Investigation on Optical Properties of Transparent ITO Thin Films

2011 ◽  
Vol 347-353 ◽  
pp. 3481-3484
Author(s):  
Xue Hua Li ◽  
Dong Sheng Wang ◽  
Jian Zhou Du

Based on the single-layer thin film theory, we calculated transmittance of ITO thin film. The reflectivity arrive a maximum or a minimum according to whether the refractive index of film is greater or smaller than the refractive index of the glass substrate. we obtain the same maximum of transparence which is above 95% and the minimum value which decrease to 76.5% with the increase of refractive index.

2019 ◽  
Vol 15 (33) ◽  
pp. 71-77
Author(s):  
Mohammed K. Khalaf

Ti6Al4V thin film was prepared on glass substrate by RFsputtering method. The effect of RF power on the optical propertiesof the thin films has been investigated using UV-visibleSpectrophotometer. It's found that the absorbance and the extinctioncoefficient (k) for deposited thin films increase with increasingapplied power, while another parameters such as dielectric constantand refractive index decrease with increasing RF power.


2018 ◽  
Vol 17 (03) ◽  
pp. 1760037 ◽  
Author(s):  
A. Nancy Anna Anasthasiya ◽  
K. Gowtham ◽  
R. Shruthi ◽  
R. Pandeeswari ◽  
B. G. Jeyaprakash

The spray pyrolysis technique was employed to deposit V2O5 thin films on a glass substrate. By varying the precursor solution volume from 10[Formula: see text]mL to 50[Formula: see text]mL in steps of 10[Formula: see text]mL, films of various thicknesses were prepared. Orthorhombic polycrystalline V2O5 films were inferred from the XRD pattern irrespective of precursor solution volume. The micro-Raman studies suggested that annealed V2O5 thin film has good crystallinity. The effect of precursor solution volume on morphological and optical properties were analysed and reported.


2015 ◽  
Vol 723 ◽  
pp. 528-531
Author(s):  
Jun Wang ◽  
Ling Yun Bai

TiO2 thin films were prepared on glass substrates by sol-gel method. The effect of withdraw speed on the thickness and optical properties of TiO2 thin films was investigated. The films were transparent in the visible wavelength. The thickness of the TiO2 films was increased from 90 nm for the withdraw speed of 1000 μm/s to 160 nm for the withdraw speed of 2000 μm/s. While, The refractive index of the TiO2 thin film decreased from 2.38 to 2.07. It may be due to the porosity of the film was increased. The optical band-gap of the films was around 3.45 eV.


Author(s):  
Abubakr Mahmoud Hamid ◽  
Hassan Wardi Hassan ◽  
Fatima Ahmed Osman

Solar energy is already has being widely successfully used in residential and industrial setting for thermal and electrical application such as space technology, communication, etc. I. Aims: The aim of this study the effect of the annealing temperature in improvement optical properties of titanium oxide nanostructure doped iron oxide for use in thin film. Study Design: The spray pyrolysis deposition method used for preparation the nanostructure material. Place and Duration of Study: This study was conducted in department of physics and department of materials sciences, Al-Neelain University, between January 2016 and January 2019.  Methodology: Thin films of Titanium Oxide (TiO2) doped Iron Oxide (Fe2O3) have been prepared by chemical spray pyrolysis deposition technique. A laboratory designed glass atomizer was used for spraying the aqueous solution. Which has an output nozzle about 1 mm. then film were deposited on preheated cleaned glass substrates at temperature of 400°C. we used different concentration to study optical parameters. A 1.5 g TiO2 powder of anatase structure doped with 1.5 g of Fe2O3 was mixed with 2 ml of ethanol and stirred using a magnetic stirrer for 30 minutes to form TiO2 paste to obtain the starting solution for deposition and spray time was 10 s and spray interval 2 min was kept constant. The carrier gas (filtered compressed air) was maintained at a pressure of 105 Nm-2, and distance between nozzle and substrate was about 30 cm ± 1 cm. Thickness of sample was measured using the weighting method and was found to be around 400nm. Optical transmittance and absorbance were record in wavelength range of (200-1100) nm using UV-Visible spectrophotometer (Shimadzu Company Japan). Results: The results obtained showed that the optical band gap decreased from 5.6eV before annealing to (3.9, 3.26, 3.24 and 3.27 eV) after annealing temperature at(450° – 500°) for TiO2:Fe2O3 thin films, this result refer to the broadening of  secondary levels that product by TiO2: doping to the Fe2O2thin films. Also the results showed the variation of refractive index with wavelength for different concentration after annealing temperature at (450° – 500°) of TiO2: Fe2O3 films from this figure, it is clear that n decrease with low concentration and increase with high concentration after annealing temperature that mean the density is decreased of this films. In addition the extinction coefficient of TiO2:Fe2O3 thin films recorded before annealing and with different concentration (1.1, 1.2, 1,5 and 1,6) and in the range of (300 – 1200) nm and at annealing temperature from (450° – 500°). It observed from that the extinction coefficient, decrease sharply with the increase of wavelength for all prepared films and all the sample after annealing is interference between them accept the sample before annealing is far from the other sample. Conclusion: The TiO2 thin film shows better result after annealing; By exposing temperature during annealing process degree at (450o- 500o) is found to be the best temperature for annealing TiO2 thin film. The study concluded that an annealing temperature Contributes to the improvement of optical properties related to increasing the efficiency of the solar cell, especially the refractive index, energy gap, extinction coefficient.


2012 ◽  
Vol 585 ◽  
pp. 214-218 ◽  
Author(s):  
N. Venugopal ◽  
Anirban Mitra

The optical properties of ZnO (Zinc Oxide)/Ag (silver)/ZnO (Zinc Oxide)/glass multilayer structure have been investigated. These properties could be tuned using the plasmonic properties of the intermediate Ag layer. ZnO thin film of 80 nm thickness has been deposited using Spray Pyrolysis on Glass Substrate. Prior to the deposition of approximately same thickness of ZnO like the previous one, a thin layer of Ag with thicknesses varying from 0.5 nm to 10 nm have been deposited using Vacuum Deposition. We have correlated the properties of multilayer thin film with thickness and morphology of the intermediate silver layer. Crystallographic properties of thin films have been characterized using XRD (X-ray Diffraction). Surface Morphology of Ag layer on ZnO has been studied using AFM (Atomic Force Microscopy). UV-VIS Spectrometer has been used to measure the optical transparency of these multilayer thin films. It has been observed that optical transparency of ZnO/Ag/ZnO/Glass thin film on glass substrate slightly enhanced compared to ZnO/ZnO/Glass. We interpret these experimental results with Maxwell-Garnett theory. The simulated and experimental SPR (Surface Plasmon Resonance) positions of ZnO/Ag/ZnO thin films are well matched. We expect that MG Theory interpretation of these kind Dielectric/Metal/Dielectric multilayer thin films were applicable only for Metallic Island thin films deposited using Vacuum coating method. We also describe the influence of Ag thickness on optical properties of the ZnO/Ag/ZnO composite and suggest a mechanism of tunability influenced by surface plasmons.


RSC Advances ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 58-64 ◽  
Author(s):  
Kyoung Woo Park ◽  
Seunghee Lee ◽  
Hyunkoo Lee ◽  
Yong-Hwan Cho ◽  
Yong Cheon Park ◽  
...  

High-performance H:SiON single layer thin film encapsulation (TFE) was deposited by plasma enhanced chemical vapor deposition (PECVD) method. To control the characteristics of the SiON thin films, hydrogen gas was introduced during PECVD process.


1982 ◽  
Vol 60 (5) ◽  
pp. 628-631 ◽  
Author(s):  
M. R. Wertheimer ◽  
J. E. Klemberg-Sapieha ◽  
R. Corriveau

The refractive index, n, of plasma-polymerized hexamethyldisiloxane and -silazane thin films has been measured by ellipsometry at 632.8 nm. For both types of films n was found to increase from about 1.4 to about 1.7, with increasing substrate temperature during film deposition, Ts. Using the Lorentz–Lorenz equation and our previously published density and infrared data for these thin film materials, it is shown that films produced at [Formula: see text] are essentially "inorganic." Calculated n values for hypothetical structures (Si2O)x and (Si2N)x (expected from the "monomer" compositions) agree to within a few percent with measured data.


2007 ◽  
Vol 124-126 ◽  
pp. 455-458
Author(s):  
Seong Hoon Kim ◽  
Han Ki Yoon ◽  
Riichi Murakami

The thin films of SiO and SiON were deposited individually by the inclination opposite target type DC magnetron sputtering equipment onto the glass substrate. And it was deposited IZO(In2O3 (90wt.%) + ZnO(10wt.%)) on those films. The effects of SiO and SiON were investigated on properties of IZO thin films. AFM images of IZO thin film included SiON film were shown smoother surfaces than that included SiO film. Multi layers of IZO were shown good properties because it have high transmissivity. Resistivity is in inverse proportion to Mobility. If it deposited SiO and SiON, generate layer of change between two layers(SiO or SiON + Substrate). Layer of change influenced resistance because Oxygen content was more than single layer of IZO. In case of using PET substrate, it influenced stronger than Glass substrate for rigid gas permeable and osmosis.


2019 ◽  
Vol 58 ◽  
pp. 90-101
Author(s):  
Amina Laskri ◽  
Abdelaziz Drici ◽  
Amor Boulouma ◽  
Abdelaziz Amara ◽  
Jean Christian Bernede

In the present work we studied the effect of temperature and molarity on microstructural and optical properties of Ag3O4 thin films deposited by spray pyrolysis. Transparent conductive thin films of silver oxide (Ag3O4) were prepared by using an aqueous solution of silver nitrate (AgNO3) and sprayed onto heated soda glass substrate at 350 °C and annealed at 550°C. X-ray diffraction showed that the films have a monoclinic structure with a preferential orientation along the (031) direction. A visible shift of the main peak as a function of temperature and solution molarity is observed. The lattice parameters a, b and c are estimated to be 3.68, 9.30 and 5.20Ǻ respectively. Scanning Electron Microscopy (SEM) analysis shows that all films are nanostructured and homogeneous with dense surfaces. Transmittance and reflectance measurements are performed in the spectral range 200-1600 nm and yielded a band gap energy (Eg) varying in the range 3.07-3.25 eV. Refractive index was studied in terms of Moss, Ravindra and Herve–Vandamme models. The optical constants such as the oscillator energy (E0), static refractive index (n0), dispersion energy (Ed) and dielectric parameters (εr ) of the films were derived from the analysis and discussed.


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