scholarly journals A Low-Dropout Regulator with PSRR Enhancement through Feed-Forward Ripple Cancellation Technique in 65 nm CMOS Process

Electronics ◽  
2020 ◽  
Vol 9 (1) ◽  
pp. 146
Author(s):  
Young-Joe Choe ◽  
Hyohyun Nam ◽  
Jung-Dong Park

In this paper, a low-dropout (LDO) regulator with an enhanced power supply rejection ratio (PSRR) is proposed with a feed-forward ripple cancellation technique (FFRC) in 65 nm CMOS technology. This technique significantly improves the PSRR over a wide range of frequencies, compared to a conventional LDO regulator. The LDO regulator provides 35–76.8 dB of PSRR in the range of 1 MHz–1 GHz, which shows up to 30 dB of PSRR improvement, compared with that of the conventional LDO regulator. The implemented LDO regulator has a dropout voltage of 0.22 V and a maximum load current of 20 mA. It can also provide an output voltage of 0.98 V at a range of 1–1.3 V of the input voltage. The load regulation is 2.3 mV/mA while the line regulation is 0.05 V/V. The circuit consumes 385 μA with an input voltage of 1.2 V. The total area without pads is 0.092 mm2.

2021 ◽  
Author(s):  
Darshil Patel

Low noise, high PSRR and fast transient low-dropout (LDO) regulators are critical for analog blocks such as ADCs, PLLs and RF SOC, etc. This paper presents design of low power, fast transient, high PSRR and high load-regulation low-dropout (LDO) regulator. The proposed LDO regulator is designed in 180nm. CMOS process and simulated in LTSpice and Cadence platform. The LDO proposed can support input voltage range up to 5V for loading currents up to 230mA. Measurements showed transient time or set-up time of less than 22µs, PSRR of ~66dB at 100kHz and >40dB at 1MHz and 0.8535mV of output voltage variation for a 0-230mA of load variation.


Author(s):  
Lianxi Liu ◽  
Yiwei Chen ◽  
Xufeng Liao ◽  
Junchao Mu ◽  
Yintang Yang

This paper proposes a three-stage coarse-fine-tuning analog-assisted digital low dropout regulator (AAD-LDO) without digital ripple. The digital regulation consists of two stages, which break the accuracy-speed-power trade-off. To further improve transient response, a step-variable counter used in the first stage is designed, which makes sure that the output current can track the load current rapidly. The ripple caused by the digital regulation disappears due to the existence of the analog-assistant stage (in the proposed AAD-LDO). As a result, the AAD-LDO achieves the output voltage with high accuracy. Designed in a 0.18[Formula: see text][Formula: see text]m CMOS process, the proposed AAD-LDO has a layout area of 0.133[Formula: see text]mm. For the input range of 1.2–1.8[Formula: see text]V, the output voltage is 1[Formula: see text]V. The maximum load current is 10[Formula: see text]mA at the input voltage of 1.2[Formula: see text]V. The linear regulation and load regulation are 0.061[Formula: see text]mV/V and 0.0082[Formula: see text]mV/mA, respectively. The over/undershoot is suppressed effectively for a 9.5[Formula: see text]mA load step. The peak current efficiency is 99.78%.


2021 ◽  
Author(s):  
Darshil Patel

Low noise, high PSRR and fast transient low-dropout (LDO) regulators are critical for analog blocks such as ADCs, PLLs and RF SOC, etc. This paper presents design of low power, fast transient, high PSRR and high load-regulation low-dropout (LDO) regulator. The proposed LDO regulator is designed in 180nm. CMOS process and simulated in LTSpice and Cadence platform. The LDO proposed can support input voltage range up to 5V for loading currents up to 230mA. Measurements showed transient time or set-up time of less than 22µs, PSRR of ~66dB at 100kHz and >40dB at 1MHz and 0.8535mV of output voltage variation for a 0-230mA of load variation.


2021 ◽  
Author(s):  
Darshil Patel

Low noise, high PSRR and fast transient low-dropout (LDO) regulators are critical for analog blocks such as ADCs, PLLs and RF SOC, etc. This paper presents design of low power, fast transient, high PSRR and high load-regulation low-dropout (LDO) regulator. The proposed LDO regulator is designed in 180nm. CMOS process and simulated in LTSpice and Cadence platform. The LDO proposed can support input voltage range up to 5V for loading currents up to 230mA. Measurements showed transient time or set-up time of less than 22µs, PSRR of ~66dB at 100kHz and >40dB at 1MHz and 0.8535mV of output voltage variation for a 0-230mA of load variation.


Author(s):  
Kenya Kondo ◽  
Hiroki Tamura ◽  
Koichi Tanno

<p>The switching operation based low dropout (LDO) regulator utilizing on-off control is pre-sented. It consists of simple circuit elements which are comparator, some logic gates, switched capacitor and feedback circuit. In this study, we target the application to the power supply circuit for the analog front end (AFE) of bio-medical system (such as daily-used bio-monitoring devices) whose required maximum load current is 50 A. In this paper, the design procedure of the proposed LDO has been clarified and actual circuit design using the procedure has been done. The proposed LDO has been evaluated by SPICE simulation using 1P 2M 0.6 m CMOS process device parameters. From simulation results, we could confirm that the low quiescent current of 1 A with the output ripple of 5 mVpp. The circuit area is 0.0173 mm2 in spite of using 0.6 m design rules. The proposed circuit is suitable for adopting to the light load and low frequency applications.</p>


2019 ◽  
Vol 28 (03) ◽  
pp. 1950043 ◽  
Author(s):  
M. Jahangiri ◽  
A. Farrokhi

A fast transient capacitor-less low-dropout regulator is presented in this study. The proposed LDO structure is based on Output Voltage Spike Reduction (OVSR) circuits and capacitance compensation circuits to enable a fast-transient response with ultra-low power dissipation and to make the LDO stable for a wide range of output load currents (0–50[Formula: see text]mA). The slew rate is improved with more slew current from the OVSR circuit and unity gain bandwidth is improved by a capacitor multiplayer circuit. The proposed LDO has been simulated with a standard 0.18[Formula: see text][Formula: see text]m CMOS process. The output voltage of the LDO was set to 1.2[Formula: see text]V for an input voltage of 1.4–2[Formula: see text]V. The Simulation results verify that the transient times are less than 2.8[Formula: see text][Formula: see text]s and the maximum undershoot and overshoot are 20[Formula: see text]mV while consuming only 26[Formula: see text][Formula: see text]A quiescent current. The proposed LDO is stable with an on-chip capacitor at the output node within the wide range of 1100[Formula: see text]PF.


Energies ◽  
2019 ◽  
Vol 12 (2) ◽  
pp. 211 ◽  
Author(s):  
Jihoon Park ◽  
Woong-Joon Ko ◽  
Dong-Seok Kang ◽  
Yoonmyung Lee ◽  
Jung-Hoon Chun

An output capacitor-less low-dropout (OCL-LDO) regulator with a wide range of load currents is proposed in this study. The structure of the proposed regulator is based on the flipped-voltage-follower LDO regulator. The feedback loop of the proposed regulator consists of two stages. The second stage is turned on or off depending on the variation in the output load current. Hence, the regulator can retain a phase margin at a wide range of load currents. The proposed regulator exhibits a better regulation performance compared to the ones in previous studies. The test chip is fabricated using a 65-nm CMOS process.


Author(s):  
Pavan , M. S ◽  
M. Nagabushanam ◽  
Sushmita Hawaldar ◽  
S. L. Gangadharaiah

The capacitor-less-output-low-dropout (CLO-LDO) regulator proposed in this study can manage a wide variety of load currents. To offer temperature independent controlled LDO output, the LDO's 0.844V reference voltage is obtained using BGR, the optimized design is presented that provide full range stability, fast transient response. These benefits allow the proposed LDO regulator to operate over a wide range of operating circumstances, with very high current efficiency 99.99% and low voltage drop 100mV, operating using very low quiescent current of 0.02µA, at the output of regulator. The proposed regulator design is constructed in 90nm CMOS technology, the structure of the regulator is implemented using a Two-stage operational amplifier to obtain large DC gain 50dB to improve supply noise rejection, and a feedback loop, and exhibits better performance in terms of large phase margin 64.516 degrees with no load and 70.63degree full load.


2011 ◽  
Vol 20 (01) ◽  
pp. 1-13 ◽  
Author(s):  
CHENCHANG ZHAN ◽  
WING-HUNG KI

A CMOS low quiescent current low dropout regulator (LDR) with high power supply rejection (PSR) and without large output capacitor is proposed for system-on-chip (SoC) power management applications. By cascoding a power NMOS with the PMOS pass transistor, high PSR over a wide frequency range is achieved. The gate-drive of the cascode NMOS is controlled by an auxiliary LDR that draws only 1 μA from a small charge pump, thus helping in reducing the quiescent current. Adaptive biasing is employed for the multi-stage error amplifier of the core LDR to achieve high loop gain hence high PSR at low frequency, low quiescent current at light load and high bandwidth at heavy load. A prototype of the proposed high-PSR LDR is fabricated using a standard 0.35 μm CMOS process, occupying an active area of 0.066 mm2. The lowest supply voltage is 1.6 V and the preset output voltage is 1.2 V. The maximum load current is 10 mA. The measured worst-case PSR at full load without using large output capacitor is -22.7 dB up to 60 MHz. The line and load regulations are 0.25 mV/V and 0.32 mV/mA, respectively.


2015 ◽  
Vol 24 (09) ◽  
pp. 1550132 ◽  
Author(s):  
Li-Ye Cheng ◽  
Xin-Quan Lai

A mode-selectable oscillator (OSC) with variable duty cycle for improved charge pump efficiency is proposed in this paper. The novel OSC adjusts its duty cycle according to the operation mode of the charge pump, thus improves the charge-pump efficiency and dynamic performance. The control of variable duty cycle is implemented in digital logic hence it provides robust noise immunity and instantaneous response. The OSC and the charge-pump have been implemented in a 0.6-μm 40-V CMOS process. Experimental results show that the peak efficiency is 92.7% at 200-mA load, the recovery time is less than 25 μs and load transient is 15 mV under 500-mA load variation. The system is able to work under a wide range of input voltage (V IN ) in all modes with low EMI.


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