scholarly journals Photoluminescence Characteristics of Zinc Blende InAs Nanowires

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
E. A. Anyebe ◽  
M. Kesaria
Keyword(s):  
Surface Defects ◽  
Complementary Metal Oxide Semiconductor ◽  
Band Gap Energy ◽  
Oxide Semiconductor ◽  
Wurtzite Phase ◽  
Zinc Blende ◽  
Dominant Band ◽  
Spectral Linewidth ◽  
Inas Nanowires ◽  
Distinct Temperature

AbstractA detailed understanding of the optical properties of self-catalysed (SC), zinc blende (ZB) dominant, nanowires (NWs) is crucial for the development of functional and impurity-free nanodevices. Despite the fact that SC InAs NWs mostly crystallize in the WZ/ZB phase, there are very limited reports on the photoluminescence (PL) properties of ZB InAs NWs. Here, we report on the PL properties of Molecular Beam Epitaxy grown, SC InAs NWs. The as-grown NWs exhibit a dominant band to band (BtB) peak associated with ZB, InAs with an emission energy of ~0.41 eV in good agreement with the band gap energy of ZB InAs and significantly lower than that of the wurtzite phase (~0.48 eV). The strong BtB peak persists to near room temperature with a distinct temperature-dependent red-shift and very narrow spectral linewidth of ~20 meV (10 K) which is much smaller than previously reported values. A narrowing in PL linewidth with increasing NWs diameter is correlated with a decline in the influence of surface defects resulting from an enlargement in NWs diameter. This study demonstrates the high optical property of SC InAs NWs which is compatible with the Si-complementary metal-oxide-semiconductor technology and paves the way for the monolithic integration of InAs NWs with Si in novel nanodevices.

Surface Defects and Passivation of Ge and III–V Interfaces

MRS Bulletin ◽  
2009 ◽  
Vol 34 (7) ◽  
pp. 504-513 ◽  
Author(s):  
Michel Houssa ◽  
Evgueni Chagarov ◽  
Andrew Kummel
Keyword(s):  
Integrated Circuits ◽  
First Principles ◽  
Surface Defects ◽  
Gate Dielectrics ◽  
High Mobility ◽  
Complementary Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Cmos Circuits ◽  
Experimental Characterization ◽  
Metal Gates

AbstractThe need for high-κ gate dielectrics and metal gates in advanced integrated circuits has reopened the door to Ge and III–V compounds as potential replacements for silicon channels, offering the possibility to further increase the performances of complementary metal oxide semiconductor (CMOS) circuits, as well as adding new functionalities. Yet, a fundamental issue related to high-mobility channels in CMOS circuits is the electrical passivation of their interfaces (i.e., achieving a low density of interface defects) approaching state-of-the-art Si-based devices. Here we discuss promising approaches for the passivation of Ge and III–V compounds and highlight insights obtained by combining experimental characterization techniques with first-principles simulations.

scholarly journals An E-Band 21-dB Variable-Gain Amplifier with 0.5-V Supply in 40-nm CMOS

Electronics ◽  
2021 ◽  
Vol 10 (7) ◽  
pp. 804
Author(s):  
Gibeom Shin ◽  
Kyunghwan Kim ◽  
Kangseop Lee ◽  
Hyun-Hak Jeong ◽  
Ho-Jin Song
Keyword(s):  
Power Consumption ◽  
Frequency Band ◽  
Noise Figure ◽  
Complementary Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Operating Frequency ◽  
Variable Gain Amplifier ◽  
Variable Gain ◽  
Operating Frequency Band ◽  
Shunt Capacitors

This paper presents a variable-gain amplifier (VGA) in the 68–78 GHz range. To reduce DC power consumption, the drain voltage was set to 0.5 V with competitive performance in the gain and the noise figure. High-Q shunt capacitors were employed at the gate terminal of the core transistors to move input matching points for easy matching with a compact transformer. The four stages amplifier fabricated in 40-nm bulk complementary metal oxide semiconductor (CMOS) showed a peak gain of 24.5 dB at 71.3 GHz and 3‑dB bandwidth of more than 10 GHz in 68–78 GHz range with approximately 4.8-mW power consumption per stage. Gate-bias control of the second stage in which feedback capacitances were neutralized with cross-coupled capacitors allowed us to vary the gain by around 21 dB in the operating frequency band. The noise figure was estimated to be better than 5.9 dB in the operating frequency band from the full electromagnetic (EM) simulation.

scholarly journals Ab initio perspective of ultra-scaled CMOS from 2D-material fundamentals to dynamically doped transistors

2021 ◽  
Vol 5 (1) ◽  
Author(s):  
Aryan Afzalian
Keyword(s):  
Field Effect ◽  
High Performance ◽  
Field Effect Transistor ◽  
High Mobility ◽  
Complementary Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Grand Challenge ◽  
Gate Length ◽  
Delay Performance ◽  
Effect Transistor

AbstractUsing accurate dissipative DFT-NEGF atomistic-simulation techniques within the Wannier-Function formalism, we give a fresh look at the possibility of sub-10-nm scaling for high-performance complementary metal oxide semiconductor (CMOS) applications. We show that a combination of good electrostatic control together with high mobility is paramount to meet the stringent roadmap targets. Such requirements typically play against each other at sub-10-nm gate length for MOS transistors made of conventional semiconductor materials like Si, Ge, or III–V and dimensional scaling is expected to end ~12 nm gate-length (pitch of 40 nm). We demonstrate that using alternative 2D channel materials, such as the less-explored HfS2 or ZrS2, high-drive current down to ~6 nm is, however, achievable. We also propose a dynamically doped field-effect transistor concept, that scales better than its MOSFET counterpart. Used in combination with a high-mobility material such as HfS2, it allows for keeping the stringent high-performance CMOS on current and competitive energy-delay performance, when scaling down to virtually 0 nm gate length using a single-gate architecture and an ultra-compact design (pitch of 22 nm). The dynamically doped field-effect transistor further addresses the grand-challenge of doping in ultra-scaled devices and 2D materials in particular.

scholarly journals Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems

Sensors ◽  
2021 ◽  
Vol 21 (1) ◽  
pp. 238
Author(s):  
Jakub Šalplachta ◽  
Tomáš Zikmund ◽  
Marek Zemek ◽  
Adam Břínek ◽  
Yoshihiro Takeda ◽  
...  
Keyword(s):  
High Efficiency ◽  
Image Inpainting ◽  
Simulated Data ◽  
Complementary Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Detection Accuracy ◽  
Reduction Procedure ◽  
X Ray ◽  
Artifacts Reduction ◽  
Ct Data

In this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to their cause and character in computed tomography (CT) data. Each type is then addressed separately in the sinogram domain. The novel iterative schemes based on relative total variations (RTV) were integrated to detect the artifacts. The correction process uses the image inpainting, and the intensity deviations smoothing method. The procedure was implemented in scope of lab-based X-ray nano CT with detection systems based on charge-coupled device (CCD) and scientific complementary metal–oxide–semiconductor (sCMOS) technologies. The procedure was then further tested and optimized on the simulated data and the real CT data of selected samples with different compositions. The performance of the procedure was quantitatively evaluated in terms of the artifacts’ detection accuracy, the comparison with existing methods, and the ability to preserve spatial resolution. The results show a high efficiency of ring removal and the preservation of the original sample’s structure.

Computational study of the staircase molecular conductivity of polyoxovanadates adsorbed on Au(111)

2021 ◽  
Vol 50 (16) ◽  
pp. 5540-5551
Author(s):  
Almudena Notario-Estévez ◽  
Xavier López ◽  
Coen de Graaf
Keyword(s):  
Metal Oxide ◽  
Computational Study ◽  
Complementary Metal Oxide Semiconductor ◽  
Cmos Technology ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Molecular Conduction ◽  
Conduction Properties ◽  
Molecular Conductivity

This computational study presents the molecular conduction properties of polyoxovanadates V6O19 (Lindqvist-type) and V18O42, as possible successors of the materials currently in use in complementary metal–oxide semiconductor (CMOS) technology.

scholarly journals Phase Change Metasurfaces by Continuous or Quasi-Continuous Atoms for Active Optoelectronic Integration

Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1272
Author(s):  
Zhihua Fan ◽  
Qinling Deng ◽  
Xiaoyu Ma ◽  
Shaolin Zhou
Keyword(s):  
Phase Change ◽  
Phase Change Materials ◽  
Complementary Metal Oxide Semiconductor ◽  
Photonic Devices ◽  
Oxide Semiconductor ◽  
Cmos Process ◽  
Nanophotonic Devices ◽  
Optoelectronic Integration ◽  
Hybrid Devices ◽  
Micro Electromechanical System

In recent decades, metasurfaces have emerged as an exotic and appealing group of nanophotonic devices for versatile wave regulation with deep subwavelength thickness facilitating compact integration. However, the ability to dynamically control the wave–matter interaction with external stimulus is highly desirable especially in such scenarios as integrated photonics and optoelectronics, since their performance in amplitude and phase control settle down once manufactured. Currently, available routes to construct active photonic devices include micro-electromechanical system (MEMS), semiconductors, liquid crystal, and phase change materials (PCMs)-integrated hybrid devices, etc. For the sake of compact integration and good compatibility with the mainstream complementary metal oxide semiconductor (CMOS) process for nanofabrication and device integration, the PCMs-based scheme stands out as a viable and promising candidate. Therefore, this review focuses on recent progresses on phase change metasurfaces with dynamic wave control (amplitude and phase or wavefront), and especially outlines those with continuous or quasi-continuous atoms in favor of optoelectronic integration.

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