IMPROVED PROPERTIES OF SnO2 THIN FILMS OBTAINED VIA SPIN COATING METHOD BY VARYING THE SOLUTION CONCENTRATION
The aim of this work is to study the solution concentration effect on the SnO2 thin film properties, which were deposited on glass substrates by spin coating technique and annealed for one hour at 500[Formula: see text]C. X-ray diffraction (XRD) spectra show that the films deposited at various solution concentrations (0.5[Formula: see text]mol/L, 0.7[Formula: see text]mol/L and 1[Formula: see text]mol/L) are polycrystalline with a tetragonal rutile type. Grains have two preferred orientations along the directions (110) and (101) corresponding to 2[Formula: see text] equal to 26.74[Formula: see text] and 34.11[Formula: see text], respectively. We have also noted that the grain size changes between 109[Formula: see text]nm and 178[Formula: see text]nm. However, the film coated at 10 deposition cycles and 0.7[Formula: see text]mol/L solution concentration has a minimum arithmetic average roughness of 0.376 nm. The optical transmittance of the films in the visible spectrum was in the range of 77–84% and the optical band gap gradually decreases with the decrease of the solution concentration from 4.11[Formula: see text]eV to 3.56[Formula: see text]eV.