous as exploration and analytical techniques have expanded. In particular, additions have been made of those elements such as arsenic, molybdenum and tungsten which are more difficult of determination by conventional methods.

Metallomics, elementomics, and analytical techniques

2008 ◽  
Vol 80 (12) ◽  
pp. 2577-2594 ◽  
Author(s):  
Yu-Feng Li ◽  
Chunying Chen ◽  
Ying Qu ◽  
Yuxi Gao ◽  
Bai Li ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Throughput ◽  
Structural Characterization ◽  
Inductively Coupled Plasma ◽  
Molecular Mapping ◽  
Analytical Techniques ◽  
Research Field ◽  
Small Samples ◽  
X Ray ◽  
Icp Ms

Metallomics is an emerging and promising research field which has attracted more and more attention. However, the term itself might be restrictive. Therefore, the term "elementomics" is suggested to encompass the study of nonmetals as well. In this paper, the application of state-of-the-art analytical techniques with the capabilities of high-throughput quantification, distribution, speciation, identification, and structural characterization for metallomics and elementomics is critically reviewed. High-throughput quantification of multielements can be achieved by inductively coupled plasma-mass spectrometry (ICP-MS) and neutron activation analysis (NAA). High-throughput multielement distribution mapping can be performed by fluorescence-detecting techniques such as synchrotron radiation X-ray fluorescence (SR-XRF), XRF tomography, energy-dispersive X-ray (EDX), proton-induced X-ray emission (PIXE), laser ablation (LA)-ICP-MS, and ion-detecting-based, secondary-ion mass spectrometry (SIMS), while Fourier transform-infrared (FT-IR) and Raman microspectroscopy are excellent tools for molecular mapping. All the techniques for metallome and elementome structural characterization are generally low-throughput, such as X-ray absorption spectroscopy (XAS), NMR, and small-angle X-ray spectroscopy (SAXS). If automation of arraying small samples, rapid data collection of multiple low-volume and -concentration samples together with data reduction and analysis are developed, high-throughput techniques will be available and in fact have partially been achieved.

scholarly journals A Methodological Assessment Based on a Systematic Review of Circular Economy and Bioenergy Addressed by Education and Communication

2021 ◽  
Vol 13 (8) ◽  
pp. 4273
Author(s):  
Alejandro Carbonell-Alcocer ◽  
Juan Romero-Luis ◽  
Manuel Gertrudix
Keyword(s):  
Circular Economy ◽  
Analytical Techniques ◽  
Small Samples ◽  
Exploratory Research ◽  
Publish Or Perish ◽  
Agents Of Change ◽  
Quantitative Synthesis ◽  
Methodological Assessment ◽  
Object Of Study ◽  
Meta Analyses

The circular economy and bioenergy are essential strategies for combatting climate change. In the last 10 years, there has been an increase in research on this subject by different disciplines. Educational and communication approaches may prompt a change to make citizens agents of change in the environmental struggle. Therefore, evaluating their level of methodological formalisation allows the identification of characteristics of the research carried out, and to ascertain where academic studies in these disciplines are aimed. Through a systematic literature review (SLR) applying the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) model, literature from 2009 to 2019 was identified on the Web of Science, Scopus and Google Scholar, using Publish or Perish software to obtain it. A qualitative and quantitative synthesis of the results was carried out, using cluster analysis and statistic percentages, and comparing column proportions. The analysis of the articles (n = 74) focused on collection techniques, data typology, characteristics of samples and analysis techniques, and showed that the majority were descriptive, oriented toward presenting proposals on educational intervention, with small samples and basic analytical techniques. Despite consistency in the corpus of the research, it is concluded that the studies had a low level of methodological formalisation, which indicates it they were generally related to exploratory research with limited scope, addressing a limited part of the object of study.

The use of x-ray microdiffraction in failure analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1762-1763
Author(s):  
D. M. File ◽  
L. R. Denton ◽  
P. L. Henderson
Keyword(s):  
Failure Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Analytical Techniques ◽  
Degree Of Crystallinity ◽  
Small Samples ◽  
X Ray ◽  
Elemental Analyses ◽  
Quantitative Analyses ◽  
Time Required ◽  
Secondary Ion

X-ray microdiffraction is a tool used at NSWC to perform and support failure analyses. Our failure analysis efforts attempt to determine the primary cause(s) of the failure and to recommend corrective action(s) in a timely manner. The analytical techniques used include Secondary Ion Mass Spectrometry (SIMS), Scanning Electron Microscopy (SEM), Auger Electron Spectroscopy (AES), and Electron Probe MicroAnalysis (EPMA). The addition of x-ray microdiffraction has provided additional capability which supports the elemental analyses, and has often reduced the analysis time required to identify the failure mode.X-ray microdiffraction can provide the following capabilities: 1) qualitative analyses, 2) quantitative analyses, 3) degree of crystallinity, 4) measurement of residual stress, 5) grain or particle size, 6) texture or preferred orientation, and 7) analysis of small samples (∼10 μm to 20 μm diameter). In addition, these analyses can usually be performed in a few minutes to an hour.X-ray microdiffraction has evolved steadily over the past 15 years.

scholarly journals Towards Precision Medicine in Psychosis: Benefits and Challenges of Multimodal Multicenter Studies—PSYSCAN: Translating Neuroimaging Findings From Research into Clinical Practice

2019 ◽  
Vol 46 (2) ◽  
pp. 432-441 ◽  
Author(s):  
Stefania Tognin ◽  
Hendrika H van Hell ◽  
Kate Merritt ◽  
Inge Winter-van Rossum ◽  
Matthijs G Bossong ◽  
...  
Keyword(s):  
Statistical Power ◽  
External Validation ◽  
Analytical Techniques ◽  
Biological Data ◽  
Machine Learning Techniques ◽  
Small Samples ◽  
Multicenter Studies ◽  
Early Stages ◽  
Learning Techniques ◽  
Cognitive Data

Abstract In the last 2 decades, several neuroimaging studies investigated brain abnormalities associated with the early stages of psychosis in the hope that these could aid the prediction of onset and clinical outcome. Despite advancements in the field, neuroimaging has yet to deliver. This is in part explained by the use of univariate analytical techniques, small samples and lack of statistical power, lack of external validation of potential biomarkers, and lack of integration of nonimaging measures (eg, genetic, clinical, cognitive data). PSYSCAN is an international, longitudinal, multicenter study on the early stages of psychosis which uses machine learning techniques to analyze imaging, clinical, cognitive, and biological data with the aim of facilitating the prediction of psychosis onset and outcome. In this article, we provide an overview of the PSYSCAN protocol and we discuss benefits and methodological challenges of large multicenter studies that employ neuroimaging measures.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Recent Applications of High Resolution Electron Microscopy to Crystalline Arrays of Virus Particles

1978 ◽  
Vol 36 (3) ◽  
pp. 470-482 ◽  
Author(s):  
R.W. Horne
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Analytical Techniques ◽  
Staining Technique ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
Full Potential ◽  
Virus Particles ◽  
Resolution Electron ◽  
Wide Range

The technique of surrounding virus particles with a neutralised electron dense stain was described at the Fourth International Congress on Electron Microscopy, Berlin 1958 (see Home & Brenner, 1960, p. 625). For many years the negative staining technique in one form or another, has been applied to a wide range of biological materials. However, the full potential of the method has only recently been explored following the development and applications of optical diffraction and computer image analytical techniques to electron micrographs (cf. De Hosier & Klug, 1968; Markham 1968; Crowther et al., 1970; Home & Markham, 1973; Klug & Berger, 1974; Crowther & Klug, 1975). These image processing procedures have allowed a more precise and quantitative approach to be made concerning the interpretation, measurement and reconstruction of repeating features in certain biological systems.

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

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