EFFECT OF SURFACE FINISHES ON THE THICKNESS AND MORPHOLOGY OF THE INTERMETALLIC LAYER IN LEAD-FREE SOLDER JOINTS

2004 ◽  
Vol 03 (06) ◽  
pp. 803-813 ◽  
Author(s):  
A. C. SPOWAGE ◽  
C. M. THONG ◽  
P. A. COLLIER ◽  
G. Y. LI
Keyword(s):  
Intermetallic Layer ◽  
Cost Effective ◽  
Electroless Nickel ◽  
Copper Metallization ◽  
Soldering Process ◽  
Surface Finishes ◽  
Joint Characteristics ◽  
Free Solder ◽  
Immersion Silver ◽  
The Impact

One of the most pressing challenges facing today's electronics packaging industry is to identify reliable and cost-effective solder alloys to replace toxic lead containing solder. Besides evaluating new alloy compositions and improving the soldering process, it is important to understand how surface finishes applied to the copper metallization affect the joint characteristics. The characterization of intermetallics during the early stages of nucleation and the growth is hindered by the nanoscopic grain size and layer thickness. This study investigates the impact of PCB finish and solder type on the interfacial intermetallics. Five types of solder and four types of finishes were used: Sn37Pb (SP), Sn3.5Ag (SA), Sn3.5Ag0.7Cu (SAC), Sn2Ag0.5Cu4Bi (SACB) and Sn3Bi8Zn (SBZ) solders, combined with immersion Silver ( I – Ag ), electroless Nickel-immersion Gold (ENIG), Organic Solderability Preservative (OSP) and immersion Tin ( I – Sn ). It was shown that both the SP and SAC solders follow a parabolic growth model and that the surface finish has a significant effect on the intermetallic morphology and growth kinetics. A combined SEM and XRD investigation was shown to be a suitable method for characterizing nanoscale intermetallics.

Effect of ENEPIG Surface Finish on the Vibration Reliability of Solder Interconnects

2013 ◽  
Vol 2013 (1) ◽  
pp. 000115-000119 ◽  
Author(s):  
Sandeep Menon ◽  
Adam Pearl ◽  
Michael Osterman ◽  
Michael Pecht
Keyword(s):  
Electroless Nickel ◽  
Copper Metallization ◽  
Printed Wiring Boards ◽  
Solder Interconnects ◽  
Solder Interconnect ◽  
Failure Data ◽  
Surface Finishes ◽  
Interconnect Reliability ◽  
Immersion Silver ◽  
The Impact

Surface finishes are used to preserve and promote solderability of exposed copper metallization on printed wiring boards. While in the best of worlds, the solder used in assembly should dictate the solder interconnect reliability, surface finishes are known to have an effect. The effect of surface finishes on solder interconnect reliability can be particularly strong under high strain rate loading conditions. In this study, durability of solder interconnects formed between BGAs and electroless nickel, electroless palladium, immersion gold (ENEPIG) finished pads assembled using SnPb and SAC305 solders under harmonic vibration loading is examined. ENEPIG test specimens with two thicknesses of palladium were evaluated. Isothermal preconditioning levels at 100°C for 24 hrs and 500 hrs were included to evaluate the impact of intermetalic evolution on the durability of the soldered interconnects. For comparison, tests specimens created with immersion silver (ImAg) finished printed wiring boards were also included. The failure data obtained found the durability of interconnects formed with ENEPIG finish was comparable or better durability than the durability of interconnects formed with ImAg finish irrespective of the solder. The tests indicate that the use of a thicker palladium layer reduced the degradation in durability which occurred from isothermal aging.

Reliability Analysis of Lead-Free Solder Joints with Solder Doping on Harsh Environment

2016 ◽  
Vol 2016 (1) ◽  
pp. 000117-000122 ◽  
Author(s):  
Cong Zhao ◽  
Thomas Sanders ◽  
Zhou Hai ◽  
Chaobo Shen ◽  
John L. Evans
Keyword(s):  
Surface Finish ◽  
Isothermal Aging ◽  
Electroless Nickel ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Paste ◽  
Surface Mount ◽  
Surface Finishes ◽  
Free Solder ◽  
Immersion Silver

Abstract This paper investigates the effect of long term isothermal aging and thermal cycling on the reliability of lead-free solder mixes with different solder compositions, PCB surface finishes, and isothermal aging conditions. A variety of surface mount components are considered, including ball grid arrays (BGAs), quad flat no-lead packages (QFNs) and 2512 Surface Mount Resistors (SMRs). 12 lead-free solder pastes are tested; for BGA packages these are reflowed with lead-free solder spheres of SAC105, SAC305 and matched doped solder spheres (“matched” solder paste and sphere composition). Three surface finishes are tested: Organic Solderability Preservative (OSP), Immersion Silver (ImAg), and Electroless Nickel Immersion Gold (ENIG). All test components are subjected to isothermal aging at 125°C for 0 or 12 months, followed by accelerated thermal cycle testing from −40°C to 125°C. Data from the first 1500 cycles is presented here, with a focus on the effect of surface finish on package reliability. Current results demonstrate that the choice of surface finish has a strong effect on reliability. However, different solder materials appear to show different reliability trends with respect to the surface finishes, and the reliability trends of BGA and SMR packages also diverge.

A STUDY OF SURFACE FINISHES FOR IC SUBSTRATES AND WIRE BOND APPLICATIONS

2011 ◽  
Vol 2011 (1) ◽  
pp. 000516-000520 ◽  
Author(s):  
John Ganjei ◽  
Ernest Long ◽  
Lenora Toscano
Keyword(s):  
Surface Finish ◽  
Printed Circuit Boards ◽  
Performance Enhancement ◽  
High Reliability ◽  
Cost Effective ◽  
Electroless Nickel ◽  
Gold Wire ◽  
Electronics Industry ◽  
Surface Finishes ◽  
And Performance

The continuing drive for ever increasing performance enhancement in the electronics industry, in combination with the recent, very significant increase in precious metal costs have left fabricators and OEMs questioning what the best, most cost effective, surface finish is for high reliability applications. Currently, the IC substrate market relies heavily on electrolytic nickel and gold as a solderable and superior wire bondable surface. The use of this finish has allowed manufacturers to avoid the reliability concerns However, this choice also results in significant design restraints being imposed. Many in the industry are now investigating the use of electroless nickel/electroless palladium/immersion gold (ENEPIG) to achieve both high reliability and performance, without the negative design restraints imparted by the use of electrolytic processes. However, over the last year alone, the industry has watched the price of gold increase by 50% and that of palladium double [1]. With this in mind, and considering the historic precedent set in the mid 1990’s when ENEPIG was also evaluated as a surface finish for printed circuit boards, when coincidentally, the cost of palladium also reached an all time high, it should be remembered that the electronics industry quickly moved to evaluate alternate, more cost sustainable, surface finishes. This paper details the use of lower cost, alternate surface finishes for IC substrate applications, with particular experimental focus on gold wire bonding capabilities and BGA solderability of the finishes described. The paper also discusses related process cycle advantages and the significantly reduced operating costs associated with these new finishes.

Study of immersion silver and tin printed-circuit-board surface finishes in lead-free solder applications

2004 ◽  
Vol 33 (9) ◽  
pp. 977-990 ◽  
Author(s):  
Minna Arra ◽  
Dongkai Shangguan ◽  
Dongji Xie ◽  
Janne Sundelin ◽  
Toivo Lepistö ◽  
...  
Keyword(s):  
Printed Circuit Board ◽  
Circuit Board ◽  
Lead Free ◽  
Lead Free Solder ◽  
Printed Circuit ◽  
Surface Finishes ◽  
Board Surface ◽  
Free Solder ◽  
Immersion Silver

Influence of Second Reflow on the Intermetallic Compound Growth with Different Surface Finish

2016 ◽  
Vol 701 ◽  
pp. 127-131
Author(s):  
Hardinnawirda Kahar ◽  
Zetty Akhtar Abd Malek ◽  
Siti Rabiatull Aisha Idris ◽  
Mahadzir Ishak
Keyword(s):  
Intermetallic Compound ◽  
Surface Finish ◽  
Electroless Nickel ◽  
Optical Microscope ◽  
Compound Formation ◽  
Intermetallic Compound Growth ◽  
Surface Finishes ◽  
Intermetallic Compound Formation ◽  
Free Solder ◽  
Immersion Tin

The formation and growth of the intermetallic were frequently discussed since lead free solder took place replacing the lead solder. However, the effect of multiple reflow process on the intermetallic morphology that was subjected to aging still needs further investigation. Thus, this study aimed to investigate the effect of second reflow towards the intermetallic compound formation and growth. Two types of surface finishes were used such as Immersion Tin (ImSn) and Electroless Nickel Immersion Gold (ENIG). Both test boards were reflowed once with Sn-3Ag-0.5Cu at the temperature of 225 °C and soaking for 8 seconds. Then, they were reflowed again at the same temperature for 25 minutes prior to an isothermal aging process for 250, 500, 1000 and 2000 hours at the temperature of 150 °C. The ProgRes C3 IM7200 Optical Microscope and ImageJ were used for the microstructural study, which includes morphology and thickness. Results indicated that IMC thickness formed between solder and ImSn surface finish increased significantly with 1.28 µm incremental when exposed to the second reflow. Whereas the IMC thickness of ENIG surface finish was increased for up to 0.15 µm. In addition, ENIG showed higher activation energy as compared to ImSn.

Effect of Soldier Bump Size On Interfacial Reactions During Soldering Between PB–Free Solder and Cu and Cu Ni/Pd/Au Surface Finishes

2012 ◽  
Author(s):  
Nor Akmal Fadil ◽  
Ali Ourdjini ◽  
Azmah Hanim Mohamed Ariff ◽  
Siti Rabiatul Aisha Idris
Keyword(s):  
Intermetallic Compounds ◽  
Surface Finish ◽  
Isothermal Aging ◽  
Flip Chip ◽  
Electroless Nickel ◽  
Lead Free ◽  
Lead Free Solder ◽  
Under Bump Metallization ◽  
Surface Finishes ◽  
Free Solder

Teknologi flip chip memberikan ketumpatan I/O yang sangat tinggi dan mengambil kira prestasi elektrikal yang paling baik dalam penyambungan komponen elektronik. Oleh itu, kajian tentang sebatian antara logam dilaksanakan untuk mengkaji kesan saiz bebola pateri bagi beberapa penyudahan permukaan, iaitu Kuprum dan Nikel tanpa elektrod/Palladium tanpa elektrod/Emas rendaman (ENEPIG). Pelogaman di bawah pateri (UBM) Ni/Pd/Au bagi aplikasi flip chip digunakan dengan sangat meluas dalam pembungkusan elektronik. Analisis FESEM dilakukan untuk menganalisis morfologi dan komposisi bagi sebatian antara logam (IMC). IMC yang terbentuk antara pateri Sn–Pb dan tanpa Pb dengan penyudahan permukaan kuprum semasa proses pematrian logam secara umumnya adalah (Cu, Ni)6Sn5 dan Cu6Sn5 dan Cu6Sn5. Sementara IMC utama yang terbentuk antara pateri Sn–Pb dan tanpa Pb dengan penyudahan permukaan ENEPIG adalah (Ni, Cu)3Sn4 dan Ni3Sn4. Hasil daripada analisis morfologi menggunakan FESEM dengan EDX menyatakan penuaan sesuhu pada suhu 150°C menyebabkan penebalan dan pengasaran struktur IMC serta menjadikan bentuknya kepada lebih sfera. Tebal IMC bagi kedua–dua penyudahan yang dikaji adalah lebih tinggi bagi bebola patri yang lebih kecil. Daripada hasil kajian juga, didapati bahawa kadar pertumbuhan IMC adalah lebih tinggi apabila pematrian dilakukan atas penyudahan kuprum berbanding ENEPIG. Hasil kajian juga menunjukkan ketebalan IMC adalah berkadaran dengan masa penuaan sesuhu. Kata kunci: Flip chip; Kumprum dan Nikel tanpa elektrod; Palladium tanpa elektrod; Emas rendaman (ENEPIG); Pelogaman di bawah pateri (UMB) Ni/Pd/Au Flip chip technology provides the ultimate in high I/O–density and count with superior electrical performance for interconnecting electronic components. Therefore, the study of the intermetallic compounds was conducted to investigate the effect of solder bumps sizes on several surface finishes which are copper and Electroless Nickel/Electroless Palladium/Immersion Gold (ENEPIG) which is widely used in electronics packaging as under–bump metallization (UBM) for flip–chip application nowadays. In this research, field emission scanning electron microscopy (FE–SEM) analyses were conducted to analyze the morphology and composition of intermetallic compounds (IMCs) formed at the interface between the solder and UBM. The IMCs between Sn–Pb and lead–free solder with Cu surface finish during reflowing were mainly (Cu, Ni)6Sn5 dan Cu6Sn5. While the main IMCs formed between Sn–Pb and lead–free solder on ENEPIG surface finish are (Ni, Cu)3Sn4 and Ni3Sn4. The results from FESEM with energy dispersive x–ray (EDX) have revealed that isothermal aging at 150°C has caused the thickening and coarsening of IMCs as well as changing them into more spherical shape. The thickness of the intermetallic compounds in both finishes investigated ware found to be higher in solders with smaller bump size. From the experimental results, it also appears that the growth rate of IMCs is higher when soldering on copper compared to ENEPIG finish. Besides that, the results also showed that the thickness of intermetallic compounds was found to be proportional to isothermal aging duration. Key words: Electroless nickel; electroless palladium; immersion gold (ENEPIG); flip chip; Ni/Pd/Au Under–bump metallization (UMB)

Regulatory and sustainability initiatives lead to improved polyaminopolyamide epichlorohydrin (PAE) wet-strength resins and paper products

TAPPI Journal ◽  
2018 ◽  
Vol 17 (09) ◽  
pp. 519-532 ◽  
Author(s):  
Mark Crisp ◽  
Richard Riehle
Keyword(s):  
Health And Safety ◽  
Cost Effective ◽  
Worker Safety ◽  
Regulatory Requirements ◽  
Wet Strength ◽  
The Past ◽  
Consumer Safety ◽  
Federal Institute ◽  
Sustainability Initiatives ◽  
The Impact

Polyaminopolyamide-epichlorohydrin (PAE) resins are the predominant commercial products used to manufacture wet-strengthened paper products for grades requiring wet-strength permanence. Since their development in the late 1950s, the first generation (G1) resins have proven to be one of the most cost-effective technologies available to provide wet strength to paper. Throughout the past three decades, regulatory directives and sustainability initiatives from various organizations have driven the development of cleaner and safer PAE resins and paper products. Early efforts in this area focused on improving worker safety and reducing the impact of PAE resins on the environment. These efforts led to the development of resins containing significantly reduced levels of 1,3-dichloro-2-propanol (1,3-DCP) and 3-monochloropropane-1,2-diol (3-MCPD), potentially carcinogenic byproducts formed during the manufacturing process of PAE resins. As the levels of these byproducts decreased, the environmental, health, and safety (EH&S) profile of PAE resins and paper products improved. Recent initiatives from major retailers are focusing on product ingredient transparency and quality, thus encouraging the development of safer product formulations while maintaining performance. PAE resin research over the past 20 years has been directed toward regulatory requirements to improve consumer safety and minimize exposure to potentially carcinogenic materials found in various paper products. One of the best known regulatory requirements is the recommendations of the German Federal Institute for Risk Assessment (BfR), which defines the levels of 1,3-DCP and 3-MCPD that can be extracted by water from various food contact grades of paper. These criteria led to the development of third generation (G3) products that contain very low levels of 1,3-DCP (typically <10 parts per million in the as-received/delivered resin). This paper outlines the PAE resin chemical contributors to adsorbable organic halogens and 3-MCPD in paper and provides recommendations for the use of each PAE resin product generation (G1, G1.5, G2, G2.5, and G3).

Exploring the Benefits of Early Contractor Involvement (ECI) and the Mechanism for Automated 5D BIM Quantification Process in Offsite Modular Construction

2016 ◽  
Author(s):  
Tochukwu Moses ◽  
David Heesom ◽  
David Oloke ◽  
Martin Crouch
Keyword(s):  
Effective Means ◽  
Cost Effective ◽  
Modular Construction ◽  
Automated Quantification ◽  
Building Information ◽  
Project Risks ◽  
Value Add ◽  
The Uk ◽  
The Impact ◽  
Level 2

The UK Construction Industry through its Government Construction Strategy has recently been mandated to implement Level 2 Building Information Modelling (BIM) on public sector projects. This move, along with other initiatives is key to driving a requirement for 25% cost reduction (establishing the most cost-effective means) on. Other key deliverables within the strategy include reduction in overall project time, early contractor involvement, improved sustainability and enhanced product quality. Collaboration and integrated project delivery is central to the level 2 implementation strategy yet the key protocols or standards relative to cost within BIM processes is not well defined. As offsite construction becomes more prolific within the UK construction sector, this construction approach coupled with BIM, particularly 5D automated quantification process, and early contractor involvement provides significant opportunities for the sector to meet government targets. Early contractor involvement is supported by both the industry and the successive Governments as a credible means to avoid and manage project risks, encourage innovation and value add, making cost and project time predictable, and improving outcomes. The contractor is seen as an expert in construction and could be counter intuitive to exclude such valuable expertise from the pre-construction phase especially with the BIM intent of äóÖbuild it twiceäó», once virtually and once physically. In particular when offsite construction is used, the contractoräó»s construction expertise should be leveraged for the virtual build in BIM-designed projects to ensure a fully streamlined process. Building in a layer of automated costing through 5D BIM will bring about a more robust method of quantification and can help to deliver the 25% reduction in overall cost of a project. Using a literature review and a case study, this paper will look into the benefits of Early Contractor Involvement (ECI) and the impact of 5D BIM on the offsite construction process.

Case Studies of Brittle Interfacial Failures in Area Array Solder Interconnects

2000 ◽  
Author(s):  
George M. Wenger ◽  
Richard J. Coyle ◽  
Patrick P. Solan ◽  
John K. Dorey ◽  
Courtney V. Dodd ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Failure Modes ◽  
Electroless Nickel ◽  
Electrical Performance ◽  
Printed Wiring Board ◽  
Solder Interconnects ◽  
Area Array ◽  
Surface Finishes ◽  
Soldering Reaction

Abstract A common pad finish on area array (BGA or CSP) packages and printed wiring board (PWB) substrates is Ni/Au, using either electrolytic or electroless deposition processes. Although both Ni/Au processes provide flat, solderable surface finishes, there are an increasing number of applications of the electroless nickel/immersion gold (ENi/IAu) surface finish in response to requirements for increased density and electrical performance. This increasing usage continues despite mounting evidence that Ni/Au causes or contributes to catastrophic, brittle, interfacial solder joint fractures. These brittle, interfacial fractures occur early in service or can be generated under a variety of laboratory testing conditions including thermal cycling (premature failures), isothermal aging (high temperature storage), and mechanical testing. There are major initiatives by electronics industry consortia as well as research by individual companies to eliminate these fracture phenomena. Despite these efforts, interfacial fractures associated with Ni/Au surface finishes continue to be reported and specific failure mechanisms and root cause of these failures remains under investigation. Failure analysis techniques and methodologies are crucial to advancing the understanding of these phenomena. In this study, the scope of the fracture problem is illustrated using three failure analysis case studies of brittle interfacial fractures in area array solder interconnects. Two distinct failure modes are associated with Ni/Au surface finishes. In both modes, the fracture surfaces appear to be relatively flat with little evidence of plastic deformation. Detailed metallography, scanning electron microscopy (SEM), energy dispersive x-ray analysis (EDX), and an understanding of the metallurgy of the soldering reaction are required to avoid misinterpreting the failure modes.

PCB Related Field Failures with ImAg Surface Finishes

2007 ◽  
Author(s):  
Anil Kurella ◽  
Aravind Munukutla ◽  
J.S. Lewis
Keyword(s):  
Emerging Markets ◽  
Galvanic Corrosion ◽  
Electrochemical Migration ◽  
Copper Sulphide ◽  
Electronic Components ◽  
Related Field ◽  
Surface Finishes ◽  
Immersion Silver ◽  
Manufacturing Environments

Abstract PCB surface finishes like Immersion silver (ImAg) are commonly used in Pb-free manufacturing environments following RoHS legislation. With this transition, however the numbers of field failures associated with electrochemical migration, copper sulphide corrosion, via barrel galvanic corrosion are on a steady rise. More often than not ImAg surfaces seem to assist these failing signatures. As computers penetrate into emerging markets with humid and industrialized environments there is a greater concern on the reliability and functionality of these electronic components.

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