scholarly journals Novel Memory Structures in QCA Nano Technology

2020 ◽  
Vol sceeer (3d) ◽  
pp. 119-124
Author(s):  
Ali Majeed ◽  
Esam Alkaldy ◽  
Mohd Zainal ◽  
Danial Nor

Quantum-dot Cellular Automata (QCA) is a new emerging technology for designing electronic circuits in nanoscale. QCA technology comes to overcome the CMOS limitation and to be a good alternative as it can work in ultra-high-speed. QCA brought researchers attention due to many features such as low power consumption, small feature size in addition to high frequency. Designing circuits in QCA technology with minimum costs such as cells count and the area is very important. This paper presents novel structures of D-latch and D-Flip Flop with the lower area and cell count. The proposed Flip-Flop has SET and RESET ability. The proposed latch and Flip-Flop have lower complexity compared with counterparts in terms of cell counts by 32% and 26% respectively. The proposed circuits are designed and simulated in QCADesigner software.

2018 ◽  
Vol 7 (4.36) ◽  
pp. 306
Author(s):  
Amita Asthana ◽  
Dr. Anil Kumar ◽  
Dr. Preeta Sharan ◽  
Dr. Sumita Mishra

Quantum dot Cellular Automata is one of the promising future nano-technology for transistor-less computing which takes advantage of the coulomb force interacting between electrons. The aim of this paper is to consider the logical circuits of ARM processors and further reducing their size in nanometres like 2:1 multiplexer , D Flip Flop, scan Flip Flop, 2:1 multiplexer with enable, encoder, decoder, SR FF, shift register, memory cell and program counter are designed  using QCAD tool . Their cell count, area, kink energy are taken in consideration to calculate power and energy dissipation.  


2020 ◽  
Vol 10 (4) ◽  
pp. 534-547
Author(s):  
Chiradeep Mukherjee ◽  
Saradindu Panda ◽  
Asish K. Mukhopadhyay ◽  
Bansibadan Maji

Background: The advancement of VLSI in the application of emerging nanotechnology explores quantum-dot cellular automata (QCA) which has got wide acceptance owing to its ultra-high operating speed, extremely low power dissipation with a considerable reduction in feature size. The QCA architectures are emerging as a potential alternative to the conventional complementary metal oxide semiconductor (CMOS) technology. Experimental: Since the register unit has a crucial role in digital data transfer between the electronic devices, such study leading to the design of cost-efficient and highly reliable QCA register is expected to be a prudent area of research. A thorough survey on the existing literature shows that the generic models of Serial-in Serial Out (SISO), Serial-in-Parallel-Out (SIPO), Parallel-In- Serial-Out (PISO) and Parallel-in-Parallel-Out (PIPO) registers are inadequate in terms of design parameters like effective area, delay, O-Cost, Costα, etc. Results: This work introduces a layered T gate for the design of the D flip flop (LTD unit), which can be broadly used in SISO, SIPO, PISO, and PIPO register designs. For detection and reporting of high susceptible errors and defects at the nanoscale, the reliability and defect tolerant analysis of LTD unit are also carried out in this work. The QCA design metrics for the general register layouts using LTD unit is modeled. Conclusion: Moreover, the cost metrics for the proposed LTD layouts are thoroughly studied to check the functional complexity, fabrication difficulty and irreversible power dissipation of QCA register layouts.


Author(s):  
A. Arunkumar Gudivada ◽  
K. Jayaram Kumar ◽  
Srinivasa Rao Jajula ◽  
Durga Prasad Siddani ◽  
Praveen Kumar Poola ◽  
...  

1997 ◽  
Vol 33 (20) ◽  
pp. 1733 ◽  
Author(s):  
K. Maezawa ◽  
H. Matsuzaki ◽  
K. Arai ◽  
T. Otsuji ◽  
M. Yamamoto

2012 ◽  
Vol 195 ◽  
pp. 128-131 ◽  
Author(s):  
Hun Hee Lee ◽  
Min Sang Yun ◽  
Hyun Wook Lee ◽  
Jin Goo Park

As the feature size of semiconductor device shrinks continuously, various high-K metals for 3-D structures have been applied to improve the device performance, such as high speed and low power consumption. Metal gate fabrication requires the removal of metal and polymer residues after etching process without causing any undesired etching and corrosion of metals. The conventional sulfuric-peroxide mixture (SPM) has many disadvantages like the corrosion of metals, environmental issues etc., DSP+(dilute sulfuric-peroxide-HF mixture) chemical is currently used for the removal of post etch residues on device surface, to replace the conventional SPM cleaning [. Due to the increased usage of metal gate in devices in recent times, the application of DSP+chemicals for cleaning processes also increases [.


2002 ◽  
Vol 11 (01) ◽  
pp. 51-55
Author(s):  
ROBERT C. CHANG ◽  
L.-C. HSU ◽  
M.-C. SUN

A novel low-power and high-speed D flip-flop is presented in this letter. The flip-flop consists of a single low-power latch, which is controlled by a positive narrow pulse. Hence, fewer transistors are used and lower power consumption is achieved. HSPICE simulation results show that power dissipation of the proposed D flip-flop has been reduced up to 76%. The operating frequency of the flip-flop is also greatly increased.


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