Numerical Simulation of Push-Bending Process of Aluminum Section Profile

2010 ◽  
Vol 97-101 ◽  
pp. 90-95
Author(s):  
Zhen Zhong Sun ◽  
Sheng Gui Chen ◽  
Ye Jing
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Section Thickness ◽  
Spring Back ◽  
Deformation Degree ◽  
Relative Cross Section ◽  
Bending Process ◽  
Section Profile ◽  
Complicated Part ◽  
Deformation Procedure

The aluminum profile can be formed into a complicated part such as 360º abnormity section circle parts that is difficult to be manufactured by other techniques. A new bending method was proposed for bending process. The push-bending principle, deformation procedure, curvature spring-back, section distortion and wrinkling are studied numerically. All cross-sections for the profile are provided a rather homogenous deformation degree. The curvature value of component and the distortion of section keep high consistence in push-bending process. The wrinkling tendency is reduced with increasing relative cross section thickness t/H and die radius R. The numerical model represents the observed response in the laboratory tests fairly well.

scholarly journals VUV and Soft X-ray Spectroscopy of Actinides

2003 ◽  
Vol 802 ◽  
Author(s):  
Clifford G. Olson ◽  
John J. Joyce ◽  
Tomasz Durakiewicz ◽  
Elzbieta Guziewicz ◽  
Martin Butterfield
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Spectral Characteristics ◽  
Electronic States ◽  
Momentum Dependence ◽  
Auger Electrons ◽  
X Ray ◽  
Relative Cross Section ◽  
Initial States ◽  
Valence Bands

ABSTRACTOptical and photoelectron spectroscopies using VUV and Soft X-ray photons are powerful tools for studies of elemental and compound actinides. Large changes in the relative atomic cross sections of the 5f, 6d and sp electrons allow decomposition of the character of the valence bands using photoemission. Resonant enhancement of photoelectrons and Auger electrons at the 5d core threshold further aids the decomposition and gives a measure of elemental specificity. Angle-resolved photoemission can be used to map the momentum dependence of the electronic states. The large changes in relative cross section with photon energy yields further details when the mapping is done at equivalent points in multiple zones. Spectra for well understood rare earth materials will be presented to establish spectral characteristics for known atomic character initial states. These signatures will be applied to the case of USb to investigate f-d hybridization near the Fermi level.

A shear center demonstration model using 3D-printing

2021 ◽  
pp. 030641902110574
Author(s):  
Lawrence N Virgin
Keyword(s):  
3D Printing ◽  
Cross Section ◽  
Cross Sections ◽  
Principal Axis ◽  
Practical Importance ◽  
Bending Moment ◽  
Shear Center ◽  
Cross Sectional ◽  
Thin Walls ◽  
Section Profile

Locating the shear, or flexural, center of non-symmetric cross-sectional beams is a key element in the teaching of structural mechanics. That is, establishing the point on the plane of the cross-section where an applied load, generating a bending moment about a principal axis, results in uni-directional deflection, and no twisting. For example, in aerospace structures it is particularly important to assess the propensity of an airfoil section profile to resist bending and torsion under the action of aerodynamic forces. Cross-sections made of thin-walls, whether of open or closed form are of special practical importance and form the basis of the material in this paper. The advent of 3D-printing allows the development of tactile demonstration models based on non-trivial geometry and direct observation.

scholarly journals The Influence of Cross-Section Thickness on Diameter at Breast Height Estimation from Point Cloud

2020 ◽  
Vol 9 (9) ◽  
pp. 495
Author(s):  
Milan Koreň ◽  
Milan Hunčaga ◽  
Juliana Chudá ◽  
Martin Mokroš ◽  
Peter Surový
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Point Cloud ◽  
Point Clouds ◽  
Estimation Accuracy ◽  
Circle Fitting ◽  
Section Thickness ◽  
Diameter At Breast Height ◽  
Breast Height ◽  
The Impact

Circle-fitting methods are commonly used to estimate diameter at breast height (DBH) of trees from horizontal cross-section of point clouds. In this paper, we addressed the problem of cross-section thickness optimization regarding DBH estimation bias and accuracy. DBH of 121 European beeches (Fagus sylvatica L.) and 43 Sessile oaks (Quercus petraea (Matt.) Liebl.) was estimated from cross-sections with thicknesses ranging from 1 to 100 cm. The impact of cross-section thickness on the bias, standard error, and accuracy of DBH estimation was statistically significant. However, the biases, standard errors, and accuracies of DBH estimation were not significantly different among 1–10-cm cross-sections, except for oak DBH estimation accuracy from an 8-cm cross-section. DBH estimations from 10–100-cm cross-sections were considerably different. These results provide insight to the influence of cross-section thickness on DBH estimation by circle-fitting methods, which is beneficial for point cloud data acquisition planning and processing. The optimal setting of cross-section thickness facilitates point cloud processing and DBH estimation by circle-fitting algorithms.

scholarly journals Charge Transfer, Complexes Formation and Furan Fragmentation Induced by Collisions with Low-Energy Helium Cations

2019 ◽  
Vol 20 (23) ◽  
pp. 6022 ◽  
Author(s):  
Tomasz J. Wasowicz ◽  
Marta Łabuda ◽  
Boguslaw Pranszke
Keyword(s):  
Gas Phase ◽  
Cross Section ◽  
Cross Sections ◽  
Emission Lines ◽  
Charge Transfer Complexes ◽  
Electronic Charge ◽  
Helium Atoms ◽  
Relative Cross Section ◽  
High Level ◽  
Projectile Charge

The present work focuses on unraveling the collisional processes leading to the fragmentation of the gas-phase furan molecules under the He+ and He2+ cations impact in the energy range 5–2000 eV. The presence of different mechanisms was identified by the analysis of the optical fragmentation spectra measured using the collision-induced emission spectroscopy (CIES) in conjunction with the ab initio calculations. The measurements of the fragmentation spectra of furan were performed at the different kinetic energies of both cations. In consequence, several excited products were identified by their luminescence. Among them, the emission of helium atoms excited to the 1s4d 1D2, 3D1,2,3 states was recorded. The structure of the furan molecule lacks an He atom. Therefore, observation of its emission lines is spectroscopic evidence of an impact reaction occurring via relocation of the electronic charge between interacting entities. Moreover, the recorded spectra revealed significant variations of relative band intensities of the products along with the change of the projectile charge and its velocity. In particular, at lower velocities of He+, the relative cross-sections of dissociation products have prominent resonance-like maxima. In order to elucidate the experimental results, the calculations have been performed by using a high level of quantum chemistry methods. The calculations showed that in both impact systems two collisional processes preceded fragmentation. The first one is an electron transfer from furan molecules to cations that leads to the neutralization and further excitation of the cations. The second mechanism starts from the formation of the He−C4H4O+/2+ temporary clusters before decomposition, and it is responsible for the appearance of the narrow resonances in the relative cross-section curves.

scholarly journals Matching in $$ pp\to t\overline{t}W/Z/h+ $$ jet SMEFT studies

2021 ◽  
Vol 2021 (6) ◽  
Author(s):  
Reza Goldouzian ◽  
Jeong Han Kim ◽  
Kevin Lannon ◽  
Adam Martin ◽  
Kelci Mohrman ◽  
...  
Keyword(s):  
Standard Model ◽  
Cross Section ◽  
Cross Sections ◽  
Parton Shower ◽  
Inclusive Cross Section ◽  
Relative Impact ◽  
Matrix Elements ◽  
Leading Order ◽  
Relative Cross Section ◽  
The Impact

Abstract In this paper, we explore the impact of extra radiation on predictions of $$ pp\to \mathrm{t}\overline{\mathrm{t}}\mathrm{X},\mathrm{X}=\mathrm{h}/{\mathrm{W}}^{\pm }/\mathrm{Z} $$ pp → t t ¯ X , X = h / W ± / Z processes within the dimension-6 SMEFT framework. While full next-to-leading order calculations are of course preferred, they are not always practical, and so it is useful to be able to capture the impacts of extra radiation using leading-order matrix elements matched to the parton shower and merged. While a matched/merged leading-order calculation for $$ \mathrm{t}\overline{\mathrm{t}}\mathrm{X} $$ t t ¯ X is not expected to reproduce the next-to-leading order inclusive cross section precisely, we show that it does capture the relative impact of the EFT effects by considering the ratio of matched SMEFT inclusive cross sections to Standard Model values, $$ {\sigma}_{\mathrm{SM}\mathrm{EFT}}\left(\mathrm{t}\overline{\mathrm{t}}\mathrm{X}+\mathrm{j}\right)/{\sigma}_{\mathrm{SM}}\left(\mathrm{t}\overline{\mathrm{t}}\mathrm{X}+\mathrm{j}\right)\equiv \mu $$ σ SMEFT t t ¯ X + j / σ SM t t ¯ X + j ≡ μ . Furthermore, we compare leading order calculations with and without extra radiation and find several cases, such as the effect of the operator $$ \left({\varphi}^{\dagger }i{\overleftrightarrow{D}}_{\mu}\varphi \right)\left(\overline{t}{\gamma}^{\mu }t\right) $$ φ † i D ↔ μ φ t ¯ γ μ t on $$ \mathrm{t}\overline{\mathrm{t}}\mathrm{h} $$ t t ¯ h and $$ \mathrm{t}\overline{\mathrm{t}}\mathrm{W} $$ t t ¯ W , for which the relative cross section prediction increases by more than 10% — significantly larger than the uncertainty derived by varying the input scales in the calculation, including the additional scales required for matching and merging. Being leading order at heart, matching and merging can be applied to all operators and processes relevant to $$ pp\to \mathrm{t}\overline{\mathrm{t}}\mathrm{X},\mathrm{X}=\mathrm{h}/{\mathrm{W}}^{\pm }/\mathrm{Z}+\mathrm{jet} $$ pp → t t ¯ X , X = h / W ± / Z + jet , is computationally fast and not susceptible to negative weights. Therefore, it is a useful approach in $$ \mathrm{t}\overline{\mathrm{t}}\mathrm{X} $$ t t ¯ X + jet studies where complete next-to-leading order results are currently unavailable or unwieldy.

Electron Irradiation Effects in Polyoxymethylene Crystals Grown Inside Trioxane Crystals

1971 ◽  
Vol 29 ◽  
pp. 78-79
Author(s):  
J. P. Colson ◽  
D. H. Reneker
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Detailed Examination ◽  
The Other ◽  
Electron Micrograph ◽  
Irradiation Effects ◽  
Threefold Axis ◽  
Typical Sample ◽  
Polymer Crystals ◽  
Chain Axis

Polyoxymethylene (POM) crystals grow inside trioxane crystals which have been irradiated and heated to a temperature slightly below their melting point. Figure 1 shows a low magnification electron micrograph of a group of such POM crystals. Detailed examination at higher magnification showed that three distinct types of POM crystals grew in a typical sample. The three types of POM crystals were distinguished by the direction that the polymer chain axis in each crystal made with respect to the threefold axis of the trioxane crystal. These polyoxymethylene crystals were described previously.At low magnifications the three types of polymer crystals appeared as slender rods. One type had a hexagonal cross section and the other two types had rectangular cross sections, that is, they were ribbonlike.

A quantitative approach to inner shell losses

1978 ◽  
Vol 36 (1) ◽  
pp. 526-527 ◽  
Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers
Keyword(s):  
Energy Transfer ◽  
Cross Section ◽  
Cross Sections ◽  
Accurate Determination ◽  
Background Intensity ◽  
Core Excitation ◽  
Quantitative Basis ◽  
Cross Section Differential ◽  
Bound Electrons

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as

Oxygen K near edge structures studied with multiple scattering calculations

1988 ◽  
Vol 46 ◽  
pp. 504-505
Author(s):  
Xudong Weng ◽  
Peter Rez
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Partial Cross Section ◽  
Energy Window ◽  
Edge Structure ◽  
Fine Structures ◽  
Hydrogenic Model ◽  
Electron Energy Loss ◽  
Quantitative Chemical

In electron energy loss spectroscopy, quantitative chemical microanalysis is performed by comparison of the intensity under a specific inner shell edge with the corresponding partial cross section. There are two commonly used models for calculations of atomic partial cross sections, the hydrogenic model and the Hartree-Slater model. Partial cross sections could also be measured from standards of known compositions. These partial cross sections are complicated by variations in the edge shapes, such as the near edge structure (ELNES) and extended fine structures (ELEXFS). The role of these solid state effects in the partial cross sections, and the transferability of the partial cross sections from material to material, has yet to be fully explored. In this work, we consider the oxygen K edge in several oxides as oxygen is present in many materials. Since the energy window of interest is in the range of 20-100 eV, we limit ourselves to the near edge structures.

Absolute inner-shell cross section determination for EELS analysis

1988 ◽  
Vol 46 ◽  
pp. 534-535
Author(s):  
P.A. Crozier
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Absolute Cross Section ◽  
Specimen Thickness ◽  
Mass Thickness ◽  
Scattering Cross ◽  
Before And After ◽  
Estimated Error ◽  
Scattering Cross Sections ◽  
Electron Microscopist

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.

A technique for preparing semiconductor cross sections for both TEM and SEM analysis

1989 ◽  
Vol 47 ◽  
pp. 712-713
Author(s):  
Stanley J. Klepeis ◽  
J.P. Benedict ◽  
R.M Anderson
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Cross Sections ◽  
Sem Analysis ◽  
Preparation Technique ◽  
Ion Milling ◽  
Tem Analysis ◽  
Polished Cross Section ◽  
Area Of Interest ◽  
Polished Side

The ability to prepare a cross-section of a specific semiconductor structure for both SEM and TEM analysis is vital in characterizing the smaller, more complex devices that are now being designed and manufactured. In the past, a unique sample was prepared for either SEM or TEM analysis of a structure. In choosing to do SEM, valuable and unique information was lost to TEM analysis. An alternative, the SEM examination of thinned TEM samples, was frequently made difficult by topographical artifacts introduced by mechanical polishing and lengthy ion-milling. Thus, the need to produce a TEM sample from a unique,cross-sectioned SEM sample has produced this sample preparation technique.The technique is divided into an SEM and a TEM sample preparation phase. The first four steps in the SEM phase: bulk reduction, cleaning, gluing and trimming produces a reinforced sample with the area of interest in the center of the sample. This sample is then mounted on a special SEM stud. The stud is inserted into an L-shaped holder and this holder is attached to the Klepeis polisher (see figs. 1 and 2). An SEM cross-section of the sample is then prepared by mechanically polishing the sample to the area of interest using the Klepeis polisher. The polished cross-section is cleaned and the SEM stud with the attached sample, is removed from the L-shaped holder. The stud is then inserted into the ion-miller and the sample is briefly milled (less than 2 minutes) on the polished side. The sample on the stud may then be carbon coated and placed in the SEM for analysis.

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