Properties of Hexagonal Wurtzite Mg0.33Zn0.67O Films on Quartz Glass Substrates

2011 ◽  
Vol 337 ◽  
pp. 612-615
Author(s):  
Quan Sheng Liu ◽  
Xi Yan Zhang ◽  
Xiao Chun Wang ◽  
Zhao Hui Bai ◽  
Neng Li Wang ◽  
...  
Keyword(s):  
Grain Size ◽  
Absorption Spectrum ◽  
Quartz Glass ◽  
Sol Gel ◽  
Hexagonal Wurtzite Structure ◽  
Xrd Analysis ◽  
Excitation Peak ◽  
Lattice Constants ◽  
Glass Substrates ◽  
Average Grain Size

Mg0.33Zn0.67Ofilms were prepared on quartz glass substrates by Sol-Gel method. Structures and optical properties of Mg0.33Zn0.67Ofilms were studied. The results of XRD analysis indicates that the Mg0.33Zn0.67Ofilm is hexagonal wurtzite structure and the lattice constants a and c are 0.3265nm and 0.5218 nm respectively. Lattice constants a and c of the Mg0.33Zn0.67O film increased because of the addition of Mg. The image of SEM shows that the Mg0.33Zn0.67O film is homogeneous and its average grain size is about 40nm. The absorption spectrum of the sample reveals that the absorption edge of Mg0.33Zn0.67O film located at 312.3nm and the corresponding forbidden band width is 3.97eV. is by three peaks ，which located at 383.9nm，442.6nm and 532.9nm respectively，constitute the luminescence spectrum of the film. The excitation peak located at 379.9nm.

Structure and Optical Properties of Mg0.5Zn0.5O Films

2011 ◽  
Vol 337 ◽  
pp. 383-386
Author(s):  
Quan Sheng Liu ◽  
Xi Yan Zhang ◽  
Xiao Chun Wang ◽  
Zhao Hui Bai ◽  
Neng Li Wang ◽  
...  
Keyword(s):  
Grain Size ◽  
Optical Properties ◽  
Quartz Glass ◽  
Absorption Edge ◽  
Sol Gel ◽  
Sem Image ◽  
Glass Substrates ◽  
Average Grain Size ◽  
Solar Blind ◽  
Cubic Structure

Mg0.5Zn0.5O films were prepared on quartz glass substrates by sol-gel method. Structure and optical properties of Mg0.5Zn0.5O film were studied.Results indicated that Mg0.5Zn0.5O film deposited on quartz glass is composed of two structures of ZnO hexagonal and MgO cubic. SEM image revealed that the film was homogenous and the average grain size of crystal was 40nm.Absorption spectrum indicated the absorption edge of hexagonal and cubic structures located in 332nm and 271nm respectively.The absorption edge of cubic structure locates in the solar blind region.The luminescence spectrum of sample is composed of three peaks at 383.7nm(3.23eV)，442.9nm(2.80eV) and 533.9nm(2.32eV) respectively.The peak of excitation spectrum is at 379nm(3.28eV).

Structural and Morphological Studies of Cadmium Sulfide Nanostructures

2013 ◽  
Vol 795 ◽  
pp. 228-232 ◽  
Author(s):  
Abdulwahab S.Z. Lahewil ◽  
Y. Al-Douri ◽  
U. Hashim ◽  
Naser Mahmoud Ahmed
Keyword(s):  
Grain Size ◽  
Cadmium Sulfide ◽  
Spin Coating ◽  
Sol Gel ◽  
Theoretical Data ◽  
Glass Substrates ◽  
Morphological Studies ◽  
Average Grain Size ◽  
Cds Nanostructures ◽  
Semiconductor Properties

Cadmium sulfide (CdS) nanostructures were prepared with different spin coating speed 1000 and 3000 rpm and molarities of Cd:S to be 1.2 to 0.01 mol/L using sol-gel spin coating technique. It is found that the average grain size of CdS nanostructures deposited on glass substrates at 1000 and 3000 rpm is 43 to 4 nm respectively. The effect of grain size on the semiconductor properties are in agreement with experimental and theoretical data.

Synthesis of Corrugated Structured N Type Pbs Thin Film

2012 ◽  
Vol 500 ◽  
pp. 118-122 ◽  
Author(s):  
E.I. Anila ◽  
K.J. Saji ◽  
U.S. Sajeev
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Xrd Analysis ◽  
Dip Coating ◽  
Pbs Nanoparticles ◽  
Glass Substrates ◽  
Average Grain Size ◽  
Type Band ◽  
Corrugated Structure ◽  
Power Measurements

PbS thin films with corrugated structure were synthesized on glass substrates by dip coating. The surface of the films was found to be corrugated. XRD analysis confirmed the formation of crystalline PbS nanoparticles with average grain size 14nm. From thermo power measurements, the conductivity of the samples was found to be of n type. Band gap of the films was estimated as 1.7eV from absorption spectra.

Effect of Mn Doping on Structural and Optical Properties of ZnO Thin Films Prepared on Glass Substrates by Sol-Gel Method

2013 ◽  
Vol 750-752 ◽  
pp. 1038-1043
Author(s):  
Peng Liu ◽  
Qiu Ying Shen ◽  
Hong Hu ◽  
Bin Yang
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Sol Gel ◽  
Hexagonal Wurtzite Structure ◽  
Blue Shift ◽  
Doping Content ◽  
Mn Doping ◽  
Lattice Constants ◽  
Glass Substrates ◽  
Xrd Patterns

Thin films of Zn1-xMnxO (x = 0.00, 0.03, 0.07, 0.10) were prepared onto glass substrates by sol-gel spin-coating technique. The structural, morphologic and optical properties of these samples were studied respectively. The XRD patterns show the thin films are all polycrystalline with hexagonal wurtzite structure and no preferred orientation. With the increase of Mn doping, the c-axis lattice constants of the samples shift towards higher values until the doping concentration reaches up to 7%. This indicates that Mn2+substituted for Zn2+of ZnO host. Moreover, the grain size decreases gradually with the increase of Mn doping content. The AFM results indicate surface roughness increases with the increase of Mn doping level. The photoluminescence spectra reveal Mn doping causes a blue shift of the UV peak. The intensity of UV emission peaks increases at the beginning and then decreases with the increase of Mn doping content.

SURFACE CHARACTERIZATION AND GRAIN SIZE CALCULATION OF SILVER FILMS DEPOSITED BY THERMAL EVAPORATION

2005 ◽  
Vol 12 (05n06) ◽  
pp. 759-766 ◽  
Author(s):  
MUHAMMAD MAQBOOL ◽  
TAHIRZEB KHAN
Keyword(s):  
Grain Size ◽  
Surface Characterization ◽  
Room Temperature ◽  
Thermal Evaporation ◽  
Xrd Analysis ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Average Grain Size ◽  
20 Nm

Thin films of pure silver were deposited on glass substrate by thermal evaporation process at room temperature. Surface characterization of the films was performed using X-ray diffraction (XRD) and Atomic Force Microscopy (AFM). Thickness of the films varied between 20 nm and 60 nm. XRD analysis provided a sharp peak at 38.75° from silver. These results indicated that the films deposited on glass substrates at room temperature are crystalline. 3D and top view pictures of the films were obtained by AFM to study the grain size and its dependency on various factors. Grain sizes were calculated using the XRD results and Scherer's formula. Average grain size increased with the thickness of the deposited films. A minimum grain size of 8 nm was obtained for 20 nm thick films, reaching a maximum value of 41.9 nm when the film size reaches 60 nm. We could not find any sequential variation in the grain size with the growth rate.

LiNiO2 Thin Films Fabricated by Diffusion of Li on Ni Tapes

2007 ◽  
Vol 336-338 ◽  
pp. 505-508
Author(s):  
Cheol Jin Kim ◽  
In Sup Ahn ◽  
Kwon Koo Cho ◽  
Sung Gap Lee ◽  
Jun Ki Chung
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Grain Size ◽  
Sol Gel ◽  
Surface Oxidation ◽  
Cold Isostatic Pressing ◽  
Tube Furnace ◽  
Treatment Conditions ◽  
Average Grain Size ◽  
Cold Rolling And Annealing

LiNiO2 thin films for the application of cathode of the rechargeable battery were fabricated by Li ion diffusion on the surface oxidized NiO layer. Bi-axially textured Ni-tapes with 50 ~ 80 μm thickness were fabricated using cold rolling and annealing of Ni-rod prepared by cold isostatic pressing of Ni powder. Surface oxidation of Ni-tapes were conducted using tube furnace or line-focused infrared heater at 700 °C for 150 sec in flowing oxygen atmosphere, resulted in NiO layer with thickness of 400 and 800 μm, respectively. After Li was deposited on the NiO layer by thermal evaporation, LiNiO2 was formed by Li diffusion through the NiO layer during subsequent heat treatment using IR heater with various heat treatment conditions. IR-heating resulted in the smoother surface and finer grain size of NiO and LiNiO2 layer compared to the tube-furnace heating. The average grain size of LiNiO2 layer was 0.5~1 μm, which is much smaller than that of sol-gel processed LiNiO2. The reacted LiNiO2 region showed homogeneous composition throughout the thickness and did not show any noticeable defects frequently found in the solid state reacted LiNiO2, but crack and delamination between the reacted LiNiO2 and Ni occurred as the reaction time increased above 4hrs.

Structural, Magnetic and Dielectric Analysis of Higher Magnetic Mn Doped Zn-Cr Oxide Nanoparticles

2021 ◽  
Vol 9 (VI) ◽  
pp. 95-102
Author(s):  
S. D. Balsure
Keyword(s):  
Type Strain ◽  
Sol Gel ◽  
Hexagonal Wurtzite Structure ◽  
Xrd Analysis ◽  
Oxide Nanoparticles ◽  
X Ray Diffraction ◽  
Microstructural Parameters ◽  
Auto Combustion ◽  
Mn Doped ◽  
Combustion Technique

Higher magnetic Mn doped Zn-Cr oxide nanoparticles with general compositional formula MxZn0.95-xCr0.05O have been synthesized by using sol-gel auto combustion technique. Room temperature X-ray diffraction (XRD) technique has been employed to study the structural and microstructural parameters of the as-prepared samples. XRD analysis confirms the phase purity and hexagonal wurtzite structure of all the samples. Replacement of Zn2+ ions by Mn2+ ions shifts peak positions slightly towards the lower angles which in turn expands the lattice lengths ‘a’ from 3.2487 to 3.2528 Å and ‘c’ from 5.2043 to 5.2118 Å. Crystallite size obtained from Scherrer equation was confirmed by Williamson – Hall (W-H) and size – strain plot methods (SSP). Both W-H and SSP methods reveals the tensile type strain for undoped sample and comprehensive type strain for Mn2+ doped samples. Magnetic properties were investigated by using vibrating sample magnetometer. Diluted ferromagnetic behaviour is observed for all the samples and saturation magnetization (MS) increases from 0.0514 to 0.1163 emu/gm. Two-probe technique was employed to understand the dielectric behaviour of the samples as a function of frequency. At lower frequency region, both dielectric constant () and dielectric loss tangent (tan ) shows higher values and decreases with the increasing applied frequency.

ATOMIC FORCE MICROSCOPY AND XRD ANALYSIS OF SILVER FILMS DEPOSITED BY THERMAL EVAPORATION

2006 ◽  
Vol 20 (02) ◽  
pp. 217-231 ◽  
Author(s):  
MUHAMMAD MAQBOOL ◽  
TAHIRZEB KHAN
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Size ◽  
Surface Characterization ◽  
Room Temperature ◽  
Thermal Evaporation ◽  
Xrd Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Average Grain Size ◽  
20 Nm

Thin films of pure silver were deposited on glass substrate by thermal evaporation process at room temperature. Surface characterization of the films was performed using X-ray diffraction (XRD) and atomic force microscopy (AFM). Thickness of the films varied between 20 nm and 72.8 nm. XRD analysis provided a sharp peak at 38.75° from silver. These results indicated that the films deposited on glass substrates at room temperature are crystalline. Three-dimension and top view pictures of the films were obtained by AFM to study the grain size and its dependency on various factors. Average grain size increased with the thickness of the deposited films. A minimum grain size of 8 nm was obtained for 20 nm thick films, reaching 41.9 nm when the film size reaches 60 nm. Grain size was calculated from the information provided by the XRD spectrum and averaging method. We could not find any sequential variation in the grain size with the growth rate.

scholarly journals The Influence of Annealing Temperature on the Structure and Magnetic Properties of Nanocrystalline BiFeO3 Prepared by Sol–Gel Method

2021 ◽  
Author(s):  
T. Pikula ◽  
T. Szumiata ◽  
K. Siedliska ◽  
V. I. Mitsiuk ◽  
R. Panek ◽  
...  
Keyword(s):  
Grain Size ◽  
Magnetic Properties ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Weak Ferromagnetism ◽  
X Ray Diffraction ◽  
Gel Method ◽  
Sol Gel Method ◽  
Average Grain Size ◽  
Spin Cycloid

AbstractIn this work, BiFeO3 powders were synthesized by a sol–gel method. The influence of annealing temperature on the structure and magnetic properties of the samples has been discussed. X-ray diffraction studies showed that the purest phase was formed in the temperature range of 400 °C to 550 °C and the samples annealed at a temperature below 550 °C were of nanocrystalline character. Mössbauer spectroscopy and magnetization measurements were used as complementary methods to investigate the magnetic state of the samples. In particular, the appearance of weak ferromagnetic properties, significant growth of magnetization, and spin-glass-like behavior were observed along with the drop of average grain size. Mössbauer spectra were fitted by the model assuming cycloidal modulation of spins arrangement and properties of the spin cycloid were determined and analyzed. Most importantly, it was proved that the spin cycloid does not disappear even in the case of the samples with a particle size well below the cycloid modulation period λ = 62 nm. Furthermore, the cycloid becomes more anharmonic as the grain size decreases. The possible origination of weak ferromagnetism of the nanocrystalline samples has also been discussed.

scholarly journals Effect of Re and Tm-site on morphology structure and optical band gap of ReTmO3 (Re: La, Ce, Nd, Gd, Dy, Y and Tm: Fe, Cr) prepared by sol-gel method

2018 ◽  
Vol 64 (4) ◽  
pp. 381
Author(s):  
Muhammad Tufiq Jamil ◽  
Javed Ahmad ◽  
Syed Hamad Bukhari ◽  
Murtaza Saleem
Keyword(s):  
Band Gap ◽  
Sol Gel ◽  
Xrd Analysis ◽  
Sem Analysis ◽  
X Ray Diffraction ◽  
Orthorhombic Crystal ◽  
X Ray ◽  
Average Grain Size ◽  
Auto Combustion ◽  
Uv Visible

Rare earth nano sized pollycrystalline orthoferrites and orthocromites ReT mO3 (Re = La, Nd, Gd, Dy, Y and T m = Fe, Cr) have been synthesized by sol-gel auto combustion citrate method. The samples have been characterized by means of X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray spectroscopy (EDX), and UV-visible spectroscopy. The samples are single phase as confirmed by XRD analysis and correspond to the orthorhombic crystal symmetry with space group pbnm. Debye Scherer formula and Williamson Hall analysis have been used to calculate the average grain size which is consistent with that of determined from SEM analysis and varied between 25-75 nm. The elemental compositions of all samples have been checked by EDX analysis. Different crystallographic parameters are calculated with strong structural correlation among Re and Tm sites. The optical energy band gap has been calculated by using Tauc relation estimated to be in the range of 1.77 - 1.87 eV and 2.77 - 3.14 eV, for ReFeO3 and ReCrO3, respectively.

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