Simulation paradigm to study circuit performance in presence of component level fault

This research presents a simulation analysis for the AC-DC converter circuit with a different configurations of the array connection of the piezoelectric sensor. The selection of AC-DC converter circuits is full wave bridge rectifier (FWBR), parallel SSHI (P-SSHI) and parallel voltage multiplier (PVM) with array configuration variation in series (S), parallel (P), series-parallel (SP) and parallel-series (PS). The system optimizes with different load configurations ranging from 10 kΩ to 1 MΩ. The best configuration of AC-DC converter with an appropriate array piezoelectric connection producing the optimum output of harvested power is presented. According to the simulation results, the harvested power produced by using P-SSHI converter connected with 3 parallel piezoelectric transducer array was 85.9% higher than for PVM and 15.88% higher than FWBR.

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Dynamic Infrared System Level Fault Isolation

ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2003p0111 ◽

2003 ◽

Author(s):

John A. Naoum ◽

Johan Rahardjo ◽

Yitages Taffese ◽

Marie Chagny ◽

Jeff Birdsley ◽

...

Keyword(s):

Fault Isolation ◽

System Level ◽

System Component ◽

Component Level ◽

Ir Imaging ◽

Non Destructive

Abstract The use of Dynamic Infrared (IR) Imaging is presented as a novel, valuable and non-destructive approach for the analysis and isolation of failures at a system/component level.

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An Overview of 300 mm SOI Starting Wafer Quality and Its Yield Detractors

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0457 ◽

2005 ◽

Author(s):

Pei Y. Tsai ◽

Junedong Lee ◽

Paul Ronsheim ◽

Lindsay Burns ◽

Richard Murphy ◽

...

Keyword(s):

Integrated Circuits ◽

Device Fabrication ◽

Sampling Plan ◽

Silicon On Insulator ◽

Manufacturing Processes ◽

Circuit Performance ◽

Characterization Techniques ◽

Wafer Manufacturing

Abstract A stringent sampling plan is developed to monitor and improve the quality of 300mm SOI (silicon on insulator) starting wafers procured from the suppliers. The ultimate goal is to obtain the defect free wafers for device fabrication and increase yield and circuit performance of the semiconductor integrated circuits. This paper presents various characterization techniques for QC monitor and examples of the typical defects attributed to wafer manufacturing processes.

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Cloud-integrated wireless-optical broadband access network with survivability

International Journal of Sensors Wireless Communications and Control ◽

10.2174/2210327910666200213121623 ◽

2020 ◽

Vol 10 ◽

Author(s):

Sangita Solanki ◽

Raksha Upadhyay ◽

Uma Rathore Bhatt

Keyword(s):

Access Network ◽

Access Networks ◽

Manhattan Distance ◽

Broadband Access ◽

Optical Access Networks ◽

Component Level ◽

Backup Path ◽

Wireless Router ◽

Path Computation ◽

Broadband Access Network

Cloud-integrated wireless optical broadband (CIW) access networks inheriting advantages of cloud computing, wireless and optical access networks have a broad prospect in the future. Due to failure of components like OLT level, ONU level, link or path failure and cloud component level in CIW, survivability is becoming one of the important issues. In this paper, we have presented cloud-integrated wireless-optical broadband access network with survivability using integer linear programming (ILP) model, to minimize the number of cloud components while providing maximum backup paths. Hence, we have proposed protection through cloud-integrated wireless router to available ONUs (PCIWRAO). So, evaluated the backup path computation. We have considered ONU level failure in which the affected traffic is transferred through wireless routers and cloud component to the available ONUs using Manhattan distance algorithm. Simulation results show different configurations for different number of routers and cloud components illustrating available backup path when ONU fails.

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Erratum: Circuit performance of low temperature CMOS polysilicon TFT operational amplifiers

Electronics Letters ◽

10.1049/el:19930486 ◽

1993 ◽

Vol 29 (8) ◽

pp. 726

Author(s):

H.-G. Yang ◽

P. Migliorato ◽

C. Reita ◽

S. Fluxman

Keyword(s):

Low Temperature ◽

Operational Amplifiers ◽

Circuit Performance ◽

Polysilicon Tft

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Sensitivity-based CMOS VLSI circuit performance optimisation

Electronics Letters ◽

10.1049/el:19951336 ◽

1995 ◽

Vol 31 (22) ◽

pp. 1918-1919

Author(s):

P.J. Mather ◽

P. Hallam ◽

M. Brouwer

Keyword(s):

Vlsi Circuit ◽

Circuit Performance ◽

Cmos Vlsi

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Effects of (in)validation and plain versus technical language on the experience of experimentally induced pain: A computer controlled simulation paradigm

Journal of Behavior Therapy and Experimental Psychiatry ◽

10.1016/j.jbtep.2019.03.008 ◽

2020 ◽

Vol 67 ◽

pp. 101473 ◽

Cited By ~ 1

Author(s):

Martina D'Agostini ◽

Kai Karos ◽

Hanne P.J. Kindermans ◽

Linda M.G. Vancleef

Keyword(s):

Technical Language ◽

Simulation Paradigm ◽

Computer Controlled ◽

Experimentally Induced

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Development of a Component-Level Hydrogen Transport Model with OpenFOAM and Application to Tritium Transport Inside a DEMO HCPB Breeder

Applied Sciences ◽

10.3390/app11083481 ◽

2021 ◽

Vol 11 (8) ◽

pp. 3481

Author(s):

Volker Pasler ◽

Frederik Arbeiter ◽

Christine Klein ◽

Dmitry Klimenko ◽

Georg Schlindwein ◽

...

Keyword(s):

Transport Model ◽

Tritium Concentration ◽

Minor Role ◽

Specific Rate ◽

Component Level ◽

Diffusion Limited ◽

Purge Gas ◽

Choice Of Species ◽

The Impact ◽

Tritium Transport

This work continues the development of a numerical model to simulate transient tritium transport on the breeder zone (BZ) level for the EU helium-cooled pebble bed (HCPB) concept for DEMO. The basis of the model is the open-source field operation and manipulation framework, OpenFOAM. The key output quantities of the model are the tritium concentration in the purge gas and in the coolant and the tritium inventory inside the BZ structure. New model features are briefly summarized. As a first relevant application a simulation of tritium transport for a single pin out of the KIT HCPB design for DEMO is presented. A variety of scenarios investigates the impact of the permeation regime (diffusion-limited vs. surface-limited), of an additional hydrogen content of 300 Pa H2 in the purge gas, of the released species (HT vs. T2), and of the choice of species-specific rate constants (recombination constant of HT set twice as for H2 and T2). The results indicate that the released species plays a minor role for permeation. Both permeation and inventory show a considerable dependence on a possible hydrogen addition in the purge gas. An enhanced HT recombination constant reduces steel T inventories and, in the diffusion-limited case, also permeation significantly. Scenarios with 80 bar vs. 2 bar purge gas pressure indicate that purge gas volumetric flow is decisive for permeation.

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Reliability Analysis and Repair Activity for the Components of 350 kW Inverters in a Large Scale Grid-Connected Photovoltaic System

Electronics ◽

10.3390/electronics10050564 ◽

2021 ◽

Vol 10 (5) ◽

pp. 564

Author(s):

Filippo Spertino ◽

Angela Amato ◽

Gabriele Casali ◽

Alessandro Ciocia ◽

Gabriele Malgaroli

Keyword(s):

Reliability Analysis ◽

Large Scale ◽

Photovoltaic System ◽

Component Level ◽

Ac Power ◽

Repair Activity ◽

Industrial Maintenance ◽

Large Scale Grid ◽

Ac Converters ◽

Scale Grid

The reliability of photovoltaic (PV) generators is strongly affected by the performance of Direct Current/Alternating Current (DC/AC) converters, being the major source of PV underperformance. However, generally, their reliability is not investigated at component level: thus, the present work presents a reliability analysis and the repair activity for the components of full bridge DC/AC converters. In the first part of the paper, a reliability analysis using failure rates from literature is carried out for 132 inverters (AC rated power of 350 kW each) with global AC power of 46 MW in a large scale grid-connected PV plant. Then, in the second part of the work, results from literature are compared with data obtained by analyzing industrial maintenance reports in the years 2015–2017. In conclusion, the yearly energy losses involved in the downtime are quantified, as well as their availability.

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