Characterization of ULSI gate oxide reliability using substrate and channel electron injection stresses
Reliability and Ruggedness of 1200V SiC Planar Gate MOSFETs Fabricated in a High Volume CMOS Foundry
2018 ◽
Vol 924
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pp. 697-702
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Keyword(s):
2007 ◽
Vol 46
(11)
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pp. 7256-7262
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Keyword(s):
1988 ◽
Vol 35
(12)
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pp. 2268-2278
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1995 ◽
Vol 35
(3)
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pp. 603-608
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Keyword(s):
1998 ◽
Vol 38
(2)
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pp. 255-258
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