Principle and Design of A High Performance Analog Switch Circuit

The electronic ignition system for special electromechanical device is composed of control module, analog switch circuit, ignition driver module and ignition module. The key point to make the system work quickly, real time, safety and accurately is the hardware design. Study on electronic ignition circuit design for special electromechanical device considering security design is employed to effectively increase the reliability and safety performance, which corresponding design idea and technical way can lay a theoretical and technical foundation for subsequent research.

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Progress of RSFQ High Performance Packet Switch

Advances in Science and Technology ◽

10.4028/www.scientific.net/ast.47.188 ◽

2006 ◽

Vol 47 ◽

pp. 188-194

Author(s):

Shinichi Yorozu ◽

Yoshihito Hashimoto ◽

Yoshio Kameda ◽

Toshiyuki Miyazaki

Keyword(s):

Power Consumption ◽

High Speed ◽

High Performance ◽

Semiconductor Technology ◽

Switch Architecture ◽

Traffic Loads ◽

Rapid Single Flux Quantum ◽

Switch System ◽

Packet Switch ◽

Switch Circuit

Internet traffic loads are increasing. Sustaining packet switching throughput of a core node will be difficult. A major reason for this is power consumption and packaging volume. As long as we use only current semiconductor technology, the switching capacity will be limited. Rapid single flux quantum (RSFQ) superconducting technology can overcome such difficulties because of high-speed operation and low-power consumption characteristics. A superconducting wiring also enables high-speed inter-chip communication. We report on progress on packet switch circuit implementation and cryo-cooled packaging for a RSFQ packet switch system. In addition, we discuss a possible packet switch architecture over 100 Tbps that uses RSFQ technology.

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Design of a low on-resistance analog switch circuit

2021 9th International Symposium on Next Generation Electronics (ISNE) ◽

10.1109/isne48910.2021.9493627 ◽

2021 ◽

Author(s):

Duocai Peng ◽

Xiangliang Jin ◽

Liang Xie

Keyword(s):

Analog Switch ◽

Switch Circuit

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Research on Electric-Fluid Mechanics with Intermittent Oscillatory of RCC Circuit

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.730.297 ◽

2015 ◽

Vol 730 ◽

pp. 297-302

Author(s):

Wei Zhou Hou

Keyword(s):

Output Power ◽

High Performance ◽

Low Cost ◽

Pulse Signal ◽

Price Ratio ◽

Flyback Converter ◽

High Efficient ◽

Large Scope ◽

Supply Equipment ◽

Switch Circuit

RCC circuit (self-oscillating flyback converter) is a kind of high efficient working circuit by use of several devices, but excessive control current will cause the occur of intermittent oscillation. And then the oscillation frequency of the circuit change in a large scope (from hundreds of hertz to several thousand hertz). In addition, the output power is more likely to make the transformer device to produce abnormal noise. However, this phenomenon is not completely useless. After improving the RCC circuit can be conclude that the circuit can start in applying a pulse signal if the output power is small. The switch circuit operates in low-power state by means of intermittent oscillation. The result is that RCC circuit have high performance price ratio and low cost, so it is a widely used in high performance power supply equipment.

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A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100061975 ◽

1969 ◽

Vol 27 ◽

pp. 14-15

Author(s):

A. V. Crewe ◽

M. Isaacson ◽

D. Johnson

Keyword(s):

High Performance ◽

Vertical Plane ◽

Median Plane ◽

Electron Gun ◽

Uniform Field ◽

Loss Mechanism ◽

Electron Scanning Microscopy ◽

Sector Type ◽

Double Focusing ◽

Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

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Vacuum System to Minimize the Specimen Contamination of High-Performance EM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100077967 ◽

1977 ◽

Vol 35 ◽

pp. 68-69

Author(s):

N. Yoshimura ◽

K. Shirota ◽

T. Etoh

Keyword(s):

Electron Microscope ◽

High Speed ◽

High Performance ◽

High Vacuum ◽

Vacuum System ◽

Pump System ◽

Pumping System ◽

Diffusion Pump ◽

Almost All ◽

Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

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Use of the Magnetostatic Analogue In Electromagnetic Lens Engineering

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100068795 ◽

1970 ◽

Vol 28 ◽

pp. 360-361

Author(s):

John W. Coleman

Keyword(s):

Boundary Conditions ◽

High Performance ◽

Force Fields ◽

Optical Design ◽

Direct Conversion ◽

Design Engineering ◽

Design Data ◽

Scalar Potentials ◽

Geometric Elements ◽

At Will

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.

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Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100086635 ◽

1991 ◽

Vol 49 ◽

pp. 466-467

Author(s):

J W Steeds ◽

R Vincent

Keyword(s):

Field Emission ◽

High Performance ◽

Small Diameter ◽

Convergent Beam Electron Diffraction ◽

Zone Axis ◽

Medium Voltage ◽

Transmission Electron ◽

Good Crystallinity ◽

Special Modification ◽

Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

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Current State of Biological High-Resolution Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100102985 ◽

1988 ◽

Vol 46 ◽

pp. 180-181 ◽

Cited By ~ 1

Author(s):

Klaus-Ruediger Peters

Keyword(s):

High Performance ◽

Low Voltage ◽

Backscattered Electrons ◽

Lens Position ◽

Low Voltage Operation ◽

Signal Collection ◽

Probe Size ◽

Electron Microscopes ◽

Scanning Electron Microscopes ◽

Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

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