scholarly journals Starch and Glycogen Analyses: Methods and Techniques

Biomolecules ◽  
2020 ◽  
Vol 10 (7) ◽  
pp. 1020 ◽  
Author(s):  
Henrike Brust ◽  
Slawomir Orzechowski ◽  
Joerg Fettke
Keyword(s):  
Analytical Methods ◽  
Analytical Techniques ◽  
Future Perspectives ◽  
Detailed Characterization ◽  
Methods And Techniques ◽  
Complex Carbohydrates ◽  
Structural Levels ◽  
Scientific Questions ◽  
Storage Carbohydrates

For complex carbohydrates, such as glycogen and starch, various analytical methods and techniques exist allowing the detailed characterization of these storage carbohydrates. In this article, we give a brief overview of the most frequently used methods, techniques, and results. Furthermore, we give insights in the isolation, purification, and fragmentation of both starch and glycogen. An overview of the different structural levels of the glucans is given and the corresponding analytical techniques are discussed. Moreover, future perspectives of the analytical needs and the challenges of the currently developing scientific questions are included.

scholarly journals Nondestructive, High-Resolution Materials Characterization with the Confocal Raman-AFM

2005 ◽  
Vol 13 (3) ◽  
pp. 30-35 ◽  
Author(s):  
U. Schmidt ◽  
A. Jauss ◽  
W. Ibach ◽  
K. Weishaupt ◽  
O. Hollricher
Keyword(s):  
High Resolution ◽  
Semiconductor Manufacturing ◽  
Analytical Techniques ◽  
Materials Characterization ◽  
Surface Markers ◽  
Detailed Characterization ◽  
Topographic Information ◽  
Materials Research ◽  
High Resolution Microscopy

Materials research, biomedical research, and semiconductor manufacturing can all benefit from nondestructive, high-resolution methods of analysis. As most materials are heterogeneous, it is important to not only acquire high resolution topographic information, but also to identify the chemical composition of samples. A combination of high resolution microscopy with chemically sensitive spectroscopy combined in one instrument allows the detailed characterization of samples with different analytical techniques. When individual instruments are used, returning to a previously surveyed sample area can be very time consuming if not impossible without surface markers.

scholarly journals A Critical Review of Analytical Methods for Comprehensive Characterization of Produced Water

Water ◽  
2021 ◽  
Vol 13 (2) ◽  
pp. 183
Author(s):  
Wenbin Jiang ◽  
Lu Lin ◽  
Xuesong Xu ◽  
Xiaoxiao Cheng ◽  
Yanyan Zhang ◽  
...  
Keyword(s):  
Analytical Methods ◽  
Management Practices ◽  
Oil And Gas ◽  
Produced Water ◽  
Treatment Effectiveness ◽  
Analytical Techniques ◽  
Gas Production ◽  
Chemical Additives ◽  
Water Composition

Produced water is the largest waste stream associated with oil and gas production. It has a complex matrix composed of native constituents from geologic formation, chemical additives from fracturing fluids, and ubiquitous bacteria. Characterization of produced water is critical to monitor field operation, control processes, evaluate appropriate management practices and treatment effectiveness, and assess potential risks to public health and environment during the use of treated water. There is a limited understanding of produced water composition due to the inherent complexity and lack of reliable and standardized analytical methods. A comprehensive description of current analytical techniques for produced water characterization, including both standard and research methods, is discussed in this review. Multi-tiered analytical procedures are proposed, including field sampling; sample preservation; pretreatment techniques; basic water quality measurements; organic, inorganic, and radioactive materials analysis; and biological characterization. The challenges, knowledge gaps, and research needs for developing advanced analytical methods for produced water characterization, including target and nontarget analyses of unknown chemicals, are discussed.

scholarly journals Characteristics of French Fries and Potato Chips in Aspect of Acrylamide Content—Methods of Reducing the Toxic Compound Content in Ready Potato Snacks

2021 ◽  
Vol 11 (9) ◽  
pp. 3943
Author(s):  
Agnieszka Tajner-Czopek ◽  
Agnieszka Kita ◽  
Elżbieta Rytel
Keyword(s):  
Adverse Effects ◽  
Review Paper ◽  
Potato Chips ◽  
French Fries ◽  
Raw Material ◽  
Detailed Characterization ◽  
Toxic Compound ◽  
Technological Factors ◽  
Methods And Techniques

The reduction of toxic acrylamide content in potato snacks, i.e., French fries and potato chips, is necessary due to the adverse effects of this compound on the human body. Therefore, in the presented review paper, a detailed characterization of French fries and chips in terms of AA content and their organoleptic quality is included. Detailed information was also collected on the raw material and technological factors that affect the formation of acrylamide content, including methods and techniques affecting the reduction of the amount of this compound in potato snacks. The obligation to control the level of acrylamide in various food products (including fried potato snacks with a higher content of this compound), introduced in 2018, has mobilized manufacturers to seek solutions, while scientists conduct further intensive research on the possibility of reducing the level of AA or even eliminating its presence from products. Therefore, it is necessary to conduct such activities, especially, because potato French fries and potato chips are willingly consumed by younger and younger consumers.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

Comparison of Ion-Milling Techniques For Cross-Sectional TEM of Semiconductors

1985 ◽  
Vol 43 ◽  
pp. 166-167
Author(s):  
Julia T. Luck ◽  
C. W. Boggs ◽  
S. J. Pennycook
Keyword(s):  
Analytical Techniques ◽  
Sample Surface ◽  
Ion Milling ◽  
Cross Sectional ◽  
Reliable Technique ◽  
Near Surface ◽  
Transmission Electron ◽  
Thin Region ◽  
Transient Thermal

The use of cross-sectional Transmission Electron Microscopy (TEM) has become invaluable for the characterization of the near-surface regions of semiconductors following ion-implantation and/or transient thermal processing. A fast and reliable technique is required which produces a large thin region while preserving the original sample surface. New analytical techniques, particularly the direct imaging of dopant distributions, also require good thickness uniformity. Two methods of ion milling are commonly used, and are compared below. The older method involves milling with a single gun from each side in turn, whereas a newer method uses two guns to mill from both sides simultaneously.

Intramolecular Proton Transfer in the Isomerization of Hydroxyacetone: A Detailed Characterization Based on Reaction Force Analysis and the Bond Fragility Spectrum

2020 ◽  
Author(s):  
Wallace Derricotte ◽  
Huiet Joseph
Keyword(s):  
Chemical Potential ◽  
Reaction Force ◽  
Intramolecular Proton Transfer ◽  
Intermediate Energy ◽  
Force Analysis ◽  
Activation Energy Barrier ◽  
Detailed Characterization ◽  
Proton Transfers ◽  
Reaction Force Constant

The mechanism of isomerization of hydroxyacetone to 2-hydroxypropanal is studied within the framework of reaction force analysis at the M06-2X/6-311++G(d,p) level of theory. Three unique pathways are considered: (i) a step-wise mechanism that proceeds through formation of the Z-isomer of their shared enediol intermediate, (ii) a step-wise mechanism that forms the E-isomer of the enediol, and (iii) a concerted pathway that bypasses the enediol intermediate. Energy calculations show that the concerted pathway has the lowest activation energy barrier at 45.7 kcal mol<sup>-1</sup>. The reaction force, chemical potential, and reaction electronic flux are calculated for each reaction to characterize electronic changes throughout the mechanism. The reaction force constant is calculated in order to investigate the synchronous/asynchronous nature of the concerted intramolecular proton transfers involved. Additional characterization of synchronicity is provided by calculating the bond fragility spectrum for each mechanism.

Exploring the characterization of Ni doped MgO nanoparticles using co-precipitation method

2020 ◽  
Vol 3 (1) ◽  
pp. 30-33
Author(s):  
Muthulakshmi M ◽  
Madhumitha G
Keyword(s):  
Magnesium Oxide ◽  
Analytical Techniques ◽  
Nickel Chloride ◽  
Precipitation Method ◽  
Crystalline Powder ◽  
High Melting Point ◽  
Design Synthesis ◽  
Mgo Nanoparticles ◽  
Co Precipitation

Nanotechnology is a field of applied science focused on design, synthesis and characterization of nanomaterials. The nickel and magnesium have improved their applications in transparent electrodes and nano electronics. In addition, magnesium oxide has moisture resistance and high melting point properties. In the present work has been carried out in the development of green crystalline powder of nickel doped magnesium oxide nanoparticles by Co-precipitation method, from the mixture of nickel chloride and magnesium chloride with KOH as solvent. From the XRD results, crystalline size of the particle can be observed. Spherical structure of Ni doped MgO nanoparticles were indicated by SEM results and powdered composition of samples were obtained from FTIR. EDAX represents the peak composition of the nanoparticle. The above analytical techniques have confirmed that the Ni doped MgO nanoparticles obtained from the mixture of NiCl2 and MgCl2.

Sign in / Sign up

Export Citation Format

Share Document