Remarks on Age and Growth Rate Determination of Amazonian Trees

IAWA Journal ◽  
1989 ◽  
Vol 10 (2) ◽  
pp. 133-145 ◽  
Author(s):  
Roland E. Vetter ◽  
Paulo C. Botosso
Keyword(s):  
Growth Rate ◽  
Amazon Basin ◽  
Cambial Activity ◽  
Age And Growth ◽  
Specific Data ◽  
X Ray ◽  
Diameter Increment ◽  
Dry Seasons ◽  
Amazonian Trees

Specific data and comments are given on age and growth rate determination in trees of the Brazilian Amazon basin, based on longterm observation and research of diameter increment, radiocarbon dating, microscopic wood structure, and gamma- and X-ray densitometry; special attention is given to species of the unflooded Terra Firrne forest. Annual dry seasons in eastern Amazonia provoke periodical cambial activity which may be measured as variation in girth increment and is recorded in the wood anatomy as well as its density. Gamma radiation densitometry is discouraged because of poor results. X-ray densitometry and the radiocarbon method are promising but must be refined. Irregular specific climatic events should be considered to be possible natural marks.

Determination of the Growth Rate of Hydrothermally Synthesised ZnO2 Crystallites

2017 ◽  
Vol 50 ◽  
pp. 41-47 ◽  
Author(s):  
Martin Egblewogbe ◽  
Garu Gebreyesus ◽  
Samuel A. Atarah
Keyword(s):  
Growth Rate ◽  
Zinc Acetate Dihydrate ◽  
Hydrothermal Process ◽  
Growth Rate Constant ◽  
Acetate Dihydrate ◽  
X Ray ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Zinc Peroxide

Powders consisting of nanoparticles of zinc peroxide were prepared via a simple hydrothermal process using zinc acetate dihydrate and hydrogen peroxide precursors. The size of the crystallites was determined using x-ray powder diffraction. Over a period of 5 hours the crystallite radius increased from 4 nm – 9 nm at a temperature of 68 °C ± 5 °C, with growth rate constant of 0.23 nm3 min−1 calculated using the Lifshitz, Slyozov, and Wagner model. The powders were further characterised with High Resolution Transmission Electron Microscopy, Energy Dispersive X-ray analysis, and Small Angle X-ray Scattering, showing well-crystallised ZnO2 nanoparticles.

Determination of growth parameters for atomic layer epitaxy using reflectance difference spectroscopy

1996 ◽  
Vol 74 (S1) ◽  
pp. 85-88 ◽  
Author(s):  
R. Arès ◽  
C. A. Tran ◽  
S. P. Watkins
Keyword(s):  
Growth Rate ◽  
Growth Parameters ◽  
Atomic Layer ◽  
Atomic Layer Epitaxy ◽  
Gas Flows ◽  
Difference Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reflectance Difference Spectroscopy

Reflectance difference spectroscopy (RDS) has been used to monitor the anisotropy of the surface of InAs and GaAs grown by atomic layer epitaxy (ALE). Saturation of the RDS signal is observed when the surface is fully covered with one monolayer of the impinging surface species. This property is used to optimize the growth interruptions for the ALE cycle. Good correlation of the RDS saturation is observed with growth-rate measurements obtained by X-ray diffraction (XRD). When exposure times are sufficiently long for saturation to be observed in the RDS signal, a growth rate of one monolayer per cycle (1 ML/cycle) is achieved. In principle all the different growth parameters such as exposure and purge times as well as gas flows can be determined in a few cycles performed on a single substrate. Without RDS the same results would require several growth runs and time consuming X-ray characterization.

scholarly journals Mn labelling of living oysters: Artificial and natural cathodoluminescence analyses as a tool for age and growth rate determination of C. gigas (Thunberg, 1793) shells

Aquaculture ◽  
2010 ◽  
Vol 300 (1-4) ◽  
pp. 206-217 ◽  
Author(s):  
Franck Lartaud ◽  
Marc de Rafelis ◽  
Michel Ropert ◽  
Laurent Emmanuel ◽  
Philippe Geairon ◽  
...  
Keyword(s):  
Growth Rate ◽  
Age And Growth

scholarly journals Age and growth of redfish (Sebastes marinus, S. mentella, and S. fasciatus) on the Flemish Cap (Northwest Atlantic)

2004 ◽  
Vol 61 (2) ◽  
pp. 231-242 ◽  
Author(s):  
Fran Saborido-Rey ◽  
Dolores Garabana ◽  
Santiago Cerviño
Keyword(s):  
Growth Rate ◽  
Density Dependence ◽  
Slow Rate ◽  
Age Determination ◽  
Age And Growth ◽  
Northwest Atlantic ◽  
Density Dependent ◽  
Dependent Growth ◽  
Sebastes Mentella

Abstract Age determination of redfish is difficult. In this paper, the ages of Sebastes mentella on the Flemish Cap are validated by following year classes from 1991 to 2000. The criteria used for S. mentella are consistent and coherent. The growth of different year classes is described and compared, and density-dependence is demonstrated to influence the growth rate of the strong 1990 year class, growth of that year class being the slowest of those followed. The slow rate of growth prevented that year class from maturing at the anticipated age. Growth is also compared between sexes, of S. mentella, S. marinus, and S. fasciatus, revealing that females grow faster than males. Finally, growth rate is compared among species. S. marinus grows fastest and S. mentella slowest, although the influence of density-dependent growth in S. mentella needs to be taken into consideration.

Lateral resolution of the electron microbeam analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 542-543
Author(s):  
H.J. Dudek
Keyword(s):  
Quantitative Analysis ◽  
Depth Resolution ◽  
Lateral Resolution ◽  
Cylindrical Particle ◽  
Correction Procedure ◽  
X Ray ◽  
Element Concentrations ◽  
Microbeam Analysis ◽  
The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

Sem and X-Ray Analysis of Renal and Biliary Calculi

1976 ◽  
Vol 34 ◽  
pp. 306-307
Author(s):  
R. J. Narconis ◽  
G. L. Johnson
Keyword(s):  
Chemical Constituents ◽  
Natural State ◽  
X Ray Diffraction ◽  
Chemical Methods ◽  
X Ray ◽  
Additional Dimension ◽  
Biliary Calculi ◽  
Calculus Formation ◽  
Scanning Electron

Analysis of the constituents of renal and biliary calculi may be of help in the management of patients with calculous disease. Several methods of analysis are available for identifying these constituents. Most common are chemical methods, optical crystallography, x-ray diffraction, and infrared spectroscopy. The application of a SEM with x-ray analysis capabilities should be considered as an additional alternative.A scanning electron microscope equipped with an x-ray “mapping” attachment offers an additional dimension in its ability to locate elemental constituents geographically, and thus, provide a clue in determination of possible metabolic etiology in calculus formation. The ability of this method to give an undisturbed view of adjacent layers of elements in their natural state is of advantage in determining the sequence of formation of subsequent layers of chemical constituents.

Preparation And elemental analysis of ancient fibers

1987 ◽  
Vol 45 ◽  
pp. 410-411
Author(s):  
Allen Angel ◽  
Kathryn A. Jakes
Keyword(s):  
Cross Sections ◽  
Physical Structure ◽  
Energy Dispersive ◽  
Archaeological Sites ◽  
X Ray ◽  
Long Term Storage ◽  
Backscattered Electron ◽  
Electron Imaging

Fabrics recovered from archaeological sites often are so badly degraded that fiber identification based on physical morphology is difficult. Although diagenetic changes may be viewed as destructive to factors necessary for the discernment of fiber information, changes occurring during any stage of a fiber's lifetime leave a record within the fiber's chemical and physical structure. These alterations may offer valuable clues to understanding the conditions of the fiber's growth, fiber preparation and fabric processing technology and conditions of burial or long term storage (1).Energy dispersive spectrometry has been reported to be suitable for determination of mordant treatment on historic fibers (2,3) and has been used to characterize metal wrapping of combination yarns (4,5). In this study, a technique is developed which provides fractured cross sections of fibers for x-ray analysis and elemental mapping. In addition, backscattered electron imaging (BSI) and energy dispersive x-ray microanalysis (EDS) are utilized to correlate elements to their distribution in fibers.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

Polarity Determination in Sphalerite and Wurtzite Structures

1990 ◽  
Vol 48 (2) ◽  
pp. 500-501
Author(s):  
Stuart McKernan ◽  
C. Barry Carter
Keyword(s):  
Opposite Polarity ◽  
Single Domain ◽  
Polar Material ◽  
Electron Microscopic ◽  
Dynamical Interaction ◽  
X Ray ◽  
Polarity Determination ◽  
The Absolute ◽  
Microscopic Techniques

The determination of the absolute polarity of a polar material is often crucial to the understanding of the defects which occur in such materials. Several methods exist by which this determination may be performed. In bulk, single-domain specimens, macroscopic techniques may be used, such as the different etching behavior, using the appropriate etchant, of surfaces with opposite polarity. X-ray measurements under conditions where Friedel’s law (which means that the intensity of reflections from planes of opposite polarity are indistinguishable) breaks down can also be used to determine the absolute polarity of bulk, single-domain specimens. On the microscopic scale, and particularly where antiphase boundaries (APBs), which separate regions of opposite polarity exist, electron microscopic techniques must be employed. Two techniques are commonly practised; the first [1], involves the dynamical interaction of hoLz lines which interfere constructively or destructively with the zero order reflection, depending on the crystal polarity. The crystal polarity can therefore be directly deduced from the relative intensity of these interactions.

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