Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure
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2015 ◽
Vol 2015
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pp. 1-10
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Keyword(s):
2012 ◽
Vol 217-219
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pp. 2634-2639
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1999 ◽
Vol 173
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pp. 185-188
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1973 ◽
Vol 31
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pp. 698-699
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1985 ◽
Vol 43
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pp. 714-715
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