Learning to Train CNNs on Faulty ReRAM-based Manycore Accelerators

2021 ◽  
Vol 20 (5s) ◽  
pp. 1-23 ◽  
Author(s):  
Biresh Kumar Joardar ◽  
Janardhan Rao Doppa ◽  
Hai Li ◽  
Krishnendu Chakrabarty ◽  
Partha Pratim Pande

The growing popularity of convolutional neural networks (CNNs) has led to the search for efficient computational platforms to accelerate CNN training. Resistive random-access memory (ReRAM)-based manycore architectures offer a promising alternative to commonly used GPU-based platforms for training CNNs. However, due to the immature fabrication process and limited write endurance, ReRAMs suffer from different types of faults. This makes training of CNNs challenging as weights are misrepresented when they are mapped to faulty ReRAM cells. This results in unstable training, leading to unacceptably low accuracy for the trained model. Due to the distributed nature of the mapping of the individual bits of a weight to different ReRAM cells, faulty weights often lead to exploding gradients. This in turn introduces a positive feedback in the training loop, resulting in extremely large and unstable weights. In this paper, we propose a lightweight and reliable CNN training methodology using weight clipping to prevent this phenomenon and enable training even in the presence of many faults. Weight clipping prevents large weights from destabilizing CNN training and provides the backpropagation algorithm with the opportunity to compensate for the weights mapped to faulty cells. The proposed methodology achieves near-GPU accuracy without introducing significant area or performance overheads. Experimental evaluation indicates that weight clipping enables the successful training of CNNs in the presence of faults, while also reducing training time by 4 X on average compared to a conventional GPU platform. Moreover, we also demonstrate that weight clipping outperforms a recently proposed error correction code (ECC)-based method when training is carried out using faulty ReRAMs.

2017 ◽  
Vol 32 (4) ◽  
pp. 381-392
Author(s):  
Irfan Fetahovic ◽  
Edin Dolicanin ◽  
Djordje Lazarevic ◽  
Boris Loncar

In this paper we give an overview of radiation effects in emergent, non-volatile memory technologies. Investigations into radiation hardness of resistive random access memory, ferroelectric random access memory, magneto-resistive random access memory, and phase change memory are presented in cases where these memory devices were subjected to different types of radiation. The obtained results proved high radiation tolerance of studied devices making them good candidates for application in radiation-intensive environments.


Materials ◽  
2019 ◽  
Vol 12 (21) ◽  
pp. 3461 ◽  
Author(s):  
Paolo La Torraca ◽  
Francesco Maria Puglisi ◽  
Andrea Padovani ◽  
Luca Larcher

Memristor-based neuromorphic systems have been proposed as a promising alternative to von Neumann computing architectures, which are currently challenged by the ever-increasing computational power required by modern artificial intelligence (AI) algorithms. The design and optimization of memristive devices for specific AI applications is thus of paramount importance, but still extremely complex, as many different physical mechanisms and their interactions have to be accounted for, which are, in many cases, not fully understood. The high complexity of the physical mechanisms involved and their partial comprehension are currently hampering the development of memristive devices and preventing their optimization. In this work, we tackle the application-oriented optimization of Resistive Random-Access Memory (RRAM) devices using a multiscale modeling platform. The considered platform includes all the involved physical mechanisms (i.e., charge transport and trapping, and ion generation, diffusion, and recombination) and accounts for the 3D electric and temperature field in the device. Thanks to its multiscale nature, the modeling platform allows RRAM devices to be simulated and the microscopic physical mechanisms involved to be investigated, the device performance to be connected to the material’s microscopic properties and geometries, the device electrical characteristics to be predicted, the effect of the forming conditions (i.e., temperature, compliance current, and voltage stress) on the device’s performance and variability to be evaluated, the analog resistance switching to be optimized, and the device’s reliability and failure causes to be investigated. The discussion of the presented simulation results provides useful insights for supporting the application-oriented optimization of RRAM technology according to specific AI applications, for the implementation of either non-volatile memories, deep neural networks, or spiking neural networks.


2020 ◽  
Vol 12 (2) ◽  
pp. 02008-1-02008-4
Author(s):  
Pramod J. Patil ◽  
◽  
Namita A. Ahir ◽  
Suhas Yadav ◽  
Chetan C. Revadekar ◽  
...  

Nanomaterials ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 1401
Author(s):  
Te Jui Yen ◽  
Albert Chin ◽  
Vladimir Gritsenko

Large device variation is a fundamental challenge for resistive random access memory (RRAM) array circuit. Improved device-to-device distributions of set and reset voltages in a SiNx RRAM device is realized via arsenic ion (As+) implantation. Besides, the As+-implanted SiNx RRAM device exhibits much tighter cycle-to-cycle distribution than the nonimplanted device. The As+-implanted SiNx device further exhibits excellent performance, which shows high stability and a large 1.73 × 103 resistance window at 85 °C retention for 104 s, and a large 103 resistance window after 105 cycles of the pulsed endurance test. The current–voltage characteristics of high- and low-resistance states were both analyzed as space-charge-limited conduction mechanism. From the simulated defect distribution in the SiNx layer, a microscopic model was established, and the formation and rupture of defect-conductive paths were proposed for the resistance switching behavior. Therefore, the reason for such high device performance can be attributed to the sufficient defects created by As+ implantation that leads to low forming and operation power.


2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Meng-Cheng Yen ◽  
Chia-Jung Lee ◽  
Kang-Hsiang Liu ◽  
Yi Peng ◽  
Junfu Leng ◽  
...  

AbstractField-induced ionic motions in all-inorganic CsPbBr3 perovskite quantum dots (QDs) strongly dictate not only their electro-optical characteristics but also the ultimate optoelectronic device performance. Here, we show that the functionality of a single Ag/CsPbBr3/ITO device can be actively switched on a sub-millisecond scale from a resistive random-access memory (RRAM) to a light-emitting electrochemical cell (LEC), or vice versa, by simply modulating its bias polarity. We then realize for the first time a fast, all-perovskite light-emitting memory (LEM) operating at 5 kHz by pairing such two identical devices in series, in which one functions as an RRAM to electrically read the encoded data while the other simultaneously as an LEC for a parallel, non-contact optical reading. We further show that the digital status of the LEM can be perceived in real time from its emission color. Our work opens up a completely new horizon for more advanced all-inorganic perovskite optoelectronic technologies.


2021 ◽  
Vol 23 (10) ◽  
pp. 5975-5983
Author(s):  
Jie Hou ◽  
Rui Guo ◽  
Jie Su ◽  
Yawei Du ◽  
Zhenhua Lin ◽  
...  

In this study, at least three kinds of VOs and conductive filaments with low resistance states and forming and set voltages are found for β-Ga2O3 memory. This suggests the great potential of β-Ga2O3 memory for multilevel storage application.


2008 ◽  
Vol 93 (22) ◽  
pp. 223505 ◽  
Author(s):  
Jung Won Seo ◽  
Jae-Woo Park ◽  
Keong Su Lim ◽  
Ji-Hwan Yang ◽  
Sang Jung Kang

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