A New User Oriented Intelligent XRF Spectrometer System

The semi-quantitative analysis, which is called ‘Standardless Analysis’, plays a major role in X-ray fluorescent analysis, especially in the field of research and development. The main feature of the semi-quantitative analysis is the fact that the composition of a sample can be obtained directly from a qualitative scan without any prior knowledge of the sample.

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The Use of Reference Intensity Ratios in X-Ray Quantitative Analysis

Powder Diffraction ◽

10.1017/s0885715600018686 ◽

1992 ◽

Vol 7 (4) ◽

pp. 186-193 ◽

Cited By ~ 116

Author(s):

Robert L. Snyder

Keyword(s):

Quantitative Analysis ◽

Standard Method ◽

Amorphous Material ◽

Internal Standard ◽

Rietveld Analysis ◽

Internal Standard Method ◽

X Ray ◽

Quantitative Results ◽

Matching Procedure ◽

Standardless Analysis

AbstractEach of the RIR based methods for carrying out quantitative X-ray powder diffraction analysis are described and a consistent set of notation is developed. The so called “standardless” analysis procedures are shown to be a special case of the internal-standard method of analysis where the normalizing assumption is used. All analytical methods, other than the Rietveld whole pattern matching procedure, require the use of explicitly measured standards, typically in the form of RIR values. However, if only semi-quantitative results can be tolerated, the standards may be obtained by using published RIR and relative intensity values. The exciting new techniques of whole pattern fitting and Rietveld constrained quantitative analysis are also described in RIR notation and shown also to be forms of the internal-standard method with the normalization assumption. The quantitative results obtained from Rietveld quantitative analysis are derived from computed standards in the form of computed, normalized, RIRN values. The normalization assumption in Rietveld analysis allows the exclusive use of computed standards and comes as close to a “standardless” analysis as one can achieve: relying on the absence of amorphous material and on the validity of the structural models. Relationships are given for obtaining quantitative analysis from these RIRN values obtainable from the least-squares scale factors.

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Quantification of Silica Uptake by Alveolar Macrophages - An Emperical Scanning Electron Microprobe Method

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100054297 ◽

1982 ◽

Vol 40 ◽

pp. 332-333

Author(s):

V. V. Damiano ◽

R. P. Daniele ◽

H. T. Tucker ◽

J. H. Dauber

Keyword(s):

Quantitative Analysis ◽

Alveolar Macrophages ◽

Bulk Sample ◽

Silica Particles ◽

Empirical Method ◽

Phagocytic Cells ◽

Calibration Standards ◽

X Ray ◽

Accurate Quantitative Analysis ◽

Scanning Electron

An important example of intracellular particles is encountered in silicosis where alveolar macrophages ingest inspired silica particles. The quantitation of the silica uptake by these cells may be a potentially useful method for monitoring silica exposure. Accurate quantitative analysis of ingested silica by phagocytic cells is difficult because the particles are frequently small, irregularly shaped and cannot be visualized within the cells. Semiquantitative methods which make use of particles of known size, shape and composition as calibration standards may be the most direct and simplest approach to undertake. The present paper describes an empirical method in which glass microspheres were used as a model to show how the ratio of the silicon Kα peak X-ray intensity from the microspheres to that of a bulk sample of the same composition correlated to the mass of the microsphere contained within the cell. Irregular shaped silica particles were also analyzed and a calibration curve was generated from these data.

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Lateral resolution of the electron microbeam analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100109859 ◽

1978 ◽

Vol 36 (1) ◽

pp. 542-543

Author(s):

H.J. Dudek

Keyword(s):

Quantitative Analysis ◽

Depth Resolution ◽

Lateral Resolution ◽

Cylindrical Particle ◽

Correction Procedure ◽

X Ray ◽

Element Concentrations ◽

Microbeam Analysis ◽

The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

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Quantitative Analysis Of X-Ray Images From Geological Materials

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010013482x ◽

1990 ◽

Vol 48 (2) ◽

pp. 244-245

Author(s):

J. M. Paque ◽

R. Browning ◽

P. L. King ◽

P. Pianetta

Keyword(s):

Quantitative Analysis ◽

Bulk Composition ◽

Principal Component ◽

Analytical Description ◽

Bulk Sample ◽

Geological Samples ◽

X Ray ◽

Software And Hardware ◽

And Storage ◽

Insight Into

Geological samples typically contain many minerals (phases) with multiple element compositions. A complete analytical description should give the number of phases present, the volume occupied by each phase in the bulk sample, the average and range of composition of each phase, and the bulk composition of the sample. A practical approach to providing such a complete description is from quantitative analysis of multi-elemental x-ray images.With the advances in recent years in the speed and storage capabilities of laboratory computers, large quantities of data can be efficiently manipulated. Commercial software and hardware presently available allow simultaneous collection of multiple x-ray images from a sample (up to 16 for the Kevex Delta system). Thus, high resolution x-ray images of the majority of the detectable elements in a sample can be collected. The use of statistical techniques, including principal component analysis (PCA), can provide insight into mineral phase composition and the distribution of minerals within a sample.

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Precision and bias in quantitative EDS: ASTM results

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010013290x ◽

1992 ◽

Vol 50 (2) ◽

pp. 1654-1655

Author(s):

John J. Friel

Keyword(s):

Stainless Steel ◽

Quantitative Analysis ◽

Mechanical Alloy ◽

Dead Time ◽

Test Program ◽

Round Robin Test ◽

Wide Range ◽

American Society ◽

Takeoff Angle ◽

Standardless Analysis

Committee E-04 on Metallography of the American Society for Testing and Materials (ASTM) conducted an interlaboratory round robin test program on quantitative energy dispersive spectroscopy (EDS). The test program was designed to produce data on which to base a precision and bias statement for quantitative analysis by EDS. Nine laboratories were sent specimens of two well characterized materials, a type 308 stainless steel, and a complex mechanical alloy from Inco Alloys International, Inconel® MA 6000. The stainless steel was chosen as an example of a straightforward analysis with no special problems. The mechanical alloy was selected because elements were present in a wide range of concentrations; K, L, and M lines were involved; and Ta was severely overlapped with W. The test aimed to establish limits of precision that could be routinely achieved by capable laboratories operating under real world conditions. The participants were first allowed to use their own best procedures, but later were instructed to repeat the analysis using specified conditions: 20 kV accelerating voltage, 200s live time, ∼25% dead time and ∼40° takeoff angle. They were also asked to run a standardless analysis.

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Low-voltage EDS of magnesium ferrite Dendrites in a FEG-SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100164854 ◽

1996 ◽

Vol 54 ◽

pp. 478-479

Author(s):

Matthew T. Johnson ◽

Ian M. Anderson ◽

Jim Bentley ◽

C. Barry Carter

Keyword(s):

Monte Carlo ◽

Quantitative Analysis ◽

Monte Carlo Simulations ◽

Cross Section ◽

Spatial Resolution ◽

Low Voltage ◽

Magnesium Ferrite ◽

X Ray ◽

Interaction Volume ◽

Ferrite Spinel

Energy-dispersive X-ray spectrometry (EDS) performed at low (≤ 5 kV) accelerating voltages in the SEM has the potential for providing quantitative microanalytical information with a spatial resolution of ∼100 nm. In the present work, EDS analyses were performed on magnesium ferrite spinel [(MgxFe1−x)Fe2O4] dendrites embedded in a MgO matrix, as shown in Fig. 1. spatial resolution of X-ray microanalysis at conventional accelerating voltages is insufficient for the quantitative analysis of these dendrites, which have widths of the order of a few hundred nanometers, without deconvolution of contributions from the MgO matrix. However, Monte Carlo simulations indicate that the interaction volume for MgFe2O4 is ∼150 nm at 3 kV accelerating voltage and therefore sufficient to analyze the dendrites without matrix contributions.Single-crystal {001}-oriented MgO was reacted with hematite (Fe2O3) powder for 6 h at 1450°C in air and furnace cooled. The specimen was then cleaved to expose a clean cross-section suitable for microanalysis.

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Comparison of high-angle take-off and low-angle take-off EDX detector geometry of the HF-2000 FE-TEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100147107 ◽

1993 ◽

Vol 51 ◽

pp. 252-253

Author(s):

Y. Sato ◽

T. Hashimoto ◽

M. Ichihashi ◽

Y. Ueki ◽

K. Hirose ◽

...

Keyword(s):

Quantitative Analysis ◽

Field Emission ◽

Solid Angle ◽

Energy Dispersive ◽

Objective Lens ◽

X Rays ◽

High Angle ◽

X Ray ◽

Detector Geometry

Analytical TEMs have two variations in x-ray detector geometry, high and low angle take off. The high take off angle is advantageous for accuracy of quantitative analysis, because the x rays are less absorbed when they go through the sample. The low take off angle geometry enables better sensitivity because of larger detector solid angle.Hitachi HF-2000 cold field emission TEM has two versions; high angle take off and low angle take off. The former allows an energy dispersive x-ray detector above the objective lens. The latter allows the detector beside the objective lens. The x-ray take off angle is 68° for the high take off angle with the specimen held at right angles to the beam, and 22° for the low angle take off. The solid angle is 0.037 sr for the high angle take off, and 0.12 sr for the low angle take off, using a 30 mm2 detector.

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