Li-DOPING EFFECT ON THE CATHODOLUMINESCENT PROPERTIES OF Y2O3:Eu3+ PHOSPHORS

2007 ◽  
Vol 14 (04) ◽  
pp. 535-538 ◽  
Author(s):  
J. S. BAE ◽  
J. H. YOON ◽  
S. K. PARK ◽  
J. P. KIM ◽  
E. D. JEONG ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Photoelectron Spectroscopy ◽  
Luminescent Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Li Doping ◽  
Enhanced Photoluminescence ◽  
Chemical States ◽  
Structural Surface ◽  
The Relationship

Influence of lithium doping on the crystallization, the surface morphology, the chemical states and the luminescent properties of Y 2 O 3: Eu 3+ phosphors was investigated. The structural, surface morphology characteristics and chemical states of the phosphors were analyzed by using X-ray diffraction (XRD), scanning electron microscope (SEM), and X-ray photoelectron spectroscopy (XPS), respectively. The crystallinity, the surface morphology, and the cathodoluminescence (CL) of phosphors highly depended on the Li doping. The relationship between the crystalline and morphological structures and the luminescent properties was studied, and Li + doping affected not only the crystallinity but also the luminescent brightness of Y 2 O 3: Eu 3+ phosphors. In particular, the incorporation of the Li + ion into the Y 2 O 3 lattice could induce remarkable increase in the CL intensity. The enhanced photoluminescence brightness with Li doping may result both from the improved crystallinity leading to higher oscillating strengths for the optical transitions, and the increased surface area due to the larger particle sizes. The strongest emission intensity was observed with Li doped Y 2 O 3: Eu 3+ ceramics whose brightness was increased by a factor of 1.8 in comparison with that of Y 2 O 3: Eu 3+ ceramics.

FeYO3@rGO nanocomposites: Synthesis, characterization and application in photooxidative degradation of atrazine under visible light

2021 ◽  
Vol 11 (5) ◽  
pp. 706-716
Author(s):  
Nada D. Al-Khthami ◽  
Tariq Altalhi ◽  
Mohammed Alsawat ◽  
Mohamed S. Amin ◽  
Yousef G. Alghamdi ◽  
...  
Keyword(s):  
Visible Light ◽  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Bandgap Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Reduced Graphene ◽  
Structural Surface ◽  
Adsorption Desorption

Different organic pollutants have been remediated photo catalytically by applying perovskite photocatalysts. Atrazine (ATR) is a pesticide commonly detected as a pollutant in drinking, surface and ground water. Herein, FeYO3@rGO heterojunction was synthesized and applied for photooxidation decomposition of ATR. First, FeYO 3nanoparticles (NPs) were prepared via routine sol-gel. After that, FeYO3 NPs were successfully incorporated with different percentages (5, 10, 15 and 20 wt.%) of reduced graphene oxide (rGO) in the synthesis of novel FeYO3@rGO photocatalyst. Morphological, structural, surface, optoelectrical and optical characteristics of constructed materials were identified via X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Transmission electron microscopy (TEM), adsorption/desorption isotherms, diffusive reflectance (DR) spectra, and photoluminescence response (PL). Furthermore, photocatalytic achievement of the constructed materials was evaluated via photooxidative degradation of ATR. Various investigations affirmed the usefulness of rGO incorporation on the advancement of formed photocatalysts. Actually, novel nanocomposite containing rGO (15 wt.%) possessed diminished bandgap energy, as well as magnified visible light absorption. Furthermore, such nanocomposite presented exceptional photocatalytic achievement when exposed to visible light as ATR was perfectly photooxidized over finite amount (1.6 g · L-1) from the optimized photocatalyst when illuminated for 30 min. The advanced photocatalytic performance of constructed heterojunctions could be accredited mainly to depressed recombination amid induced charges. The constructed FeYO3@rGO nanocomposite is labelled as efficient photocatalyst for remediation of herbicides from aquatic environments.

scholarly journals Room-Temperature Formation of Hard BCx Films by Low Power Magnetron Sputtering

2021 ◽  
Vol 11 (21) ◽  
pp. 9896
Author(s):  
Veronica Sulyaeva ◽  
Maxim Khomyakov ◽  
Marina Kosinova
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
Film Properties ◽  
X Ray ◽  
Sputtering Power ◽  
Chemical States ◽  
Rf Signal ◽  
Dual Target

Boron carbide is one of the most important non-metallic materials. Amorphous BCx films were synthesized at room temperature by single- and dual-target magnetron sputtering processes. A B4C target and C target were operated using an RF signal and a DC signal, respectively. The effect of using single- and dual-target deposition and process parameters on the chemical bonding and composition of the films as well as their functional properties were characterized by Fourier transform infrared spectroscopy, Raman spectroscopy, X-ray photoelectron spectroscopy, X-ray energy dispersive analysis, X-ray diffraction, ellipsometry, and spectrophotometry. It was found that the film properties depend on the sputtering power and the used targets. EDX data show that the composition of the samples varied from B2C to practically BC2 in the case of using an additional C target. According to the XPS data, it corresponds to the different chemical states of the boron atom. A nanoindentation study showed that the film with a composition close to B2C deposited with the highest B4C target power reached a hardness of 25 GPa and Young’s modulus of 230 GPa. The optical properties of the films also depend on the composition, so the band gap (Eg) of the BCx film varied in the range of 2.1–2.8 eV, while the Eg of the carbon-rich films decreased to 1.1 eV.

scholarly journals Annealing-Driven Microstructural Evolution and Its Effects on the Surface and Nanomechanical Properties of Cu-Doped NiO Thin Films

Coatings ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 107 ◽  
Author(s):  
San-Ho Wang ◽  
Sheng-Rui Jian ◽  
Guo-Ju Chen ◽  
Huy-Zu Cheng ◽  
Jenh-Yih Juang
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Annealing Temperature ◽  
Film Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanomechanical Properties ◽  
Glass Substrates ◽  
Structural Surface ◽  
Diffraction Peaks

The effects of annealing temperature on the structural, surface morphological and nanomechanical properties of Cu-doped (Cu-10 at %) NiO thin films grown on glass substrates by radio-frequency magnetron sputtering are investigated in this study. The X-ray diffraction (XRD) results indicated that the as-deposited Cu-doped NiO (CNO) thin films predominantly consisted of highly defective (200)-oriented grains, as revealed by the broadened diffraction peaks. Progressively increasing the annealing temperature from 300 to 500 °C appeared to drive the films into a more equiaxed polycrystalline structure with enhanced film crystallinity, as manifested by the increased intensities and narrower peak widths of (111), (200) and even (220) diffraction peaks. The changes in the film microstructure appeared to result in significant effects on the surface energy, in particular the wettability of the films as revealed by the X-ray photoelectron spectroscopy and the contact angle of the water droplets on the film surface. The nanoindentation tests further revealed that both the hardness and Young’s modulus of the CNO thin films increased with the annealing temperature, suggesting that the strain state and/or grain boundaries may have played a prominent role in determining the film’s nanomechanical characterizations.

Synthesis and Characterization of Ag/TiO2 Thin Film via Sol-Gel Method

2018 ◽  
Vol 273 ◽  
pp. 140-145 ◽  
Author(s):  
Dewi Suriyani Che Halin ◽  
Norsuria Mahmed ◽  
Mohd Arif Anuar Mohd Salleh ◽  
A.N. Mohd Sakeri ◽  
Kamrosni Abdul Razak
Keyword(s):  
Surface Morphology ◽  
Spin Coating ◽  
Sol Gel ◽  
Synthesis And Characterization ◽  
Drying Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coating Method ◽  
Structural Surface

Ag/TiO2thin films were prepared via sol-gel spin coating method. Structural, surface morphology and optical properties were investigated with the addition of two different amount of silver (Ag). X-ray diffraction pattern shows the sample with pure TiO2, the only phase presence was brookite TiO2. When the Ag content added into the solution, the phase existed for the samples with TiO2doped 0.5g Ag and TiO2doped 1.0g Ag were anatase TiO2with no peak corresponds to Ag phase. The surface morphology of film was characterized by scanning electron microscopy (SEM). The films were annealed at 450 °C and it shows non-uniform films. The films have a large flaky and cracks film which was attributed to surface tension between the film and the air during the drying process. When the solution of sol was added with Ag content, it shows the porous structure with flaky-crack films. With the increasing of the Ag content from 0.5g to 1.0g, the structure is more porous and it is good for the photocatalytic activity. The UV-Vis spectra shows that the film exhibits a low absorbance which was due to the substrate is inhomogeneously covered by the flaky-crack films.

Simplified Synthesis and Luminous Mechanism of Eu2+-Doped α-Si3N4 Nanowires with Strong Green Luminescent Properties

2017 ◽  
Vol 727 ◽  
pp. 635-641 ◽  
Author(s):  
Rui Su ◽  
Zhi Feng Huang ◽  
Fei Chen ◽  
Qiang Shen ◽  
Lian Meng Zhang
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Broad Band ◽  
Luminescent Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Broad Band Emission ◽  
Band Emission ◽  
Nitridation Process ◽  
Transmission Electron

Ultra-long, single crystal, Eu-doped α-Si3N4 nanowires were prepared by a simple approach involving nitriding Eu-doped cryomilled nanocrystalline Si powder in NH3 flow at 1350 °C for 4 h. Phases, chemical composition and microcosmic feature of cryomilled powders and as-prepared nanowires were tested by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), respectively. The results suggested that Eu was successfully introduced into Si lattice after the cryomilling process and then entered into the lattice of α-Si3N4 during the nitridation process. The as-synthesized Eu-doped α-Si3N4 nanowires had highly uniform dimension with 20~30 nm in diameter and ~100 μm in length. The room temperature photoluminescence (PL) spectrum of as-synthesized nanowires showed a broad band emission center at 570 nm which was attributed to the transition from 4f65d to 4f7 in Eu2+. The transition from Eu3+ to Eu2+ during nitridation process was tested by X-ray photoelectron spectroscopy (XPS).

scholarly journals In-Depth Characterization of Secondary Phases in Cu2ZnSnS4 Film and Its Application to Solar Cells

Nanomaterials ◽  
2019 ◽  
Vol 9 (6) ◽  
pp. 855 ◽  
Author(s):  
Xianfeng Zhang ◽  
Hongde Wu ◽  
Engang Fu ◽  
Yuehui Wang
Keyword(s):  
Solar Cell ◽  
Conversion Efficiency ◽  
Photoelectron Spectroscopy ◽  
Czts Film ◽  
Elemental Distribution ◽  
Secondary Phases ◽  
X Ray Diffraction ◽  
X Ray ◽  
Chemical States ◽  
Czts Thin Films

Secondary phases are common in Cu2ZnSnS4 (CZTS) thin films, which can be fatal to the performance of solar cell devices fabricated from this material. They are difficult to detect by X-Ray diffraction (XRD) because of the weak peak in spectra compared with the CZTS layer. Herein, it was found that in-depth elemental distribution by a secondary ion mass spectroscopy method illustrated uniform film composition in the bulk with slight fluctuation between different grains. X-ray photoelectron spectroscopy (XPS) measurement was conducted after sputtering the layer with different depths. An Auger electron spectrum with Auger parameter were used to check the chemical states of elements and examine the distribution of secondary phases in the CZTS films. Secondary phases of CuS, ZnS and SnS were detected at the surface of the CZTS film within a 50-nm thickness while no secondary phases were discovered in the bulk. The solar cell fabricated with the as-grown CZTS films showed a conversion efficiency of 2.1% (Voc: 514.3 mV, Jsc: 10.4 mA/cm2, FF: 39.3%) with an area of 0.2 cm2 under a 100 mW/cm2 illumination. After a 50-nm sputtering on the CZTS film, the conversion efficiency of the solar cell was improved to 6.2% (Voc: 634.0 mV, Jsc: 17.3 mA/cm2, FF: 56.9%).

scholarly journals Microstructure and Oxidation Behavior of Metal V Films Deposited by Magnetron Sputtering

Materials ◽  
2019 ◽  
Vol 12 (3) ◽  
pp. 425 ◽  
Author(s):  
Song Zhang ◽  
Tingting Wang ◽  
Ziyu Zhang ◽  
Jun Li ◽  
Rong Tu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Morphology ◽  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Oxidation Behavior ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atomic Force ◽  
Transmission Electron ◽  
Influence Of Substrate

Direct-current magnetron sputtering (DCMS) was applied to prepare vanadium (V) films on Si substrate. The influence of substrate temperature (Ts) and target–substrate distance (Dt–s) on phase structure and surface morphology of V films were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscope (AFM) and transmission electron microscopy (TEM). The results show that the crystallinity of the V films increases with increasing Ts and decreasing Dt–s. The film deposited at Ts = 400 °C and Dt–s = 60 mm exhibits the best crystallinity and <111> preferred orientation with a regular tetrahedral surface morphology. Oxidation behavior of the V thin films has also been studied by X-ray photoelectron spectroscopy (XPS).

Development of quasi-two-dimensional Nb2O5 nanoflakes with thickness-depended electro-chemical properties

2015 ◽  
Vol 08 (01) ◽  
pp. 1550007 ◽  
Author(s):  
Serge Zhuiykov ◽  
Eugene Kats ◽  
Tomoaki Sato ◽  
Hiroshi Ikeda ◽  
Norio Miura
Keyword(s):  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Chemical Properties ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Conductive Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Structural Surface

Quasi-two-dimensional (Q2D) Nb 2 O 5 nanoflakes were synthesized by combined sol–gel/exfoliation method with the average thickness of 10–25 nm. Their structural, surface- and electro-chemical properties were closely studied and analyzed by X-ray diffraction (XRD), energy dispersive X-ray spectroscopy (EDX), scanning electron microscopy (SEM), conductive atomic force microscopy (AFM), Fourier transform infrared (FTIR) spectroscopy, X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy techniques.

Preparation of ZrO2 in SiC coating via hydrothermal method and sintering process onto carbon/carbon composite

2021 ◽  
Vol 11 (12) ◽  
pp. 1997-2003
Author(s):  
Zu-Li Mao ◽  
Li Yang ◽  
Jie Wu
Keyword(s):  
Hydrothermal Method ◽  
Photoelectron Spectroscopy ◽  
Carbon Composite ◽  
Elemental Distribution ◽  
Sintering Process ◽  
X Ray Diffraction ◽  
Carbon Phase ◽  
X Ray ◽  
Sem Image ◽  
Chemical States

To reduce the defects in SiC coating, a SiC/ZrO2 composite is prepared and coated onto carbon/carbon composite via hydrothermal method and sintering process. The microstructure, surface morphology, chemical states, and elemental distribution of SiC/ZrO2 coating are analysed with X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), and X-ray photoelectron spectroscopy (XPS). In addition, we analyze the tribological behavior of the SiC and SiC/SiC/ZrO2 coatings and the related microstructure. The results show that SiC/ZrO2 coating is composed of SiC phase, ZrO2 phase, carbon phase, and SiO2 phase. EDS results show that Si, C, O, and Zr elements are present in the SiC/ZrO2 coating. Moreover, XPS results show the presence of SiC, ZrO2, and SiO2. According to the SEM image, the coating is dense except for some observable cracks. Notably, specimens with the SiC/ZrO2 coating have smaller, more stable friction coefficients and less weight loss than specimens with the SiC-only coating. The formation of ZrO2 strengthens the SiC coating, while the SiO2 formed in the coating acts as a lubricant and reduces the friction coefficient of the coating.

The Synthesis of Polycrystalline Chalcopyrite Semiconductors by Microwave Irradiation

1993 ◽  
Vol 327 ◽  
Author(s):  
Christopher C. Landry ◽  
Andrew R. Barron
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Surface Morphology ◽  
Microwave Irradiation ◽  
Photoelectron Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Edx Analysis ◽  
Chalcopyrite Semiconductors ◽  
Scanning Electron

AbstractPolycrystalline samples of the chalcopyrites CuInS2, CuInSe2, AgInS2, and AgInSe2 have been prepared from stoichiometric mixtures of the pure elements using microwave irradiation. The reactions were performed in sealed quartz tubes in as few as three minutes. The products were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis, and X-ray photoelectron spectroscopy (XPS). The surface morphology and shape of the particles produced by this method suggests that the products are formed from liquid melts.

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